WO2001084120A3 - Methods and devices for signal position analysis - Google Patents

Methods and devices for signal position analysis Download PDF

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Publication number
WO2001084120A3
WO2001084120A3 PCT/US2001/014292 US0114292W WO0184120A3 WO 2001084120 A3 WO2001084120 A3 WO 2001084120A3 US 0114292 W US0114292 W US 0114292W WO 0184120 A3 WO0184120 A3 WO 0184120A3
Authority
WO
WIPO (PCT)
Prior art keywords
signal
methods
devices
signal position
position analysis
Prior art date
Application number
PCT/US2001/014292
Other languages
French (fr)
Other versions
WO2001084120A2 (en
Inventor
Michael D Reiman
Original Assignee
Quantech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Quantech Ltd filed Critical Quantech Ltd
Priority to AU2001261155A priority Critical patent/AU2001261155A1/en
Priority to EP01935027A priority patent/EP1301770A2/en
Publication of WO2001084120A2 publication Critical patent/WO2001084120A2/en
Publication of WO2001084120A3 publication Critical patent/WO2001084120A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N21/774—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure
    • G01N21/7743—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure the reagent-coated grating coupling light in or out of the waveguide
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance

Abstract

A method of detecting a deviation from a baseline of a signal includes generating at least one pair of Fourier coefficients from the signal. A phase angle is then determined from a pair of the Fourier coefficients and the phase angle is correlated to the position of the deviation from the baseline of the signal. Another embodiment is an apparatus that includes a processor that is configured and arranged to carry out the steps in the method. The method and apparatus can be used to analyze a variety of signals including optical spectra and telecommunications signals. One particular exemplified example is the analysis of surface plasmon resonance signals.
PCT/US2001/014292 2000-05-03 2001-05-02 Methods and devices for signal position analysis WO2001084120A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AU2001261155A AU2001261155A1 (en) 2000-05-03 2001-05-02 Methods and devices for signal position analysis
EP01935027A EP1301770A2 (en) 2000-05-03 2001-05-02 Methods and devices for signal position analysis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US56414000A 2000-05-03 2000-05-03
US09/564,140 2000-05-03

Publications (2)

Publication Number Publication Date
WO2001084120A2 WO2001084120A2 (en) 2001-11-08
WO2001084120A3 true WO2001084120A3 (en) 2002-05-23

Family

ID=24253311

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/014292 WO2001084120A2 (en) 2000-05-03 2001-05-02 Methods and devices for signal position analysis

Country Status (3)

Country Link
EP (1) EP1301770A2 (en)
AU (1) AU2001261155A1 (en)
WO (1) WO2001084120A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60316985T2 (en) * 2002-08-28 2008-07-24 Fujifilm Corp. measuring device
JP2008107320A (en) * 2006-09-29 2008-05-08 Fujifilm Corp Detection apparatus, detection method, and optically transparent member

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2247749A (en) * 1990-09-05 1992-03-11 Marconi Gec Ltd Sensor utilising surface plasmon resonance

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2247749A (en) * 1990-09-05 1992-03-11 Marconi Gec Ltd Sensor utilising surface plasmon resonance

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
CHU-XIONG DING ET AL: "Peak position estimation algorithms for cross-correlation function in elastography", PROCEEDINGS OF THE 20TH ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY. VOL.20 BIOMEDICAL ENGINEERING TOWARDS THE YEAR 2000 AND BEYOND (CAT. NO.98CH36286), PROCEEDINGS OF THE 20TH ANNUAL INTERNATIONAL CONFEREN, 1998, Piscataway, NJ, USA, IEEE, USA, pages 866 - 868 vol.2, XP002187549, ISBN: 0-7803-5164-9 *
MORANDI C ET AL: "Digital image registration by phase correlation between boundary maps", IEE PROCEEDINGS E (COMPUTERS AND DIGITAL TECHNIQUES), MARCH 1987, UK, vol. 134, no. 2, pages 101 - 104, XP001058273, ISSN: 0143-7062 *

Also Published As

Publication number Publication date
WO2001084120A2 (en) 2001-11-08
EP1301770A2 (en) 2003-04-16
AU2001261155A1 (en) 2001-11-12

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