WO2001054768A1 - Hermetic grounded pin assembly - Google Patents

Hermetic grounded pin assembly Download PDF

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Publication number
WO2001054768A1
WO2001054768A1 PCT/US2001/002961 US0102961W WO0154768A1 WO 2001054768 A1 WO2001054768 A1 WO 2001054768A1 US 0102961 W US0102961 W US 0102961W WO 0154768 A1 WO0154768 A1 WO 0154768A1
Authority
WO
WIPO (PCT)
Prior art keywords
plug
braze alloy
temperature braze
pin
low temperature
Prior art date
Application number
PCT/US2001/002961
Other languages
French (fr)
Inventor
Shawki Ibrahim
Original Assignee
Cts Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cts Corporation filed Critical Cts Corporation
Priority to EP01906780A priority Critical patent/EP1251909B1/en
Priority to DE60100794T priority patent/DE60100794T2/en
Publication of WO2001054768A1 publication Critical patent/WO2001054768A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/58Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation characterised by the form or material of the contacting members
    • H01R4/62Connections between conductors of different materials; Connections between or with aluminium or steel-core aluminium conductors
    • H01R4/625Soldered or welded connections
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61NELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N1/00Electrotherapy; Circuits therefor
    • A61N1/18Applying electric currents by contact electrodes
    • A61N1/32Applying electric currents by contact electrodes alternating or intermittent currents
    • A61N1/36Applying electric currents by contact electrodes alternating or intermittent currents for stimulation
    • A61N1/372Arrangements in connection with the implantation of stimulators
    • A61N1/375Constructional arrangements, e.g. casings
    • A61N1/3752Details of casing-lead connections
    • A61N1/3754Feedthroughs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/02Soldered or welded connections
    • H01R4/029Welded connections
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R9/00Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips or terminal blocks; Terminals or binding posts mounted upon a base or in a case; Bases therefor
    • H01R9/16Fastening of connecting parts to base or case; Insulating connecting parts from base or case
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making

Definitions

  • This invention relates to a hermetic ground pin assembly for making an
  • implantable electronic medical devices such as pacemakers, heart pumps and
  • the electronics are hermetically sealed within a case typically
  • circuitry inside the case must be electrically isolated from the case and yet be
  • the plating is done after any high temperature processing. Subjecting the
  • U.S. patent no. 5,871 ,513 is a centerless ground feedthrough pin for an
  • An additional feature of the invention is to provide a hermetic ground pin
  • braze alloy is located between the plug and the case for affixing the plug within the
  • a high temperature braze alloy is located between the plug and the outer pin for affixing the pin to the plug.
  • Figure 1 is a side cross-sectional view of the preffered embodiment of a hermetic ground pin assembly.
  • Figure 2 is a side cross-sectional view of another embodiment of a hermetic
  • FIG 1 there is a hermetic ground pin assembly 10 shown.
  • Assembly 10 has a titanium case 12 for containing electronic circuitry (not shown).
  • Case 12 has a cavity 11. Case 12 has an inside surface 13 and an outer surface 14.
  • An aperture 15 passes through case 12.
  • An annular titamium plug 16 is located in
  • aperture 15 has a pair of opposed bores, an inner bore 18 and an outer bore 17.
  • Outer bore 17 has a flare 19 and inner bore 18 has a flare 20.
  • pin 25 and a cylindrical outer pin 24 are located and affixed into bores 17 and 18,
  • Outer pin 24 is held by a high temperature braze alloy 27.
  • Inner pin 25 is held by a high temperature braze alloy 27.
  • the outer pin is formed from an alloy of 90% platinum and 10% iridium.
  • the inner pin is formed from 100% nickel so that it
  • Pin 25 has a head 26.
  • a wire 30 is attached to head 26 by a
  • Wire 30 is an ultrasonically bondable wire such as aluminum or gold.
  • High temperature braze alloy 27 is located in flare 19 between pin 24 and bore 17.
  • the high temperature braze alloy 27 is made up of an alloy that ranges in
  • the plug 16 is located and affixed into aperture 15 by a low temperature
  • braze alloy28 Low temperature braze alloy 28 is located between case 12 and plug
  • the pin 25 is located and affixed into bore 18 by low temperature braze alloy 28.
  • the low temperature braze alloy 28 is made up of an alloy that ranges in concentration of 20 to 40 percent copper and 60 to 80 percent silver by weight. Other
  • pins (not shown) are used in the package that are insulated from the case 12 by a
  • the hermetic ground pin assembly 10 can be assembled in the following
  • a low temperature braze alloy is applied as a preform in the
  • the low temperature braze alloy has a concentration range of 20-40 percent copper and 60-80
  • Assembly 50 has a titanium case 12 for containing electronic
  • Case 12 has a cavity 1 1. Case 12 has an inside surface 13
  • An inner bore 52 and an outer bore 53 are located on inside
  • Outer bore 53 has a flare 55 and inner
  • a cylindrical inner pin 25 and a cylindrical outer pin 24 are
  • Inner pin 25 is held by a low temperature braze alloy 28.
  • the outer pin is formed from an alloy of 90% platinum and 10% iridium.
  • the inner pin is formed from an alloy of 90% platinum and 10% iridium.
  • Pin 25 has a head 26.
  • a wire 30 is attached to head 26 by a wire bond 29.
  • Wire 30 is an ultrasonically bondable wire such as aluminum or gold.
  • High temperature braze alloy 27 is located
  • the high temperature braze alloy 27 is made
  • the pin 25 is located and affixed into bore 52 by low
  • the low temperature braze alloy 28 is made up of an alloy that ranges in concentration of 20 to 40 percent copper and 60 to 80 percent
  • the grounded pin assembly 10 of figure 1 allows for an electronic package with
  • a hermetically sealed package A wire bondable pin on the
  • alloy pin if desired other types of alloys could be used such as alloys of palladium, gold, silver, rhodium.
  • the ground pin assembly shown used a low temperature braze alloy and a high

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Electrotherapy Devices (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)

Abstract

A hermetic ground pin assembly for making an electrical connection between a hermetically sealed enclosure and an external circuit. A case has an aperture and a plug located within the aperture. A low temperature braze alloy is located between the plug and the case to attach the plug within the aperture. Two different pins are attached to opposite sides of the plug. A high temperature braze alloy attaches one of the pins to the plug and the low temperature braze alloy attaches the other pin to the plug.

Description

HERMETIC GROUNDED PIN ASSEMBLY
BACKGROUND OF THE INVENTION
1. FIELD OF THE INVENTION
This invention relates to a hermetic ground pin assembly for making an
electrical connection between a hermetically sealed enclosure and an external circuit.
2. DESCRIPTION OF THE RELATED ART
Various devices are well known for conducting an electrical signal. One
type of application for signal conduction that is very demanding is in the field of
implantable electronic medical devices such as pacemakers, heart pumps and
implantable defibrillators. These electronic packages must be of the highest reliability and corrosion resistance as any failure can have potentially lethal
consequences. The electronics are hermetically sealed within a case typically
made from titanium. The case needs to be grounded to protect the circuitry inside
from electromagnetic transients and electrostatic discharge. At the same time, the
circuitry inside the case must be electrically isolated from the case and yet be
connectable to external circuits such as a battery or signal pins.
In order to insure reliable connections gold plated pins and/or terminals are
used. The plating is done after any high temperature processing. Subjecting the
plating to high temperatures will destroy the integrity of the plating. Unfortunately, apart from the high cost of gold plating, the case cannot be electroplated due to
physiological compatibility problems during contact with human tissue. Therefore,
the case cannot be connected directly to the electrical connectors for
electroplating. In prior art designs, a ceramic insert was used to isolate the pins
from the case for electroplating. Other methods then had to be employed such as
special glass to metals seals around a wire to provide a ground connection after
the rest of the assembly was completed. A current unmet need exists for a reliable,
low cost, simple and robust hermetic ground pin assembly for making an electrical connection between a hermetically sealed enclosure and an external circuit that
allow other terminals to be electroplated and the electronic enclosure to be
physiologically compatible with human tissue.
3. Related Art
Examples of patents that are related to the present invention are as follows,
and each patent is herein incorporated by reference for the supporting teachings:
U.S. patent no. 5,871 ,513 is a centerless ground feedthrough pin for an
electrical power source in an implantable medical device.
The foregoing patents reflect the state of the art of which the applicant is aware
and are tendered with the view toward discharging the applicant's acknowledged duty
of candor in disclosing information which may be pertinent in the examination of this
application. It is respectfully stipulated, however, that none of these patents teach or
render obvious, singly or when considered in combination, the applicants claimed invention.
SUMMARY OF THE INVENTION
It is a feature of the invention to provide a hermetic ground pin assembly for
making an electrical connection between a hermetically sealed enclosure and an
external circuit.
An additional feature of the invention is to provide a hermetic ground pin
assembly for making an electrical path that includes a case or a case having an
aperture therethrough and a plug located within the aperture. A low temperature
braze alloy is located between the plug and the case for affixing the plug within the
aperture. One or more pins are attached to the plug. A high temperature braze alloy is located between the plug and the outer pin for affixing the pin to the plug.
The invention resides not in any one of these features per se, but rather in the
particular combination of all of them herein disclosed and claimed and it is
distinguished from the prior art in this particular combination of all of its structures for
the functions specified. Other features of the present invention will become more
clear from the following detailed description of the invention, taken in conjunction with
the accompanying drawings and claims, or may be learned by the practice of the
invention.
There has thus been outlined, rather broadly, the more important features of
the invention in order that the detailed description thereof that follows may be better
understood, and in order that the present contribution to the art may be better appreciated. There are, of course, additional features of the invention that will be described hereinafter and which will form the subject matter of the claims appended
hereto. Those skilled in the art will appreciate that the conception, upon which this
disclosure is based, may readily be utilized as a basis for the designing of other
structures, methods and systems for carrying out the several purposes of the present
invention. It is important, therefore, that the claims be regarded as including such
equivalent constructions insofar as they do not depart from the spirit and scope of the present invention.
BRIEF DESCRIPTION OF THE DRAWINGS
Figure 1 is a side cross-sectional view of the preffered embodiment of a hermetic ground pin assembly.
Figure 2 is a side cross-sectional view of another embodiment of a hermetic
ground pin assembly
It is noted that the drawings of the invention are not to scale. The drawings are
merely schematic representations, not intended to portray specific parameters of the
invention. The drawings are intended to depict only typical embodiments of the
invention, and therefore should not be considered as limiting the scope of the
invention. The invention will be described with additional specificity and detail through
the use of the accompanying drawings. In the drawings like numbering represents like
elements between the drawings. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
Referring to figure 1 , there is a hermetic ground pin assembly 10 shown.
Assembly 10 has a titanium case 12 for containing electronic circuitry (not shown).
Case 12 has a cavity 11. Case 12 has an inside surface 13 and an outer surface 14.
An aperture 15 passes through case 12. An annular titamium plug 16 is located in
aperture 15 and has a pair of opposed bores, an inner bore 18 and an outer bore 17.
Outer bore 17 has a flare 19 and inner bore 18 has a flare 20. A cylindrical inner
pin 25 and a cylindrical outer pin 24 are located and affixed into bores 17 and 18,
respectively. Outer pin 24 is held by a high temperature braze alloy 27. Inner pin 25
is held by a low temperature braze alloy 28. The outer pin is formed from an alloy of 90% platinum and 10% iridium. The inner pin is formed from 100% nickel so that it
can be wire bonded to. Pin 25 has a head 26. A wire 30 is attached to head 26 by a
wire bond 29. Wire 30 is an ultrasonically bondable wire such as aluminum or gold.
High temperature braze alloy 27 is located in flare 19 between pin 24 and bore 17.
The high temperature braze alloy 27 is made up of an alloy that ranges in
concentration of 10 to 30 percent nickel and 70 to 90 percent gold by weight. The
plug 16 has an annular groove 21 disposed circumferential ly and an annular step 22
at one end. The plug 16 is located and affixed into aperture 15 by a low temperature
braze alloy28. Low temperature braze alloy 28 is located between case 12 and plug
16. The pin 25 is located and affixed into bore 18 by low temperature braze alloy 28.
The low temperature braze alloy 28 is made up of an alloy that ranges in concentration of 20 to 40 percent copper and 60 to 80 percent silver by weight. Other
pins (not shown) are used in the package that are insulated from the case 12 by a
ceramic insert (not shown). These pins are the signal pins which are required to be electroplated with gold.
The hermetic ground pin assembly 10 can be assembled in the following
manner. First the outer pin 24 is inserted into the plug and the high temperature braze
alloy is placed as a preform or otherwise adjacent flare 19. The plug and pin are
placed in a fixture and then inserted into a vacuum furnace between 920 and 970
degrees Celsius, such that the high temperature braze melts. The pin and plug is then cooled to room or ambient temperature. The high temperature braze solidifies and pin
24 is fixed into bore 17. Next, the pin 25 is inserted into bore 18 and plug 16 is
inserted into aperture 15. A low temperature braze alloy is applied as a preform in the
aperture, between the case and the plug and around pin 25 adjacent flare 20. The low temperature braze alloy has a concentration range of 20-40 percent copper and 60-80
percent silver by weight. The case and plug, other signal pins and ceramic spacers
are then placed in a fixture and heated in a vaccuum oven to between 760 and 800
degrees Celsius, such that the low temperature braze alloy melts. The assembly 10
is then cooled. The low temperature braze alloy solidifies and the plug 16 and pins
are fixed into the aperture. Next, all the other pins in the package besides the ground
pin are electroplated with electrolytic nickel and then with gold plating. The package
would then have circuitry placed in case 12 for connection to the ground pin using
wirebond 29. Referring to figure 2, there is another embodiment of a hermetic ground pin
assembly 50 shown. Assembly 50 has a titanium case 12 for containing electronic
circuitry (not shown). Case 12 has a cavity 1 1. Case 12 has an inside surface 13
and an outer surface 14. An inner bore 52 and an outer bore 53 are located on inside
surface 13 and outer surface 14, respectively. Outer bore 53 has a flare 55 and inner
bore 52 has a flare 56. A cylindrical inner pin 25 and a cylindrical outer pin 24 are
located and affixed into bores 52 and 53, respectively. Outer pin 24 is held by a high
temperature braze alloy 27. Inner pin 25 is held by a low temperature braze alloy 28.
The outer pin is formed from an alloy of 90% platinum and 10% iridium. The inner
pin is formed from 100% nickel so that it can be wire bonded to. Pin 25 has a head 26.
A wire 30 is attached to head 26 by a wire bond 29. Wire 30 is an ultrasonically bondable wire such as aluminum or gold. High temperature braze alloy 27 is located
in flare 55 between pin 24 and bore 53. The high temperature braze alloy 27 is made
up of an alloy that ranges in concentration of 10 to 30 percent nickel and 70 to 90
percent gold by weight. The pin 25 is located and affixed into bore 52 by low
temperature braze alloy 28. The low temperature braze alloy 28 is made up of an alloy that ranges in concentration of 20 to 40 percent copper and 60 to 80 percent
silver by weight. Other pins (not shown) are used in the package that are insulated
from the case 12 by a ceramic insert (not shown). These pins are the signal pins
which are required to be electroplated with gold. Hermetic ground pin assembly 50
is assembled similar to assembly 10, with the high temperature braze alloy melted
around outer pin 24 first and then the low temperature braze alloy melted around inner pin 25, next.
Remarks About the Preferred Embodiment
The grounded pin assembly 10 of figure 1 allows for an electronic package with
the following attributes: A hermetically sealed package. A wire bondable pin on the
inside of the case that is not electroplated. A solderable pin on the outside of the case. A titanium case that is free of electroplating. Signal terminals or pins attached
to the case that are electroplated with gold.
Variations of the Preferred Embodiment
Although the illustrated embodiment shows the use of a platinum and iridium
alloy pin, if desired other types of alloys could be used such as alloys of palladium, gold, silver, rhodium.
The ground pin assembly shown used a low temperature braze alloy and a high
temperature braze alloy of a particular composition.
While the invention has been taught with specific reference to these
embodiments, someone skilled in the art will recognize that changes can be made in
form and detail without departing from the spirit and the scope of the invention. The
described embodiments are to be considered in all respects only as illustrative and
not restrictive. The scope of the invention is, therefore, indicated by the appended
claims rather than by the foregoing description. All changes which come within the
meaning and range of equivalency of the claims are to be embraced within their
scope.

Claims

What is claimed is:
1. A hermetic ground pin assembly for making an electrical path comprising:
a) a case having an aperture therethrough; b) a plug located within the aperture;
c) a low temperature braze alloy located between the plug and the case for affixing the plug within the aperture; d) at least one pin attached to the plug; and
e) a high temperature braze alloy located between plug and the pin for affixing the pin to the plug.
2. The hermetic ground pin assembly according to claim 1 , wherein the plug has a pair of opposed bores having the pins therein.
3. The hermetic ground pin assembly according to claim 2, wherein the low
temperature braze alloy has a concentration of 20-40 percent copper and 60-80 percent silver by weight.
4. The hermetic ground pin assembly according to claim 2, wherein the high
temperature braze alloy has a concentration of 10-30 percent nickel and 70-90
percent gold by weight.
5. The hermetic ground pin assembly according to claim 3, wherein the pin is an alloy of platinum and iridium.
6. A hermetic ground pin assembly for an implantable medical device comprising: a) a case having an aperture;
b) a plug having a first and second opposed bores, the plug affixed within the
aperture by brazing with a low temperature braze alloy;
c) a first pin affixed in the first bore by brazing with a high temperature braze alloy; and
d) a second pin affixed in the second bore by brazing with the low temperature braze alloy.
7. The hermetic ground pin assembly according to claim 6, wherein the low
temperature braze alloy has a concentration of 20-40 percent copper and 60-80 percent silver by weight.
8. The hermetic ground pin assembly according to claim 7, wherein the high
temperature braze alloy has a concentration of 10-30 percent nickel and 70-90 percent gold by weight.
9. The hermetic ground pin assembly according to claim 8, wherein the first pin is an alloy of platinum and iridium.
10. The hermetic ground pin assembly according to claim 9, wherein the low
temperature braze alloy melts between 760 and 800 degrees Celsius.
11. The hermetic ground pin assembly according to claim 10, wherein the high
temperature braze alloy melts between 920 and 970 degrees Celsius.
12. A method for making a hermetic ground pin assembly comprising the steps of:
a) providing a case having an aperture therethrough and a plug having a first and second opposed bores;
b) inserting a first pin into the first bore;
c) applying a high temperature braze alloy adjacent the first pin, the high
temperature braze alloy having a concentration of 10-30 percent nickel and 70-90 percent gold by weight.
d) heating the first pin, the plug and the high temperature braze alloy to
between 920 and 970 degrees Celsius, such that the high temperature braze alloy
melts;
e) cooling the first pin, the plug and the high temperature braze alloy to an
ambient temperature, such that the high temperature braze alloy solidifies and the first
pin is affixed into the first bores;
f) inserting the second pin into the second bore; g) inserting the plug into the aperture;
g) applying a low temperature braze alloy adjacent the plug and the second
pin, the low temperature braze alloy having a concentration of 20-40 percent copper
and 60-80 percent silver by weight;
h) heating the case, the pins, the plug and the low temperature braze alloy to
between 760 and 800 degrees Celsius, such that the low temperature braze alloy
melts; and i) cooling the pins, the plug, the case and the low temperature braze alloy to
an ambient temperature, such that the low temperature braze alloy solidifies and the
plug and pins are affixed into the aperture.
13. The method of making a hermetic ground pin assembly according to claim 12,
wherein the first pin is an alloy of platinum and iridium.
PCT/US2001/002961 2000-01-31 2001-01-30 Hermetic grounded pin assembly WO2001054768A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP01906780A EP1251909B1 (en) 2000-01-31 2001-01-30 Hermetic grounded pin assembly
DE60100794T DE60100794T2 (en) 2000-01-31 2001-01-30 HERMETIC GROUNDING PIN ARRANGEMENT

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/495,220 US6415182B1 (en) 2000-01-31 2000-01-31 Hermetic ground pin assembly and method of making
US09/495,220 2000-01-31

Publications (1)

Publication Number Publication Date
WO2001054768A1 true WO2001054768A1 (en) 2001-08-02

Family

ID=23967757

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/002961 WO2001054768A1 (en) 2000-01-31 2001-01-30 Hermetic grounded pin assembly

Country Status (4)

Country Link
US (1) US6415182B1 (en)
EP (1) EP1251909B1 (en)
DE (1) DE60100794T2 (en)
WO (1) WO2001054768A1 (en)

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US6905474B2 (en) 2000-09-11 2005-06-14 Csf Dynamic A/S Fluid shunt system and a method for the treatment of hydrocephalus
EP1688160A2 (en) * 2005-02-08 2006-08-09 Greatbatch, Inc. Feedthrough assembly
EP3300768A1 (en) * 2013-05-24 2018-04-04 Heraeus Deutschland GmbH & Co. KG Ceramic feedthrough brazed to an implantable medical device housing

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US6850080B2 (en) * 2001-03-19 2005-02-01 Semiconductor Energy Laboratory Co., Ltd. Inspection method and inspection apparatus
JP4216823B2 (en) * 2005-03-04 2009-01-28 田中貴金属工業株式会社 Probe pin and a blob card having the blob bin
DE102008055955A1 (en) 2008-11-05 2010-05-12 Continental Automotive Gmbh Circuit board in a housing has an external high current contact through the housing with fused glass insulation also as a housing hermetic seal
JP2011090924A (en) * 2009-10-23 2011-05-06 Ushio Inc Excimer lamp
KR101656723B1 (en) * 2015-06-30 2016-09-12 재단법인 오송첨단의료산업진흥재단 Feedthrough making method

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US5871513A (en) 1997-04-30 1999-02-16 Medtronic Inc. Centerless ground feedthrough pin for an electrical power source in an implantable medical device
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US5817984A (en) * 1995-07-28 1998-10-06 Medtronic Inc Implantable medical device wtih multi-pin feedthrough
US5870272A (en) * 1997-05-06 1999-02-09 Medtronic Inc. Capacitive filter feedthrough for implantable medical device
EP0877539A1 (en) * 1997-05-09 1998-11-11 Mecanismos Auxiliares Industriales S.A. M.A.I.S.A. Improvements in the manufacturing processes of service boxes and their parts

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6905474B2 (en) 2000-09-11 2005-06-14 Csf Dynamic A/S Fluid shunt system and a method for the treatment of hydrocephalus
EP1688160A2 (en) * 2005-02-08 2006-08-09 Greatbatch, Inc. Feedthrough assembly
EP1688160A3 (en) * 2005-02-08 2012-02-08 Greatbatch Ltd. Feedthrough assembly
EP3300768A1 (en) * 2013-05-24 2018-04-04 Heraeus Deutschland GmbH & Co. KG Ceramic feedthrough brazed to an implantable medical device housing

Also Published As

Publication number Publication date
DE60100794D1 (en) 2003-10-23
DE60100794T2 (en) 2004-07-01
US6415182B1 (en) 2002-07-02
EP1251909A1 (en) 2002-10-30
EP1251909B1 (en) 2003-09-17

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