WO2003056567A3 - Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture - Google Patents

Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture Download PDF

Info

Publication number
WO2003056567A3
WO2003056567A3 PCT/EP2002/014747 EP0214747W WO03056567A3 WO 2003056567 A3 WO2003056567 A3 WO 2003056567A3 EP 0214747 W EP0214747 W EP 0214747W WO 03056567 A3 WO03056567 A3 WO 03056567A3
Authority
WO
WIPO (PCT)
Prior art keywords
desired aperture
production
probe tip
optical microscopy
field optical
Prior art date
Application number
PCT/EP2002/014747
Other languages
German (de)
French (fr)
Other versions
WO2003056567A2 (en
Inventor
Khaled Karrai
Florian Bickel
Original Assignee
Univ Muenchen L Maximilians
Khaled Karrai
Florian Bickel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Muenchen L Maximilians, Khaled Karrai, Florian Bickel filed Critical Univ Muenchen L Maximilians
Priority to AU2002361214A priority Critical patent/AU2002361214A1/en
Publication of WO2003056567A2 publication Critical patent/WO2003056567A2/en
Publication of WO2003056567A3 publication Critical patent/WO2003056567A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders

Abstract

The invention relates to a method for the production of a probe tip (10) for optical examinations, particularly for near-field optical microscopy, having a desired aperture, wherein at least one optically transparent intermediate layer (14) is provided in a light conducting fiber (12) with a peripheral surface (12c) tapering towards the free end thereof between said peripheral surface (12c) and an optically non-transparent layer (18/20) that is applied on said peripheral surface (12c). The thickness of the intermediate layer is chosen depending on the desired aperture. This makes it possible to produce probe tips (10) using a simple and scalable method.
PCT/EP2002/014747 2001-12-24 2002-12-23 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture WO2003056567A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002361214A AU2002361214A1 (en) 2001-12-24 2002-12-23 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10164093.5 2001-12-24
DE10164093 2001-12-24

Publications (2)

Publication Number Publication Date
WO2003056567A2 WO2003056567A2 (en) 2003-07-10
WO2003056567A3 true WO2003056567A3 (en) 2004-03-04

Family

ID=7710952

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2002/014747 WO2003056567A2 (en) 2001-12-24 2002-12-23 Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture

Country Status (2)

Country Link
AU (1) AU2002361214A1 (en)
WO (1) WO2003056567A2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4725727A (en) * 1984-12-28 1988-02-16 International Business Machines Corporation Waveguide for an optical near-field microscope
EP0487233A2 (en) * 1990-11-19 1992-05-27 AT&T Corp. Near field scanning optical microscope and applications thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4725727A (en) * 1984-12-28 1988-02-16 International Business Machines Corporation Waveguide for an optical near-field microscope
EP0487233A2 (en) * 1990-11-19 1992-05-27 AT&T Corp. Near field scanning optical microscope and applications thereof

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
GENOLET G ET AL: "MICROMACHINED PHOTOPLASTIC PROBE FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 72, no. 10, October 2001 (2001-10-01), pages 3877 - 3879, XP001115999, ISSN: 0034-6748 *
MURANISHI M ET AL: "CONTROL OF APERTURE SIZE OF OPTICAL PROBES FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY USING FOCUSED ION BEAM TECHNOLOGY", JAPANESE JOURNAL OF APPLIED PHYSICS, PUBLICATION OFFICE JAPANESE JOURNAL OF APPLIED PHYSICS. TOKYO, JP, vol. 36, no. 7B, PART 2, 15 July 1997 (1997-07-15), pages L942 - L944, XP000742415, ISSN: 0021-4922 *
YUNG DOUG SUH ET AL: "IMPROVED PROBES FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY", ADVANCED MATERIALS, VCH VERLAGSGESELLSCHAFT, WEINHEIM, DE, vol. 12, no. 15, 2 August 2000 (2000-08-02), pages 1139 - 1142, XP000963577, ISSN: 0935-9648 *

Also Published As

Publication number Publication date
AU2002361214A1 (en) 2003-07-15
WO2003056567A2 (en) 2003-07-10
AU2002361214A8 (en) 2003-07-15

Similar Documents

Publication Publication Date Title
EP1727138A3 (en) Near-field optical head and method for manufacturing same
MY137844A (en) Lensed tip optical fiber and method of making the same
EP2309609A3 (en) An optical fibre Raman cell and corresponding method of manufacturing
BR0313533A (en) High precision otoelectronic components
AU2008233157B2 (en) Retention and rotation clamp assembly for use with an angled optical fiber cleaver
EP1557708A3 (en) Microscope with evanescent illumination
EP0831344A3 (en) Arrangement of two integrated optics lightguides on the upper surface of a substrate
ATE355540T1 (en) OPTICAL COUPLER FOR MULTIMODE PUMP
US7697807B2 (en) Multi-tipped optical component
WO2008117517A1 (en) Optical fiber for laser guide and laser guide including the same
IL145136A0 (en) Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes
EP1211539A3 (en) Optical module
WO2004044623A3 (en) Device having multiple optical fibers
JP4933181B2 (en) Optical fiber sheet with connector and manufacturing method thereof
WO2003056567A3 (en) Method for the production of a probe tip, particularly for near-field optical microscopy, having a desired aperture
EP0874216A3 (en) Optical probe, method of manufacturing an optical probe, and scanning probe microscope
ATE259074T1 (en) METHOD FOR PRODUCING A CAVITY RESONATOR IN AN OPTICAL FIBER, IN PARTICULAR FOR AN INTERFEROMETRIC SENSOR, AND CAVITY RESONATOR PRODUCED BY THIS METHOD
WO2000007051A3 (en) Bonding operation for fabricating fiber optic terminus
EP1241504A3 (en) Ferrule assembly, method of making the same, and optical module
WO2005036212A3 (en) Photodetector/optical fiber apparatus with enhanced optical coupling efficiency and method for forming the same
WO2004068193A3 (en) Lensed fiber having small form factor and method of making same
JP4944932B2 (en) Manufacturing method of thin fiberscope
WO2002073246A3 (en) System and method for macroscopic and confocal imaging of tissue
JPH10197807A (en) Multifiber tube structure and small-diameter fiber scope
EP1619531A3 (en) Optical waveguide probe and manufacturing method of the same, and scanning near-field optical microscope

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ OM PH PL PT RO RU SC SD SE SG SK SL TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LU MC NL PT SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

122 Ep: pct application non-entry in european phase
NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP