WO2004010200A1 - Catadioptric multi-mirror systems for protection lithography - Google Patents
Catadioptric multi-mirror systems for protection lithography Download PDFInfo
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- WO2004010200A1 WO2004010200A1 PCT/US2002/022766 US0222766W WO2004010200A1 WO 2004010200 A1 WO2004010200 A1 WO 2004010200A1 US 0222766 W US0222766 W US 0222766W WO 2004010200 A1 WO2004010200 A1 WO 2004010200A1
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/082—Catadioptric systems using three curved mirrors
- G02B17/0828—Catadioptric systems using three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0892—Catadioptric systems specially adapted for the UV
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
Definitions
- the present invention relates to an optical system of a reduction exposure apparatus, such as steppers and microlithography systems and more particularly, relates to catadioptric reduction optical systems suitable for use with ultraviolet light sources and including a sufficiently high numerical aperture to provide improved lithography performance in the ultraviolet wavelength region.
- Optical systems having a refractive group have achieved satisfactory resolutions operating with illumination sources having wavelengths of 248 or 193 nanometers.
- the need for optical projection systems capable of providing enhanced resolution increases.
- shorter wavelengths of electromagnetic radiation must be used to project the image of a reticle or mask onto a photosensitive substrate, such as a semiconductor wafer. Because very few refractive optical materials are able to transmit significant electromagnetic radiation below a wavelength of 193 nanometers, it is necessary to reduce to a minimum or eliminate refractive elements in optical projection systems operating at wavelengths below 193 nanometers.
- catadioptric reduction optical systems i.e., ones that combine a reflective system with a refractive system
- catadioptric systems are particularly well-suited to satisfy the aforementioned objectives.
- a number of parties have developed or proposed development of systems for wavelengths below 365 nm.
- One catadioptric system concept relates to a Dyson- type arrangement used in conjunction with a beam splitter to provide ray clearance and unfold the path to provide for parallel scanning (e.g., U.S. patent Nos. 5,537,260; 5,742,436; and 5,805,357).
- an off-axis design is provided using a group with a numerical aperture of 0.70 operating at 248 nm.
- U.S. patent Nos. 6,195,213 and 6,362,926 to Omura et al. disclose other examples of this approach and U.S. patent No. 5,835,275 to Takahashi illustrates yet another example.
- Takahashi et al. offer several similar examples of beam splitter free designs in European patent application EP 1168028.
- An exemplary catadioptric projection system includes a first optical group and a second optical group that are both arranged so that the first optical group presents a reduced, virtual image to the second optical group.
- the first optical group is formed of three mirrors in combination with at least two lens elements and the second optical group is a substantially refractive optical group more image forward than the first optical group having a number of lenses.
- the second optical group provides image reduction.
- the first optical group provides compensative aberrative correction for the second optical group.
- the present objective forms an image with a numerical aperture of at least 0.80.
- the objective is characterized by a design which is used off-axis in a ring field geometry so that no polarizing beam splitter cube is required. This eliminates problems associated with manufacture of the cube and also the provision of an illumination system that delivers polarized light to the cube.
- the design of the exemplary objective is such that the image field is off axis for the light beams to pass by mirrors and rectangular slits are often preferred over ring slits in practice.
- the present objective has a folded off-axis field geometry.
- the present optical system achieves mask and wafer planes that are parallel to each other and perpendicular to the optical axis, enabling unlimited scanning in a step/scan lithographic configuration.
- the present embodiments have an axis of rotational symmetry
- the system itself is not coaxial from the reticle to the wafer.
- the objective preferably utilizes a reflective field group in a folded, off-axis (ring) field geometry in a number of the present embodiments.
- the system can path the beam in such away to enable this unlimited parallel scan.
- the present optical system is designed to provide a system that can perform well in optical lithography applications where the wavelength is extended to 157 nm. Due to the arrangement of the optical groups, a system is provided that can operate at high numerical apertures (NA of 0.80 or more) for these particular microlithographic applications where a wavelength of 157 nm is desired.
- NA numerical aperture
- the present catadioptric multi-mirror optical systems disclosed herein overcome the deficiencies associated with conventional catadioptric optical systems and offer a number of advantages, including the following: (1) a beam splitter is not required; (2) a polarized illuminator is likewise not required; (3) the systems do not require new technologies to be developed in order for the present systems to be implemented; and (4) low blank mass designs ( ⁇ 60 kg) are possible.
- Fig. 1 schematically illustrates a microlithographic projection reduction objective according to a first embodiment, wherein the field groups are shown in a non-folded geometry
- FIG. 2 schematically illustrates the microlithographic projection reduction objective of Fig. 1 having one field group in a folded geometry
- Fig. 3 schematically illustrates a microlithographic projection reduction objective according to a second embodiment, wherein the field groups are shown in a non-folded geometry
- Fig. 4 schematically illustrates a microlithographic projection reduction objective according to Fig. 3 having one field group in a folded geometry
- Fig. 5 schematically illustrates a microlithographic projection reduction objective according to a third embodiment having one field group in a folded geometry.
- catadioptric projection systems are provided.
- the catadioptric projection system is formed of a two distinct imaging groups Gl and G2.
- Group Gl is a front end catadioptric group that provides a conjugate stop position to correct chromatic aberration, if desired, and works to balance the aberrations of the second group G2.
- This second group, G2 is dioptric and enables the system to achieve numerical apertures up to and in excess of 0.80.
- This catadioptric optical system achieves high numerical aperture preferably using no beam splitters and a non-coaxial geometry.
- a catadioptric multi-mirror (CMM) projection reduction objective 100 according to a first embodiment is illustrated.
- CCM catadioptric multi-mirror
- Table 1 The specific details of this embodiment are set forth in Table 1, below.
- Fig. 1 is a schematic optical diagram of the system 100 illustrating the system 100 in an unfolded position to generally show the arrangement of the elements
- Fig. 2 is a schematic optical diagram of the system 100 after a pair of folding mirrors have been introduced into group Gl .
- the system 100 is divided into two distinct functional groups: (1) group Gl including 3 -mirrors and 3 lens elements and (2) group G2 including 13 individual lens elements and also preferably includes a protective plane parallel plate 102.
- the protective plane parallel plate 102 is a CaFl plate with a 4 mm thickness.
- Group Gl includes lens elements E1-E3 near the object plane and includes a concave mirror M2 and a convex mirror M3.
- the group G2 includes lens elements E4-E16, as shown, and as described in detail below with reference to Figs. 1-2.
- the design according to the first embodiment has a non-coaxial geometry and does not include the use of beam splitter. While the exemplary embodiment has an axis of rotational symmetry, folds are required to enable unlimited parallel scanning. However, the designs of Figs. 1 and 2 do not require a beam splitter since an off-axis ring field enables the necessary beam clearance to ensure that the mask and wafer planes are parallel.
- Group Gl forms a minified, virtual image located behind mirror M3 at a reduction of about ⁇ 0.7x.
- Group G2 takes this virtual image and forms a usable real image at the image plane.
- G2 operates at reduction of about 0.29x, thereby allowing the system 100 to achieve a reduction of 0.25x.
- One of the disadvantages of the system 100 in the arrangement shown in Fig. 1 is that unlimited parallel scanning is very difficult to obtain due to the positioning of the object plane (mask) relative to the group G2 and the wafer. More specifically, scanning equipment would be disposed between M3 and the mask and therefore is placed directly between groups Gl and G2. Such positioning would cause the scanner to interfere with the light that is traveling between Ml (Group Gl) and M2 (Group G2) and therefore, this arrangement does not readily lend itself to unlimited parallel scanning.
- a first folding mirror FI is added after the lens element El to deviate the image bundle by an included angle of 96°.
- the direction of the image bundle is then reversed by the reflection at concave mirror Ml.
- a second folding mirror F2 is added to the beam path at a location that is between lens element E2 and concave mirror M2. This second folding mirror F2 acts to deviate the imaging bundles by an included angle of 84°.
- the second folding mirror F2 also serves to direct the imaging bundles in a direction that is parallel to the light emanating from the object plane.
- the aperture stop lies in group G2 has a conjugate position in Gl in close proximity to mirror Ml, but not exactly at mirror Ml. This allows a negative chief ray height at lens elements E2/E3 (for a positive field height at the reticle). This chief ray height, when combined with the sign of the marginal ray and the negative power of the E2/E3 pair, advantageously provides for a lateral chromatic aberration contribution that substantially cancels the lateral color contribution from group G2.
- the strong negative power contained in elements E2 and E3 enable a strongly undercorrected or negative paraxial axial color (PAC) contribution that effectively balances the strongly overcorrected or positive PAC contribution from dioptric group G2.
- PAC paraxial axial color
- This correction mechanism is greatly enhanced by the double pass through these elements after reflection from mirror Ml.
- the transverse PAC contribution from Gl is -413.8 nm/pm, which balances the +423.5 nm/pm traverses PAC contribution from G2.
- the large marginal ray height at second mirror M2 means that a small non-zero chief ray height (e.g., -8 mm to -12 mm) can be used to generate the overcorrected paraxial lateral color (PLC) contribution that is needed to balance the undercorrected PLC residual from the lens elements E4-E16 in group G2.
- PLC paraxial lateral color
- an overcorrected PLC contribution of +36.8 nm/pm is generated in group Gl, balanced against an undercorrected PLC contribution of - 48.8 nm/pm from G2, netting a residual of +12 nm/pm.
- the intermediate image that is formed near the third mirror M3 is highly aberrated and the origin of this aberration is worthy of discussion.
- the intermediate image is forced to suffer excessive coma and therefore, the rays from the periphery of the pupil focus below the chief ray at the intermediate image.
- Driving the lower rim ray from the conjugate stop away from the optical axis creates this coma, but in turn provides the necessary beam clearance at the second mirror M2.
- This large induced overcorrected contribution from group Gl is obviously balanced by group G2.
- the monochromatic aberrations are corrected via a balance between groups Gl and G2. This is done in such a manner to as to leave the lens elements E4-E16 in the group G2 "unstressed".
- the system 100 has a composite RMS wavefront error of 4.0 m ⁇ evaluated monochromatically over the field.
- the RMS wavefront error across the field ring varies from 3.2 m ⁇ to 4.9 m ⁇ , while the distortion is less than 1 nm at all field points.
- the paraxial color is corrected to 12 nm/pm, while the paraxial lateral color is corrected to better than 12 nm/pm. It will be appreciated that further correction means are available; however in the interest of brevity, these further means are not disclosed.
- the design of the first embodiment approaches the "zero aberration" condition required by state of the art lithographic scanners.
- the aspheric decomposition of the system 100 is listed in Table 3.
- the high-order asphere content is relatively low and displays favorable ratios between successive orders. Accordingly, the selection for good null lenses for the embodiment of Fig. 2 should be an easy task.
- Table 3 Aspheric decomposition for the first embodiment of Fig. 2.
- R vertex is the radius of the vertex of the surface, (i.e., at the optical axis R) and R envelope is the radius of the best fit sphere for the aspheric surface.
- the group G2 contains more positive lens elements than negative lens elements and more specifically, the group G2 contains 4 negative lens elements and 9 positive lens elements.
- the lens element E16 (the most image forward lens element) is a negative lens and the lens element E4 (the least image forward lens element) is a negative lens and lens elements E5-E7 are positive lens elements; E8-E9 are negative lens elements; E10-E13 are positive lens elements; E14 is a negative lens element; and El 5 is a positive lens element.
- CCMM catadioptric multi-mirror
- the system 200 is similar to the system 100 of Figs. 1-2 and therefore like elements will be numbered alike.
- the system 200 is configured to provide a higher numeral aperture (e.g., up to and over 0.85) in comparison to the system 100.
- Fig. 3 is a schematic optical diagram of the system 200 illustrating the system 200 in a non-folded geometry to show the general configuration of the groups Gl and G2, while Fig. 4 is a schematic optical diagram of the system 200 after a pair of folding mirror have been introduced into group Gl to form a folded geometry.
- the system 200 is divided into two distinct functional groups: (1) group Gl including 3-mirrors and 3 lens elements and (2) group G2 including 13 individual lens elements and also preferably includes a protective plane parallel plate, e.g., a CaFl plate 102 with a 4 mm thickness.
- group Gl including 3-mirrors and 3 lens elements
- group G2 including 13 individual lens elements and also preferably includes a protective plane parallel plate, e.g., a CaFl plate 102 with a 4 mm thickness.
- the second embodiment illustrates that unlimited parallel scanning is difficult due to the position of the object (mask) between the groups Gl and G2 (thus potentially interfering with the light beams as they are directed from Gl to G2).
- the system 200 achieves a numerical aperture of 0.85 over the same 26 mm x 6 mm field at 4x reduction.
- the precise number of elements contained in the system 200 is the same as in the system 100, with the differences between the two systems being very subtle and found in the construction of the strong dioptric imaging group (i.e., group G2). More specifically, the lens elements E15 and El 6 (of the first embodiment of Figs. 1-2) were combined since the airspace in that particular region offered little high-order aberration correction. In addition, lens element E9 was thickened and then split to accommodate a measure of stop motion as a function of numerical aperture change. The real stop position was iterated and telecentricity was set as evident by the details of the prescription of the system 200 found in Table 4.
- the second embodiment in the folded geometry of Fig. 4 utilizes a first folding mirror FI and a second folding mirror F2.
- the first folding mirror FI is added after the lens element El to deviate the image bundle.
- the direction of the image bundle is then reversed at concave mirror Ml .
- a second folding mirror F2 is added to the beam path between lens element E2 and concave mirror M2.
- This second folding mirror F2 also acts to deviate the imaging bundles and direct them in a direction that is parallel to the light emanating from the object plane.
- the first and second folding mirrors FI and F2 work together to ensure that the line of sight is displaced but not deviated.
- the group G2 contains more positive lens elements than negative ' lens elements and more specifically, the group G2 contains 3 negative lens elements and 10 positive lens elements.
- the lens element El 6 (the most image forward lens element) is a positive lens and the lens element E4 (the least image forward lens element) is a negative lens and lens elements E5-E7 are positive lens elements; E8 is a negative lens elements; E9 is a positive lens element; E10 is a negative lens element; El 1-E16 are positive lens elements. While the fundamentals of the aberration correction remain the same, several incremental improvements were made as the numerical aperture was scaled.
- the front working distance was increased from 25 mm to 27.5 mm and it will be appreciated that a larger front working distance is possible with additional design modifications.
- the composite wavelength error is 3.6 m ⁇ which is an improvement over the design of the first embodiment set forth in Figs. 1 and 2.
- the RMS wavefront error is also better balanced across the field ring, ranging from 2.5 m ⁇ to 4.1 m ⁇ .
- the centroid distortion is reduced to less than 3 nm.
- Tables 5 and 6 provide an overview of the design of the second embodiment. These tables therefore reflect the additional modifications that were done in order to bring the design of Figs. 3 and 4 to a higher state of correction.
- the design of system 200 processes excellent CD control at 65 nm with an acceptable ki -factor.
- Table 6 RMS wavefront error and centroid shift across field of view for the second embodiment of Fig. 4.
- the asphere decomposition of the system 200 is illustrated in Table 7.
- the design of system 200 uses relatively mild aspheres and is tailored in such a way so that the deepest departures lie on surfaces with the strongest radii.
- the design of system 200 sits atop a broad plateau of local minimum which indicates that slight modifications can be made to produce improvements in terms of both reduced asphere count and reduced element count.
- the aspheric departure on A17 was driven to 8.5 ⁇ m and it is likely that this asphere can be eliminated with some additional modifications.
- Table 7 Aspheric decomposition for the second embodiment of Fig. 4.
- Figs. 1-4 were constructed to illustrate and prove that improved lithographic performance can be realized by such designs.
- lithographic performance it is also desirable to optimize the blank mass of the system and more specifically, blank mass reduction is desirable to product a system that has specifications that support use in a number of microlithographic applications. Since it well known that the blank mass scales with the volume, a logical method of reducing the blank mass is by scaling. The track length is simply scaled down by a factor that gives the target blank mass and reoptimization is used to cover the performance of the system (e.g., unfolding the system 200 of Fig. 4 in a straight line would yield a system that is about 2625 mm in length).
- the system 200 of Figs. 3-4 was scaled by a factor of 0.80 (i.e., a reduction in scale by 20%) and this resulted in the blank mass being effectively reduced from 110.2 kg to 56.5 kg.
- This exemplary scaled system is illustrated in Fig. 5 which shows the fold geometry of this embodiment illustrating a total track from mask to wafer of 1250 mm and an axis offset of 100 mm.
- the two field groups, namely groups Gl and G2 of this embodiment have the same general arrangement. More specifically, a folded off-axis field geometry is presented and includes folding mirrors FI and F2 which deviate the image bundles and also direct the image bundles in a direction that is parallel to the light emanating from the object plane.
- the present system has an arrangement of elements that permits scaling without reducing the overall performance of the system.
- Table 8 sets forth the performance summary for the embodiment of Fig. 5. where the system has been scaled for blank mass reduction. The reoptimized design recovers performance to the 4-5 m ⁇ level with reductions in both blank mass and lens diameter.
- a complete optical prescription of this embodiment is found in Table 9, describing the optical surfaces in Code V format. What the prescription reveals is that the inner radius of the ring field is to 12 mm in this scaled embodiment, meaning that a 22 mm wide ring field is more appropriate. This would eliminate excessive over scan and problems associated with non-compensable induced distortions.
- Table 10 Aspheric decomposition for the third embodiment of Fig. 5.
- optical design description provided herein demonstrates an advantageous catadioptric projection system for DUV or VUV lithography. While the present embodiments have been designed for use in a 157 nm tool (scanner), the basic concept has no wavelength limitations, either shorter or longer, providing a suitable refractive material exists for the particular application that is desired.
- the various optical systems disclosed herein are each characterized as being a catadioptric optical system consisting of two groups, Gl and G2, constructed so that group Gl presents a reduced virtual image to group G2.
- the function of group G2 is to relay this virtual image to a real image located at the plane of the wafer.
- Group Gl is constructed of 3 mirrors in combination with at least two lens elements whose primary function is to provide telecentricity at the mask and enable correction of axial chromatic aberration
- an image of the aperture stop is located in close proximity to mirror Ml.
- Group G2 is preferably entirely dioptric providing most of the system and a corresponding high numerical aperture (up to or in excess of 0.75) at the wafer. This group G2 also makes the final image telecentric in wafer space. Group Gl aids correction of high-order field aberrations and the Petzval sum, allowing a substantial relaxation of the lens elements found in group G2. Both groups Gl and G2 make use of at least 8 aspheric surfaces as listed in Tables 3, 7 and 9. The present system utilizes a reflective field group in a folded off- axis field geometry.
- the present system is free from the complications associated with the use of a beam splitter cube (most notably, the manufacture of the beam splitter cube itself and the design of an illumination system that delivers polarized light to the beam splitting cube). As a result, the present system does not require the polarization at the reticle to be polarized.
- the disclosed embodiments make use of a coma at the intermediate image to ensure proper ray clearance in the M2/M3 mirror region of the design. This coma is added to the design to help minimize the obliquity of the off-axis field.
- the optical system achieves mask and wafer planes that are parallel to each other and perpendicular to the optical axis, enabling unlimited scanning in step/scan lithographic configuration.
- Correction of chromatic aberration is achieved using a single optical material in this catadioptric configuration.
- the lateral chromatic aberration is substantially balanced between group Gl and G2 using a favorable balance of power near the conjugate stop location in close proximity to mirror Ml .
- Correction of axial chromatic aberration is enabled using a negative lens group located at mirror Ml in group Gl, providing an axial chromatic aberration contribution that is nearly equal in magnitude and opposite in sign to the chromatic aberration generated by group G2.
- This high level of axial chromatic aberration correction eliminates the need for a high spectral purity laser and therefore, enables a spectral bandwidth in excess of 1 pm.
- the exemplary embodiments disclosed herein include the first embodiment which has a 26 mm x 6 mm field operating at a numerical aperture of 0.80; a second embodiment, is disclosed having a numerical aperture of 0.85.
- the design of the second embodiment illustrates that by making several modifications the numerical aperture can be expanded to 0.85 using the same off-axis (ring) field geometry with essentially the same blank mass as in the first embodiment.
- the third embodiment discloses an optical system that is also operated at a numerical aperture of 0.85 but has been redesigned in such a way as to use only Vz of the lens material as either the first and second embodiments.
- an objective in another aspect of the present optical systems, as shown in Fig. 4, includes a first partial objective with a concave mirror (Ml) and at least one negative lens (NL) that is double passed by light traveling to and from the concave mirror (Ml); an intermediate image (Imi); and a second partial objective with two curved mirrors (M2, M3) and a plurality of lenses (G2).
- the intermediate image (Imi) is thus located between the first and second partial objectives.
- the second partial objective has two curved mirrors (M2, M3) that are configured and arranged to form a virtual image.
- the lens group (G2) is provided imageward of the two curved mirrors (M2, M3) and is configured so that it provides reduction magnification.
- the optical system includes a system aperture (AP) that is located within the second partial objective and only a purely refractive lens group is arranged between the system aperture (AP) and an image plane (IMG).
- the system aperture (AP) is located between lens (E9) and lens (E10).
- the refractive lens group that is arranged between the system aperture (AP) and the image plane (IMG) contains one negative lens (E10) and six positive lenses (Ell- E16).
- the first partial objective is a catadioptric group providing the intermediate image (Imi) and the second partial objective is an optical group selected from the group of optical groups consisting of a catoptric group and a catadioptric group, for providing the virtual image.
- the plurality of lenses (G2) is a dioptric group providing the real image.
- the plurality of lenses (G2) includes a positive lens group of more than 5 lenses (El 1 -El 6) and a least image forward lens of the purely refractive group comprises a negative lens (E10).
- an objective can be constructed having any number of combinations of any of the aforementioned features.
- an objective can be constructed having any number of combinations of claimed features.
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Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2002316719A AU2002316719A1 (en) | 2002-07-17 | 2002-07-17 | Catadioptric multi-mirror systems for protection lithography |
PCT/US2002/022766 WO2004010200A1 (en) | 2002-07-17 | 2002-07-17 | Catadioptric multi-mirror systems for protection lithography |
JP2004522907A JP2005533288A (en) | 2002-07-17 | 2002-07-17 | Catadioptric multiple mirror system for projection lithography |
US10/521,504 US20060109559A1 (en) | 2002-07-17 | 2002-07-17 | Catadioptric multi-mirror systems for projection lithography |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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PCT/US2002/022766 WO2004010200A1 (en) | 2002-07-17 | 2002-07-17 | Catadioptric multi-mirror systems for protection lithography |
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WO2004010200A1 true WO2004010200A1 (en) | 2004-01-29 |
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PCT/US2002/022766 WO2004010200A1 (en) | 2002-07-17 | 2002-07-17 | Catadioptric multi-mirror systems for protection lithography |
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JP (1) | JP2005533288A (en) |
AU (1) | AU2002316719A1 (en) |
WO (1) | WO2004010200A1 (en) |
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US7301694B2 (en) * | 2005-06-18 | 2007-11-27 | Samsung Electronics Co., Ltd. | Off-axis projection optical system and extreme ultraviolet lithography apparatus using the same |
US7755839B2 (en) | 2003-12-19 | 2010-07-13 | Carl Zeiss Smt Ag | Microlithography projection objective with crystal lens |
DE102009011328A1 (en) * | 2009-03-05 | 2010-08-19 | Carl Zeiss Smt Ag | Projection optics for use in projection exposure apparatus utilized for producing e.g. microchip, has beam path formed between object field and mirror and another beam path formed after another mirror, where paths intersect each other |
US7782538B2 (en) | 2003-12-15 | 2010-08-24 | Carl Zeiss Smt Ag | Projection objective having a high aperture and a planar end surface |
US8908269B2 (en) | 2004-01-14 | 2014-12-09 | Carl Zeiss Smt Gmbh | Immersion catadioptric projection objective having two intermediate images |
US8913316B2 (en) | 2004-05-17 | 2014-12-16 | Carl Zeiss Smt Gmbh | Catadioptric projection objective with intermediate images |
US9091843B1 (en) | 2014-03-16 | 2015-07-28 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with low track length to focal length ratio |
US9316808B1 (en) | 2014-03-16 | 2016-04-19 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with a low sag aspheric lens element |
US9316820B1 (en) | 2014-03-16 | 2016-04-19 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with low astigmatism |
US9494772B1 (en) | 2014-03-16 | 2016-11-15 | Hyperion Development, LLC | Optical assembly for a wide field of view point action camera with low field curvature |
US9726859B1 (en) | 2014-03-16 | 2017-08-08 | Navitar Industries, Llc | Optical assembly for a wide field of view camera with low TV distortion |
US9772478B2 (en) | 2004-01-14 | 2017-09-26 | Carl Zeiss Smt Gmbh | Catadioptric projection objective with parallel, offset optical axes |
US9995910B1 (en) | 2014-03-16 | 2018-06-12 | Navitar Industries, Llc | Optical assembly for a compact wide field of view digital camera with high MTF |
US10139595B1 (en) | 2014-03-16 | 2018-11-27 | Navitar Industries, Llc | Optical assembly for a compact wide field of view digital camera with low first lens diameter to image diagonal ratio |
US10386604B1 (en) | 2014-03-16 | 2019-08-20 | Navitar Industries, Llc | Compact wide field of view digital camera with stray light impact suppression |
US10545314B1 (en) | 2014-03-16 | 2020-01-28 | Navitar Industries, Llc | Optical assembly for a compact wide field of view digital camera with low lateral chromatic aberration |
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WO2002044786A2 (en) * | 2000-11-28 | 2002-06-06 | Carl Zeiss Smt Ag | Catadioptric projection system for 157 nm lithography |
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- 2002-07-17 WO PCT/US2002/022766 patent/WO2004010200A1/en active Application Filing
- 2002-07-17 AU AU2002316719A patent/AU2002316719A1/en not_active Abandoned
- 2002-07-17 JP JP2004522907A patent/JP2005533288A/en active Pending
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US6362926B1 (en) * | 1998-06-08 | 2002-03-26 | Nikon Corporation | Projection exposure apparatus and method |
WO2001051979A2 (en) * | 2000-01-14 | 2001-07-19 | Carl Zeiss | Microlithographic reduction projection catadioptric objective |
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AU2002316719A1 (en) | 2004-02-09 |
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