WO2000075641A1 - Three dimensional imaging - Google Patents
Three dimensional imaging Download PDFInfo
- Publication number
- WO2000075641A1 WO2000075641A1 PCT/GB2000/002168 GB0002168W WO0075641A1 WO 2000075641 A1 WO2000075641 A1 WO 2000075641A1 GB 0002168 W GB0002168 W GB 0002168W WO 0075641 A1 WO0075641 A1 WO 0075641A1
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- WO
- WIPO (PCT)
- Prior art keywords
- sample
- radiation
- emitter
- reflected
- transmitted
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 30
- 230000005855 radiation Effects 0.000 claims abstract description 123
- 238000000034 method Methods 0.000 claims abstract description 49
- 230000001678 irradiating effect Effects 0.000 claims abstract description 20
- 230000005670 electromagnetic radiation Effects 0.000 claims abstract description 9
- 230000003287 optical effect Effects 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 18
- 230000001419 dependent effect Effects 0.000 claims description 5
- 230000009021 linear effect Effects 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000009022 nonlinear effect Effects 0.000 claims description 4
- 229910007709 ZnTe Inorganic materials 0.000 claims description 3
- 239000010453 quartz Substances 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- XTWYTFMLZFPYCI-KQYNXXCUSA-N 5'-adenylphosphoric acid Chemical compound C1=NC=2C(N)=NC=NC=2N1[C@@H]1O[C@H](COP(O)(=O)OP(O)(O)=O)[C@@H](O)[C@H]1O XTWYTFMLZFPYCI-KQYNXXCUSA-N 0.000 claims description 2
- 229910005540 GaP Inorganic materials 0.000 claims description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 2
- 239000007836 KH2PO4 Substances 0.000 claims description 2
- 229910003327 LiNbO3 Inorganic materials 0.000 claims description 2
- 229910012463 LiTaO3 Inorganic materials 0.000 claims description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 2
- LFVGISIMTYGQHF-UHFFFAOYSA-N ammonium dihydrogen phosphate Chemical compound [NH4+].OP(O)([O-])=O LFVGISIMTYGQHF-UHFFFAOYSA-N 0.000 claims description 2
- 229910002113 barium titanate Inorganic materials 0.000 claims description 2
- 229910052980 cadmium sulfide Inorganic materials 0.000 claims description 2
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 claims description 2
- CSJLBAMHHLJAAS-UHFFFAOYSA-N diethylaminosulfur trifluoride Substances CCN(CC)S(F)(F)F CSJLBAMHHLJAAS-UHFFFAOYSA-N 0.000 claims description 2
- 229910000402 monopotassium phosphate Inorganic materials 0.000 claims description 2
- GNSKLFRGEWLPPA-UHFFFAOYSA-M potassium dihydrogen phosphate Chemical compound [K+].OP(O)([O-])=O GNSKLFRGEWLPPA-UHFFFAOYSA-M 0.000 claims description 2
- 229910052968 proustite Inorganic materials 0.000 claims description 2
- 229910052711 selenium Inorganic materials 0.000 claims description 2
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 claims description 2
- 229910052714 tellurium Inorganic materials 0.000 claims description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 2
- 238000000926 separation method Methods 0.000 claims 2
- 239000000523 sample Substances 0.000 description 145
- 238000001514 detection method Methods 0.000 description 24
- 239000013078 crystal Substances 0.000 description 16
- 230000005540 biological transmission Effects 0.000 description 9
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- 206010006187 Breast cancer Diseases 0.000 description 1
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- 102100035971 Molybdopterin molybdenumtransferase Human genes 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001501867A JP2004500546A (en) | 1999-06-04 | 2000-06-05 | 3D image formation |
US10/009,249 US6828558B1 (en) | 1999-06-04 | 2000-06-05 | Three dimensional imaging |
EP00935401A EP1190234A1 (en) | 1999-06-04 | 2000-06-05 | Three dimensional imaging |
AU50943/00A AU776886B2 (en) | 1999-06-04 | 2000-06-05 | Three dimensional imaging |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9913089.0A GB9913089D0 (en) | 1999-06-04 | 1999-06-04 | Three dimensional imaging |
GB9913089.0 | 1999-06-04 | ||
GB9913429.8 | 1999-06-09 | ||
GB9913429A GB2350673B (en) | 1999-06-04 | 1999-06-09 | Three dimensional imaging |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2000075641A1 true WO2000075641A1 (en) | 2000-12-14 |
Family
ID=26315639
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2000/002168 WO2000075641A1 (en) | 1999-06-04 | 2000-06-05 | Three dimensional imaging |
Country Status (5)
Country | Link |
---|---|
US (1) | US6828558B1 (en) |
EP (1) | EP1190234A1 (en) |
JP (1) | JP2004500546A (en) |
AU (1) | AU776886B2 (en) |
WO (1) | WO2000075641A1 (en) |
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WO2003058212A1 (en) * | 2001-12-28 | 2003-07-17 | Nikon Corporation | Spectral measuring device |
GB2397207A (en) * | 2003-01-10 | 2004-07-14 | Teraview Ltd | Imaging chemical samples |
WO2004086560A2 (en) * | 2003-03-27 | 2004-10-07 | Cambridge University Technical Services Limited | Terahertz radiation sources and methods |
WO2005019807A1 (en) * | 2003-08-22 | 2005-03-03 | Teraview Limited | A method and apparatus for investigating a sample |
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US7244934B2 (en) | 2002-02-15 | 2007-07-17 | Teraview Limited | Analysis apparatus and method |
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US7595491B2 (en) | 2005-12-27 | 2009-09-29 | Rensselaer Polytechnic Institute | Methods and systems for the enhancement of terahertz wave generation for analyzing a remotely-located object |
US7718969B2 (en) | 2005-12-27 | 2010-05-18 | Rensselaer Polytechnic Institute | Methods and systems for generating amplified terahertz radiation for analyzing remotely-located objects |
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US7378849B2 (en) * | 2003-10-07 | 2008-05-27 | Sra International, Inc. | Method and apparatus for obtaining spatial information and measuring the dielectric constant of an object |
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EP0828143A2 (en) * | 1996-09-09 | 1998-03-11 | Lucent Technologies Inc. | Optical system employing terahertz radiation |
GB2347835A (en) * | 1999-02-23 | 2000-09-13 | Toshiba Res Europ Ltd | Terahertz radiation imaging |
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2000
- 2000-06-05 JP JP2001501867A patent/JP2004500546A/en active Pending
- 2000-06-05 EP EP00935401A patent/EP1190234A1/en not_active Withdrawn
- 2000-06-05 AU AU50943/00A patent/AU776886B2/en not_active Ceased
- 2000-06-05 WO PCT/GB2000/002168 patent/WO2000075641A1/en active IP Right Grant
- 2000-06-05 US US10/009,249 patent/US6828558B1/en not_active Expired - Lifetime
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EP0828143A2 (en) * | 1996-09-09 | 1998-03-11 | Lucent Technologies Inc. | Optical system employing terahertz radiation |
GB2347835A (en) * | 1999-02-23 | 2000-09-13 | Toshiba Res Europ Ltd | Terahertz radiation imaging |
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Title |
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US10076261B2 (en) | 2000-03-03 | 2018-09-18 | Teraview Limited | Imaging apparatus and method |
WO2001065240A1 (en) * | 2000-03-03 | 2001-09-07 | Teraview Limited | Imaging apparatus and method |
GB2371618A (en) * | 2001-01-30 | 2002-07-31 | Teraprobe Ltd | A probe comprising a dielectric body for examining a sample using radiation |
JP2004522151A (en) * | 2001-01-30 | 2004-07-22 | テラビュー リミテッド | Probe, transceiver and method for examining a sample |
US7315175B2 (en) | 2001-01-30 | 2008-01-01 | Teraview Limited | Probe apparatus and method for examining a sample |
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WO2003058212A1 (en) * | 2001-12-28 | 2003-07-17 | Nikon Corporation | Spectral measuring device |
US7244934B2 (en) | 2002-02-15 | 2007-07-17 | Teraview Limited | Analysis apparatus and method |
US6977379B2 (en) * | 2002-05-10 | 2005-12-20 | Rensselaer Polytechnic Institute | T-ray Microscope |
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WO2004063726A1 (en) * | 2003-01-10 | 2004-07-29 | Teraview Limited | Imaging techniques and associated apparatus |
WO2004086560A3 (en) * | 2003-03-27 | 2005-12-29 | Univ Cambridge Tech | Terahertz radiation sources and methods |
WO2004086560A2 (en) * | 2003-03-27 | 2004-10-07 | Cambridge University Technical Services Limited | Terahertz radiation sources and methods |
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US6828558B1 (en) | 2004-12-07 |
JP2004500546A (en) | 2004-01-08 |
AU776886B2 (en) | 2004-09-23 |
AU5094300A (en) | 2000-12-28 |
EP1190234A1 (en) | 2002-03-27 |
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