WO2003088314A2 - Remote monitoring system for chemical liquid delivery - Google Patents

Remote monitoring system for chemical liquid delivery Download PDF

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Publication number
WO2003088314A2
WO2003088314A2 PCT/US2003/010874 US0310874W WO03088314A2 WO 2003088314 A2 WO2003088314 A2 WO 2003088314A2 US 0310874 W US0310874 W US 0310874W WO 03088314 A2 WO03088314 A2 WO 03088314A2
Authority
WO
WIPO (PCT)
Prior art keywords
tool
chemical delivery
status
computer
interface
Prior art date
Application number
PCT/US2003/010874
Other languages
French (fr)
Other versions
WO2003088314A3 (en
Inventor
Christopher Blatt
Mustafa Nayfah
Dan Wolfe
Marc Van Cleemput
Daniel Joseph Teff
Original Assignee
Arch Specialty Chemicals, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arch Specialty Chemicals, Inc. filed Critical Arch Specialty Chemicals, Inc.
Priority to JP2003585149A priority Critical patent/JP2005523577A/en
Priority to EP03719656A priority patent/EP1495485A4/en
Priority to KR10-2004-7016308A priority patent/KR20040101457A/en
Publication of WO2003088314A2 publication Critical patent/WO2003088314A2/en
Publication of WO2003088314A3 publication Critical patent/WO2003088314A3/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52Controlling or regulating the coating process
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring

Definitions

  • the present invention relates to a system and method for remote monitoring
  • liquid chemical delivery systems The system allows an operator to control
  • the system and method may be utilized for monitoring and controlling
  • the chemicals supplied to the tools range from low k dielectrics to barrier
  • the fab with the highest tool utilization will typically be the more cost efficient facility, as the return on investment for their assets will
  • the tool must be supplied constantly with the necessary liquid chemicals and facility services.
  • the present invention provides a system and method that addresses the problem of properly supplying tools used during the fabrication and/or
  • the present invention provides the operator of liquid chemical vapor
  • CVD chemical vapor deposition
  • the operator may therefore monitor the tools without leaving the clean room environment and can quickly determine the status of each critical chemical and delivery system.
  • a computerized system may constantly monitor all the critical liquids being
  • the operator may focus on core process
  • sensors may also be installed in each tool that constantly monitor tool parameters (e.g., loss of air, loss of nitrogen, loss of exhaust, unauthorized entry, or a liquid
  • the clean room is where the operators of the tool
  • the present invention provides a system and method for monitoring support and chemical delivery systems associated with tools used in the fabrication and/or manufacture of electronic/semiconductor components. This system and method are capable of monitoring parameters associated with tools used in the fabrication
  • a system for monitoring chemical delivery to at least one tool according to
  • an embodiment of the present invention includes an interface; at least one
  • a method for monitoring the chemical delivery to a tool includes the steps of sensing the status of at
  • the tool communicating the status to a computer; and analyzing the status to
  • the present invention also provides a system and method, which is capable
  • Figure 1 is a perspective view of a system in accordance with a preferred
  • Figure 2 shows an example of a computer screen display identifying the
  • Figure 3 shows another example of a computer screen display identifying
  • Figure 4 shows another example of a computer screen display identifying four chemical delivery systems of the present invention
  • Figure 5 shows a pictorial overview of the another embodiment of the present invention
  • Figure 6 is a block diagram showing a method for remote monitoring of a process according to the present invention.
  • one embodiment of the remote monitoring system 10 of the present invention may include a computer interface 12 connected to a
  • the computer interface 12 may be routed via cable 34 or wireless technology (not shown) back to a central processing
  • the central processing station 18 may include a computer 20.
  • the system 10 may include delivery sensors 22 that monitor parameters
  • Signals from the delivery sensors 22 may be sent via the cables 34 and computer interface 12 to the computer 20 for
  • the delivery sensors 22 may monitor any combination of the following parameters:
  • the chemical delivery systems 14 may include a number of liquid
  • the system 10 may also include tool sensors 24 that monitor any suitable
  • parameters associated with the tool 12 including air pressure, nitrogen pressure,
  • the tools sensors 24 may be connected to the central processing station 18 via the computer interface 12 and routed via cable 34
  • tool sensors 24 allow for the tool to be constantly monitored and may help ensure a
  • the signals from both sensors 22, 24 may be displayed on a computer
  • the screen 26 may display the parameters of the computer 20.
  • the central processing station 18 may be located in a clean room 28 whereas the tool
  • cabinets 30 associated with the delivery systems 14 may be located in an area away
  • the remote monitoring system 10 may be configured to
  • the monitored parameters may be displayed on a single computer display
  • the remote monitoring system 10 therefore extracts system parameters from one screen 26.
  • the remote monitoring system 10 therefore
  • the computer system 20 will quickly detect the problem and alert the operator by displaying a visual indication on the screen 26 or the system may include an alarm 32 for signaling an audio alarm. The operator may then identify the indicated parameter for the specific tool or delivery system to a support person in order for the support person to diagnose the problem.
  • any one of the following occurrences could precipitate a
  • visual indication or alarm signal including low liquid level, low exhaust level, loss
  • the signal may then be quickly identified by the operator on
  • the situation may then be solved immediately ensuring and protecting the chemical supply to the tool, thus, maximizing the tool utilization and creating a
  • indication is caused by a signal sent from a tool sensor 24.
  • the display identifies the chemical delivery system and also the status display indicators for the chemical delivery system.
  • status indicators for the chemical delivery systems may include indications for Left
  • FIG. 1 shows another example 50 of a computer
  • the four tool cabinet symbols may be used to calculate the number of the present invention.
  • the four tool cabinet symbols may be used to calculate the number of the present invention.
  • Figure 4 shows another example 60 of a computer screen display identifying four chemical delivery systems of the
  • the displays may be configured by the operator to maximize
  • GeMSTM System 70 may include, but is not limited to, the following
  • Computer system 72 with user interface for input and visual and audio
  • the communication connections may be either wired or wireless. Associated
  • the monitoring system of the present invention may include a computer that monitors the status of
  • the program includes the following steps,
  • TS tool system
  • CDS chemical delivery system
  • Logic block 100 checks the TS status. If the TS is not working, then block 102 generates an error signal to the computer. If the TS is working, then block 104 checks the CDS status. If the CDS is not working, then block 106 generates an
  • Block 110 shows the start of the TS monitoring. If the TS monitoring
  • block 1 14 shows
  • the tool sensors including for example, air
  • readings are sent to the computer as seen in block 116.
  • the computer monitors the
  • Block 120 shows that the readings are then analyzed.
  • All of the TS parameters may be analyzed in order to determine whether the parameters are within an acceptable range or status. For example, blocks 122
  • Block 122 shows the air
  • Block 124 shows that if the TS air pressure is too high or too low a signal is sent to send an alarm to flash an alarm on the computer screen.
  • Block 126 shows that if the reading is within an acceptable range, the next reading is analyzed by returning to block 118. These same types of analysis steps may be repeated for any other TS parameters (e.g., nitrogen pressure, exhaust pressure, etc.). In some instances an alarm signal and a
  • shut down signal will be sent to the TS and the CDS if a parameter is out of a particular range, as shown in block 128.
  • Block 130 shows the start of the CDS monitoring. If the CDS monitoring
  • block 134 shows the monitoring of the CDS parameters by the delivery sensors including, for
  • Block 138 monitors the signals as shown in block 138 and then analyzes each signal.
  • All of the CDS parameters may be analyzed to determine whether the
  • Block 142 shows the liquid level compared to the normal CDS liquid level
  • Block 144 shows that if the CDS liquid level is too low, then an alarm signal is sent to the computer screen.
  • Block 146 shows that if the liquid level is critically low, then a different alarm signal is sent to the screen and a shut down
  • Block 148 shows that if the reading shows that the liquid level is above normal, then the next reading is analyzed by repeating block 138 for new readings. Similar analysis steps may be repeated for the other CDS parameters (e.g., left cabinet status, left door entry status, spill status, etc.). In some instances,
  • Figure 6 is one example of a block and logic diagram for the present
  • the parameters are continuously read by the TS and CDS sensors and

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)

Abstract

A system and method for remote monitoring one or more liquid chemical delivery systems and tools associated with semiconductor fabrication includes a computer interface (12) linkiong a delivery system (14) and tool (16) to a computer (20). Sensors (22, 24) provide information such as temperature, pressure, liquid level, leakage and the presence of spills.

Description

REMOTE MONITORING SYSTEM FOR CHEMICAL LIQUID
DELIVERY
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a system and method for remote monitoring
one or more liquid chemical delivery systems. The system allows an operator to
quickly and accurately verify the status of each system with respect to liquid
condition, alarms, problem situations, and other indications from one convenient
location. The system and method may be utilized for monitoring and controlling
high purity liquid delivery systems in the electronics/semiconductor industry from remote locations.
2. Description of the Prior Art
During the fabrication of components for the electronic and semiconductor industry there are normally multiple delivery systems containing and dispensing a
variety of chemicals to tools used in the fabrication and/or manufacturing process.
The chemicals supplied to the tools range from low k dielectrics to barrier
materials, all designed to serve and address the low k/copper process generation
during manufacturing of the components. As consumers continuously strive for
lower priced electronics, the component manufacturing fabs or laboratories are
driven to higher and higher levels of efficiency to successfully compete in today's market place. The most obvious sign of increasing efficiency is the shift to 300mm
wafer technology, which allows the fabs to produce more chips per unit time, thus increasing efficiency. Another aspect of the increased efficiency is maximization
of tool utilization in a fab. The fab with the highest tool utilization will typically be the more cost efficient facility, as the return on investment for their assets will
be maximized. Therefore, in order to keep a tool functioning at maximum
efficiency, the tool must be supplied constantly with the necessary liquid chemicals and facility services.
Although there has been much activity in ensuring that the facility services
such as air, exhaust, nitrogen, etc., are well supplied and monitored at all times,
there has been little to no effort spent on ensuring that the liquid chemistry is
constantly being supplied to the fabrication and manufacturing tools. Failure to
supply the proper liquid chemistry to the tools results in the stopping of the
fabrication and/or manufacturing process, therein decreasing efficiency. Therefore,
the assurance that the supply of these chemistries to the tools are constant is critical
for any fab to achieve the efficiency demanded in today's market.
The present invention provides a system and method that addresses the problem of properly supplying tools used during the fabrication and/or
manufacturing of components for the semiconductor/electronics industry. For
example, the present invention provides the operator of liquid chemical vapor
deposition (CVD) tools a system and method by which they can quickly and
efficiently monitor the tool status, including the tool-critical low k, high k, barrier,
and other copper chemistries from one easily accessible location. The operator may therefore monitor the tools without leaving the clean room environment and can quickly determine the status of each critical chemical and delivery system.
Utilization of the system and/or method of the present invention will allow
for the increased efficiency of the entire fab in a variety of ways. For example, first, a computerized system may constantly monitor all the critical liquids being
delivered to the tool and alert the operators or support personnel that attention should be given to any particular system that may adversely affect the efficiency or
utilization of the tool set. Second, the operator may focus on core process
technology and more rapidly develop new processes for the fab without being
distracted by inspecting the various systems in multiple locations. Third,
additional facility staff required to monitor all the delivery system locations may be
reduced as the operator can call down to a staff member and direct them quickly
and efficiently to the source of the tool problem.
In addition to being able to quickly determine the level of chemistry
available to the tool, the operator will be able to monitor the entire status of each
system ranging from, but not limited to loss of air, loss of nitrogen, loss of exhaust,
unauthorized entry, a liquid spill or leak, or temperature. A variety of independent
sensors may also be installed in each tool that constantly monitor tool parameters (e.g., loss of air, loss of nitrogen, loss of exhaust, unauthorized entry, or a liquid
spill or leak, temperature, etc.) and other parameters to ensure a constant and steady supply of chemistry to the tools allowing the tools to achieve its maximum
efficiency.
Without the level of diagnosis provided by the present invention an operator must troubleshoot the chemical delivery system and tool by physically
moving to the delivery system and the tool. Since the delivery system and tool are normally in different locations, a large time commitment is required. The
troubleshooting duration is lengthened because chemical delivery systems are
normally located in the sub-fab area where the price per square foot is much lower
than that in the clean room. The clean room is where the operators of the tool
systems typically reside and work. In order for an operator to inspect the delivery system, the operator may normally travel not only a long distance, but through
several floors and through several clean room boundaries. Entry and exit from a
clean room requires the operator to remove their clean room suit. The operator
must then investigate the delivery systems in the sub-fab, and then upon returning
to the clean room, re-apply their clean room suit. Clearly, this costs valuable time
and money, not only in moving between areas, but in clothes and garments that
need to be re-issued. Again, the system of the present invention allows rapid and
accurate diagnosis of the situation, which will allow the situation to be fixed
quickly. Historically, without this level of diagnosis, the operator may spend
countless hours investigating all other areas and eliminating them one by one until
the operator discovers the problem. SUMMARY OF THE INVENTION
The present invention provides a system and method for monitoring support and chemical delivery systems associated with tools used in the fabrication and/or manufacture of electronic/semiconductor components. This system and method are capable of monitoring parameters associated with tools used in the fabrication
and/or manufacturing of components in the electronics/semiconductor industry.
A system for monitoring chemical delivery to at least one tool, according to
an embodiment of the present invention, includes an interface; at least one
chemical delivery system in communication with the interface; and at least one tool
connected to the chemical delivery system.
A method for monitoring the chemical delivery to a tool, according to an embodiment of the present invention includes the steps of sensing the status of at
least one parameter of a chemical delivery system and/or at least one parameter of
the tool; communicating the status to a computer; and analyzing the status to
determine whether the parameters of the chemical delivery system and or the tool
are within a predetermined range.
The present invention also provides a system and method, which is capable
of utilizing a monitoring system that enables an operator to monitor tool
parameters and troubleshoot error conditions from a remote location. This can be accomplished via a screen that will allow an operator to monitor the parameters of
a number of fabrication tools from a single location.
BRIEF DESCRIPTION OF THE DRAWINGS
Figure 1 is a perspective view of a system in accordance with a preferred
embodiment of the present invention;
Figure 2 shows an example of a computer screen display identifying the
tool parameters and chemical delivery system parameters for a tool of the present
invention;
Figure 3 shows another example of a computer screen display identifying
the status of chemical delivery system parameters for four tools of the present invention;
Figure 4 shows another example of a computer screen display identifying four chemical delivery systems of the present invention;
Figure 5 shows a pictorial overview of the another embodiment of the present invention; and Figure 6 is a block diagram showing a method for remote monitoring of a process according to the present invention.
DETAILED DESCRIPTION OF THE INVENTION
Referring to Figure 1 , one embodiment of the remote monitoring system 10 of the present invention may include a computer interface 12 connected to a
chemical delivery system 14 for a tool 16. The computer interface 12 may be routed via cable 34 or wireless technology (not shown) back to a central processing
station 18. The central processing station 18 may include a computer 20.
The system 10 may include delivery sensors 22 that monitor parameters
associated with the chemical delivery system 14. Signals from the delivery sensors 22 may be sent via the cables 34 and computer interface 12 to the computer 20 for
display on a computer screen 26. The delivery sensors 22 may monitor any
suitable parameters associated with the chemical delivery system 14 including
liquid container volume, container pressure status, exhaust status, door status, spill,
leak, etc. The chemical delivery systems 14 may include a number of liquid
containers depending on the tool 12 serviced by the delivery system 14.
The system 10 may also include tool sensors 24 that monitor any suitable
parameters associated with the tool 12 including air pressure, nitrogen pressure,
temperature, liquid spill, or leak, etc. The tools sensors 24 may be connected to the central processing station 18 via the computer interface 12 and routed via cable 34
or wireless technology (not shown) back to the central processing station 18. The
tool sensors 24 allow for the tool to be constantly monitored and may help ensure a
steady supply of chemistry to the tool, therein allowing the tool to achieve
maximum efficiency.
The signals from both sensors 22, 24 may be displayed on a computer
screen 26 of the computer 20. The screen 26 may display the parameters of the
tool 16 and delivery system 14 monitored by the monitoring system 10. The central processing station 18 may be located in a clean room 28 whereas the tool
cabinets 30 associated with the delivery systems 14 may be located in an area away
from the clean room 28. The remote monitoring system 10 may be configured to
monitor any number of tools 16 and delivery systems 14 by configuration of any
necessary interfaces 12 or cables 34 to the monitoring system 10.
The monitored parameters may be displayed on a single computer display
screen 26 to therein allow the operator to monitor all tool parameters and delivery
system parameters from one screen 26. The remote monitoring system 10 therefore
allows the operator to quickly scan each tool 16 and the parameters of delivery
systems 14 by looking at the screen 26 and to detect any problems associated
therewith since the central processing station 18 constantly monitors the delivery
systems 14. Should a condition occur in any one of the tools 16 or delivery systems 14,
the computer system 20 will quickly detect the problem and alert the operator by displaying a visual indication on the screen 26 or the system may include an alarm 32 for signaling an audio alarm. The operator may then identify the indicated parameter for the specific tool or delivery system to a support person in order for the support person to diagnose the problem.
For example, any one of the following occurrences could precipitate a
visual indication or alarm signal including low liquid level, low exhaust level, loss
of air, loss of nitrogen, high temperature, liquid spill, or leak. When the indication
or alarm is triggered, the signal may then be quickly identified by the operator on
the screen 26. The operator may then select the delivery systems 14 showing the
problem from the computer 20 and review all the parameters of delivery systems
14 pertaining to those delivery systems 14 which caused the signal such as liquid
level, exhaust level, temperature, entry status, etc. A support person may then be
contacted by the operator and notified of delivery systems 14 experiencing the
problem. The situation may then be solved immediately ensuring and protecting the chemical supply to the tool, thus, maximizing the tool utilization and creating a
more efficient fab. The same troubleshooting procedures may be followed if the
indication is caused by a signal sent from a tool sensor 24.
With reference to Figure 2, an example 40 of a computer screen display
identifying the tool parameters and chemical delivery system parameters for a tool of the present invention is shown. The display identifies the chemical delivery system and also the status display indicators for the chemical delivery system. The
status indicators for the chemical delivery systems may include indications for Left
Cabinet Empty (L.C. empty), Left Door (L. Door), Left Spill (L. Spill), etc. The
display may be configured based on the type of tool and the type of chemical delivery system being utilized. Figure 3 shows another example 50 of a computer
screen display identifying the status of chemical delivery system parameters for
four tools of the present invention. The four tool cabinet symbols may be used to
identify the chemical delivery system of the tool. Figure 4 shows another example 60 of a computer screen display identifying four chemical delivery systems of the
present invention. The displays may be configured by the operator to maximize
efficiency.
Referring to Figure 5, another embodiment of the remote monitoring
system 70, or GeMS™ System, may include, but is not limited to, the following
equipment. Computer system 72, with user interface for input and visual and audio
outputs, has communication connections 74 to the various GenStream™ systems
76. The communication connections may be either wired or wireless. Associated
hardware is installed in the GenStream™ systems to allow for communication back
to the GeMS™ system 76.
Referring to Figure 6, a logic and block diagram shows another
embodiment of the system and method of the present invention. The monitoring system of the present invention may include a computer that monitors the status of
the tool and chemical delivery system. The program includes the following steps,
which will monitor the tool system (TS) and chemical delivery system (CDS).
Logic block 100 checks the TS status. If the TS is not working, then block 102 generates an error signal to the computer. If the TS is working, then block 104 checks the CDS status. If the CDS is not working, then block 106 generates an
error signal to the computer and generates a signal to turn off the TS.
The next step is to begin the monitoring of the TS and CDS as shown in block 108. Block 110 shows the start of the TS monitoring. If the TS monitoring
does not function, then an error signal identifying the problem is sent to the
computer as shown in block 112. If the TS monitoring begins, then the next step is
to check the parameters to be monitored on the TS. For example, block 1 14 shows
the monitoring of the TS parameters by the tool sensors including for example, air
pressure, nitrogen pressure, exhaust status, temperature, etc. The parameter
readings are sent to the computer as seen in block 116. The computer monitors the
signals as shown in block 118 and then analyzes each signal. Block 120 shows that the readings are then analyzed.
All of the TS parameters may be analyzed in order to determine whether the parameters are within an acceptable range or status. For example, blocks 122
through 126 show the analyzing of the air pressure. Block 122 shows the air
pressure compared to the normal TS air pressure range. Block 124 shows that if the TS air pressure is too high or too low a signal is sent to send an alarm to flash an alarm on the computer screen. Block 126 shows that if the reading is within an acceptable range, the next reading is analyzed by returning to block 118. These same types of analysis steps may be repeated for any other TS parameters (e.g., nitrogen pressure, exhaust pressure, etc.). In some instances an alarm signal and a
shut down signal will be sent to the TS and the CDS if a parameter is out of a particular range, as shown in block 128.
Block 130 shows the start of the CDS monitoring. If the CDS monitoring
does not function, then an error signal identifying the problem is sent to the
computer, as shown in block 132. If the CDS monitoring begins, then the next step
is to check the parameters to be monitored on the CDS. For example, block 134 shows the monitoring of the CDS parameters by the delivery sensors including, for
example, Left Cabinet Empty, Left Door status, Left Can status, etc. The
parameter readings are sent to the computer as seen in block 136. The computer
monitors the signals as shown in block 138 and then analyzes each signal. Block
140 shows that the readings are then analyzed.
All of the CDS parameters may be analyzed to determine whether the
parameters are within an acceptable range or status. For example, blocks 142
through 148 show the analyzing of the liquid level of a chemical that is sent to the
tool. Block 142 shows the liquid level compared to the normal CDS liquid level
range. Block 144 shows that if the CDS liquid level is too low, then an alarm signal is sent to the computer screen. Block 146 shows that if the liquid level is critically low, then a different alarm signal is sent to the screen and a shut down
signal is sent to the tool. Block 148 shows that if the reading shows that the liquid level is above normal, then the next reading is analyzed by repeating block 138 for new readings. Similar analysis steps may be repeated for the other CDS parameters (e.g., left cabinet status, left door entry status, spill status, etc.). In some instances,
an alarm signal and a shut down signal will be sent to the TS and the CDS if a
specific parameter is out of a normal range and a critical failure could occur with
the TS and or the CDS.
Figure 6 is one example of a block and logic diagram for the present
invention. The parameters are continuously read by the TS and CDS sensors and
analyzed by the computer during the system operation.
The present invention having been thus described with particular reference to the preferred forms thereof, it will be obvious that various changes and
modifications may be made therein without departing from the spirit of the present invention.

Claims

WE CLAIM:
1. A system for monitoring chemical delivery to at least one processing tool,
the system comprising:
an interface;
at least one chemical delivery system in communication with said interface;
and
at least one tool connected to said chemical delivery system.
2. The system of claim 1, wherein said system is a remote monitoring system.
3. The system of claim 1, wherein said at least one processing tool is at least
one semiconductor processing tool.
4. The system of claim 1 , further comprising a central processing unit
connected to said interface.
5. The system of claim 4, wherein said central processing unit communicates
with said interface by at least one cable.
6. The system of claim 4, wherein said central processing unit communicates
with said interface via wireless communications.
7. The system of claim 1, further comprising at least one sensor for monitoring at least one parameter of said at least one chemical delivery system.
8. The system of claim 7, wherein said parameter is at least one selected from
the group consisting of: volume, pressure, exhaust, door status, spill,
leakage, and temperature.
9. The system of claim 7, wherein said at least one sensor communicates a
signal to said interface.
10. The system of claim 1 , wherein said chemical delivery system comprises at
least one container, which is capable of storing chemical.
1 1. The system of claim 1, further comprising at least one tool sensor in
communication with said interface.
12. The system of claim 11, wherein said at least one tool sensor is capable of
monitoring at least one tool parameter.
13. The system of claim 12, wherein said tool parameter is at least one selected from the group consisting of: pressure, temperature, spills, leaks, volume, and flow rate.
14. The system of claim 4, wherein said central processing unit is located in a
clean room.
15. A method for monitoring the chemical delivery to a tool, the method
comprising the steps of:
sensing the status of at least one parameter of a chemical delivery system and/or at least one parameter of said tool;
communicating said status to a computer; and
analyzing said status to determine whether the parameters of said chemical
delivery system and/or said tool are within a predetermined range.
16. The method of claim 15, wherein said status of said chemical delivery
system and/or said tool is monitored with at least one sensor in communication with said computer.
17. The method of claim 15, wherein said computer is located remote to said
tool.
18. The method of claim 15, wherein said tool is at least one semiconductor
processing tool.
19. The method of claim 15, wherein said computer is located in a clean room.
20. The method of claim 15, wherein said parameter of said chemical delivery system is at least one selected from the group consisting of: volume,
pressure, exhaust, door status, spill, leakage, and temperature.
21. The method of claim 15, wherein said parameter of said tool is at least one
selected from the group consisting of: pressure, temperature, spills, leaks,
volume, and flow rate.
22. The method of claim 15, wherein said status is communicated to said
computer through an interface.
3. The method of claim 22, wherein said interface is in communication with at least one sensor on said chemical delivery system and/or said tool by a
connecting means selected from the group consisting of: cables, wireless
means, and a combination thereof.
PCT/US2003/010874 2002-04-12 2003-04-09 Remote monitoring system for chemical liquid delivery WO2003088314A2 (en)

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KR10-2004-7016308A KR20040101457A (en) 2002-04-12 2003-04-09 Remote monitoring system for chemical liquid delivery

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9031683B2 (en) 2006-07-10 2015-05-12 Entegris, Inc. Systems and methods for managing material storage vessels having information storage elements
US9618942B2 (en) 2001-06-13 2017-04-11 Entegris, Inc. Liquid handling system with electronic information storage
CN109383359A (en) * 2017-08-09 2019-02-26 中国石油化工股份有限公司 Real-time Transportation of Dangerous Chemicals natural hazard risk monitoring device and method

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016142002A1 (en) * 2015-03-09 2016-09-15 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Audio encoder, audio decoder, method for encoding an audio signal and method for decoding an encoded audio signal
CN106406199B (en) * 2016-08-31 2019-04-09 聚光科技(杭州)股份有限公司 Harmful influence monitoring device and method
US11438364B2 (en) 2020-04-30 2022-09-06 Bank Of America Corporation Threat analysis for information security
US11308231B2 (en) 2020-04-30 2022-04-19 Bank Of America Corporation Security control management for information security

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5878793A (en) * 1993-04-28 1999-03-09 Siegele; Stephen H. Refillable ampule and method re same
US6148846A (en) * 1996-12-20 2000-11-21 Chemand Corporation Waste liquid collection system

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3235474A (en) * 1961-10-02 1966-02-15 Air Prod & Chem Electrolytic method of producing nitrogen trifluoride
US4091081A (en) * 1977-04-19 1978-05-23 Air Products And Chemicals, Inc. Preparation of nitrogen trifluoride
US4830757A (en) * 1985-08-06 1989-05-16 The Mogul Corporation Telemetry system for water and energy monitoring
US5475618A (en) * 1993-01-28 1995-12-12 Advanced Micro Devices Apparatus and method for monitoring and controlling an ion implant device
US5607002A (en) * 1993-04-28 1997-03-04 Advanced Delivery & Chemical Systems, Inc. Chemical refill system for high purity chemicals
US6137473A (en) * 1994-09-02 2000-10-24 Nec Corporation System and method for switching control between a host computer and a remote interface device
US5858065A (en) * 1995-07-17 1999-01-12 American Air Liquide Process and system for separation and recovery of perfluorocompound gases
US6010605A (en) * 1995-10-17 2000-01-04 Florida Scientific Laboratories Inc. Nitrogen trifluoride production apparatus
US5628894A (en) * 1995-10-17 1997-05-13 Florida Scientific Laboratories, Inc. Nitrogen trifluoride process
US5637285A (en) * 1996-01-30 1997-06-10 Air Products And Chemicals, Inc. Process for nitrogen trifluoride synthesis
US5794645A (en) * 1996-07-15 1998-08-18 Creative Pathways, Inc. Method for supplying industrial gases using integrated bottle controllers
US6251801B1 (en) * 1998-10-07 2001-06-26 Kabushiki Kaisha Toshiba Method and apparatus for manufacturing semiconductor device
US6427096B1 (en) * 1999-02-12 2002-07-30 Honeywell International Inc. Processing tool interface apparatus for use in manufacturing environment
US6290576B1 (en) * 1999-06-03 2001-09-18 Micron Technology, Inc. Semiconductor processors, sensors, and semiconductor processing systems
WO2001001366A2 (en) * 1999-06-25 2001-01-04 Telemonitor, Inc. Smart remote monitoring system and method
US6328802B1 (en) * 1999-09-14 2001-12-11 Lsi Logic Corporation Method and apparatus for determining temperature of a semiconductor wafer during fabrication thereof
US6264064B1 (en) * 1999-10-14 2001-07-24 Air Products And Chemicals, Inc. Chemical delivery system with ultrasonic fluid sensors
ES2332869T3 (en) * 1999-11-17 2010-02-15 Boston Scientific Limited MICROFABRICATED DEVICES FOR THE DELIVERY OF MOLECULES IN CARRIER FLUIDS.
US6517634B2 (en) * 2000-02-28 2003-02-11 Applied Materials, Inc. Chemical vapor deposition chamber lid assembly
KR100875090B1 (en) * 2000-08-04 2008-12-22 아치 스페셜티 케미칼즈, 인코포레이티드 Automatic refill system for ultra high purity chemicals or contamination sensitive chemicals
US6688162B2 (en) * 2000-10-20 2004-02-10 University Of Kentucky Research Foundation Magnetoelastic sensor for characterizing properties of thin-film/coatings
JPWO2002057860A1 (en) * 2001-01-22 2004-05-27 東京エレクトロン株式会社 Device productivity improvement system and method
US6470946B2 (en) * 2001-02-06 2002-10-29 Anadigics, Inc. Wafer demount gas distribution tool
US6587754B2 (en) * 2001-03-19 2003-07-01 General Electric Company System and methods for remote management of steam generating systems
US7044911B2 (en) * 2001-06-29 2006-05-16 Philometron, Inc. Gateway platform for biological monitoring and delivery of therapeutic compounds
US6672171B2 (en) * 2001-07-16 2004-01-06 Mks Instruments, Inc. Combination differential and absolute pressure transducer for load lock control

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5878793A (en) * 1993-04-28 1999-03-09 Siegele; Stephen H. Refillable ampule and method re same
US6148846A (en) * 1996-12-20 2000-11-21 Chemand Corporation Waste liquid collection system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1495485A2 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9618942B2 (en) 2001-06-13 2017-04-11 Entegris, Inc. Liquid handling system with electronic information storage
US9031683B2 (en) 2006-07-10 2015-05-12 Entegris, Inc. Systems and methods for managing material storage vessels having information storage elements
US10127094B2 (en) 2006-07-10 2018-11-13 Entegris, Inc Systems and methods for managing material storage vessels having information storage elements
CN109383359A (en) * 2017-08-09 2019-02-26 中国石油化工股份有限公司 Real-time Transportation of Dangerous Chemicals natural hazard risk monitoring device and method

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WO2003088314A3 (en) 2004-07-22
US20040015331A1 (en) 2004-01-22
EP1495485A2 (en) 2005-01-12
TWI274825B (en) 2007-03-01
EP1495485A4 (en) 2007-10-10
TW200401868A (en) 2004-02-01
JP2005523577A (en) 2005-08-04
KR20040101457A (en) 2004-12-02

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