WO2003052433A3 - Circuit arrangement for measurement or detection of current - Google Patents

Circuit arrangement for measurement or detection of current Download PDF

Info

Publication number
WO2003052433A3
WO2003052433A3 PCT/EP2002/012314 EP0212314W WO03052433A3 WO 2003052433 A3 WO2003052433 A3 WO 2003052433A3 EP 0212314 W EP0212314 W EP 0212314W WO 03052433 A3 WO03052433 A3 WO 03052433A3
Authority
WO
WIPO (PCT)
Prior art keywords
current
mirror
circuit arrangement
detection
transistor
Prior art date
Application number
PCT/EP2002/012314
Other languages
German (de)
French (fr)
Other versions
WO2003052433A2 (en
Inventor
Ulrich Joos
Original Assignee
Conti Temic Microelectronic
Ulrich Joos
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Conti Temic Microelectronic, Ulrich Joos filed Critical Conti Temic Microelectronic
Publication of WO2003052433A2 publication Critical patent/WO2003052433A2/en
Publication of WO2003052433A3 publication Critical patent/WO2003052433A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only

Abstract

A circuit arrangement for current detection conventionally comprises a current mirror arrangement with two mirror transistors in the emitter circuit and a measuring resistance connected between the emitters of the mirror transistors. The current mirror arrangement converts a given reference current flowing through the first mirror transistor into a mirror current flowing through the second mirror transistor. A measuring current for detection is passed through the measuring resistance and generates a voltage drop across the same influenced by the mirror current. The current for measuring can thus be detected by determining the mirror current. A disadvantage is that the above circuit arrangement gives imprecise results. The aim of the invention is for the novel circuit arrangement to avoid the above disadvantage. Said aim is achieved whereby the novel circuit arrangement comprises an output transistor connected in series to the second mirror transistor in a cascade circuit, from which an output voltage representative of the current measurement or current detection is decoupled.
PCT/EP2002/012314 2001-12-15 2002-11-05 Circuit arrangement for measurement or detection of current WO2003052433A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2001161760 DE10161760A1 (en) 2001-12-15 2001-12-15 Circuit arrangement for current measurement or current detection
DE10161760.7 2001-12-15

Publications (2)

Publication Number Publication Date
WO2003052433A2 WO2003052433A2 (en) 2003-06-26
WO2003052433A3 true WO2003052433A3 (en) 2003-09-25

Family

ID=7709408

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2002/012314 WO2003052433A2 (en) 2001-12-15 2002-11-05 Circuit arrangement for measurement or detection of current

Country Status (2)

Country Link
DE (1) DE10161760A1 (en)
WO (1) WO2003052433A2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105137154A (en) * 2015-09-23 2015-12-09 中国人民解放军理工大学 Circuit for measuring starting voltage and discharging residual current of self-locking gas discharging pipe
CN105334409A (en) * 2015-09-23 2016-02-17 中国人民解放军理工大学 Comprehensive system suitable for characteristic detection of various anti-thunder elements

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112004002729D2 (en) 2003-12-11 2006-11-09 Conti Temic Microelectronic Method for functional testing of a lamp circuit
DE102004009006A1 (en) * 2003-12-11 2005-07-14 Conti Temic Microelectronic Gmbh Method for functional testing of a lamp circuit
DE60320815D1 (en) 2003-12-15 2008-06-19 Dialog Semiconductor Gmbh Current measuring circuit for DC-DC buck converter
US8717047B2 (en) 2008-08-19 2014-05-06 Sma Solar Technology Ag Method for measuring a current, in particular by means of a grounding apparatus
EP2157437B1 (en) 2008-08-19 2015-08-19 SMA Solar Technology AG Method for measuring a current, particularly through an earthing device
CN109491442A (en) * 2018-11-07 2019-03-19 深圳市风云实业有限公司 Voltage monitoring circuit and voltage monitoring systems

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4573019A (en) * 1983-03-16 1986-02-25 Trio Kabushiki Kaisha Current mirror circuit
US5378998A (en) * 1992-11-05 1995-01-03 Smiths Industries Public Limited Company Current measurement circuits

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4107415C2 (en) * 1991-03-08 1995-10-12 Telefunken Microelectron Circuit for monitoring consumers
US5498984A (en) * 1994-09-30 1996-03-12 Maxim Integrated Products High side, current sense amplifier using a symmetric amplifier
DE19521907C2 (en) * 1995-06-16 1997-09-25 Telefunken Microelectron Signal coupling circuit
US5627494A (en) * 1995-12-04 1997-05-06 Motorola, Inc. High side current sense amplifier
DE19844465A1 (en) * 1998-09-28 2000-04-13 Siemens Ag Current measuring circuit arrangement

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4573019A (en) * 1983-03-16 1986-02-25 Trio Kabushiki Kaisha Current mirror circuit
US5378998A (en) * 1992-11-05 1995-01-03 Smiths Industries Public Limited Company Current measurement circuits

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105137154A (en) * 2015-09-23 2015-12-09 中国人民解放军理工大学 Circuit for measuring starting voltage and discharging residual current of self-locking gas discharging pipe
CN105334409A (en) * 2015-09-23 2016-02-17 中国人民解放军理工大学 Comprehensive system suitable for characteristic detection of various anti-thunder elements

Also Published As

Publication number Publication date
DE10161760A1 (en) 2003-07-10
WO2003052433A2 (en) 2003-06-26

Similar Documents

Publication Publication Date Title
US10018658B2 (en) Class D audio amplifier and method for reading a current supplied by the amplifier
US6492845B1 (en) Low voltage current sense amplifier circuit
EP1174720A3 (en) Current sensing circuit
WO2008113239A1 (en) A current testing circuit and device
EP1970720A3 (en) Semiconductor component and method for testing the same
JP3101998B2 (en) Overcurrent detection circuit
WO2003052433A3 (en) Circuit arrangement for measurement or detection of current
WO2009000236A3 (en) High-dynamic ammeter with small time constant
US6967488B1 (en) Double-mirror short-circuit detection
DE60128560D1 (en) A PERFORMANCE DETECTOR FOR USE IN A POWER AMPLIFIER
US10914618B2 (en) Readout circuit for sensor and readout method thereof
WO2002052720A8 (en) Circuit for low noise, fully differential amplification
JP2007040771A (en) Semiconductor device for noise measurement
US20090021271A1 (en) Measuring the On-Resistance of a Transistor Load Path
DE50100529D1 (en) CIRCUIT ARRANGEMENT FOR WORKING POINT ADJUSTMENT OF A HIGH FREQUENCY TRANSISTOR AND AMPLIFIER CIRCUIT
JP6658269B2 (en) Overcurrent detection circuit
JPH02249976A (en) Output current detecting circuit for mos transistor
JP2004028607A5 (en)
JP4492003B2 (en) Current detection circuit
US7129775B2 (en) Self-mirroring current mirror
KR940018694A (en) Infinite Distance Determination Circuit of Camera
JPS61149883A (en) Range measuring instrument
TW200500611A (en) Voltage detection apparatus
ATE459862T1 (en) CIRCUIT ARRANGEMENT FOR INDUCTIVE DISTANCE MEASUREMENT
KR930003741Y1 (en) Power control circuit

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): US

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LU MC NL PT SE SK TR

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
122 Ep: pct application non-entry in european phase