WO2001090749A3 - Scanning kelvin microprobe system and process for biomolecule microassay - Google Patents

Scanning kelvin microprobe system and process for biomolecule microassay Download PDF

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Publication number
WO2001090749A3
WO2001090749A3 PCT/CA2001/000716 CA0100716W WO0190749A3 WO 2001090749 A3 WO2001090749 A3 WO 2001090749A3 CA 0100716 W CA0100716 W CA 0100716W WO 0190749 A3 WO0190749 A3 WO 0190749A3
Authority
WO
WIPO (PCT)
Prior art keywords
biomolecule
substrate
microassay
scanning kelvin
skm
Prior art date
Application number
PCT/CA2001/000716
Other languages
French (fr)
Other versions
WO2001090749A2 (en
Inventor
Michael Thompson
Larisa-Emilia Cheran
Mark Mcgovern
Original Assignee
Sensorchem Internat Corp
Michael Thompson
Cheran Larisa Emilia
Mark Mcgovern
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sensorchem Internat Corp, Michael Thompson, Cheran Larisa Emilia, Mark Mcgovern filed Critical Sensorchem Internat Corp
Priority to CA002447960A priority Critical patent/CA2447960A1/en
Priority to AU2001261947A priority patent/AU2001261947A1/en
Priority to US10/296,508 priority patent/US20040029131A1/en
Publication of WO2001090749A2 publication Critical patent/WO2001090749A2/en
Publication of WO2001090749A3 publication Critical patent/WO2001090749A3/en
Priority to US11/302,143 priority patent/US20060089825A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/30Scanning potential microscopy
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/002Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the work function voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/53Immunoassay; Biospecific binding assay; Materials therefor
    • G01N33/543Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals
    • G01N33/54366Apparatus specially adapted for solid-phase testing
    • G01N33/54373Apparatus specially adapted for solid-phase testing involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings
    • G01N33/5438Electrodes

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Urology & Nephrology (AREA)
  • Molecular Biology (AREA)
  • Hematology (AREA)
  • Biomedical Technology (AREA)
  • Biotechnology (AREA)
  • Electrochemistry (AREA)
  • Microbiology (AREA)
  • Nanotechnology (AREA)
  • Cell Biology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

There is provided a system and process for detecting biomolecular interaction on a substrate having a biomolecule immobilized on a surface of the substrate. The system and process incorporate a scanning Kelvin microprobe (SKM) capable of analyzing surface topography as well as a contact potential difference image signal. Also provided is the use of SKM in measuring and analyzing biochemical molecular interactions between a probe bound to the surface of the substrate, and a target suspected to be present in a liquid sample. One of the probe and target combination is a biomolecule such as a nucleic acid, a polypeptide, or a small molecule, and an antibody antigen combination may be used.
PCT/CA2001/000716 2000-05-24 2001-05-18 Scanning kelvin microprobe system and process for biomolecule microassay WO2001090749A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CA002447960A CA2447960A1 (en) 2000-05-24 2001-05-18 Scanning kelvin microprobe system and process for biomolecule microassay
AU2001261947A AU2001261947A1 (en) 2000-05-24 2001-05-18 Scanning kelvin microprobe system and process for biomolecule microassay
US10/296,508 US20040029131A1 (en) 2000-05-24 2001-05-18 Scanning kelvinmicroprobe system and process for biomolecule microassay
US11/302,143 US20060089825A1 (en) 2000-05-24 2005-12-14 Scanning kelvin microprobe system and process for biomolecule microassay

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CA2,309,412 2000-05-24
CA002309412A CA2309412A1 (en) 2000-05-24 2000-05-24 Scanning of biochemical microassays by kelvin microprobe

Publications (2)

Publication Number Publication Date
WO2001090749A2 WO2001090749A2 (en) 2001-11-29
WO2001090749A3 true WO2001090749A3 (en) 2002-02-28

Family

ID=4166240

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/CA2001/000717 WO2001090730A2 (en) 2000-05-24 2001-05-18 Scanning kelvin microprobe system and process for analyzing a surface
PCT/CA2001/000716 WO2001090749A2 (en) 2000-05-24 2001-05-18 Scanning kelvin microprobe system and process for biomolecule microassay

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/CA2001/000717 WO2001090730A2 (en) 2000-05-24 2001-05-18 Scanning kelvin microprobe system and process for analyzing a surface

Country Status (7)

Country Link
US (2) US20040029131A1 (en)
EP (1) EP1295119B1 (en)
AT (1) ATE333095T1 (en)
AU (2) AU2001261947A1 (en)
CA (1) CA2309412A1 (en)
DE (1) DE60121446T2 (en)
WO (2) WO2001090730A2 (en)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6657780B2 (en) * 2001-02-20 2003-12-02 University Of Maryland Baltimore County Widely tunable and integrated optical system and method
WO2003033993A1 (en) * 2001-10-19 2003-04-24 Commonwealth Scientific And Industrial Research Organisation A kelvin probe instrument
FR2833082B1 (en) * 2001-12-03 2004-08-27 Centre Nat Rech Scient POSITIONING DETECTION AND DETERMINATION OF SEPARATE BIOLOGICAL MOLECULES ON A SURFACE, USING THE MEASUREMENT OF AN ELECTRICAL PROPERTY OR EFFECT
WO2003058260A1 (en) * 2002-01-07 2003-07-17 Capres A/S Electrical feedback detection system for multi-point probes
DE10235124B4 (en) * 2002-08-01 2005-12-15 Herbert Amrhein Measuring device for the electrical measurement of the surface of a test object
US7107158B2 (en) 2003-02-03 2006-09-12 Qcept Technologies, Inc. Inspection system and apparatus
US7103482B2 (en) * 2003-02-03 2006-09-05 Qcept Technologies, Inc. Inspection system and apparatus
US6957154B2 (en) * 2003-02-03 2005-10-18 Qcept Technologies, Inc. Semiconductor wafer inspection system
US7308367B2 (en) * 2003-02-03 2007-12-11 Qcept Technologies, Inc. Wafer inspection system
WO2005012853A1 (en) 2003-07-25 2005-02-10 Qcept Technologies, Inc. Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor
US20050154270A1 (en) * 2004-01-08 2005-07-14 Richard Nuccitelli Application of the kelvin probe technique to mammalian skin and other epithelial structures
US8694088B2 (en) * 2005-01-07 2014-04-08 Bioelectromed Corp. Hand-held electric field imager for measuring the electric field in mammalian skin and other epithelial structures
DE102005002293A1 (en) * 2005-01-17 2006-07-27 Mariusz Wicinski Method and apparatus for inspecting a metal surface
GB0618514D0 (en) * 2006-09-20 2006-11-01 Univ Nottingham Trent Method of detecting interactions on a microarray using nuclear magnetic resonance
JP2008166702A (en) * 2006-12-06 2008-07-17 Jeol Ltd Charged particle beam apparatus
US7659734B2 (en) 2007-03-07 2010-02-09 Qcept Technologies, Inc. Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
US7900526B2 (en) * 2007-11-30 2011-03-08 Qcept Technologies, Inc. Defect classification utilizing data from a non-vibrating contact potential difference sensor
US7752000B2 (en) 2008-05-02 2010-07-06 Qcept Technologies, Inc. Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion
WO2010008720A1 (en) * 2008-07-18 2010-01-21 Bioelectromed Corp. Hand-held electric field imager for measuring the surface topography of mammalian skin and other epithelial structures
DE102008053184B4 (en) 2008-10-24 2010-12-23 Amrhein Messtechnik Gmbh Measuring device for E-field measurement in the near field
FR2944873B1 (en) * 2009-04-22 2011-05-13 Centre Nat Rech Scient SYSTEM FOR DETECTING PROBE HYBRIDIZING COMPLEXES WITH SPECIFIC LIGANDS, AND USES THEREOF
GB2495998B (en) * 2012-02-24 2013-09-25 Kp Technology Ltd Measurement apparatus
KR101731613B1 (en) 2015-02-27 2017-04-28 연세대학교 원주산학협력단 Detection of Gene Mutation by nanoparticle-DNA corona complex and Au or Si substrate via Kelvin Probe Force Microscopy
KR101731615B1 (en) 2015-02-27 2017-04-28 연세대학교 원주산학협력단 High-throughput detection method for single-to-multiple nucleotide mutations based on nanoparticle-DNA corona complex via Kelvin probe force microscopy
CN113030602B (en) * 2021-03-02 2022-10-21 北京纳米能源与系统研究所 Method, device, equipment and medium for measuring electrical property of sample material

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4649336A (en) * 1985-01-29 1987-03-10 Atomic Energy Of Canada Limited Automatic, self sustaining probe for measuring the work function
US6094971A (en) * 1997-09-24 2000-08-01 Texas Instruments Incorporated Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions

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US5336887A (en) * 1991-11-15 1994-08-09 Olympus Optical Co., Ltd. Scanning probe microscope
US5267471A (en) * 1992-04-30 1993-12-07 Ibm Corporation Double cantilever sensor for atomic force microscope
US5763768A (en) * 1997-03-17 1998-06-09 Iowa State University Research Foundation, Inc. Analytical method using modified scanning probes
JP3925991B2 (en) * 1997-07-08 2007-06-06 日本電子株式会社 Scanning probe microscope
DE69817329T2 (en) * 1998-06-02 2004-06-09 International Business Machines Corp. Device and method for identifying a substance through surface interactions

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4649336A (en) * 1985-01-29 1987-03-10 Atomic Energy Of Canada Limited Automatic, self sustaining probe for measuring the work function
US6094971A (en) * 1997-09-24 2000-08-01 Texas Instruments Incorporated Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CAVIC, CHERAN, MCGOVERN, THOMPSON: "Label-free detection of DNA probe microarrays by scanning Kelvin microprobe", INTERNET: CSC2000 CONFERENCE PROGRAM, ABSTRACT 56, SESSION AN3, 13 May 2000 (2000-05-13), XP002182470, Retrieved from the Internet <URL:http://www.chem.ucalgary.ca/csc2000/program/00000819.htm> [retrieved on 20011108] *

Also Published As

Publication number Publication date
DE60121446D1 (en) 2006-08-24
EP1295119A2 (en) 2003-03-26
AU2001261947A1 (en) 2001-12-03
ATE333095T1 (en) 2006-08-15
WO2001090730A2 (en) 2001-11-29
EP1295119B1 (en) 2006-07-12
US20060089825A1 (en) 2006-04-27
WO2001090730A3 (en) 2002-02-28
CA2309412A1 (en) 2001-11-24
DE60121446T2 (en) 2007-02-15
US20040029131A1 (en) 2004-02-12
WO2001090749A2 (en) 2001-11-29
AU2001261948A1 (en) 2001-12-03

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