WO2001036319A8 - Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation - Google Patents
Method for reducing variations in arrays of micro-machined cantilever structures using ion implantationInfo
- Publication number
- WO2001036319A8 WO2001036319A8 PCT/US2000/031358 US0031358W WO0136319A8 WO 2001036319 A8 WO2001036319 A8 WO 2001036319A8 US 0031358 W US0031358 W US 0031358W WO 0136319 A8 WO0136319 A8 WO 0136319A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- micro
- arrays
- ion implantation
- reducing variations
- cantilever structures
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00642—Manufacture or treatment of devices or systems in or on a substrate for improving the physical properties of a device
- B81C1/0065—Mechanical properties
- B81C1/00666—Treatments for controlling internal stress or strain in MEMS structures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0161—Controlling physical properties of the material
- B81C2201/0163—Controlling internal stress of deposited layers
- B81C2201/0164—Controlling internal stress of deposited layers by doping the layer
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Micromachines (AREA)
- Pressure Sensors (AREA)
Abstract
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16546399P | 1999-11-15 | 1999-11-15 | |
| US60/165,463 | 1999-11-15 | ||
| US09/712,109 US6410912B1 (en) | 1999-11-15 | 2000-11-14 | Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation |
| US09/712,109 | 2000-11-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2001036319A1 WO2001036319A1 (en) | 2001-05-25 |
| WO2001036319A8 true WO2001036319A8 (en) | 2001-09-27 |
Family
ID=26861414
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2000/031358 Ceased WO2001036319A1 (en) | 1999-11-15 | 2000-11-15 | Method for reducing variations in arrays of micro-machined cantilever structures using ion implantation |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2001036319A1 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103449356B (en) * | 2012-05-31 | 2016-03-30 | 中国科学院微电子研究所 | Stress matching method for bi-material cantilever beam |
| CN103048051B (en) * | 2012-12-17 | 2014-12-10 | 中国科学院西安光学精密机械研究所 | Infrared detector non-uniformity correction device |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3699334A (en) * | 1969-06-16 | 1972-10-17 | Kollsman Instr Corp | Apparatus using a beam of positive ions for controlled erosion of surfaces |
| JPS6410140A (en) * | 1987-07-02 | 1989-01-13 | Yokogawa Electric Corp | Vibration type strain sensor |
| JP2823276B2 (en) * | 1989-03-18 | 1998-11-11 | 株式会社東芝 | Method for manufacturing X-ray mask and apparatus for controlling internal stress of thin film |
| US5677090A (en) * | 1995-02-23 | 1997-10-14 | Mitsubishi Denki Kabushiki Kaisha | Method of making X-ray mask having reduced stress |
| US5922212A (en) * | 1995-06-08 | 1999-07-13 | Nippondenso Co., Ltd | Semiconductor sensor having suspended thin-film structure and method for fabricating thin-film structure body |
| US5844238A (en) * | 1996-03-27 | 1998-12-01 | David Sarnoff Research Center, Inc. | Infrared imager using room temperature capacitance sensor |
-
2000
- 2000-11-15 WO PCT/US2000/031358 patent/WO2001036319A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2001036319A1 (en) | 2001-05-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AK | Designated states |
Kind code of ref document: A1 Designated state(s): JP |
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| AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR |
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| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
| AK | Designated states |
Kind code of ref document: C1 Designated state(s): JP |
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| AL | Designated countries for regional patents |
Kind code of ref document: C1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR |
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| CFP | Corrected version of a pamphlet front page | ||
| CR1 | Correction of entry in section i |
Free format text: PAT. BUL. 21/2001 UNDER (30) REPLACE "NOT FURNISHED" BY "09/712109" |
|
| 122 | Ep: pct application non-entry in european phase | ||
| NENP | Non-entry into the national phase in: |
Ref country code: JP |