WO1997020221A3 - Process and device for testing an impedance connected to a low-frequency amplifier - Google Patents

Process and device for testing an impedance connected to a low-frequency amplifier Download PDF

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Publication number
WO1997020221A3
WO1997020221A3 PCT/DE1996/001817 DE9601817W WO9720221A3 WO 1997020221 A3 WO1997020221 A3 WO 1997020221A3 DE 9601817 W DE9601817 W DE 9601817W WO 9720221 A3 WO9720221 A3 WO 9720221A3
Authority
WO
WIPO (PCT)
Prior art keywords
low
frequency amplifier
testing
impedance connected
impedance
Prior art date
Application number
PCT/DE1996/001817
Other languages
German (de)
French (fr)
Other versions
WO1997020221A2 (en
Inventor
Andreas Rinne
Original Assignee
Bosch Gmbh Robert
Andreas Rinne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert, Andreas Rinne filed Critical Bosch Gmbh Robert
Publication of WO1997020221A2 publication Critical patent/WO1997020221A2/en
Publication of WO1997020221A3 publication Critical patent/WO1997020221A3/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
    • H03F1/305—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in case of switching on or off of a power supply

Abstract

A process and device are disclosed for determining in a simple manner an impedance connected to a low-frequency amplifier. For that purpose, the output of the low-frequency amplifier is decoupled and a current is transmitted into the amplifier output. The voltage established at the amplifier output as a result of the current flowing through the impedance connected thereto represents a measure for the connected impedance.
PCT/DE1996/001817 1995-11-30 1996-09-26 Process and device for testing an impedance connected to a low-frequency amplifier WO1997020221A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19544658.5 1995-11-30
DE19544658A DE19544658C1 (en) 1995-11-30 1995-11-30 Loudspeaker impedance testing method

Publications (2)

Publication Number Publication Date
WO1997020221A2 WO1997020221A2 (en) 1997-06-05
WO1997020221A3 true WO1997020221A3 (en) 1997-07-17

Family

ID=7778818

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE1996/001817 WO1997020221A2 (en) 1995-11-30 1996-09-26 Process and device for testing an impedance connected to a low-frequency amplifier

Country Status (2)

Country Link
DE (1) DE19544658C1 (en)
WO (1) WO1997020221A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2775861B1 (en) * 1998-03-05 2000-03-31 Alsthom Cge Alcatel RADIOTELECOMMUNICATION TERMINAL
US6870934B2 (en) * 2002-07-15 2005-03-22 Visteon Global Technologies, Inc. Audio loudspeaker detection using back-EMF sensing
EP2120485B1 (en) 2008-04-28 2014-10-08 Harman Becker Automotive Systems GmbH Load detection

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4228394A (en) * 1978-11-16 1980-10-14 Beckman Instruments, Inc. Digital ohmmeter with electrical continuity tester
EP0027078A1 (en) * 1979-10-02 1981-04-15 Jacques Rondier Control and diagnostics apparatus for car radios
US4670709A (en) * 1984-03-30 1987-06-02 John Iredale Portable audio system and audio cable continuity tester
EP0551199A2 (en) * 1992-01-08 1993-07-14 Robin Electronics Limited Electrical insulation and continuity tester

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA956576A (en) * 1972-09-06 1974-10-22 General Signal Corporation Circuit integrity checking means for audio signal circuit
DE3842169A1 (en) * 1988-12-15 1990-06-28 Bosch Gmbh Robert Circuit arrangement with an FET output stage

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4228394A (en) * 1978-11-16 1980-10-14 Beckman Instruments, Inc. Digital ohmmeter with electrical continuity tester
EP0027078A1 (en) * 1979-10-02 1981-04-15 Jacques Rondier Control and diagnostics apparatus for car radios
US4670709A (en) * 1984-03-30 1987-06-02 John Iredale Portable audio system and audio cable continuity tester
EP0551199A2 (en) * 1992-01-08 1993-07-14 Robin Electronics Limited Electrical insulation and continuity tester

Also Published As

Publication number Publication date
DE19544658C1 (en) 1997-03-20
WO1997020221A2 (en) 1997-06-05

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