WO2004088287A3 - Method of automatic correction for an optoelectronic measuring device - Google Patents
Method of automatic correction for an optoelectronic measuring device Download PDFInfo
- Publication number
- WO2004088287A3 WO2004088287A3 PCT/FR2004/000717 FR2004000717W WO2004088287A3 WO 2004088287 A3 WO2004088287 A3 WO 2004088287A3 FR 2004000717 W FR2004000717 W FR 2004000717W WO 2004088287 A3 WO2004088287 A3 WO 2004088287A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- devices
- measuring device
- automatic correction
- optoelectronic measuring
- green
- Prior art date
Links
- 230000005693 optoelectronics Effects 0.000 title abstract 2
- 230000035945 sensitivity Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Mathematical Physics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Color Television Image Signal Generators (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR03/03730 | 2003-03-26 | ||
FR0303730A FR2853068B1 (en) | 2003-03-26 | 2003-03-26 | AUTOMATIC CORRECTION PROCEDURE FOR OPTOELECTRONIC MEASURING APPARATUS AND RELATED MEANS |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004088287A2 WO2004088287A2 (en) | 2004-10-14 |
WO2004088287A3 true WO2004088287A3 (en) | 2004-11-18 |
Family
ID=32947190
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2004/000717 WO2004088287A2 (en) | 2003-03-26 | 2004-03-24 | Method of automatic correction for an optoelectronic measuring device |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR2853068B1 (en) |
WO (1) | WO2004088287A2 (en) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0646784A1 (en) * | 1993-09-07 | 1995-04-05 | Bayer Corporation | Video test strip reader and method for evaluating test strips |
WO2001015597A1 (en) * | 1999-08-31 | 2001-03-08 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Imaging apparatus for displaying concentration ratios |
WO2002001209A1 (en) * | 2000-06-23 | 2002-01-03 | Teradyne, Inc. | Compensation system and related techniques for use in a printed circuit board inspection system |
WO2002039094A1 (en) * | 2000-11-10 | 2002-05-16 | Arkray, Inc. | Measuring method and instrument comprising image sensor |
US6400468B1 (en) * | 1998-03-31 | 2002-06-04 | International Business Machines Corporation | Smoothing calibration files to improve reproduction of digitized images |
US20020071041A1 (en) * | 2000-12-07 | 2002-06-13 | Pine Joshua I. | Enhanced resolution mode using color image capture device |
US20020122192A1 (en) * | 2000-12-08 | 2002-09-05 | Gretag-Macbeth Ag | Device for the pixel-by-pixel photoelectric measurement of a planar measured object |
US20020122123A1 (en) * | 2001-03-01 | 2002-09-05 | Semiconductor Energy Laboratory Co., Ltd. | Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system |
US6452179B1 (en) * | 1998-08-14 | 2002-09-17 | Global Technovations, Inc. | On-site analyzer |
-
2003
- 2003-03-26 FR FR0303730A patent/FR2853068B1/en not_active Expired - Fee Related
-
2004
- 2004-03-24 WO PCT/FR2004/000717 patent/WO2004088287A2/en active Application Filing
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0646784A1 (en) * | 1993-09-07 | 1995-04-05 | Bayer Corporation | Video test strip reader and method for evaluating test strips |
US6400468B1 (en) * | 1998-03-31 | 2002-06-04 | International Business Machines Corporation | Smoothing calibration files to improve reproduction of digitized images |
US6452179B1 (en) * | 1998-08-14 | 2002-09-17 | Global Technovations, Inc. | On-site analyzer |
WO2001015597A1 (en) * | 1999-08-31 | 2001-03-08 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Imaging apparatus for displaying concentration ratios |
WO2002001209A1 (en) * | 2000-06-23 | 2002-01-03 | Teradyne, Inc. | Compensation system and related techniques for use in a printed circuit board inspection system |
WO2002039094A1 (en) * | 2000-11-10 | 2002-05-16 | Arkray, Inc. | Measuring method and instrument comprising image sensor |
US20020071041A1 (en) * | 2000-12-07 | 2002-06-13 | Pine Joshua I. | Enhanced resolution mode using color image capture device |
US20020122192A1 (en) * | 2000-12-08 | 2002-09-05 | Gretag-Macbeth Ag | Device for the pixel-by-pixel photoelectric measurement of a planar measured object |
US20020122123A1 (en) * | 2001-03-01 | 2002-09-05 | Semiconductor Energy Laboratory Co., Ltd. | Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system |
Also Published As
Publication number | Publication date |
---|---|
FR2853068B1 (en) | 2006-06-16 |
WO2004088287A2 (en) | 2004-10-14 |
FR2853068A1 (en) | 2004-10-01 |
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