WO1997005497A1 - Method and apparatus for automated wafer level testing and reliability data analysis - Google Patents
Method and apparatus for automated wafer level testing and reliability data analysis Download PDFInfo
- Publication number
- WO1997005497A1 WO1997005497A1 PCT/US1996/012533 US9612533W WO9705497A1 WO 1997005497 A1 WO1997005497 A1 WO 1997005497A1 US 9612533 W US9612533 W US 9612533W WO 9705497 A1 WO9705497 A1 WO 9705497A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- wafer
- lifetime
- tester
- network
- integrated circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Definitions
- the invention is directed to the field of integrated circuit fabrication and more particularly to the field of testing integrated circuits fabricated on a semiconductor wafer, prior to dicing of the wafer.
- semiconductor devices such as integrated circuits
- semiconductor devices are fabricated starting with the wafer of crystalline silicon.
- the purity of the wafer is high.
- Components of an integrated circuit, such as resistors, transistors, diodes, et cetera are formed by selectively introducing impurities into portions of the surface of the silicon wafer and by adding various layers of materials having different characteristics on the surface of the wafer.
- a multiple layer device is thus created.
- the multiple layers include semiconductor layers, insulating layers and conductive layers linking the various regions of the components of the integrated circuit device.
- Complex devices can be created by carefully defining the regions which are exposed to the various steps of fabrication using physical and chemical masks.
- Figure 1a shows such a wafer. Of the devices formed on the wafer, some might be defective. Testing of all or selected devices on a particular wafer is needed to ensure the reliability of the end devices. This is 'frequently done using automatic test apparatus.
- FIG 1 is an illustration of automatic test apparatus of the prior art.
- the apparatus comprises a wafer tester 100 and a wafer presentation system 160.
- Wafer tester 100 has an automatic test probe 155 controlled by a positioning mechanism 150 which operates under control of a tester controller mounted within the cabinet of the wafer tester.
- the tester controller incorporates a computer with an input device, such as keyboard 140, disc drives 130, and a visual display 120.
- the tester controller is loaded with software such as operating system 200 and tester control application software 210, both shown in Figure 2.
- the tester control application software controls the location of positioning axm.150 to place the automatic test probe 155 over the precise point on the wafer where tests are to be conducted.
- Wafers may be tested one at a time or positioned on a presentation mechanism 160, such as a carousel where wafers may be rotated sequentially to positions within the reach of positioning arm 150 and its probe.
- a presentation mechanism 160 such as a carousel where wafers may be rotated sequentially to positions within the reach of positioning arm 150 and its probe.
- Each wafer 170 contains a plurality of semiconductor devices, such as integrated circuits, each of which is to be tested.
- the tester controller sequences the test probe through the positions needed to make a test on each integrated circuit on the wafer.
- test results from the tester controller were printed and manual calculations were performed.
- test results were manually entered into a standard personal computer class device and the various calculations were calculated by the computer.
- the test results and calculation results were transferred to a central database. This increased the chance for error in data transfer.
- the problems of the prior art are overcome in accordance with the invention by providing a wafer tester with expanded functionality and by providing a network connection between one or more tester controllers and an organizational data base.
- one advantage of the invention resides in the ability to capture data, analyze data and to cause both the collected data and the results of the analysis to be entered into an organizational data base from a single device.
- Another advantage of the invention resides in the ability to retain raw measurement data with minimal effort and improved accuracy so that the raw data can be available for future calculations.
- Another advantage of the invention is that the calculation results as well as raw data are globally accessible throughout an organization over a network.
- Another advantage of the invention is the provision of a wafer tester with expanded functionality.
- Another advantage of the invention is the ability of one tester connected to a network to interact with and, if desirable, control other testers over the network.
- Another advantage resides in storing a computer program for implementing wafer testing in accordance with the invention on a computer readable diskette or memory.
- a wafer testing system having a network, a wafer tester with an automatic test probe and a tester controller connected to a network and a database connected to the network receiving test results from the wafer tester.
- the system includes analysis software on the tester controller for processing test results to derive a predicted lifetime for each integrated circuit on a wafer being tested. The results of the lifetime calculation are written to the database over the network.
- the system in accordance with one embodiment of the invention, implements a lifetime calculation as follows: Collecting breakdown voltages of capacitors at 2 stress conditions,
- X is the operating voltage of device being tested.
- a plurality of wafer testers may be connected to the network and each may monitor wafers containing different types of integrated circuits.
- the invention is also directed to a method of automatically testing integrated circuits fabricated on a wafer using a wafer tester by probing selected points on each integrated circuit of a wafer to measure one or more electrical values, storing the values with data identifying the integrated circuit and wafer at the wafer tester, processing the values to produce an estimate of lifetime for the integrated circuit at the wafer tester, and storing the estimate of lifetime together with the values at a location remote from the wafer tester over a network.
- the invention is also directed to a computer readable diskette or memory having stored thereon a computer program for implementing the method described immediately above.
- Figure 1 is an illustration of automatic test apparatus of the prior art.
- Figure la is a representation of a silicon wafer with certain integrated circuits fabricated thereon.
- Figure 2 is a representation of the software suite utilized with automatic test apparatus of the prior art.
- Figure 3 is a representation of the software suite of automatic test apparatus in accordance with the invention.
- Figure 4 is an illustration of a plurality of automatic test apparatus connected over a network to a common data base in accordance with the invention.
- Figure 5 is a flow chart of the processing of test data gathered by automatic test apparatus to produce a predicted lifetime.
- FIG. 6 is a flow chart of a lifetime calculation from a Voltage Ramp Dielectric Breakdown Voltage Test (VRDB). Best Mode for Carrying out the Invention
- a wafer tester such as that shown in Figure 1 as item 100 is modified to have additional "software and hardware compared to the prior art configuration.
- the wafer tester is one marketed by Keithley Instruments of Cleveland Ohio under model designation S900.
- the model S900 device is modified beyond the configuration shown in Figure 2 by integrating numerical analysis software such as that designated RSI and manufactured by Borland International of Scotts Valley, California.
- the test or hardware is modified by including a line card for connection to a network.
- the line card would, of course, be compatible with the network to which it is attached. Examples of networks suitable for handling communications between wafer testers and an organizational data base would include TCP/IP networks, token ring networks, and many other common digital or analog networks.
- Network access software utilized to drive the line card and facilitate communications across the network is, of course, loaded on to the system.
- Such software is shown in the software suite of Figure 3 as network access software 320.
- the numerical analysis software is shown in the same figure at 330.
- the installation and porting of the software to the network so as to permit access to the remote data base over the network is well known in the art and easily accomplished.
- Figure 4 illustrates a network arrangement in which multiple wafer testers modified in accordance with the invention are connected to ports on a network, which network also services data base 490.
- Each of wafer testers 400 and 400' is set up with the hardware and software complement described above.
- Network interface units 480 and 480 are shown symbolically in Figure 4 and although depicted separately are normally part of the network line card resident on the mother board of the wafer tester controller.
- Figure 5 is a flow chart of the processing of the data gathered by the automatic test apparatus.
- the automatic test probe is directed to take test measurements at (510) and store the results in the tester controller (520).
- one or more loop tests are conducted, depending on the order in which the tests are to be taken to ensure that all data is gathered. In one alternative, a single test is taken from each IC on the wafer prior to taking a different test from each IC on the wafer. In an another alternative, all tests for one IC are taken before moving to the next IC.
- the particular loop tests implemented at step 530 are those designed to implement the particular testing order desired.
- an analysis of the data runs is undertaken, lifetime calculations prepared and optionally trend charts generated. The raw data and the lifetime calculations are then stored in a remote data base, (550) and the procedure ends.
- a Voltage Ramp Dielectric Breakdown Voltage Test (VRDB) is used to evaluate the reliability of gate oxide. Voltage was ramped up at a step of 0.2 volt at 2 time intervals, 30 and 300 milliseconds, until the current reaches 10 miliamps, destructive breakdown. From the breakdown voltage shifts between the two time intervals, beta values and lifetimes are calculated in accordance with the following.
- Another calculation for lifetime can be based on the hot carrier injection test.
- the peak substrate current is measured for a fixed source to drain voltage (preferably the operating voltage of the devuce under test) as a function of a scanned gate voltage for N and P- channel devices.
- the algorithm for calculating lifetime using the hot carrier injection test is:
- Vt (threshold) fluence tests are used to investigate the charge trapping characteristics of transistors.
- a constant current of 1 nA is applied to a gate (positive) for 200 seconds.
- Vt is measured before the stress and at intervals of 20 seconds until 200 seconds have elapsed.
- N-channel and P-channel transistors with particular gate widths and gate lengths without diode protection on scribe line monitors are tested.
- the Vt shift is defined as the difference of Vt values after 200 second stressing, and Vt value prior to stressing.
- the preferred tests and variables measured or used by the automatic test equipment include: hot carrier injection (substrate currents at maximum gate voltage, average value, standard deviation, M factor (where the M factor equals I substrate /I drain ), and lifetimes (voltage ramp dialectic breakdown) breakdown voltages and destruction current level, average value, standard deviation, mode A%, B%, C%, beta value and lifetimes (V t fluence threshold voltages and its shifts) and isothermal test (actual time to fail, initial resistance, and lifetimes).
- hot carrier injection substrate currents at maximum gate voltage, average value, standard deviation, M factor (where the M factor equals I substrate /I drain )
- lifetimes voltage ramp dialectic breakdown
- the system described in this disclosure permits automated wafer level reliability test data analysis and calculations which offer greater flexibility and expanded functionality over that provided by the prior art.
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP96926832A EP0783705A1 (en) | 1995-07-31 | 1996-07-31 | Method and apparatus for automated wafer level testing and reliability data analysis |
JP9507875A JPH10507320A (en) | 1995-07-31 | 1996-07-31 | Method and apparatus for automated wafer level testing and reliability data analysis |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/509,362 | 1995-07-31 | ||
US08/509,362 US5822717A (en) | 1995-07-31 | 1995-07-31 | Method and apparatus for automated wafer level testing and reliability data analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1997005497A1 true WO1997005497A1 (en) | 1997-02-13 |
Family
ID=24026348
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1996/012533 WO1997005497A1 (en) | 1995-07-31 | 1996-07-31 | Method and apparatus for automated wafer level testing and reliability data analysis |
Country Status (5)
Country | Link |
---|---|
US (1) | US5822717A (en) |
EP (1) | EP0783705A1 (en) |
JP (1) | JPH10507320A (en) |
KR (1) | KR100404762B1 (en) |
WO (1) | WO1997005497A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2763716A1 (en) * | 1997-05-20 | 1998-11-27 | Samsung Electronics Co Ltd | CONTROL SYSTEM AND METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT TEST OPERATION |
TWI742865B (en) * | 2020-09-28 | 2021-10-11 | 蔚華科技股份有限公司 | Automatic testing machine with data processing function and its information processing method |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6446021B1 (en) * | 1998-02-27 | 2002-09-03 | Micron Technology, Inc. | Method and apparatus to display processing parameter |
US6424930B1 (en) * | 1999-04-23 | 2002-07-23 | Graeme G. Wood | Distributed processing system for component lifetime prediction |
US7337088B2 (en) * | 2001-05-23 | 2008-02-26 | Micron Technology, Inc. | Intelligent measurement modular semiconductor parametric test system |
KR100418523B1 (en) * | 2001-06-29 | 2004-02-11 | 삼성전자주식회사 | Equipment and method for monitoring implanter input parameter in semiconductor product device trerefor |
US7539591B2 (en) * | 2001-08-24 | 2009-05-26 | Vi Technology, Inc. | Enterprise test data management system utilizing hierarchical test data models and related methods |
US7113883B1 (en) * | 2001-08-24 | 2006-09-26 | Vi Technology, Inc. | Test configuration and data management system and associated method for enterprise test operations |
US7162386B2 (en) * | 2002-04-25 | 2007-01-09 | Micron Technology, Inc. | Dynamically adaptable semiconductor parametric testing |
US7010451B2 (en) * | 2003-04-17 | 2006-03-07 | Micron Technology, Inc. | Dynamic creation and modification of wafer test maps during wafer testing |
US6963215B1 (en) * | 2004-07-26 | 2005-11-08 | Agere Systems Inc. | Operation of semiconductor devices subject to hot carrier injection |
KR100633449B1 (en) | 2004-08-17 | 2006-10-13 | 주식회사 유니테스트 | System for interfacing semiconductor tester |
KR20060067055A (en) * | 2004-12-14 | 2006-06-19 | 삼성전자주식회사 | System and method for controlling tester remotely |
US8053257B2 (en) * | 2005-06-14 | 2011-11-08 | International Business Machines Corporation | Method for prediction of premature dielectric breakdown in a semiconductor |
US7274202B2 (en) * | 2005-10-07 | 2007-09-25 | Verigy (Singapore) Pte. Ltd. | Carousel device, system and method for electronic circuit tester |
JP4844101B2 (en) * | 2005-11-29 | 2011-12-28 | 株式会社Sumco | Semiconductor device evaluation method and semiconductor device manufacturing method |
US8316023B2 (en) * | 2009-07-31 | 2012-11-20 | The United States Of America As Represented By The Secretary Of The Navy | Data management system |
KR102038102B1 (en) * | 2013-03-07 | 2019-10-30 | 삼성디스플레이 주식회사 | Resistance measuring apparatus for inspecting compression quality and measuring method using the same |
US10019335B2 (en) * | 2014-08-29 | 2018-07-10 | Skyworks Solutions, Inc. | Systems and methods for processing test results |
Citations (3)
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JPH02114185A (en) * | 1988-10-24 | 1990-04-26 | Nissan Motor Co Ltd | Measuring apparatus of semiconductor |
US5298433A (en) * | 1990-12-27 | 1994-03-29 | Kabushiki Kaisha Toshiba | Method for testing semiconductor devices |
US5355320A (en) * | 1992-03-06 | 1994-10-11 | Vlsi Technology, Inc. | System for controlling an integrated product process for semiconductor wafers and packages |
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US4878179A (en) * | 1987-11-12 | 1989-10-31 | Rockwell International Corporation | Interactive diagnostic methodology and apparatus for microelectronic devices |
US5206582A (en) * | 1988-05-18 | 1993-04-27 | Hewlett-Packard Company | Control system for automated parametric test equipment |
US5390129A (en) * | 1992-07-06 | 1995-02-14 | Motay Electronics, Inc. | Universal burn-in driver system and method therefor |
US5557559A (en) * | 1992-07-06 | 1996-09-17 | Motay Electronics, Inc. | Universal burn-in driver system and method therefor |
US5475618A (en) * | 1993-01-28 | 1995-12-12 | Advanced Micro Devices | Apparatus and method for monitoring and controlling an ion implant device |
US5511005A (en) * | 1994-02-16 | 1996-04-23 | Ade Corporation | Wafer handling and processing system |
US5598341A (en) * | 1995-03-10 | 1997-01-28 | Advanced Micro Devices, Inc. | Real-time in-line defect disposition and yield forecasting system |
-
1995
- 1995-07-31 US US08/509,362 patent/US5822717A/en not_active Expired - Lifetime
-
1996
- 1996-07-31 WO PCT/US1996/012533 patent/WO1997005497A1/en not_active Application Discontinuation
- 1996-07-31 JP JP9507875A patent/JPH10507320A/en active Pending
- 1996-07-31 EP EP96926832A patent/EP0783705A1/en not_active Withdrawn
- 1996-07-31 KR KR1019970701982A patent/KR100404762B1/en not_active IP Right Cessation
Patent Citations (3)
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JPH02114185A (en) * | 1988-10-24 | 1990-04-26 | Nissan Motor Co Ltd | Measuring apparatus of semiconductor |
US5298433A (en) * | 1990-12-27 | 1994-03-29 | Kabushiki Kaisha Toshiba | Method for testing semiconductor devices |
US5355320A (en) * | 1992-03-06 | 1994-10-11 | Vlsi Technology, Inc. | System for controlling an integrated product process for semiconductor wafers and packages |
Non-Patent Citations (2)
Title |
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PATENT ABSTRACTS OF JAPAN vol. 14, no. 333 (P - 1078) 18 July 1990 (1990-07-18) * |
STRATFORD: "NETWORKED AUTOMATIC TEST EQUIPMENT IMPROVES MANUFACTURING EFFICIENCY", EDN ELECTRICAL DESIGN NEWS, vol. 28, no. 5, March 1983 (1983-03-01), NEWTON, MASSACHUSETTS US, pages 47 - 56, XP002018217 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2763716A1 (en) * | 1997-05-20 | 1998-11-27 | Samsung Electronics Co Ltd | CONTROL SYSTEM AND METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT TEST OPERATION |
US6055463A (en) * | 1997-05-20 | 2000-04-25 | Samsung Electronics Co. Ltd. | Control system and method for semiconductor integrated circuit test process |
TWI742865B (en) * | 2020-09-28 | 2021-10-11 | 蔚華科技股份有限公司 | Automatic testing machine with data processing function and its information processing method |
Also Published As
Publication number | Publication date |
---|---|
EP0783705A1 (en) | 1997-07-16 |
US5822717A (en) | 1998-10-13 |
JPH10507320A (en) | 1998-07-14 |
KR970706506A (en) | 1997-11-03 |
KR100404762B1 (en) | 2004-02-14 |
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