WO1995002859A1 - Optimization circuit - Google Patents
Optimization circuit Download PDFInfo
- Publication number
- WO1995002859A1 WO1995002859A1 PCT/CA1994/000378 CA9400378W WO9502859A1 WO 1995002859 A1 WO1995002859 A1 WO 1995002859A1 CA 9400378 W CA9400378 W CA 9400378W WO 9502859 A1 WO9502859 A1 WO 9502859A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- voltage
- semiconductor device
- active semiconductor
- breakdown
- reference component
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
- H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
- H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits
Definitions
- This invention relates to an optimization circuit for use with an active semi-conductor device, such as a MOS or CMOS field effect transistor circuit.
- guard banding has been employed to distance the circuit operating conditions from the minimum breakdown voltage but inevitably speed performance is adversely affected. There is a trade-off between performance and reject rate. The smaller the guard band, the better the performance but the higher the reject rate. In the production of any semi-conductor device, the objective is to obtain the lowest reject rate, or highest yield, possible.
- the object of the invention is to alleviate the aforementioned problems.
- a method of improving the performance of an active semiconductor device with a voltage-controllable channel length comprising providing a matched reference component having similar operating characteristics to said active semiconductor device, continually monitoring the breakdown voltage of said matched reference component, and maintaining the operating voltage of said active semiconductor device to lie just below the measured breakdown voltage of said matched reference component .
- the invention can be applied to any electrical circuit which has well matched active components.
- the operating voltage can be set by a linear voltage control circuit comprising an amplifier and a power transistor forming a pass element.
- the function of the pass element is to reduce the voltage to a value of V 0 below the reference device breakdown voltage.
- the same technique can be used or an operational amplifier can be used to buffer the reference voltage, with the required voltage drop being obtained from a level shifting circuit .
- the reference device is preferably maintained in close physical proximity on the same circuit to the active device. As a result, the reference component is influenced by the same external factors as the active component and consequently its breakdown voltage varies in a similar fashion.
- a small current is forced through the reference component with a current limiting device to cause it to breakdown, and the breakdown voltage is then presented to an input of an operational amplifier, which at its output provides a control voltage.
- the invention provides an optimization circuit comprising an active semiconductor device having a channel with an identifiable breakdown voltage, a voltage regulator for applying a desired output voltage to said device, said output voltage determining the length of said channel, a matched reference component having similar operating characteristics to said active device, means for continually monitoring the breakdown voltage of said matched reference component, and means for adjusting the voltage applied to said device by said voltage regulator to maintain the output voltage of said device at a level just below that at which breakdown occurs.
- the described circuit has the advantage that each semi-conductor device is operated as close as possible to the optimum breakdown voltage without actually causing breakdown. As a result, regardless of processing variations, the circuit will always operate very close to the maximum possible speed.
- FIG. 1 is a generalized block diagram of an optimization circuit in accordance with the invention.
- Figure 2 is a circuit detail of a specific implementation of an optimization circuit, in which the reference device is designed to breakdown at a voltage lower than the active circuit devices so as to eliminate the need for a pass element.
- an unregulated input voltage V is applied to a pass element 1 and current limiter 2.
- the current limiter 2 forces a small current through matched reference component 3, causing it to break down.
- the matched reference component 3 is chosen to have operating characteristics as close as possible to an active channel device 4, such as a CMOS FET.
- the matched component 3 is also placed in close physical proximity to the device 4 so as to be influenced by the same external factors.
- the matched reference component therefore behaves in the same manner as the active device 4.
- the breakdown voltage db of the matched reference component 3 is continually presented to a non-inverting input of operational amplifier 5 having an inverting input connected to the mid-point of a potential divider formed by resistors 6, 7.
- the output of operational amplifier 5 is connected to pass element 1.
- the operational amplifier 5 is connected as a voltage regulator in which the potential divider can be adjusted to set the voltage Vo' to be close to the matched refer-" e voltage.
- Level shifter 8 then sets the voltage drop t. a value Vo, which is just below the breakdown voltage of the frequency limiting circuitry.
- Figure 2 shows a more detailed implementation of the optimization circuit.
- the reference circuit comprising a reference MOS F ⁇ T 11 connected in series with a load 14, which may be a resistor or MOS transistor, for supplying a small current to the reference MOS FET 11.
- the small reduction in channel length ⁇ ensures that the reference device breaks down at a slightly lower voltage than the active circuit devices. This arrangement eliminates the need for a pass element or level shifting circuit, but the matching characteristics still remain very good.
- Operational amplifier 5 has transistors with a channel length L > L a .
- the active circuit has a first set of non-critical transistors (not shown) that are operated with channel lengths L such that L > L a ⁇ and these transistors are supplied by the external supply 13.
- a second set of critical transistors (not shown) are operated with channel lengths L a , and these are supplied by the output of the operational amplifier 5, which has one input connected to the reference MOSFET 11.
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Amplifiers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/583,114 US5684390A (en) | 1993-07-16 | 1994-07-13 | Active semiconductor device with matched reference component maintained in breakdown mode |
JP7504257A JPH09509267A (en) | 1993-07-16 | 1994-07-13 | Optimization circuit |
EP94921556A EP0708939B1 (en) | 1993-07-16 | 1994-07-13 | Optimization circuit |
DE69403661T DE69403661T2 (en) | 1993-07-16 | 1994-07-13 | OPTIMIZATION CIRCUIT |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA2,100,727 | 1993-07-16 | ||
CA002100727A CA2100727C (en) | 1993-07-16 | 1993-07-16 | Optimization circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1995002859A1 true WO1995002859A1 (en) | 1995-01-26 |
Family
ID=4151938
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CA1994/000378 WO1995002859A1 (en) | 1993-07-16 | 1994-07-13 | Optimization circuit |
Country Status (6)
Country | Link |
---|---|
US (1) | US5684390A (en) |
EP (1) | EP0708939B1 (en) |
JP (1) | JPH09509267A (en) |
CA (1) | CA2100727C (en) |
DE (1) | DE69403661T2 (en) |
WO (1) | WO1995002859A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1595151B1 (en) * | 2003-02-12 | 2006-06-14 | Koninklijke Philips Electronics N.V. | Current monitoring system using bi-directional current sensor |
CN100412753C (en) * | 2004-11-20 | 2008-08-20 | 鸿富锦精密工业(深圳)有限公司 | Circuit for producing operating voltage of host board chip set |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2292280A1 (en) * | 1974-11-21 | 1976-06-18 | Ibm | COMPENSATOR IN LSI TECHNOLOGY TO REMEDY FOR VARIATIONS IN CERTAIN PARAMETERS DUE TO THE MANUFACTURING PROCESS |
GB2146145A (en) * | 1983-08-31 | 1985-04-11 | Nat Semiconductor Corp | Internal high voltage regulator for integrated circuits |
EP0214899A1 (en) * | 1985-08-16 | 1987-03-18 | Fujitsu Limited | Semiconductor device having means for regulating power supply voltage applied thereto |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4158804A (en) * | 1977-08-10 | 1979-06-19 | General Electric Company | MOSFET Reference voltage circuit |
US4260946A (en) * | 1979-03-22 | 1981-04-07 | Rca Corporation | Reference voltage circuit using nested diode means |
DE3341345C2 (en) * | 1983-11-15 | 1987-01-02 | SGS-ATES Deutschland Halbleiter-Bauelemente GmbH, 8018 Grafing | Longitudinal voltage regulator |
JP2851754B2 (en) * | 1992-07-31 | 1999-01-27 | シャープ株式会社 | Semiconductor integrated circuit for stabilized power supply circuit |
US5548205A (en) * | 1993-11-24 | 1996-08-20 | National Semiconductor Corporation | Method and circuit for control of saturation current in voltage regulators |
-
1993
- 1993-07-16 CA CA002100727A patent/CA2100727C/en not_active Expired - Fee Related
-
1994
- 1994-07-13 JP JP7504257A patent/JPH09509267A/en active Pending
- 1994-07-13 DE DE69403661T patent/DE69403661T2/en not_active Expired - Fee Related
- 1994-07-13 WO PCT/CA1994/000378 patent/WO1995002859A1/en active IP Right Grant
- 1994-07-13 US US08/583,114 patent/US5684390A/en not_active Expired - Fee Related
- 1994-07-13 EP EP94921556A patent/EP0708939B1/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2292280A1 (en) * | 1974-11-21 | 1976-06-18 | Ibm | COMPENSATOR IN LSI TECHNOLOGY TO REMEDY FOR VARIATIONS IN CERTAIN PARAMETERS DUE TO THE MANUFACTURING PROCESS |
GB2146145A (en) * | 1983-08-31 | 1985-04-11 | Nat Semiconductor Corp | Internal high voltage regulator for integrated circuits |
EP0214899A1 (en) * | 1985-08-16 | 1987-03-18 | Fujitsu Limited | Semiconductor device having means for regulating power supply voltage applied thereto |
Also Published As
Publication number | Publication date |
---|---|
DE69403661D1 (en) | 1997-07-10 |
JPH09509267A (en) | 1997-09-16 |
CA2100727C (en) | 2001-06-12 |
DE69403661T2 (en) | 1998-01-02 |
US5684390A (en) | 1997-11-04 |
EP0708939A1 (en) | 1996-05-01 |
EP0708939B1 (en) | 1997-06-04 |
CA2100727A1 (en) | 1995-01-17 |
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