WO2001036319A8 - Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation - Google Patents

Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation

Info

Publication number
WO2001036319A8
WO2001036319A8 PCT/US2000/031358 US0031358W WO0136319A8 WO 2001036319 A8 WO2001036319 A8 WO 2001036319A8 US 0031358 W US0031358 W US 0031358W WO 0136319 A8 WO0136319 A8 WO 0136319A8
Authority
WO
WIPO (PCT)
Prior art keywords
micro
arrays
ion implantation
reducing variations
cantilever structures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2000/031358
Other languages
French (fr)
Other versions
WO2001036319A1 (en
Inventor
Thomas Stephen Villani
Lawrence A Goodman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sarnoff Corp
Original Assignee
Sarnoff Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/712,109 external-priority patent/US6410912B1/en
Application filed by Sarnoff Corp filed Critical Sarnoff Corp
Publication of WO2001036319A1 publication Critical patent/WO2001036319A1/en
Publication of WO2001036319A8 publication Critical patent/WO2001036319A8/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00642Manufacture or treatment of devices or systems in or on a substrate for improving the physical properties of a device
    • B81C1/0065Mechanical properties
    • B81C1/00666Treatments for controlling internal stress or strain in MEMS structures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2201/00Manufacture or treatment of microstructural devices or systems
    • B81C2201/01Manufacture or treatment of microstructural devices or systems in or on a substrate
    • B81C2201/0161Controlling physical properties of the material
    • B81C2201/0163Controlling internal stress of deposited layers
    • B81C2201/0164Controlling internal stress of deposited layers by doping the layer

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Micromachines (AREA)
  • Pressure Sensors (AREA)

Abstract

A method of adjusting the position of a micro-mechanical bi-material cantilever is provided. The bi-material includes a first and a second material and each material has a corresponding thermal expansion coefficient. The method includes implanting ions predominantly into one material of the bi-material to modify internal stress in one of the first and second materials relative to the other material. The deformation of the bi-material is then detected to modulate the implantation of ions thereto.
PCT/US2000/031358 1999-11-15 2000-11-15 Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation Ceased WO2001036319A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US16546399P 1999-11-15 1999-11-15
US60/165,463 1999-11-15
US09/712,109 US6410912B1 (en) 1999-11-15 2000-11-14 Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation
US09/712,109 2000-11-14

Publications (2)

Publication Number Publication Date
WO2001036319A1 WO2001036319A1 (en) 2001-05-25
WO2001036319A8 true WO2001036319A8 (en) 2001-09-27

Family

ID=26861414

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/031358 Ceased WO2001036319A1 (en) 1999-11-15 2000-11-15 Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation

Country Status (1)

Country Link
WO (1) WO2001036319A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103449356B (en) * 2012-05-31 2016-03-30 中国科学院微电子研究所 Stress matching method for bi-material cantilever beam
CN103048051B (en) * 2012-12-17 2014-12-10 中国科学院西安光学精密机械研究所 Infrared detector non-uniformity correction device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3699334A (en) * 1969-06-16 1972-10-17 Kollsman Instr Corp Apparatus using a beam of positive ions for controlled erosion of surfaces
JPS6410140A (en) * 1987-07-02 1989-01-13 Yokogawa Electric Corp Vibration type strain sensor
JP2823276B2 (en) * 1989-03-18 1998-11-11 株式会社東芝 Method for manufacturing X-ray mask and apparatus for controlling internal stress of thin film
US5677090A (en) * 1995-02-23 1997-10-14 Mitsubishi Denki Kabushiki Kaisha Method of making X-ray mask having reduced stress
US5922212A (en) * 1995-06-08 1999-07-13 Nippondenso Co., Ltd Semiconductor sensor having suspended thin-film structure and method for fabricating thin-film structure body
US5844238A (en) * 1996-03-27 1998-12-01 David Sarnoff Research Center, Inc. Infrared imager using room temperature capacitance sensor

Also Published As

Publication number Publication date
WO2001036319A1 (en) 2001-05-25

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