WO2004075251A3 - Tmos-infrared uncooled sensor and focal plane array - Google Patents
Tmos-infrared uncooled sensor and focal plane array Download PDFInfo
- Publication number
- WO2004075251A3 WO2004075251A3 PCT/IL2004/000142 IL2004000142W WO2004075251A3 WO 2004075251 A3 WO2004075251 A3 WO 2004075251A3 IL 2004000142 W IL2004000142 W IL 2004000142W WO 2004075251 A3 WO2004075251 A3 WO 2004075251A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sensor
- tmos
- focal plane
- plane array
- array
- Prior art date
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 238000001312 dry etching Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000035945 sensitivity Effects 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14649—Infrared imagers
- H01L27/1465—Infrared imagers of the hybrid type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/545,892 US7489024B2 (en) | 2003-02-20 | 2004-02-15 | TMOS-infrared uncooled sensor and focal plane array |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US44810303P | 2003-02-20 | 2003-02-20 | |
US60/448,103 | 2003-02-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004075251A2 WO2004075251A2 (en) | 2004-09-02 |
WO2004075251A3 true WO2004075251A3 (en) | 2005-12-01 |
Family
ID=32908535
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IL2004/000142 WO2004075251A2 (en) | 2003-02-20 | 2004-02-15 | Tmos-infrared uncooled sensor and focal plane array |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2004075251A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8552380B1 (en) * | 2012-05-08 | 2013-10-08 | Cambridge Cmos Sensors Limited | IR detector |
CN103263255B (en) * | 2013-05-25 | 2014-09-24 | 慈溪迈思特电子科技有限公司 | Method for processing data of human body infrared temperature sensor |
US9528881B1 (en) * | 2016-05-18 | 2016-12-27 | Nxp Usa, Inc. | Stress isolated detector element and microbolometer detector incorporating same |
CN116086621B (en) * | 2023-03-31 | 2023-07-25 | 杭州海康微影传感科技有限公司 | Infrared reading circuit and control method thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6465786B1 (en) * | 1999-09-01 | 2002-10-15 | Micron Technology, Inc. | Deep infrared photodiode for a CMOS imager |
US6483111B1 (en) * | 1998-09-14 | 2002-11-19 | Mitsubishi Denki Kabushiki Kaisha | Thermal infrared-detector array and method of fabrication thereof |
US20040200962A1 (en) * | 2003-04-11 | 2004-10-14 | Mitsubishi Denki Kabushiki Kaisha | Thermal type infrared detector and infrared focal plane array |
-
2004
- 2004-02-15 WO PCT/IL2004/000142 patent/WO2004075251A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6483111B1 (en) * | 1998-09-14 | 2002-11-19 | Mitsubishi Denki Kabushiki Kaisha | Thermal infrared-detector array and method of fabrication thereof |
US6465786B1 (en) * | 1999-09-01 | 2002-10-15 | Micron Technology, Inc. | Deep infrared photodiode for a CMOS imager |
US20040200962A1 (en) * | 2003-04-11 | 2004-10-14 | Mitsubishi Denki Kabushiki Kaisha | Thermal type infrared detector and infrared focal plane array |
Also Published As
Publication number | Publication date |
---|---|
WO2004075251A2 (en) | 2004-09-02 |
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