WO2002095586A2 - Hierarchical built-in self-test for system-on-chip design - Google Patents
Hierarchical built-in self-test for system-on-chip design Download PDFInfo
- Publication number
- WO2002095586A2 WO2002095586A2 PCT/GB2002/002302 GB0202302W WO02095586A2 WO 2002095586 A2 WO2002095586 A2 WO 2002095586A2 GB 0202302 W GB0202302 W GB 0202302W WO 02095586 A2 WO02095586 A2 WO 02095586A2
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- WO
- WIPO (PCT)
- Prior art keywords
- bist
- test
- local
- macro
- central
- Prior art date
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/27—Built-in tests
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Drying Of Semiconductors (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002591985A JP3962337B2 (en) | 2001-05-23 | 2002-05-15 | Hierarchical built-in self-test for system-on-chip design |
AU2002304504A AU2002304504A1 (en) | 2001-05-23 | 2002-05-15 | Hierarchical built-in self-test for system-on-chip design |
DE60212962T DE60212962T2 (en) | 2001-05-23 | 2002-05-15 | HIERARCHIC INTERGRATED SELF TEST |
EP02732895A EP1389315B1 (en) | 2001-05-23 | 2002-05-15 | Hierarchical built-in self-test |
KR10-2003-7013805A KR100536984B1 (en) | 2001-05-23 | 2002-05-15 | Hierarchical built-in self-test for system-on-chip design |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/863,952 | 2001-05-23 | ||
US09/863,952 US6728916B2 (en) | 2001-05-23 | 2001-05-23 | Hierarchical built-in self-test for system-on-chip design |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2002095586A2 true WO2002095586A2 (en) | 2002-11-28 |
WO2002095586A3 WO2002095586A3 (en) | 2003-10-16 |
Family
ID=25342182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2002/002302 WO2002095586A2 (en) | 2001-05-23 | 2002-05-15 | Hierarchical built-in self-test for system-on-chip design |
Country Status (11)
Country | Link |
---|---|
US (1) | US6728916B2 (en) |
EP (1) | EP1389315B1 (en) |
JP (1) | JP3962337B2 (en) |
KR (1) | KR100536984B1 (en) |
CN (1) | CN1302388C (en) |
AT (1) | ATE332530T1 (en) |
AU (1) | AU2002304504A1 (en) |
DE (1) | DE60212962T2 (en) |
ES (1) | ES2262810T3 (en) |
TW (1) | TWI220024B (en) |
WO (1) | WO2002095586A2 (en) |
Cited By (4)
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JP2004212395A (en) * | 2002-12-31 | 2004-07-29 | Agere Systems Inc | Built-in self test hierarchy for integrated circuit |
JP2005241651A (en) * | 2004-02-26 | 2005-09-08 | Samsung Electronics Co Ltd | Soc with built-in self-test circuit, and self-test method therefor |
US7852434B2 (en) | 2005-06-10 | 2010-12-14 | Sumitomo Chemical Company, Limited | Aromatic polymer |
CN106973409A (en) * | 2017-03-28 | 2017-07-21 | 努比亚技术有限公司 | A kind of system and method for antenna tuning parameters debugging |
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US7395474B2 (en) * | 2003-08-01 | 2008-07-01 | Intermec Ip Corp. | Lab-on-chip system and method and apparatus for manufacturing and operating same |
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US6922649B2 (en) * | 2003-11-25 | 2005-07-26 | International Business Machines Corporation | Multiple on-chip test runs and repairs for memories |
JP2005266861A (en) * | 2004-03-16 | 2005-09-29 | Nec Electronics Corp | Microcomputer and its test method |
EP1585139A1 (en) * | 2004-04-08 | 2005-10-12 | STMicroelectronics Pvt. Ltd | An on-chip and at-speed tester for testing and characterization of different types of memories |
JP4044075B2 (en) * | 2004-06-14 | 2008-02-06 | 株式会社東芝 | Test circuit and test method for semiconductor integrated circuit |
US7360134B1 (en) * | 2004-09-21 | 2008-04-15 | Sun Microsystems, Inc. | Centralized BIST engine for testing on-chip memory structures |
US7370292B2 (en) * | 2004-12-14 | 2008-05-06 | International Business Machines Corporation | Method for incremental design reduction via iterative overapproximation and re-encoding strategies |
KR100638476B1 (en) * | 2004-12-22 | 2006-10-26 | 삼성전자주식회사 | Virtual platform based system on chip development environment and development method for the same |
US7284167B2 (en) * | 2005-01-24 | 2007-10-16 | Spansion Llc | Automated tests for built-in self test |
US7240255B2 (en) * | 2005-03-22 | 2007-07-03 | Cisco Technology, Inc. | Area efficient BIST system for memories |
US7657807B1 (en) * | 2005-06-27 | 2010-02-02 | Sun Microsystems, Inc. | Integrated circuit with embedded test functionality |
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US20070168809A1 (en) * | 2005-08-09 | 2007-07-19 | Naoki Kiryu | Systems and methods for LBIST testing using commonly controlled LBIST satellites |
US7861106B2 (en) * | 2005-08-19 | 2010-12-28 | A. Avizienis And Associates, Inc. | Hierarchical configurations in error-correcting computer systems |
KR100727975B1 (en) | 2005-09-10 | 2007-06-14 | 삼성전자주식회사 | Fault diagnostic apparatus of System on chip and method thereof, SoC capable of fault diagnostic |
US7308656B1 (en) * | 2005-10-04 | 2007-12-11 | Xilinx, Inc. | Method and apparatus for generating a boundary scan description and model |
US7930595B2 (en) * | 2006-06-22 | 2011-04-19 | International Business Machines Corporation | Method and apparatus for analyzing error conditions in a massively parallel computer system by identifying anomalous nodes within a communicator set |
US20080016421A1 (en) * | 2006-07-13 | 2008-01-17 | International Business Machines Corporation | Method and apparatus for providing programmable control of built-in self test |
US20080126001A1 (en) * | 2006-09-01 | 2008-05-29 | Murray David W | Equipment testing system and method having scaleable test line limits |
US8499208B2 (en) * | 2006-10-27 | 2013-07-30 | Qualcomm Incorporated | Method and apparatus for scheduling BIST routines |
US7822567B2 (en) * | 2007-06-29 | 2010-10-26 | Advanced Micro Devices, Inc. | Method and apparatus for implementing scaled device tests |
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US8990811B2 (en) | 2007-10-19 | 2015-03-24 | Oracle International Corporation | Future-based performance baselines |
US7856577B2 (en) * | 2007-11-21 | 2010-12-21 | Lsi Corporation | Command language for memory testing |
US7882406B2 (en) | 2008-05-09 | 2011-02-01 | Lsi Corporation | Built in test controller with a downloadable testing program |
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US7941713B2 (en) * | 2008-08-27 | 2011-05-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Programmable self-test for random access memories |
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US8381052B2 (en) * | 2009-11-10 | 2013-02-19 | International Business Machines Corporation | Circuit and method for efficient memory repair |
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US9037928B2 (en) | 2012-01-01 | 2015-05-19 | Mosys, Inc. | Memory device with background built-in self-testing and background built-in self-repair |
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US10816595B2 (en) | 2018-10-19 | 2020-10-27 | Nxp Usa, Inc. | Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof |
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Citations (1)
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US6044481A (en) * | 1997-05-09 | 2000-03-28 | Artisan Components, Inc. | Programmable universal test interface for testing memories with different test methodologies |
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-
2001
- 2001-05-23 US US09/863,952 patent/US6728916B2/en not_active Expired - Lifetime
-
2002
- 2002-05-15 CN CNB028103971A patent/CN1302388C/en not_active Expired - Fee Related
- 2002-05-15 DE DE60212962T patent/DE60212962T2/en not_active Expired - Lifetime
- 2002-05-15 EP EP02732895A patent/EP1389315B1/en not_active Expired - Lifetime
- 2002-05-15 AU AU2002304504A patent/AU2002304504A1/en not_active Abandoned
- 2002-05-15 WO PCT/GB2002/002302 patent/WO2002095586A2/en active IP Right Grant
- 2002-05-15 ES ES02732895T patent/ES2262810T3/en not_active Expired - Lifetime
- 2002-05-15 KR KR10-2003-7013805A patent/KR100536984B1/en not_active IP Right Cessation
- 2002-05-15 AT AT02732895T patent/ATE332530T1/en not_active IP Right Cessation
- 2002-05-15 JP JP2002591985A patent/JP3962337B2/en not_active Expired - Fee Related
- 2002-05-22 TW TW091110822A patent/TWI220024B/en not_active IP Right Cessation
Patent Citations (1)
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US6044481A (en) * | 1997-05-09 | 2000-03-28 | Artisan Components, Inc. | Programmable universal test interface for testing memories with different test methodologies |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004212395A (en) * | 2002-12-31 | 2004-07-29 | Agere Systems Inc | Built-in self test hierarchy for integrated circuit |
JP2005241651A (en) * | 2004-02-26 | 2005-09-08 | Samsung Electronics Co Ltd | Soc with built-in self-test circuit, and self-test method therefor |
US7761763B2 (en) | 2004-02-26 | 2010-07-20 | Samsung Electronics Co., Ltd. | System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC |
US7852434B2 (en) | 2005-06-10 | 2010-12-14 | Sumitomo Chemical Company, Limited | Aromatic polymer |
CN106973409A (en) * | 2017-03-28 | 2017-07-21 | 努比亚技术有限公司 | A kind of system and method for antenna tuning parameters debugging |
CN106973409B (en) * | 2017-03-28 | 2021-01-26 | 努比亚技术有限公司 | System and method for debugging antenna tuning parameters |
Also Published As
Publication number | Publication date |
---|---|
US6728916B2 (en) | 2004-04-27 |
KR100536984B1 (en) | 2005-12-14 |
EP1389315A2 (en) | 2004-02-18 |
TWI220024B (en) | 2004-08-01 |
DE60212962T2 (en) | 2007-01-04 |
AU2002304504A1 (en) | 2002-12-03 |
JP2004534220A (en) | 2004-11-11 |
ATE332530T1 (en) | 2006-07-15 |
JP3962337B2 (en) | 2007-08-22 |
EP1389315B1 (en) | 2006-07-05 |
DE60212962D1 (en) | 2006-08-17 |
KR20030092094A (en) | 2003-12-03 |
WO2002095586A3 (en) | 2003-10-16 |
CN1511285A (en) | 2004-07-07 |
US20020178416A1 (en) | 2002-11-28 |
CN1302388C (en) | 2007-02-28 |
ES2262810T3 (en) | 2006-12-01 |
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