WO2004021386A3 - Mass spectrometer - Google Patents
Mass spectrometer Download PDFInfo
- Publication number
- WO2004021386A3 WO2004021386A3 PCT/US2003/027298 US0327298W WO2004021386A3 WO 2004021386 A3 WO2004021386 A3 WO 2004021386A3 US 0327298 W US0327298 W US 0327298W WO 2004021386 A3 WO2004021386 A3 WO 2004021386A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ions
- accelerated
- electric field
- provides
- mass
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/403—Time-of-flight spectrometers characterised by the acceleration optics and/or the extraction fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/488—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with retarding grids
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003268325A AU2003268325A1 (en) | 2002-08-30 | 2003-08-29 | Mass spectrometer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US40743002P | 2002-08-30 | 2002-08-30 | |
US60/407,430 | 2002-08-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004021386A2 WO2004021386A2 (en) | 2004-03-11 |
WO2004021386A3 true WO2004021386A3 (en) | 2005-04-28 |
Family
ID=31978484
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/027298 WO2004021386A2 (en) | 2002-08-30 | 2003-08-29 | Mass spectrometer |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU2003268325A1 (en) |
WO (1) | WO2004021386A2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0427632D0 (en) | 2004-12-17 | 2005-01-19 | Micromass Ltd | Mass spectrometer |
GB201003566D0 (en) * | 2010-03-03 | 2010-04-21 | Ilika Technologies Ltd | Mass spectrometry apparatus and methods |
WO2011127091A1 (en) * | 2010-04-05 | 2011-10-13 | Indiana University Research And Technology Corporation | Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry |
CN102263003B (en) * | 2011-06-03 | 2013-01-09 | 中国科学院西安光学精密机械研究所 | Method and mapping meter for mapping flight time and momentum energy of refraction type charged particle |
CN102446693B (en) * | 2011-11-29 | 2016-04-06 | 邱永红 | A kind of accelerated method of charged particle and application thereof |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020100870A1 (en) * | 2001-01-29 | 2002-08-01 | Craig Whitehouse | Charged particle trapping in near-surface potential wells |
US6593570B2 (en) * | 2000-05-24 | 2003-07-15 | Agilent Technologies, Inc. | Ion optic components for mass spectrometers |
-
2003
- 2003-08-29 WO PCT/US2003/027298 patent/WO2004021386A2/en not_active Application Discontinuation
- 2003-08-29 AU AU2003268325A patent/AU2003268325A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6593570B2 (en) * | 2000-05-24 | 2003-07-15 | Agilent Technologies, Inc. | Ion optic components for mass spectrometers |
US20020100870A1 (en) * | 2001-01-29 | 2002-08-01 | Craig Whitehouse | Charged particle trapping in near-surface potential wells |
Also Published As
Publication number | Publication date |
---|---|
WO2004021386A2 (en) | 2004-03-11 |
AU2003268325A1 (en) | 2004-03-19 |
AU2003268325A8 (en) | 2004-03-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1367631A3 (en) | Mass spectrometer | |
Loboda et al. | A tandem quadrupole/time‐of‐flight mass spectrometer with a matrix‐assisted laser desorption/ionization source: Design and performance | |
CA2103038C (en) | Tandem time-of-flight mass spectrometer | |
JP3219434B2 (en) | Tandem mass spectrometry system | |
CA2444614A1 (en) | Method and system for mass spectroscopy | |
CA2318586A1 (en) | Mass spectrometry from surfaces | |
WO2006064280A3 (en) | Mass spectrometer | |
WO2000033350A3 (en) | Method and apparatus for multiple stages of mass spectrometry | |
WO2005045419A3 (en) | Ion source and methods for maldi mass spectrometry | |
WO2001069647A3 (en) | Tandem high field asymmetric waveform ion mobility spectrometry (faims)/tandem mass spectrometry | |
US5861623A (en) | Nth order delayed extraction | |
WO2002103746A3 (en) | Mass spectrometers and methods of ion separation and detection | |
US8735810B1 (en) | Time-of-flight mass spectrometer with ion source and ion detector electrically connected | |
WO2007122383A3 (en) | Ion energy spread reduction for mass spectrometer | |
AU2002302251A1 (en) | Method for mass spectrometry, separation of ions with different charges | |
US6130426A (en) | Kinetic energy focusing for pulsed ion desorption mass spectrometry | |
CA2116821A1 (en) | Improvements in plasma mass spectrometry | |
WO2004021386A3 (en) | Mass spectrometer | |
WO2004108257A3 (en) | Mass spectrometer and related ionizer and methods | |
US6621078B2 (en) | Ion trapping device | |
Sundqvist et al. | Plasma desorption mass spectrometry (PDMS). Limitations and possibilities | |
EP0278736A3 (en) | Secondary ion mass spectrometer | |
Greenwood et al. | State-selective one-electron capture from He, Ne and Ar by 4 keV state-prepared ions | |
Gooden et al. | Evaluation of different combinations of gated trapping, RF-only mode and trap compensation for in-field MALDI Fourier transform mass spectrometry | |
JP2002117802A (en) | Overhead acceleration time-of-flight type mass spectrometry apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
122 | Ep: pct application non-entry in european phase | ||
NENP | Non-entry into the national phase |
Ref country code: JP |
|
WWW | Wipo information: withdrawn in national office |
Country of ref document: JP |