WO2003073379A3 - Method for evaluating the signals of an electronic image sensor and system for evaluating the position of the edge of a test piece - Google Patents

Method for evaluating the signals of an electronic image sensor and system for evaluating the position of the edge of a test piece Download PDF

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Publication number
WO2003073379A3
WO2003073379A3 PCT/DE2003/000568 DE0300568W WO03073379A3 WO 2003073379 A3 WO2003073379 A3 WO 2003073379A3 DE 0300568 W DE0300568 W DE 0300568W WO 03073379 A3 WO03073379 A3 WO 03073379A3
Authority
WO
WIPO (PCT)
Prior art keywords
evaluating
image sensor
signals
edge
test piece
Prior art date
Application number
PCT/DE2003/000568
Other languages
German (de)
French (fr)
Other versions
WO2003073379A2 (en
Inventor
Bernd Ruediger Stoeber
Original Assignee
Koenig & Bauer Ag
Bernd Ruediger Stoeber
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koenig & Bauer Ag, Bernd Ruediger Stoeber filed Critical Koenig & Bauer Ag
Priority to EP03717107A priority Critical patent/EP1488378A2/en
Priority to AU2003221587A priority patent/AU2003221587A1/en
Publication of WO2003073379A2 publication Critical patent/WO2003073379A2/en
Publication of WO2003073379A3 publication Critical patent/WO2003073379A3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Abstract

The invention relates to a system and a method for evaluating the signals of an electronic image sensor during analysis of the position of the edge of a test piece. The image sensor has a surface that is provided with a plurality of pixels, each of which has a photosensitive area such that each pixel emits an electric output signal according to the light input signal received in the respective pixel position. The intensity of said electric output signal correlates with the light input signal and is evaluated in an evaluation unit as image information.
PCT/DE2003/000568 2002-02-26 2003-02-22 Method for evaluating the signals of an electronic image sensor and system for evaluating the position of the edge of a test piece WO2003073379A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP03717107A EP1488378A2 (en) 2002-02-26 2003-02-22 Method for evaluating the signals of an electronic image sensor and system for evaluating the position of the edge of a test piece
AU2003221587A AU2003221587A1 (en) 2002-02-26 2003-02-22 Method for evaluating the signals of an electronic image sensor and system for evaluating the position of the edge of a test piece

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10208287.1 2002-02-26
DE2002108287 DE10208287A1 (en) 2002-02-26 2002-02-26 Method for signal evaluation of an electronic image sensor and an arrangement for evaluating the position of a body edge of a test specimen

Publications (2)

Publication Number Publication Date
WO2003073379A2 WO2003073379A2 (en) 2003-09-04
WO2003073379A3 true WO2003073379A3 (en) 2004-02-12

Family

ID=27762462

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2003/000568 WO2003073379A2 (en) 2002-02-26 2003-02-22 Method for evaluating the signals of an electronic image sensor and system for evaluating the position of the edge of a test piece

Country Status (4)

Country Link
EP (1) EP1488378A2 (en)
AU (1) AU2003221587A1 (en)
DE (1) DE10208287A1 (en)
WO (1) WO2003073379A2 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6023535A (en) * 1995-08-31 2000-02-08 Ricoh Company, Ltd. Methods and systems for reproducing a high resolution image from sample data
EP1001374A2 (en) * 1998-11-10 2000-05-17 Canon Kabushiki Kaisha Image processing method and apparatus
EP1014305A1 (en) * 1998-12-21 2000-06-28 Sharp Kabushiki Kaisha Resolution improvement from multiple images of a scene containing motion at fractional pixel values
US6208765B1 (en) * 1998-06-19 2001-03-27 Sarnoff Corporation Method and apparatus for improving image resolution

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2202087A1 (en) * 1971-02-26 1972-09-07 Polygraph Leipzig Photoelectric measuring device on sheet-forming and sheet-processing machines
EP0108470A1 (en) * 1982-08-13 1984-05-16 Bl Technology Limited Apparatus and method for inspecting a component
JPH0891543A (en) * 1994-09-28 1996-04-09 Omron Corp Image processing method, and device therefor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6023535A (en) * 1995-08-31 2000-02-08 Ricoh Company, Ltd. Methods and systems for reproducing a high resolution image from sample data
US6208765B1 (en) * 1998-06-19 2001-03-27 Sarnoff Corporation Method and apparatus for improving image resolution
EP1001374A2 (en) * 1998-11-10 2000-05-17 Canon Kabushiki Kaisha Image processing method and apparatus
EP1014305A1 (en) * 1998-12-21 2000-06-28 Sharp Kabushiki Kaisha Resolution improvement from multiple images of a scene containing motion at fractional pixel values

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
ABDALLAH S ET AL: "A general overview of solid state imaging sensors types", THIRD WORKSHOP ON PHOTONICS AND ITS APPLICATION AT EGYPTIAN ENGINEERING FACULTIES AND INSTITUTES (CAT. NO.02EX509), THIRD WORKSHOP ON PHOTONICS AND ITS APPLICATIONS AT EGYPTIAN ENGINEERING FACULTIES AND INSTITUTES, GIZA, EGYPT, 5 JAN. 2002, 2002, Piscataway, NJ, USA, IEEE, USA, pages 1 - 10, XP002258483, ISBN: 0-7803-7163-1 *
See also references of EP1488378A2 *
WEI H ET AL: "High-resolution image reconstruction from multiple low-resolution images", SEVENTH INTERNATIONAL CONFERENCE ON IMAGE PROCESSING AND ITS APPLICATIONS (CONF. PUBL. NO.465), PROCEEDINGS OF 7TH INTERNATIONAL CONGRESS ON IMAGE PROCESSING AND ITS APPLICATIONS, MANCHESTER, UK, 13-15 JULY 1999, 1999, London, UK, IEE, UK, pages 596 - 600 vol.2, XP002258482, ISBN: 0-85296-717-9 *

Also Published As

Publication number Publication date
EP1488378A2 (en) 2004-12-22
AU2003221587A1 (en) 2003-09-09
AU2003221587A8 (en) 2003-09-09
DE10208287A1 (en) 2003-09-18
WO2003073379A2 (en) 2003-09-04

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