WO2002004692A3 - Two-stage sputter deposition method - Google Patents

Two-stage sputter deposition method Download PDF

Info

Publication number
WO2002004692A3
WO2002004692A3 PCT/US2001/041206 US0141206W WO0204692A3 WO 2002004692 A3 WO2002004692 A3 WO 2002004692A3 US 0141206 W US0141206 W US 0141206W WO 0204692 A3 WO0204692 A3 WO 0204692A3
Authority
WO
WIPO (PCT)
Prior art keywords
batch
conductive material
conductive layer
deposition method
substrate
Prior art date
Application number
PCT/US2001/041206
Other languages
French (fr)
Other versions
WO2002004692A2 (en
Inventor
John C Forster
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of WO2002004692A2 publication Critical patent/WO2002004692A2/en
Publication of WO2002004692A3 publication Critical patent/WO2002004692A3/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/046Coating cavities or hollow spaces, e.g. interior of tubes; Infiltration of porous substrates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • C23C14/354Introduction of auxiliary energy into the plasma
    • C23C14/358Inductive energy

Abstract

A method and system for depositing a conductive layer on a substrate by serially providing, proximate to the substrate, first and second batches of conductive material, comprising electrically neutral atoms and electrically charge ions with a substantial majority of the conductive material associated with the first batch being electrically neutral atoms and a substantial majority of the conductive material associated with the second batch being electrically charged ions. A first portion of the conductive layer is formed on the substrate from the first batch. The first portion of the conductive layer is formed before the second batch of conductive material is present. Subsequent to formation of the first portion, a second portion of the conductive layer is formed from the second batch of conductive material.
PCT/US2001/041206 2000-07-10 2001-06-29 Two-stage sputter deposition method WO2002004692A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61300500A 2000-07-10 2000-07-10
US09/613,005 2000-07-10

Publications (2)

Publication Number Publication Date
WO2002004692A2 WO2002004692A2 (en) 2002-01-17
WO2002004692A3 true WO2002004692A3 (en) 2002-06-20

Family

ID=24455483

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/041206 WO2002004692A2 (en) 2000-07-10 2001-06-29 Two-stage sputter deposition method

Country Status (1)

Country Link
WO (1) WO2002004692A2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4622919A (en) * 1983-12-29 1986-11-18 Nissin Electric Co., Ltd. Film forming apparatus
US5707498A (en) * 1996-07-12 1998-01-13 Applied Materials, Inc. Avoiding contamination from induction coil in ionized sputtering
US6080285A (en) * 1998-09-14 2000-06-27 Applied Materials, Inc. Multiple step ionized metal plasma deposition process for conformal step coverage

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4622919A (en) * 1983-12-29 1986-11-18 Nissin Electric Co., Ltd. Film forming apparatus
US5707498A (en) * 1996-07-12 1998-01-13 Applied Materials, Inc. Avoiding contamination from induction coil in ionized sputtering
US6080285A (en) * 1998-09-14 2000-06-27 Applied Materials, Inc. Multiple step ionized metal plasma deposition process for conformal step coverage

Also Published As

Publication number Publication date
WO2002004692A2 (en) 2002-01-17

Similar Documents

Publication Publication Date Title
IE822913L (en) Current enhanced photovoltanic device
EP1087431A3 (en) Method and apparatus for forming a sputtered doped seed layer
WO1998059087A3 (en) Method for bias sputtering
EP1201786A3 (en) Seed layer deposition
WO2004053926A3 (en) A method for depositing a metal layer on a semiconductor interconnect structure
WO2000055102A3 (en) Methods of making low haze coatings and the coatings and coated articles made thereby
EP0256568B1 (en) Process for obtaining thin-film circuits and passive circuit made by said process
WO2001020647A3 (en) Novel chip interconnect and packaging deposition methods and structures
EP0856884A3 (en) Low temperature via and trench fill process by means of CVD of Cu followed by PVD of Cu
EP0924777A3 (en) A method for the formation of an indium oxide film by electro deposition process or electroless deposition process, a substrate provided with said indium oxide film for a semiconductor element, and a semiconductor element provided with said substrate
IL169135A0 (en) A method for depositing a metal layer on a semiconductor interconnect structure having a capping layer
MX216784B (en)
JPH10209468A (en) Soi semiconductor device
WO2004095513A3 (en) A method for plasma deposition of a substrate barrier layer
TW374224B (en) Dual damascene process for manufacturing low k dielectrics
TW429599B (en) Method for forming inductors on the semiconductor substrate
EP0372930A3 (en) Electrolytic etch for preventing electrical shorts in solar cells on polymer surfaces
US5725740A (en) Adhesion layer for tungsten deposition
EP1020902A3 (en) Method of fabricating a split gate memory cell
SG136807A1 (en) A method to improve adhesion of dielectric films in damascene interconnects
GB2379802A (en) A method for forming a product sensor and a product sensor
WO2002004692A3 (en) Two-stage sputter deposition method
WO2001077419A3 (en) Process for the direct metal-plating of a plastic substrate
EP0303083A3 (en) Barrier layer containing conductive articles
CN115537722B (en) Process for preparing conductive black and insulating black on same surface layer and product thereof

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): JP

AK Designated states

Kind code of ref document: A3

Designated state(s): JP

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
NENP Non-entry into the national phase

Ref country code: JP