WO1991006211A1 - Method of and device for detecting crack in eggshell - Google Patents

Method of and device for detecting crack in eggshell Download PDF

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Publication number
WO1991006211A1
WO1991006211A1 PCT/JP1990/001065 JP9001065W WO9106211A1 WO 1991006211 A1 WO1991006211 A1 WO 1991006211A1 JP 9001065 W JP9001065 W JP 9001065W WO 9106211 A1 WO9106211 A1 WO 9106211A1
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WO
WIPO (PCT)
Prior art keywords
egg
impact
cracks
signal
given surface
Prior art date
Application number
PCT/JP1990/001065
Other languages
French (fr)
Japanese (ja)
Inventor
Kunio Nambu
Jakuho Kiyota
Original Assignee
Nambu Electric Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1288197A external-priority patent/JPH03147724A/en
Application filed by Nambu Electric Co., Ltd. filed Critical Nambu Electric Co., Ltd.
Publication of WO1991006211A1 publication Critical patent/WO1991006211A1/en

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Classifications

    • AHUMAN NECESSITIES
    • A01AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01KANIMAL HUSBANDRY; AVICULTURE; APICULTURE; PISCICULTURE; FISHING; REARING OR BREEDING ANIMALS, NOT OTHERWISE PROVIDED FOR; NEW BREEDS OF ANIMALS
    • A01K43/00Testing, sorting or cleaning eggs ; Conveying devices ; Pick-up devices
    • AHUMAN NECESSITIES
    • A01AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01KANIMAL HUSBANDRY; AVICULTURE; APICULTURE; PISCICULTURE; FISHING; REARING OR BREEDING ANIMALS, NOT OTHERWISE PROVIDED FOR; NEW BREEDS OF ANIMALS
    • A01K43/00Testing, sorting or cleaning eggs ; Conveying devices ; Pick-up devices
    • A01K43/04Grading eggs

Definitions

  • the present invention seeks a method and apparatus for detecting cracks in an egg shell.
  • a device for detecting cracks disclosed in US Pat.No. 3,744,229 applies an egg to a semicircular button connected to a piezoelectric crystal, and vibrates the piezoelectric crystal, which can be achieved at this time. Eggs and cracks are detected from the electrical signals generated.
  • means such as image processing makes the device complicated and hard to detect fine cracks, which is not very satisfactory.
  • the present invention has been made in view of the above-mentioned points, and an object of the present invention is to provide a method and a device capable of reliably detecting cracks at a plurality of locations of one egg shell. It is in .
  • Another object of the present invention is to provide a method and an apparatus for reliably detecting a crack in an egg shell without causing a new crack in the egg shell.
  • Another object of the present invention is to provide a method and an apparatus for easily detecting cracks all around the shell of an egg. Disclosure of the invention
  • the egg is rolled and moved by its own weight.
  • the eggs are dropped at a plurality of locations, and in each of the drops, the eggs collide with a given surface, and the impact generated on the surface due to the collision is sensed, and the egg shell is detected from the sensed impact.
  • a method is provided for detecting cracks in cracks.
  • the egg is dropped at a fixed position a plurality of times while rolling the egg at the fixed position, and the egg is caused to collide with a given surface in each of the drops.
  • a method is provided for sensing and detecting cracks in an egg shell from the sensed impact.
  • the eggs are transported while being forcibly rolled, and the eggs transported while being rolled are dropped a plurality of times during the transport so that the eggs collide with the given surface a plurality of times.
  • the egg that is rolling due to its own weight is dropped at a plurality of sites while maintaining the rolling movement of the egg, and the egg collides with a given surface a plurality of times.
  • Means for receiving an impact means for sensing an impact resulting from the impact of the egg on a given surface in the means for receiving the impact, and a method for detecting the impact of the egg by means of the impact sensing signal sent from the sensing means.
  • An apparatus for detecting cracks in an egg shell comprising: means for determining the presence or absence of cracks.
  • the eggs are transported because the eggs cannot be forcibly rolled.
  • An apparatus for detecting cracks in an egg shell comprising: means for determining.
  • the egg is dropped at a fixed position a plurality of times while rolling the egg at the fixed position, and in each of the drops, the egg is collided with a given surface, and a means for receiving an impact by the collision is provided.
  • An apparatus for detecting cracks in an egg shell comprising: means for determining nothing.
  • the crack of the egg shell referred to in the present invention is a case of an egg in a state where the contents are contained therein. This refers to cracks in the egg shell and the collapse of a part of the egg shell that can be seen.
  • FIG. 1 is a sectional view taken along the line II of FIG. 2 of a preferred embodiment of the present invention
  • FIG. 2 is a perspective view of the specific example shown in FIG. 1,
  • Fig. 3 is a partially detailed electric circuit diagram of the device for determining the presence or absence of cracks in the eggshell shown in Fig. 1,
  • FIG. 4 is a detailed electric circuit diagram of another part of the determination device shown in FIG. 1,
  • FIG. 5 is a detailed electrical circuit diagram of the rest of the determination device shown in FIG. 1,
  • FIG. 6 is an explanatory diagram of electric signals output from the filter shown in FIG. 3, in which the horizontal axis indicates time, the vertical axis indicates voltage, and FIG. 7 is FIG. 3 to FIG.
  • FIG. 8 shows another preferred embodiment of the present invention in FIG.
  • FIG. 9 is a perspective view of the specific example shown in FIG. 8,
  • FIG. 10 is a cross-sectional view of a preferred third embodiment of the present invention
  • FIG. 11 is a cross-sectional view of a modification of the embodiment shown in FIG. 10
  • FIG. FIG. 13 of the preferred fourth embodiment, shown in FIG. FIG. 13 is a perspective view of the specific example shown in FIG. 12,
  • FIG. 14 is a sectional view of a fifth preferred embodiment of the present invention
  • FIG. 15 is a perspective view of a sixth preferred embodiment of the present invention
  • FIG. 16 is a preferred embodiment of the present invention. It is a top view of the new 7th example.
  • an elastic member 2 is provided on a base 1, and an impact body 3 is provided on the elastic member 2.
  • the impact body 3 made of a single member is elastically fixed to the base 1 via an elastic member 2 by means of a countersunk screw 4 or the like.
  • the degree of tightening of the impact body 3 to the base 1 by the flathead screw 4 is such that an electric signal described later can be obtained.
  • the upper surface of the impact body 3 is formed with five planes 6 connected via a step 5.
  • the height of the step 5 is between 1 mm and 1.5 mm in a preferred embodiment.
  • the substantially horizontal plane 6 is formed with a sufficient area so that the egg 8 does not jump over the flat plane 6 in the direction 9 due to its own weight. Thus, the plane 6 acts as a rolling bed for the egg 8 in the movement of the egg 8 in the direction 9.
  • a shock sensor 12 such as a piezoelectric acceleration pickup is attached to the back surface 10 facing the plane 6 of the impact body 3, and the egg 8 thus formed keeps rolling movement due to its own weight.
  • the egg 8 is dropped at a plurality of locations while holding the egg 8 and collided with the egg 8 a plurality of times on a given surface, and a means for receiving an impact due to the collision is a combination of the base 1, the elastic member 2, and the impact body 3.
  • the eggs 8 are arranged, for example, between a feeding conveyor 16 for eggs 8 and a receiving conveyor 17 for eggs 8.
  • the electric signal obtained from the shock detector 12 is supplied to a device 21 for determining whether or not the shell of the egg 8 has cracked from the electric signal. Details of the decision device 21 are shown in FIGS. 3 to 5.
  • an amplifier 24 that receives an electric signal from the impact detector 12 via terminals 22 and 23 amplifies the received signal and supplies it to a low-pass filter 25.
  • the filter 25 has, for example, a cut-off frequency of 5 kHz, and removes high-frequency noise such as a signal component based on mechanical resonance of the impact body 3 or the like from a supplied signal. .
  • the output terminal of the filter 25 detects the first peak of the signal from the filter 25 and holds a peak level L1 of the detection circuit 26 and the signal from the filter 25.
  • the detection circuit 27 detects the second peak following the first peak and holds the peak level L2, and the signal from the filter 25 from the first zero level to the next zero level It is connected to the time interval measuring circuit 28 that measures the time interval T of and holds the signal corresponding to the time interval T.
  • the output terminal of the amplifier 29 composed of an operational amplifier in which the non-inverting input terminal is connected to the output terminal of the filter 25 is composed of the diodes 30 and 31 and the resistor 32. Connected to the input terminal of the analog switch 33 via a positive rectifier circuit. The inverting input terminal of the amplifier 29 is connected to the diode 30 and one end of the resistor 32.
  • the output terminal of the analog switch 33 is connected to one end of each of the resistor 34 and the capacitor 35 and to the non-inverting input terminal of an amplifier 36 composed of an operational amplifier.
  • the amplifier 36 has a resistor 37 connected between an inverting input terminal and an output terminal of the amplifier 36, and is formed as a voltage follower type.
  • the other end of the resistor 34 is connected to one end of the analog switch 38, and the other end of the analog switch 38 and the other end of the capacitor 35 are grounded.
  • the output terminal of the amplifier 47 composed of an operational amplifier in which the non-inverting input terminal is connected to the output terminal of the filter 25 is connected to the diodes 48, 49 and the resistor 50. It is connected to the input terminal of analog switch 51 via a negative rectifier circuit.
  • the inverting input terminal of the amplifier 47 is connected to the diode 48 and one end of the resistor 50.
  • An output terminal of the analog switch 51 is connected to one end of each of the resistor 52 and the capacitor 53 and a non-inverting input terminal of an amplifier 54 composed of an operational amplifier.
  • Amplifier 54 It has a resistor 55 connected between the inverting input terminal and the output terminal of the resistor 54 and is formed of a voltage follower tire.
  • the other end of the resistor 52 is connected to one end of an analog switch 56, the other end of the analog switch 56 is connected to a positive DC power source 57, and The other end of 3 is grounded.
  • the non-inverting input terminal is connected to the output terminal of the filter 25 via the resistor 66.
  • the inverting input terminal of the amplifier 67 composed of an operational amplifier is a voltage dividing resistor.
  • the other end of the resistor 68 is connected to the positive DC power supply 71, and the other end of the resistor 69 is grounded.
  • the output terminal of the amplifier 67 is connected to its own non-inverting input terminal via a resistor 70 so that the amplifier 67 has a hysteresis characteristic, while one input terminal of the AND gate 72 is provided. Connected to terminal.
  • the output terminal of the gate 72 is connected to the control terminal of the analog switch 73.
  • the output terminal of the analog switch 73 whose input terminal is connected to the positive DC power supply 74 is connected to the other end of the capacitor 77 whose one end is grounded via the resistor 75 via the resistor 75. They are connected to the non-inverting input terminals of the amplifiers 78, respectively.
  • One end of the resistor 76 is connected to the other end of the analog switch 79 whose one end is grounded.
  • the other end of the resistor 80 whose one end is grounded is connected to one end of the resistor 81 and the inversion of the amplifier 78. Each is connected to an input terminal.
  • the other end of the resistor 81 which is a feedback resistor, is connected to the output terminal of the amplifier 78.
  • control signal generation circuit 39 which receives signals from the output terminals of the filter 25 and the gate 72 defines a detection period of the first peak level from the received signals. A signal is generated and supplied to the control terminal of the analog switch 33.
  • control signal generation circuit 58 that receives signals from the output terminals of the filter 25 and the gate 72 defines the detection period of the second peak level from these received signals. A signal is generated and supplied to the control terminal of the analog switch 51.
  • an inspection circuit for detecting whether the ratio of the level L1 of the signal obtained from the amplifier 36 to the level L2 of the signal obtained from the amplifier 54 is larger or smaller than a preset value.
  • 9 1 is a resistor 9 2 having one end connected to the output terminal of the amplifier 54, and resistors 9 3 and 9 4 having one end connected to the output terminal of the amplifier 36 and resistors 9 2 and 9 3.
  • Non-inverting input to the other end of the amplifier 95 with one end connected to the other end of the resistor 94 and the other end of the resistor 96 and the resistor 94 connected to the other end It consists of an amplifier 97 connected to its terminals.
  • the output terminal of the amplifier 95 is connected to its own inverting input terminal and the amplifier 9 7 Inverting input terminal and connected to.
  • the amplifier 97 has the formula: 1 + X then 2Y-X so,
  • the logical signal 0 is converted to the ratio L If the value of 1 ZL 2 is smaller than the value of (1 + X) / (Y-X), a logical signal 1 is output.
  • the amplifier 100 is connected to the output terminal of the amplifier 78. Assuming that the respective values of the resistors 98 and 99 are R98 and R99, the amplifier 100
  • the logic signal 0 is applied and the ratio L1ZLT is calculated as (R9810R99). If the value is smaller than the value of ZR99, a logical signal 1 is output.
  • a resistor 1 having one end connected to a positive DC power supply 102 is connected.
  • the other end of 03 is connected to the other end of the resistor 104 whose one end is grounded and the inverting input terminal of the amplifier 105, respectively.
  • the non-inverting input terminal of the amplifier 105 is The amplifier 78 is connected to the output terminal.
  • Resistors 103, 104 and DC power supply 10 Assuming that the respective values of the power supply voltage of R 2 are R l 03, R 104 and E, the amplifier 105
  • a resistor whose one end is connected to a positive DC power supply 107 is provided.
  • the other end of 108 is connected to the other end of the resistor 109 whose one end is grounded and the inverting input terminal of the amplifier 110, respectively, and the non-inverting input terminal of the amplifier 110 is connected. Is connected to the output terminal of the amplifier 36.
  • the values of the power supply voltages of the resistors 108 and 109 and the DC power supply 107 are R108, R109 and E, the amplifier 110
  • a resistor 1 connected at one end to a negative DC power supply 1 1 2
  • the other end of 13 is connected to the other end of resistor 114 whose one end is grounded and the non-inverting input terminal of amplifier 115, respectively.
  • the inverting input terminal of amplifier 115 is connected to the amplifier. 54 Connected to output terminal 4. Assuming that the respective values of the power supply voltages of the resistors 1 13, 1 14 and the DC power supply 1 12 are Rl 13, R 1 14 and E, the amplifier 1 15
  • the logical signal 0 is changed to the level L2 If is less than the value of R114 / (R113 + R114) XE, the logic signal 1 is output.
  • the D terminal D1 of the flip-flop circuit 122 in which five D-type flip-flop circuits are assembled, is connected to the output terminal of the amplifier 97, and The D terminal D 2 of the flip-flop circuit 122 is connected to the output terminal of the amplifier 100, and the D terminal D 3 of the flip-flop circuit 122 is connected to the amplifier 100.
  • the 0 terminal 04 of the flip-flop circuit 12 is connected to the output terminal of the amplifier 11 and the flip-flop circuit 12 2
  • the D terminal D5 of the flip-flop circuit 122 is connected to the output terminal of the amplifier 115, and the clock terminal C of the flip-flop circuit 122 is connected to the control signal generation circuit 58 of the detection circuit 27. Connected to output terminal.
  • the Q output terminals Q1 to Q5 of the flip-flop circuit 122 are connected to one input terminal of the exclusive OR gates 123 to 127, respectively.
  • the other input terminals of 123 to 127 are respectively connected to one terminal of switches 130 to 134 connected to the positive DC power supply 129 via the resistor 128.
  • Switch 130
  • the other terminal of 134 is grounded.
  • the output terminals of the exclusive OR gates 123 to 127 are connected to one end of the light emitting diodes 140 to 144 for confirming the individual test results and the OR gate 1 via switches 13 to 13.
  • the other ends of the light emitting diodes 140 to 144 are connected to the other end of a resistor array 144 whose one end is grounded. Have been.
  • the output terminal of OR gate 145 is connected to one end of the light emitting diode 147 for confirming the comprehensive inspection result and the output terminal 148 of the decision device 21.
  • the other end of the current limiting resistor 149 having one end grounded is connected to one end.
  • the output terminal 148 is connected to a known cracked egg ejection mechanism (not shown), and the cracked egg ejection mechanism is based on a determination result signal obtained at the output terminal 148. Then, the cracked eggs 8 arriving at the receiving conveyor 17 are discharged.
  • the egg 8 passes through the delivery conveyor 16 and the first to fourth planes 6 while rolling by its own weight.
  • the other end of the resistor 15 3 is connected to the positive DC power supply 15 5, and the other end of the capacitor 15 4 is connected to one end of the positive DC power supply 15 5.
  • the other end of the resistor 157 connected to 6 and the input terminal of the inverter 158 forming a Schmitt trigger circuit having hysteresis characteristics.
  • the output terminal of the inverter 158 is connected to the clock terminal C of each of the D tire flip-flop circuits 159 and 160, and the flip-flop circuits 159 and 1 60 D terminal is positive Connected to power supply 1 6 1 and clamped to logic 1.
  • the Q terminal of the flip-flop circuit 1559 is connected to the control terminals of the detectors 26 and 27 and the analog D-switches 38, 56 and 79 of the time interval measurement circuit 28.
  • the Q terminal of the flicker flop circuit 160 is connected to the other input terminal of the AND gate 72 of the time interval measuring circuit 28.
  • the reset terminal R of the flip-flop circuit 160 is connected to the output terminal of the control signal generation circuit 58 of the detection circuit 27.
  • the input terminal is connected to the output terminal of the AND gate 72.
  • the output terminal of the connected inverter 163 is connected to the reset terminal R of the flip-flop circuit 159.
  • a pulse signal from a detector (not shown) for detecting this is given.
  • 21 0 is the terminal 15 1, Canon. It is supplied to the clock terminal C of the flip-flop circuits 159 and 160 via the inverter 154 and the inverter 158.
  • the Q terminal of the flip-flop circuit 159 generates a signal 2 11 of logic 1 and the Q terminal of the flip-flop circuit 16 0 outputs the signal 2 1 of logic 1 Signal 2 11, the analog switches 3 8 5 6 and 7 9 are turned on by the signal 2 1 1, and the charges on the capacitors 3 5 5 6 and 7 7 turn on resistors 34, 52 and 7 6 While one of the input terminals of gate 72 is set to a logic one by signal 211. The other input terminal of get 72 is At this point, since the output is at logic 0, the output terminal of the gate 72 outputs a signal of logic 0, and thus the analog switch 73 is in the off state. While not supplied to one terminal of the capacitor 77 through 75, the control signal generation circuits 39 and 58 output a logical 0 signal, and as a result, the analog switches 33 and 51 It is set to off.
  • the impact body 3 When the egg 8 rolling in its own weight and moving in the direction 9 falls on the -th flat surface 6, the impact body 3 receives the impact of the fall of the egg 8, and the impact sensors 12 And generates an electrical signal.
  • This electric signal is supplied to the amplifiers 29 and 47 as the signal 201 or 202 via the amplifier 24 and the filter 25, and is also supplied to the amplifier via the resistor 66. 67, and further to control signal generation circuits 39 and 58.
  • the output terminal of the amplifier 67 becomes logic 1 and the gate is thereby turned on.
  • the output terminal of 72 also generates the signal 2 13 of logic 1, and as a result, the analog switch 73 is set to the on state, while the flip-flop circuit 159 is reset. .
  • the reset of the flip-flop circuit 159 causes the signal 2 11 of logic 1 to disappear, and the analog ⁇ switches 38, 56, and 79 to be turned off.
  • a logic 1 signal 2 1 3 is generated from the output terminal of gate 7 2.
  • the control signal generating circuit 39 receiving this outputs a signal 2 14 of logic 1 to the output terminal, whereby the analog switch 33 is set to the ON state, and the capacitor 35 Is charged with the voltage of the positive portion of the signal 201 or 202 supplied through the amplifier 29 and the diode 31, and this voltage is sequentially output from the amplifier 36.
  • the control signal generator 39 observes the signal 201 or 202, detects the arrival of the first peak level in the signal 201 or 202, and detects the time t.
  • the first peak level is detected in 2
  • the analog switch 33 is turned off, and as a result, canon.
  • the shifter 35 holds the voltage of the peak level L 1 of the signal 201 or 202.
  • the control signal generation circuit 58 After receiving the signal 2 13, the control signal generation circuit 58 observes the signal 201 or 202, detects the arrival of the first peak level in the signal 201 or 202, and detects the time t 2 When this first peak level is detected, a signal 2 15 of logic 1 is transmitted. As a result, the analog switch 51 receiving the signal 2 15 of the logic 1 is turned on, and the analog switch 56 is set to the off state after the time t1, so that the capacitor 53 is connected to the amplifier 53. It is charged with the voltage of the negative part of the signal 201 or 202 supplied via the diode 47 and the diode 49, and this voltage is output in turn via the amplifier 54.
  • Control signal generation After sending out the signal 2 15, the circuit 58 observes the signal 201 or 202 further, and detects the next peak level in the signal 201 or 202 (the signal 201 or 200 2 shown in the figure). In this case, the arrival of the first negative peak level) is detected, and when this peak level is detected at time t4, the transmission of the logic 1 signal 215 is stopped. With the disappearance of the signal 215, the analog switch 51 is turned off, so that the channel 53 holds the voltage of the second peak level L2 of the signal 201 or 202.
  • the capacitor 777 is turned on by the voltage of the DC power supply 74 to output the signal 201 or 20. 2 is charged again up to the voltage specified by the resistors 68 and 69, that is, until the amplifier 67 outputs a signal of logic 0 and the signal 2 13 disappears at time t3. Therefore, the period during which the signal 2 13 occurs corresponds to the time interval T, and the capacitor 77 charges the voltage of the DC power supply 74 for the time interval T, and as a result, is sent to the output terminal of the amplifier 78.
  • the voltage level has a value LT proportional to the time interval.
  • the flip-flop circuit '12 2 to which the signal 215 is supplied is connected to the amplifier 97, which is supplied to the D terminals D 1 to D 5 at the time t 4 when the signal 215 disappears,
  • the operation result signals from 100, 105, 110, and 115 are stored and output to the Q1 to Q5 terminals, respectively.
  • the flip-flop circuit 160 to which the signal 2 15 is supplied is connected to the signal 2 1
  • the signal is reset at the time point t4 when the disappearance of 5, and the transmission of the signal 2 12 from the Q terminal is stopped.
  • one input terminal of the gate 72 becomes logic 0.
  • the signals generated at the Q terminals Q1 to Q5 of the flip-flop D-pump circuit 122 are fed to the egg discharge mechanism (not shown) via the exclusive OR gates 123 to 127 and the OR gate 144. Therefore, when at least one signal of logic 1 is received at time t4 at the D terminal of the flip-flop circuit 122, it is treated as a cracked egg by the egg ejector ellipse. I do.
  • the signal 210 is again supplied to the terminal 151, and The same operation is repeated, and this operation is performed until the egg 8 passes through the fifth plane 6 while rolling under its own weight.
  • the egg ejection mechanism observes the output signal of OR gate 144 until the operation up to the fifth for one egg 8 is completed, and outputs at least one logical 1 signal to OR gate 14 5 , The shell of the egg 8 is discharged as having cracks. The occurrence of logic 1 can be visually observed with diodes 140 to 144 and 1407.
  • the present invention is not limited to this.
  • five individual substantially rectangular parallelepiped bodies 301 were prepared, and 0 1 is attached to the base 300 having a step 302 via a separate elastic member 310, and each plane 300 of each impact body 301 is connected to the base 300 via a step 330.
  • the impact means may be formed so that the impact bodies 301 are individually subjected to impact by arranging them in this case.
  • each of the impact sensors 309 is connected to each of the impact bodies 3 opposed to the flat surface 306.
  • the electric signal of the impact detector 309 is supplied to the amplifier 24 of the determination device 21.
  • each electric signal from the shock detector 309 may be supplied to the amplifier 24 via the buffer amplifier 310.
  • the plane 6 or 30 6 does not need to be arranged horizontally, and may be arranged so as to descend in the moving direction 9 of the egg 8. As a result, the rolling movement is ensured.
  • the egg 8 was dropped at a plurality of different sites while maintaining the rolling movement of the egg 8, but the present invention is not limited to this.
  • a polygon 3 2 2 having a plane 3 2 1 connected via a step 3 2 0 is prepared, and a shock sensor 3 is provided in the center hole 3 2 3 of the polygon 3 2 2 facing the plane 3 2 1.
  • All the polygons 3 2 2 are attached to the rotating shaft 3 2 6 via the elastic members 3 2 5 to form an impinging means, and the polygon 3 2 2 is rotated by the rotation 3 2 7 in the direction of the rotating shaft 3 2 6.
  • the movement preventing members 328 and 329 are arranged on both sides of the polygonal body 322 so that the egg 8 does not move.
  • a plurality of impact sensors 3 24 are mounted on the impact body 32 2, but instead of this, as shown in FIG.
  • the impact sensor 3 3 1 may be attached to the 3 3 6 bearing 3 3 0, and the bearing 3 3 0 may be attached to the base 3 3 3 via the elastic member 3 3 2 .
  • the rotating shaft 3 26 and the impacting body 322 can be directly connected to each other through the center hole 3233 of the impacting body 322 without passing through the elastic member 325.
  • the energy of the falling of the egg 8 is used to move the egg 8, but as shown in FIGS. 12 and 13, the endless chain 3 40
  • the egg 8 is forcibly moved while being rolled in the direction 9 by a conveying device 342 comprising a pair of rollers 341, which are attached to the endless chain 3410 so as to be parallel to each other.
  • a conveying device 342 comprising a pair of rollers 341, which are attached to the endless chain 3410 so as to be parallel to each other.
  • each impact body 345 supported by the base 3443 via the elastic member 3444 is tilted and disposed at almost the same position, Up
  • Up The plane 346 may be set so as to become a slope, and a step 347 may be formed by this.
  • the eggs 8 are conveyed while being arranged between a pair of rollers 34 1 and another pair of ⁇ -rollers 34 1, and the upstream delivery tray 34 8 and the downstream receiving tray 3 4
  • Each of 4 9 is formed of a pair of long members, and spaces 350 and 35 1 are formed between the pair of long members so that the eggs 8 can be easily transported while rolling with their long diameters lying sideways. I do.
  • the eggs 8 are moved while rolling by a pair of rotatable rollers 341 to pass through each step 347.
  • Each of the 3 4 1 groups does not necessarily need to be rotatable, but may be a simple round bar.
  • a pair of push plates 3 5 5 is attached to an endless chain 3 40. May be attached so as to be parallel to each other to form a transfer device for the eggs 8, and the eggs 8 arranged between the pair of push plates 35 5 and the other pair of push plates 35 5 The sheet is conveyed along the direction 9 while being pushed by the push plate 355, and falls at the step 347 to generate an impact on the impact body 345.
  • each of the colliding eggs 8 arranged via the step is formed by a continuous one plane.
  • FIG. 15 as shown in FIG. Each face to be arranged
  • a pair of curved surfaces 36 2 may be formed by a pair of semi-cylindrical members 36 3 and 36 4 arranged in parallel.
  • the semi-cylindrical members 36 3 and 36 4 are alternately supported on the base 36 6 via the elastic members 365, and the other semi-cylindrical members 36 3 and 3 6 4 is directly supported on the base 36 6, and the striking detector is mounted only on the semi-cylindrical members 36 3 and 36 4 supported on the base 36 6 via the elastic member 36 5. Only the electric signals from these shock sensors may be used.
  • a plurality of rows in this example, three rows of egg movement guide members 371, 372, and 373 are provided along the movement direction 9 of the eggs 8.
  • a plurality of steps 3777 are formed in the guide member 371, in the region 3774, in the guide member 372 in the region 3775, and in the guide member 3773 in the region 3776.
  • the second peak level L2 was used in determining the presence or absence of cracks, the present invention is not limited to this, and the level L2 is defined as the difference between the first peak and the second peak.
  • the difference that is, the level L3 from peak to peak shown in FIG. 6 may be used.
  • the presence or absence of cracks in the shell of egg 8 was determined by all of 1 ZL 2, L 1 ZLT, values L, L 1, and L 2, but switches 13 0 to 13 4 And the on / off state of 135 to 13 9 as appropriate, and set the ratios L 1 ZL 2, L 1 ZLT, values LT, L 1 and L 2 to the required number of cracks in the shell of egg 8 May be determined, for example, only by comparing the ratio L 1 ZL 2 with a preset value or only by comparing the ratio L 1 / L 3 with a preset value. You may decide to determine if the shell of egg 8 is cracked.
  • a signal that fights for the presence or absence of cracks in the egg shell can be corrected multiple times. It can be obtained reliably, and the presence or absence of cracks in the eggshell can be reliably detected.
  • the reliability of the eggshell can be extremely high, and the presence or absence of cracks in the eggshell can be detected with high reliability over a long period of time.

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

An egg (8) to be examined is allowed to roll down under its own weight a plurality of planes (6) connected to each other through a plurality of steps (5) and to strike the planes (6) one by one while falling down the steps (5), whereby impact generated by the strike of the dropping egg on an impact receiving body (3) comprising the planes (6) is detected by an impact detector (12) and, from the intensity of the detected impact, a crack of the eggshell (8) is detected. The impact receiving body (3) is resiliently fixed to a base (1) through a resilient member (2).

Description

明 細 書  Specification
卵の殻のひび割れを検出する方法及びその装置 技術分野  Method and apparatus for detecting cracks in egg shells
本発明は卵の殻のひび割れを検出する方法及びその装置 に鬨する 。 背景技術  The present invention seeks a method and apparatus for detecting cracks in an egg shell. Background art
卵の殻のひび割れを検出する装置と しては、 従来、 米国 特許第 3 7 4 4 2 9 9号 ( U S P第 3 7 4 4 2 9 9号) 明 細書に開示されている よ う に、 卵の殻を直接軽打してその と きの振動を電気信号に変換し、 正常卵の場合と比較する こ と によ って、 ひび割れを検出する装置、 卵に光を照射し 反射光を電気信号に変換して検出する装置及び卵の表面を 撮像し、 画像処理によ り検出する装置等が知られている 。  As a device for detecting cracks in an egg shell, conventionally, as disclosed in the specification of U.S. Pat. No. 3,744,299 (USP 3,744,299), By directly tapping the egg shell and converting the vibration at that time into an electric signal and comparing it with that of a normal egg, a device that detects cracks, irradiates the egg with light and reflects the reflected light There are known a device that converts the signal into an electric signal for detection, a device that captures an image of the surface of an egg, and detects the image by image processing.
U S P第 3 7 4 4 2 9 9号明細書に開示されたひび割れ を検出す.る装置は、 圧電結晶に連結された半円形ボタンに 卵を 当てて、 圧電結晶を振動させ、 このと き得られる電気 信号から卵めひび割れを検出している 。  A device for detecting cracks disclosed in US Pat.No. 3,744,229, applies an egg to a semicircular button connected to a piezoelectric crystal, and vibrates the piezoelectric crystal, which can be achieved at this time. Eggs and cracks are detected from the electrical signals generated.
この開示された装置では、 離散的に設けられた半円形の ボタンに確実に卵を当てなければ、 一の卵の殻の複数箇所 でのひび割れ検出を行いがたく 、 卵がほんの少し飛び跳ね た り した場合には、 ボタンに当た らない虞を有する一方、 確実にボタンに卵を当てる よ う にボタ ンをシー トから大き く突出させる と 、 卵の搬送がう ま く いかなくなる不都合も あ り 、 場合によっては、 卵の殻に新たなひび割れを生じさ せて しま う こ とがある 。 In the disclosed device, it is difficult to detect cracks at a plurality of portions of the shell of one egg unless the egg is securely hit on the semicircular button provided discretely, and the egg jumps a little. If you do, you may not hit the button, If the button is pushed out of the sheet to ensure that the button touches the egg, there is a disadvantage that the egg cannot be transported properly, and in some cases, a new crack is formed in the egg shell. I may let you do it.
また、 画像処理などの手段では、 装置が複雑となる上に 微細なひびを検出 しがたく 、 それほど満足し得る ものでは ない。  In addition, means such as image processing makes the device complicated and hard to detect fine cracks, which is not very satisfactory.
本発明は、 前記諸点に鑑みてなされたものであ り 、 その 目的とする と ころは、 一の卵の殻の複数箇所でのひび割れ 検出を確実に行い得る方法及びその装置を提供する こ と に ある 。  The present invention has been made in view of the above-mentioned points, and an object of the present invention is to provide a method and a device capable of reliably detecting cracks at a plurality of locations of one egg shell. It is in .
本発明の他の目的は、 卵の殻に新たなひび割れを生じさ せる こ となく卵の殻のひび割れ検出を確実に行う こ とがで きる方法及びその装置を提供する こ と にある。  Another object of the present invention is to provide a method and an apparatus for reliably detecting a crack in an egg shell without causing a new crack in the egg shell.
本発明の更に他の目的は、 筒単な構成によ り長期に渡つ て信頼性のある卵の殻のひび割れ検出を行う こ とができ る 方法及びその装置を提供する こ と にある。  It is still another object of the present invention to provide a method and a device capable of reliably detecting a crack in an egg shell over a long period of time with a simple structure.
また本発明の他の目的は、 卵の殻の全周囲に渡ってひび 割れを容易に検出する こ とができ る方法及びその装置を提 供するこ とにある 。 発明の開示  Another object of the present invention is to provide a method and an apparatus for easily detecting cracks all around the shell of an egg. Disclosure of the invention
本発明によれば、 自重によ り卵を転がり移動させ、 この 転がり移動中、 複数部位で卵を落下せしめ、 この各落下に おいて所与の面で卵を衝突させ、 この衝突によ り 当該面に 生じる衝撃を感知し、 この感知した衝撃から卵の殻のひび 割れを検出する方法が提供される 。 According to the present invention, the egg is rolled and moved by its own weight. During the rolling movement, the eggs are dropped at a plurality of locations, and in each of the drops, the eggs collide with a given surface, and the impact generated on the surface due to the collision is sensed, and the egg shell is detected from the sensed impact. A method is provided for detecting cracks in cracks.
また、 本発明によれば、 卵を一定位置で転がせつつ複数 回一定位置で卵を落下せしめ、 この各落下において所与の 面で卵を衝突させ、 この衝突によ り 当該面に生じる衝撃を 感知し、 この感知した衝撃から卵の殻のひび割れを検出す る方法が提供される。  Further, according to the present invention, the egg is dropped at a fixed position a plurality of times while rolling the egg at the fixed position, and the egg is caused to collide with a given surface in each of the drops. A method is provided for sensing and detecting cracks in an egg shell from the sensed impact.
更に本発明によれば、 卵を強制的に転がせながら搬送し この転がされながら搬送される卵を当該搬送中、 複数回落 下せしめて卵を複数回所与の面で衝突させ、 この衝突によ り 当該面に生じる衝撃を感知し、 この感知した衝撃から卵 の殻のひび割れを検出する方法が提供される。  Further, according to the present invention, the eggs are transported while being forcibly rolled, and the eggs transported while being rolled are dropped a plurality of times during the transport so that the eggs collide with the given surface a plurality of times. Thus, there is provided a method of detecting an impact generated on the surface and detecting a crack in the egg shell from the detected impact.
加えて 、 本発明によれば、 自重によ り転がりつつある卵 の当該転がり移動を保持しつつ複数部位で卵を落下せしめ て卵を複数回所与の面で衝突させ、 この衝突によ り衝撃を 受ける手段と 、 この衝撃を受ける手段における所与の面へ の卵の衝突によ り生じる衝擊を感知する手段と 、 この感知 する手段から送出される衝擊感知信号によ り卵の殻のひび 割れの有無を決定する手段と を具備する卵の殻のひび割れ を検出する装置が提供される 。  In addition, according to the present invention, the egg that is rolling due to its own weight is dropped at a plurality of sites while maintaining the rolling movement of the egg, and the egg collides with a given surface a plurality of times. Means for receiving an impact, means for sensing an impact resulting from the impact of the egg on a given surface in the means for receiving the impact, and a method for detecting the impact of the egg by means of the impact sensing signal sent from the sensing means. An apparatus for detecting cracks in an egg shell, comprising: means for determining the presence or absence of cracks.
また、 本発明によれば、 卵を強制的に転がせなから搬送 する手段と 、 この搬送する手段によ り転がされながら搬送 される卵を当該搬送中、 複数回落下せしめて卵を複数回所 与の面で衝突させ、 この衝突によ り衝撃を受ける手段と 、 この衝撃を受ける手段における所与の面への卵の衝突によ り生じる衝撃を感知する手段と 、 この感知する手段から送 出される衝撃感知信号によ り卵の殻のひび割れの有無を決 定する手段と を具備する卵の殻のひび割れを検出する装置 が提供される 。 Further, according to the present invention, the eggs are transported because the eggs cannot be forcibly rolled. And means for dropping the egg transported while being rolled by the transporting means a plurality of times during the transport, causing the egg to collide with the applied surface a plurality of times, and receiving an impact due to the collision. And a means for sensing the impact caused by the impact of the egg on a given surface in the means for receiving the impact, and the presence or absence of cracks in the egg shell based on the impact sensing signal sent from the sensing means. An apparatus for detecting cracks in an egg shell, comprising: means for determining.
更にまた、 本発明によれば、 卵を一定位置で転がせつつ 複数回一定位置で卵を落下せしめ、 この各落下において所 与の面で卵を衝突させ、 この衝突によ り衝撃を受ける手段 と 、 、 この衝撃を受ける手段における所与の面への卵の衢 突によ り生じる衝撃を感知する手段と 、 この感知する手段 から送出される衝撃感知信号によ り卵の殻のひび割れの有 無を決定する手段と を具備する卵の殻のひび割れを検出す る装置が提供される。  Still further, according to the present invention, the egg is dropped at a fixed position a plurality of times while rolling the egg at the fixed position, and in each of the drops, the egg is collided with a given surface, and a means for receiving an impact by the collision is provided. A means for sensing an impact caused by the impact of the egg on a given surface in the means for receiving the impact; and a crack in the shell of the egg based on an impact detection signal sent from the sensing means. An apparatus for detecting cracks in an egg shell, comprising: means for determining nothing.
尚、 本発明にいう卵の殻のひび割れとは、 内容物の入つ た状態の卵の場合であって、 単独又は結合して生じている 目にみる こ とのできない卵の殻のひび、 目にみるこ とので き る卵の殻のひび及び卵の殻の一部の陥没等をいう 。  Incidentally, the crack of the egg shell referred to in the present invention is a case of an egg in a state where the contents are contained therein. This refers to cracks in the egg shell and the collapse of a part of the egg shell that can be seen.
本発明の前記目的、 特徴、 更に他の目的及び特徴は、 以 下に図面と共に説明する本発明の好ま しい具体例でよ り明 確となるであろ う 。 尚、 本発明は、 以下の具体例に限定さ れず、 種々の変形例を含むものである 。 図面の筒単な説明 The above objects, features, and other objects and features of the present invention will become more apparent with preferred embodiments of the present invention described below with reference to the drawings. The present invention is limited to the following specific examples. Instead, it includes various modifications. Simple explanation of the drawing
第 1 図は、 本発明の好ま しい具体例の第 2図に示す I - I線断面図、  FIG. 1 is a sectional view taken along the line II of FIG. 2 of a preferred embodiment of the present invention;
第 2図は、 第 1 図に示す具体例の斜視図、  FIG. 2 is a perspective view of the specific example shown in FIG. 1,
第 3図は、 第 1 図に示す卵の殻のひび割れの有無を決定 する装置の一部詳細電気回路図、  Fig. 3 is a partially detailed electric circuit diagram of the device for determining the presence or absence of cracks in the eggshell shown in Fig. 1,
第 4図は、 第 1 図に示す決定装置の他の一部の詳細電気 回路図、  FIG. 4 is a detailed electric circuit diagram of another part of the determination device shown in FIG. 1,
第 5図は 第 1 図に示す決定装置の残りの部分の詳細電 気回路図、  FIG. 5 is a detailed electrical circuit diagram of the rest of the determination device shown in FIG. 1,
第 6図は 第 3図に示すフ ィ ルタから出力される電気信 号の説明図で、 横軸は時間を 、 縦軸は電圧を夫々示し、 第 7図は、 第 3図から第 5図に示す卵の殻のひび割れの 有無を決定する装置での信号ダイ アグラム、  FIG. 6 is an explanatory diagram of electric signals output from the filter shown in FIG. 3, in which the horizontal axis indicates time, the vertical axis indicates voltage, and FIG. 7 is FIG. 3 to FIG. The signal diagram of the device for determining the presence or absence of cracks in the egg shell shown in
第 8図は、 本発明の他の好ま しい具体例の第 9図に示す FIG. 8 shows another preferred embodiment of the present invention in FIG.
VI— 11線断面図、 VI—section line 11
第 9図は、. 第 8図に示す具体例の斜視図、  FIG. 9 is a perspective view of the specific example shown in FIG. 8,
第 1 0図は、 本発明の好ま しい第 3の具体例の断面図、 第 1 1 図は、 第 1 0図に示す具体例の変形例の断面図、 第 1 2図は、 本発明の好ま しい第 4の具体例の第 1 3図 に示す X I— Χ ϋ線断面図、 第 1 3図は、 第 1 2図に示す具体例の斜視図、 FIG. 10 is a cross-sectional view of a preferred third embodiment of the present invention, FIG. 11 is a cross-sectional view of a modification of the embodiment shown in FIG. 10, and FIG. FIG. 13 of the preferred fourth embodiment, shown in FIG. FIG. 13 is a perspective view of the specific example shown in FIG. 12,
第 1 4図は、 本発明の好ま しい第 5の具体例の断面図、 第 1 5図は、 本発明の好ま しい第 6の具体例の斜視図、 第 1 6図は、 本発明の好ま しい第 7の具体例の平面図で ある 。 発明を実施するための最良の形態  FIG. 14 is a sectional view of a fifth preferred embodiment of the present invention, FIG. 15 is a perspective view of a sixth preferred embodiment of the present invention, and FIG. 16 is a preferred embodiment of the present invention. It is a top view of the new 7th example. BEST MODE FOR CARRYING OUT THE INVENTION
第 1 図及び第 2図において 、 基台 1 の上には、 弾性部材 2が設けられてお り 、 弾性部材 2の上には、 衝撃体 3が設 けられている 。 単一部材からなる衝撃体 3は、 皿ねじ 4等 によ り弾性部材 2 を介して基台 1 に弾性的に固定されてい る。 皿ねじ 4 によ る衝撃体 3の基台 1 への締め付けの程度 は、 後述.する電気信号が得られる よ う にする。 衝撃体 3の 上面は、 段差 5 を介して連結された 5個の平面 6 を もって 形成されている。 段差 5の高さは、 好ま しい具体例では 1 m mから 1 . 5 m mである 。 ほぼ水平に配置された平面 6 は、 卵 8の自重による方向 9の移動において卵 8がーの平 面 6 を飛び越える こ とがないよ う に十分な面積をも って形 成されている 。 従って平面 6は、 方向 9への卵 8の移動に おいて卵 8のための転がり床と して機能する。  In FIGS. 1 and 2, an elastic member 2 is provided on a base 1, and an impact body 3 is provided on the elastic member 2. The impact body 3 made of a single member is elastically fixed to the base 1 via an elastic member 2 by means of a countersunk screw 4 or the like. The degree of tightening of the impact body 3 to the base 1 by the flathead screw 4 is such that an electric signal described later can be obtained. The upper surface of the impact body 3 is formed with five planes 6 connected via a step 5. The height of the step 5 is between 1 mm and 1.5 mm in a preferred embodiment. The substantially horizontal plane 6 is formed with a sufficient area so that the egg 8 does not jump over the flat plane 6 in the direction 9 due to its own weight. Thus, the plane 6 acts as a rolling bed for the egg 8 in the movement of the egg 8 in the direction 9.
衝撃体 3の平面 6に対向する裏面 1 0 には、 圧電形加速 度ピックアップ等の衝撃感知器 1 2が取り付けられている このよ う に形成された卵 8の自重による転がり移動を保 持しつつ複数部位で卵 8を落下せしめて卵 8を複数回所与 の面で衝突させ、 この衝突によ り衝撃を受ける手段である 基台 1 、 弾性部材 2及び衝擊体 3の組合せ体は、 例えば卵 8の送り 出しコンベア 1 6 と卵 8の受けコンベア 1 7 との 間に配置されている。 A shock sensor 12 such as a piezoelectric acceleration pickup is attached to the back surface 10 facing the plane 6 of the impact body 3, and the egg 8 thus formed keeps rolling movement due to its own weight. The egg 8 is dropped at a plurality of locations while holding the egg 8 and collided with the egg 8 a plurality of times on a given surface, and a means for receiving an impact due to the collision is a combination of the base 1, the elastic member 2, and the impact body 3. The eggs 8 are arranged, for example, between a feeding conveyor 16 for eggs 8 and a receiving conveyor 17 for eggs 8.
衝撃感知器 1 2で得られる電気信号は、 この電気信号か ら卵 8の殻のひび割れの有無を決定する装置 2 1 に供給さ れている 。 決定装置 2 1 の詳細は、 第 3図から第 5図まで に示されている。  The electric signal obtained from the shock detector 12 is supplied to a device 21 for determining whether or not the shell of the egg 8 has cracked from the electric signal. Details of the decision device 21 are shown in FIGS. 3 to 5.
第 3図において 、 衝擊感知器 1 2からの電気信号を端子 2 2及び 2 3 を介して受信する増幅器 2 4は、 この受信し た信号を増幅してローパスフ ィ ルタ 2 5に供耠する 。 フ ィ ルタ 2 5は、 例えばカ ッ トオフ周波数と して 5 k H z を有 してお り 、 供給される信号から衝撃体 3等の機械的共振に 基づく信号成分等の高周波雑音を除去する 。 フ ィルタ 2 5 の出力端子は、 フ ィルタ 2 5からの信号のう ち最初のピー クを検出 してそのピーク レベル L 1 を保持する検出回路 2 6 と 、 フ ィルタ 2 5からの信号のう ち最初のピークに続く 第二番目のピーク を検出してそのピーク レベル L 2 を保持 する検出回路 2 7 と 、 フ ィ ルタ 2 5からの信号のう ち最初 のゼロレベルから次のゼロレベルまでの時間間隔 Tを計測 してそれに対応した信号を保持する時間間隔測定回路 2 8 と に接続されている。 検出回路 2 6において、 フ ィルタ 2 5の出力端子に非反 転入力端子が接続された演算増幅器からなる増幅器 2 9の 出力端子は、 ダイ オー ド 3 0 、 3 1及び抵抗器 3 2からな る正整流回路を介してアナログスィ ツチ 3 3の入力端子に 接続されている。 増幅器 2 9の反転入力端子は、 ダイォー ド 3 0及び抵抗器 3 2の一端に接続されている 。 アナログ スィ ッチ 3 3の出力端子は、 抵抗器 3 4及びキャパシタ 3 5の夫々の一端並びに演算増幅器からなる増幅器 3 6の非 反転入力端子に夫々接続されている。 増幅器 3 6は、 増幅 器 3 6の反転入力端子と出力端子との間に接続された抵抗 器 3 7 を有して電圧フ ォロアタイプで形成されている。 抵 抗器 3 4の他端はアナログスィ ツチ 3 8の一端に接続され てお り 、 アナログスィ ッチ 3 8及びキャパシタ 3 5の他端 は接地されている 。 In FIG. 3, an amplifier 24 that receives an electric signal from the impact detector 12 via terminals 22 and 23 amplifies the received signal and supplies it to a low-pass filter 25. The filter 25 has, for example, a cut-off frequency of 5 kHz, and removes high-frequency noise such as a signal component based on mechanical resonance of the impact body 3 or the like from a supplied signal. . The output terminal of the filter 25 detects the first peak of the signal from the filter 25 and holds a peak level L1 of the detection circuit 26 and the signal from the filter 25. The detection circuit 27 detects the second peak following the first peak and holds the peak level L2, and the signal from the filter 25 from the first zero level to the next zero level It is connected to the time interval measuring circuit 28 that measures the time interval T of and holds the signal corresponding to the time interval T. In the detection circuit 26, the output terminal of the amplifier 29 composed of an operational amplifier in which the non-inverting input terminal is connected to the output terminal of the filter 25 is composed of the diodes 30 and 31 and the resistor 32. Connected to the input terminal of the analog switch 33 via a positive rectifier circuit. The inverting input terminal of the amplifier 29 is connected to the diode 30 and one end of the resistor 32. The output terminal of the analog switch 33 is connected to one end of each of the resistor 34 and the capacitor 35 and to the non-inverting input terminal of an amplifier 36 composed of an operational amplifier. The amplifier 36 has a resistor 37 connected between an inverting input terminal and an output terminal of the amplifier 36, and is formed as a voltage follower type. The other end of the resistor 34 is connected to one end of the analog switch 38, and the other end of the analog switch 38 and the other end of the capacitor 35 are grounded.
検出回路 2 7において、 フ ィ ルタ 2 5の出力端子に非反 転入力端子が接続された演算増幅器からなる増幅器 4 7の 出力端子は、 ダイ オー ド 4 8 、 4 9及び抵抗器 5 0からな る負整流回路を介してアナログスィ ツチ 5 1 の入力端子に 接続されている。 増幅器 4 7の反転入力端子は、 ダイ才ー ド 4 8及び抵抗器 5 0の一端に接続されている 。 アナログ スィ ッチ 5 1 の出力端子は、 抵抗器 5 2及びキャパシタ 5 3の夫々の一端並びに演算増幅器からなる増幅器 5 4の非 反転入力端子に夫々接続されている 。 増幅器 5 4は、 増幅 器 5 4の反転入力端子と 出力端子との間に接続された抵抗 器 5 5 を有して電圧フ ォロアタイ アで形成されている 。 抵 抗器 5 2 の他端はアナログス ィ ツチ 5 6の一端に接続され てお り 、 アナログスィ ッチ 5 6の他端は、 正の直流電源 5 7に接続されてお り 、 キャパシタ 5 3の他端は接地されて いる 。 In the detection circuit 27, the output terminal of the amplifier 47 composed of an operational amplifier in which the non-inverting input terminal is connected to the output terminal of the filter 25 is connected to the diodes 48, 49 and the resistor 50. It is connected to the input terminal of analog switch 51 via a negative rectifier circuit. The inverting input terminal of the amplifier 47 is connected to the diode 48 and one end of the resistor 50. An output terminal of the analog switch 51 is connected to one end of each of the resistor 52 and the capacitor 53 and a non-inverting input terminal of an amplifier 54 composed of an operational amplifier. Amplifier 54 It has a resistor 55 connected between the inverting input terminal and the output terminal of the resistor 54 and is formed of a voltage follower tire. The other end of the resistor 52 is connected to one end of an analog switch 56, the other end of the analog switch 56 is connected to a positive DC power source 57, and The other end of 3 is grounded.
時間間隔測定回路 2 8において 、 抵抗器 6 6 を介して非 反転入力端子がフ ィルタ 2 5の出力端子に接続されている 演算増幅器からなる増幅器 6 7の反転入力端子は、 分圧抵 抗器 6 8及び 6 9の接続部に接続されてお り 、 抵抗器 6 8 の他端は正の直流電源 7 1 に接続されてお り 、 抵抗器 6 9 の他端は接地されている 。 増幅器 6 7の出力端子は、 増幅 器 6 7 にヒステリ シス特性を持たせるべく 、 抵抗器 7 0 を 介して 自身の非反転入力端子に接続されている一方、 アン ドゲー ト 7 2の一方の入力端子に接続されている 。 ゲー ト 7 2の出力端子は、 アナログスィ ッチ 7 3の制御端子に接 続されている 。 入力端子が正の直流電源 7 4に接続された アナログスィ ツチ 7 3 の出力端子は、 抵抗器 7 5 を介して 抵抗器 7 6友び一端が接地されたキャパシタ 7 7の他端並 びに演算増幅器 7 8の非反転入力端子に夫々接続されてい る。 抵抗器 7 6の一端は、 一端が接地されたアナログスィ ツチ 7 9の他端に接続されている 。 一端が接地された抵抗 器 8 0の他端は、 抵抗器 8 1 の一端及び増幅器 7 8の反転 入力端子に夫々接続されている 。 フ ィ ードバッ ク抵抗であ る抵抗器 8 1 の他端は、 増幅器 7 8の出力端子に接続され ている。 In the time interval measurement circuit 28, the non-inverting input terminal is connected to the output terminal of the filter 25 via the resistor 66.The inverting input terminal of the amplifier 67 composed of an operational amplifier is a voltage dividing resistor. The other end of the resistor 68 is connected to the positive DC power supply 71, and the other end of the resistor 69 is grounded. The output terminal of the amplifier 67 is connected to its own non-inverting input terminal via a resistor 70 so that the amplifier 67 has a hysteresis characteristic, while one input terminal of the AND gate 72 is provided. Connected to terminal. The output terminal of the gate 72 is connected to the control terminal of the analog switch 73. The output terminal of the analog switch 73 whose input terminal is connected to the positive DC power supply 74 is connected to the other end of the capacitor 77 whose one end is grounded via the resistor 75 via the resistor 75. They are connected to the non-inverting input terminals of the amplifiers 78, respectively. One end of the resistor 76 is connected to the other end of the analog switch 79 whose one end is grounded. The other end of the resistor 80 whose one end is grounded is connected to one end of the resistor 81 and the inversion of the amplifier 78. Each is connected to an input terminal. The other end of the resistor 81, which is a feedback resistor, is connected to the output terminal of the amplifier 78.
検出回路 2 6において、 フィルタ 2 5 と ゲー ト 7 2 との 出力端子からの信号を受信する制御信号発生回路 3 9は、 受信したこれらの信号から第一番目のピークレベルの検出 期間を規定する信号を生成して、 これをアナ Πグスィ ッチ 3 3の制御端子に供耠する 。  In the detection circuit 26, the control signal generation circuit 39 which receives signals from the output terminals of the filter 25 and the gate 72 defines a detection period of the first peak level from the received signals. A signal is generated and supplied to the control terminal of the analog switch 33.
検出回路 2 7において、 フィルタ 2 5 と ゲー ト 7 2 との 出力端子からの信号を受信する制御信号発生回路 5 8は、 受信したこれらの信号から第二番目のピーク レベルの検出 期間を規定する信号を生成して、 これをアナログスィ ツチ 5 1 の制御端子に供給する 。  In the detection circuit 27, the control signal generation circuit 58 that receives signals from the output terminals of the filter 25 and the gate 72 defines the detection period of the second peak level from these received signals. A signal is generated and supplied to the control terminal of the analog switch 51.
第 4図において、 増幅器 3 6から得られる信号のレベル L 1 と増幅器 5 4から得られる信号のレベル L 2 との比が 予め設定された値よ り も大き いか小さいかを検查する検査 回路 9 1 は、 一端が増幅器 5 4の出力端子に接続された抵 抗器 9 2 と一端が増幅器 3 6の出力端子に接続された抵抗 器 9 3及び 9 4 と抵抗器 9 2及び 9 3の他端に非反転入力 端子が接続された増幅器 9 5 と一端が抵抗器 9 4の他端に 接続されて他端が接地された抵抗器 9 6 と抵抗器 9 4の他 端に非反転入力端子が接続された増幅器 9 7 とからなる 。 増幅器 9 5の出力端子は、 自身の反転入力端子と増幅器 9 7の反転入力端子と に接続されている 。 抵抗器 9 2 、 9 3 9 4及び 9 6の夫々の値を R 9 2 、 R 9 3 、 R 9 4及び R 9 6 とする と 、 増幅器 9 7は、 し 1 + X し 2 Y - X で、 In FIG. 4, an inspection circuit for detecting whether the ratio of the level L1 of the signal obtained from the amplifier 36 to the level L2 of the signal obtained from the amplifier 54 is larger or smaller than a preset value. 9 1 is a resistor 9 2 having one end connected to the output terminal of the amplifier 54, and resistors 9 3 and 9 4 having one end connected to the output terminal of the amplifier 36 and resistors 9 2 and 9 3. Non-inverting input to the other end of the amplifier 95 with one end connected to the other end of the resistor 94 and the other end of the resistor 96 and the resistor 94 connected to the other end It consists of an amplifier 97 connected to its terminals. The output terminal of the amplifier 95 is connected to its own inverting input terminal and the amplifier 9 7 Inverting input terminal and connected to. Assuming that the respective values of the resistors 92, 93394, and 96 are R92, R93, R94, and R96, the amplifier 97 has the formula: 1 + X then 2Y-X so,
R 9 2  R 9 2
X =  X =
R 9 2 + R 9 3  R 9 2 + R 9 3
R 9 6 R 9 6
Y  Y
R 9 4 + R 9 6 なる演算を実行し、 比 L 1 Z L 2の値が ( 1 + X ) / ( Y 一 X ) の値よ り も大き い場合には、 論理信号 0 を、 比 L 1 Z L 2の値が ( 1 + X ) / ( Y - X ) の値よ り も小さい場 合には、 論理信号 1 を夫々出力する。  If the ratio R 1 ZL 2 is greater than the value of (1 + X) / (Y-X), the logical signal 0 is converted to the ratio L If the value of 1 ZL 2 is smaller than the value of (1 + X) / (Y-X), a logical signal 1 is output.
増幅器 3 6から得られる信号のレベル L 1 と時間間隔 T に比例した増幅器 7 8から得られる信号のレベル L Tとの 比が予め設定された値よ り も大き いか小さ いかを検査する 検査回路 9 7 aにおいて、 一端が増幅器 3 6の出力端子に 接続された抵抗器 9 8の他端は、 一端が接地された抵抗器 9 9の他端及び増幅器 1 0 0の反転入力端子に夫々接続さ れている 。 増幅器 1 0 0の非反転入力端子は、 増幅器 7 8 の出力端子に接続されている 。 抵抗器 9 8及び 9 9の夫々 の値を R 9 8及び R 9 9 とする と 、 増幅器 1 0 0は、 Between the level L 1 of the signal obtained from the amplifier 36 and the level LT of the signal obtained from the amplifier 78 proportional to the time interval T. Inspect whether the ratio is larger or smaller than a preset value. In the test circuit 97a, one end of the resistor 98 whose one end is connected to the output terminal of the amplifier 36 has one end grounded. The other end of the resistor 99 and the inverting input terminal of the amplifier 100 are connected respectively. The non-inverting input terminal of the amplifier 100 is connected to the output terminal of the amplifier 78. Assuming that the respective values of the resistors 98 and 99 are R98 and R99, the amplifier 100
L 1 R 9 8 + R 9 9 L 1 R 9 8 + R 9 9
L T R 9 9 なる演算を実行し、 比 L 1 Z L Tが + / R 9 9の値よ り も大き い場合には、 論理信号 0 を、 比 L 1 ZL Tが ( R 9 8十 R 9 9 ) ZR 9 9の値よ り も小さい場 合には、 論理信号 1 を夫々出力する。 If the ratio L1ZLT is greater than the value of + / R99, the logic signal 0 is applied and the ratio L1ZLT is calculated as (R9810R99). If the value is smaller than the value of ZR99, a logical signal 1 is output.
増幅器 7 8から得られる信号のレベル L Tが予め設定さ れた値よ り も大き いか小さいかを検査する検査回路 1 0 1 において、 一端が正の直流電源 1 0 2に接続された抵抗器 1 0 3の他端は、 一端が接地された抵抗器 1 0 4の他端及 び増幅器 1 0 5の反転入力端子に夫々接続されてお り 、 増 幅器 1 0 5の非反転入力端子は、 増幅器 7 8の出力端子に 接続されている。 抵抗器 1 0 3、 1 0 4及び直流電源 1 0 2の電源電圧の夫々の値を R l 0 3 、 R 1 0 4及び E とす る と 、 増幅器 1 0 5は、 In a test circuit 101 for checking whether the level LT of the signal obtained from the amplifier 78 is larger or smaller than a preset value, a resistor 1 having one end connected to a positive DC power supply 102 is connected. The other end of 03 is connected to the other end of the resistor 104 whose one end is grounded and the inverting input terminal of the amplifier 105, respectively.The non-inverting input terminal of the amplifier 105 is The amplifier 78 is connected to the output terminal. Resistors 103, 104 and DC power supply 10 Assuming that the respective values of the power supply voltage of R 2 are R l 03, R 104 and E, the amplifier 105
R 1 0 4 R 1 0 4
L T E  L T E
R 1 0 3 + R 1 0 4 なる演算を実行し、 レベル L Tが R 1 0 4 Z ( R 1 0 3 + 1 0 4 ) X Eの値よ り も大きい場合には、 論理信号 0 を レベル L Tが R 1 0 4 Z ( R 1 0 3 + R 1 0 4 ) X Eの値 よ り も小さい場合には、 論理信号 1 を夫々出力する 。  Performs the operation of R103 + R104, and if level LT is greater than the value of R104Z (R103 + 104) XE, logical signal 0 is changed to level LT. Is smaller than the value of R104Z (R103 + R104) XE, the logic signal 1 is output.
増幅器 3 6から得られる信号のレベル L 1 が予め設定さ れた値よ り も大き いか小さ いかを検査する検査回路 1 0 6 において、 一端が正の直流電源 1 0 7 に接続された抵抗器 1 0 8の他端は、 一端が接地された抵抗器 1 0 9の他端及 び増幅器 1 1 0の反転入力端子に夫々接続されてお り 、 増 幅器 1 1 0の非反転入力端子は、 増幅器 3 6の出力端子に 接続されている。 抵抗器 1 0 8、 1 0 9及び直流電源 1 0 7の電源電圧の夫々の値を R 1 0 8、 R 1 0 9及び E とす る と 、 増幅器 1 1 0は、  In a test circuit 106 for checking whether the level L 1 of the signal obtained from the amplifier 36 is larger or smaller than a preset value, a resistor whose one end is connected to a positive DC power supply 107 is provided. The other end of 108 is connected to the other end of the resistor 109 whose one end is grounded and the inverting input terminal of the amplifier 110, respectively, and the non-inverting input terminal of the amplifier 110 is connected. Is connected to the output terminal of the amplifier 36. Assuming that the values of the power supply voltages of the resistors 108 and 109 and the DC power supply 107 are R108, R109 and E, the amplifier 110
R 1 0 9  R 1 0 9
し 1 一 E  1 1 E
R 1 0 8 + R 1 0 9 なる演算を実行し、 レベル L 1 が R 1 0 9 Z ( R 1 0 8 + R 1 0 9 ) X Eの値よ り も大きい場合には、 論理信号 0 を レベル L 1 が R l O S Z i R l O S + R l O Q ) X Eの値 よ り も小さい場合には、 論理信号 1 を夫々出力する 。 R 1 0 8 + R 1 0 9 If the level L 1 is greater than the value of R 1 0 9 Z (R 1 0 8 + R 1 0 9) XE, the logic signal 0 is applied to the level L 1 and R l OSZ i R l OS + R l OQ) If the value is smaller than the value of XE, the logic signal 1 is output.
増幅器 54から得られる信号のレベル L 2が予め設定さ れた値よ り も大き いか小さ いかを検査する検査回路 1 1 1 において、 一端が負の直流電源 1 1 2 に接続された抵抗器 1 1 3の他端は、 一端が接地された抵抗器 1 1 4の他端及 び増幅器 1 1 5の非反転入力端子に夫々接続されてお り 、 増幅器 1 1 5の反転入力端子は、 増幅器 5 4の出力端子に 接続されている。 抵抗器 1 1 3 、 1 1 4及び直流電源 1 1 2の電源電圧の夫々の値を R l 1 3 、 R 1 1 4及び E とす る と 、 増幅器 1 1 5は、  In a test circuit 1 1 1 for checking whether the level L 2 of the signal obtained from the amplifier 54 is larger or smaller than a preset value, a resistor 1 connected at one end to a negative DC power supply 1 1 2 The other end of 13 is connected to the other end of resistor 114 whose one end is grounded and the non-inverting input terminal of amplifier 115, respectively.The inverting input terminal of amplifier 115 is connected to the amplifier. 54 Connected to output terminal 4. Assuming that the respective values of the power supply voltages of the resistors 1 13, 1 14 and the DC power supply 1 12 are Rl 13, R 1 14 and E, the amplifier 1 15
R 1 1 4 R 1 1 4
し 2 — E  2 — E
R + R 1 1 4 なる演算を実行し、 レベル L 2が R l 1 4 / ( R 1 1 3 + R 1 1 4 ) X Eの値よ り も大きい場合には、 論理信号 0 を レベル L 2が R 1 1 4 / ( R 1 1 3 + R 1 1 4 ) X Eの値 よ り も小さい場合には、 論理信号 1 を夫々出力する 。 · 第 5図に示す検査結果を選択して送出する回路 1 2 1 に おいて、 5個の Dタイ プフ リ ップフロ ップ回路が組みにな つたフ リ ップフロ ップ回路 1 2 2の D端子 D 1 は、 増幅器 9 7の出力端子に接続されてお り 、 フ リ ップフ ロ ップ回路 1 2 2の D端子 D 2は、 増幅器 1 0 0の出力端子に接続さ れてお り 、 フ リ ップフ ロ ップ回路 1 2 2の D端子 D 3は、 増幅器 1 0 5の出力端子に接続されてお り 、 フ リ ツアフロ ッァ回路 1 2 2の 0端子0 4は、 増幅器 1 1 0の出力端子 に接続されてお り 、 フ リ ップフロ ップ回路 1 2 2の D端子 D 5は、 増幅器 1 1 5の出力端子に接続されてお り 、 フ リ ップフロ ッァ回路 1 2 2のクロ ッ ク端子 Cは、 検出回路 2 7の制御信号発生回路 5 8の出力端子に接続されて いる 。 フ リ ッアフロ ップ回路 1 2 2の Q出力端子 Q 1 〜 Q 5は、 夫々ェクスクルー ブオアゲー ト 1 2 3〜 1 2 7の一方の 入力端子に接続されている 。 ェクスクルーシブオアゲー トWhen the operation of R + R1 14 is performed and the level L2 is greater than the value of Rl14 / (R1 13 + R1 1 4) XE, the logical signal 0 is changed to the level L2 If is less than the value of R114 / (R113 + R114) XE, the logic signal 1 is output. · The circuit for selecting and sending the inspection results shown in Fig. 5 In this case, the D terminal D1 of the flip-flop circuit 122, in which five D-type flip-flop circuits are assembled, is connected to the output terminal of the amplifier 97, and The D terminal D 2 of the flip-flop circuit 122 is connected to the output terminal of the amplifier 100, and the D terminal D 3 of the flip-flop circuit 122 is connected to the amplifier 100. 5 is connected to the output terminal of the amplifier 11. The 0 terminal 04 of the flip-flop circuit 12 is connected to the output terminal of the amplifier 11 and the flip-flop circuit 12 2 The D terminal D5 of the flip-flop circuit 122 is connected to the output terminal of the amplifier 115, and the clock terminal C of the flip-flop circuit 122 is connected to the control signal generation circuit 58 of the detection circuit 27. Connected to output terminal. The Q output terminals Q1 to Q5 of the flip-flop circuit 122 are connected to one input terminal of the exclusive OR gates 123 to 127, respectively. Exclusive orgate
1 2 3〜 1 2 7の他方の入力端子は、 抵抗器 1 2 8 を介し て正の直流電源 1 2 9 に接続されたスィ ツチ 1 3 0〜 1 3 4の一方の端子に夫々接続されてお り 、 スィ ツチ 1 3 0〜The other input terminals of 123 to 127 are respectively connected to one terminal of switches 130 to 134 connected to the positive DC power supply 129 via the resistor 128. Switch 130
1 3 4の他方の端子は接地されている 。 ェクスクルーシブ オアゲー ト 1 2 3〜 1 2 7の出力端子は、 スィ ッチ 1 3 5 〜 1 3 9 を介して個別検査結果確認用の発光ダイ オード 1 4 0〜 1 4 4の一端及びオアゲー ト 1 4 5の入力端子に夫 々接続されてお り 、 発光ダイ オー ド 1 4 0〜 1 4 4の他端 は、 一端が接地された抵抗器アレー 1 4 6の他端に接続さ れている 。 オアゲー ト 1 4 5の出力端子は、 総合検査結果 確認用の発光ダイ オー ド 1 4 7の一端及び決定装置 2 1 の 出力端子 1 4 8に接続されてお り 、 発光ダイオード 1 4 7 の他端には、 一端が接地された電流制限用の抵抗器 1 4 9 の他端が接続されている。 出力端子 1 4 8は、 知られたひ び割れ卵の排出機構 (図示せず) に接続されてお り 、 ひび 割れ卵の排出機構は、 出力端子 1 4 8に得られる決定結果 信号に基づいて受けコ ンベア 1 7 に到来したひび割れ卵 8 の排出を実行する 。 The other terminal of 134 is grounded. The output terminals of the exclusive OR gates 123 to 127 are connected to one end of the light emitting diodes 140 to 144 for confirming the individual test results and the OR gate 1 via switches 13 to 13. The other ends of the light emitting diodes 140 to 144 are connected to the other end of a resistor array 144 whose one end is grounded. Have been. The output terminal of OR gate 145 is connected to one end of the light emitting diode 147 for confirming the comprehensive inspection result and the output terminal 148 of the decision device 21. The other end of the current limiting resistor 149 having one end grounded is connected to one end. The output terminal 148 is connected to a known cracked egg ejection mechanism (not shown), and the cracked egg ejection mechanism is based on a determination result signal obtained at the output terminal 148. Then, the cracked eggs 8 arriving at the receiving conveyor 17 are discharged.
第 5図に示す決定装置 2 1 の制御信号発生回路 1 5 0 に おいて、 送り 出しコ ンベア 1 6並びに第一番目から第四番 目の平面 6 を卵 8が自重によ り転がりながら通過した際に これを検出する検出器 (図示せず) からの信号を受信する 端子 1 5 1及び 1 5 2 における一方の端子 1 5 1 は、 微分 回路を形成する抵抗器 1 5 3及びキャパシタ 1 5 4 の一端 に接続されてお り 、 抵抗器 1 5 3の他端は正の直流電源 1 5 5 に接続されてお り 、 キャパシタ 1 5 4の他端は一端が 正の直流電源 1 5 6に接続された抵抗器 1 5 7の他端及び ヒステリ シス特性を有する シュ ミ ッ ト ト リガ回路を形成す るイ ンバータ 1 5 8の入力端子に接続されている 。 イ ンバ ータ 1 5 8の出力端子は D タイアフ リ ップフロ ップ回路 1 5 9及び 1 6 0の夫々のクロ ック端子 Cに接続されてお り フ リ ッアフロ ッァ回路 1 5 9及び 1 6 0の D端子は正の直 流電源 1 6 1 に接続されて論理 1 にク ランプされている 。 フ リ ップフロ ップ回路 1 5 9 の Q端子は、 検出器 2 6 、 2 7及び時間間隔測定回路 2 8のアナ Dグスィ ッ チ 3 8 、 5 6及び 7 9の夫々の制御端子に接続されてお り 、 フ リ ツァ フロ ップ回路 1 6 0の Q端子は、 時間間隔測定回路 2 8の アン ドゲート 7 2の他方の入力端子に接続されている 。 フ リ ツアフ ロ ップ回路 1 6 0 の リセ ッ ト端子 Rは、 検出回路 2 7の制御信号発生回路 5 8の出力端子に接続されている 入力端子がアン ドゲー ト 7 2 の出力端子に接続されたィ ン ノ ータ 1 6 3 の出力端子は、 フ リ ップフ口 ップ回路 1 5 9 の リ セ ッ ト端子 Rに接続されている。 In the control signal generation circuit 150 of the decision device 21 shown in FIG. 5, the egg 8 passes through the delivery conveyor 16 and the first to fourth planes 6 while rolling by its own weight. One of the terminals 15 1 and 15 2, which receives a signal from a detector (not shown) that detects this, is a resistor 15 3 and a capacitor 1 which form a differentiating circuit. The other end of the resistor 15 3 is connected to the positive DC power supply 15 5, and the other end of the capacitor 15 4 is connected to one end of the positive DC power supply 15 5. The other end of the resistor 157 connected to 6 and the input terminal of the inverter 158 forming a Schmitt trigger circuit having hysteresis characteristics. The output terminal of the inverter 158 is connected to the clock terminal C of each of the D tire flip-flop circuits 159 and 160, and the flip-flop circuits 159 and 1 60 D terminal is positive Connected to power supply 1 6 1 and clamped to logic 1. The Q terminal of the flip-flop circuit 1559 is connected to the control terminals of the detectors 26 and 27 and the analog D-switches 38, 56 and 79 of the time interval measurement circuit 28. The Q terminal of the flicker flop circuit 160 is connected to the other input terminal of the AND gate 72 of the time interval measuring circuit 28. The reset terminal R of the flip-flop circuit 160 is connected to the output terminal of the control signal generation circuit 58 of the detection circuit 27.The input terminal is connected to the output terminal of the AND gate 72. The output terminal of the connected inverter 163 is connected to the reset terminal R of the flip-flop circuit 159.
このよ う に第 1 図から第 5図に示すよ う に構成された卵 の殻のひび割れを検出する装置 2 0 0の動作を第 6図及び 第 7図を も参照して次に説明する 。  The operation of the apparatus 200 for detecting cracks in the egg shell constructed as shown in FIGS. 1 to 5 will now be described with reference to FIGS. 6 and 7. .
一つの平面 6に卵 8が落下した場合、 殻にひび割れのな い卵である と 、 フ ィルタ 2 5の出力端子には、 加速度波形 2 0 1 で示すよ う な電圧信号が得られる一方、 ひび割れ卵 である と 、 加速度波形 2 0 2で示すよ うな電圧信号が得ら れる こ とが判明した。 換言する と 、 ひびのない卵 8 を一つ の平面 6 に落下させた場合、 フ ィ ルタ 2 5 の出力端子に波 形 2 0 1 で示すよ うな電圧信号が得られる よ う に、 皿ねじ 4 を適度に締めて弾性部材 2 を圧縮する と 、 ひび割れ卵 8 の場合には、 波形 2 0 2で示すよ うな電圧信号がフ ィ ルタ 1δ When the egg 8 falls on one plane 6, if the egg has no crack in the shell, a voltage signal as shown by an acceleration waveform 201 is obtained at the output terminal of the filter 25, while In the case of a cracked egg, it was found that a voltage signal as shown by the acceleration waveform 202 was obtained. In other words, when the unbroken egg 8 is dropped on one plane 6, the flat screw is set so that a voltage signal as shown by the waveform 201 is obtained at the output terminal of the filter 25. When the elastic member 2 is compressed by appropriately tightening 4, in the case of a cracked egg 8, a voltage signal as shown by a waveform 202 is filtered. 1δ
2 5の出力端子から得られる 。  It is obtained from 25 output terminals.
信号 2 0 1 と 2 0 2 とから 、 比 L 1 ZL 2及び L 1 ZT 並びにレベル L 1及び時間間隔 Τが夫々大き く 、 レベル L 2が絶対値において小さい場合は、 正常卵、 すなわちひび 割れのない卵であ り 、 比 L 1 Z L 2及び L 1 ZT並びにレ ベル L 1及び時間間隔 Τが夫々小さ く 、 レベル L 2が絶対 値において大きい場合は、 異常卵、 すなわちひび割れのあ る卵であるこ とが判明する 。  From the signals 201 and 202, if the ratios L 1 ZL 2 and L 1 ZT and the level L 1 and the time interval Τ are large and the level L 2 is small in absolute value, a normal egg, that is, a crack If the ratio L 1 ZL 2 and L 1 ZT and the level L 1 and the time interval Τ are small and the level L 2 is large in absolute value, the egg is abnormal, that is, a cracked egg. It turns out that it is.
まず、 検出動作の前に、 スィ ツチ 1 3 0〜 1 34及び 1 First, before the detection operation, switches 130-134 and 1
3 5〜 1 3 9 を全てオン状態にする。 Turn on all of 35 to 1 39.
次に時刻 t 0で送り 出しコンベア 1 6によ り送り 出され る卵 8がコンベア 1 6 を自重によ り転がりながら通過する と 、 これを検出する検出器 (図示せず) からのパルス信号 2 1 0が端子 1 5 1 、 キヤ ノ、。シタ 1 54及びイ ンバータ 1 5 8を介してフ リ ップフロ ップ回路 1 5 9及び 1 6 0のク ロ ッ ク端子 Cに供給される 。 これによ り 、 フ リ ツアフロ ッ プ回路 1 5 9の Q端子は、 論理 1 の信号 2 1 1 を発生し、 フ リ ップフロ ップ回路 1 6 0の Q端子は、 論理 1の信号 2 1 2 を発生し、 信号 2 1 1 によってアナログス ィ ッチ 3 8 5 6及び 7 9はオン状態にされ、 キャパシタ 3 5、 5 3及 び 7 7の電荷は抵抗器 34 、 52及び 7 6 を介して放電さ れる一方、 信号 2 1 2によ ってゲート 7 2の一方の入力端 子は論理 1 に設定される。 ゲ ト 7 2の他方の入力端子は この時点では論理 0であるから、 ゲー ト 7 2の出力端子は 論理 0の信号を出力 し、 従ってアナログス ィ ッ チ 7 3は、 オフ状態である結果、 直流電源 7 4の電圧は抵抗器 7 5 を 介してキャパシタ 7 7の一方の端子には供耠されない一方 制御信号発生回路 3 9及び 5 8は、 論理 0の信号を出力す る結果、 アナログスィ ッチ 3 3及び 5 1 は、 オフの状態に 設定されている。 Next, at time t0, when the eggs 8 sent out by the feed-out conveyor 16 pass through the conveyor 16 while rolling under their own weight, a pulse signal from a detector (not shown) for detecting this is given. 21 0 is the terminal 15 1, Canon. It is supplied to the clock terminal C of the flip-flop circuits 159 and 160 via the inverter 154 and the inverter 158. As a result, the Q terminal of the flip-flop circuit 159 generates a signal 2 11 of logic 1 and the Q terminal of the flip-flop circuit 16 0 outputs the signal 2 1 of logic 1 Signal 2 11, the analog switches 3 8 5 6 and 7 9 are turned on by the signal 2 1 1, and the charges on the capacitors 3 5 5 6 and 7 7 turn on resistors 34, 52 and 7 6 While one of the input terminals of gate 72 is set to a logic one by signal 211. The other input terminal of get 72 is At this point, since the output is at logic 0, the output terminal of the gate 72 outputs a signal of logic 0, and thus the analog switch 73 is in the off state. While not supplied to one terminal of the capacitor 77 through 75, the control signal generation circuits 39 and 58 output a logical 0 signal, and as a result, the analog switches 33 and 51 It is set to off.
自重によ り転がって方向 9 に移動する卵 8がー番目の平 面 6 に落下する と 、 衝撃体 3は卵 8の落下によ る衝撃を受 け、 衝撃感知器 1 2は、 この衝撃を検出し電気信号を発生 する 。 この電気信号は、 増幅器 2 4及びフ ィ ルタ 2 5 を介 して信号 2 0 1又は 2 0 2 と して増幅器 2 9及び 4 7に供 給される と共に、 抵抗器 6 6 を介して増幅器 6 7に供給さ れ、 更に制御信号発生回路 3 9及び 5 8にも供耠される 。 時刻 t 1 で信号 2 0 1 又は 2 0 2が抵抗器 6 8及び 6 9で 規定される微小電圧以上になる と 、 増幅器 6 7の出力端子 は論理 1 とな り 、 これによ り ゲー ト 7 2の出力端子も論理 1 の信号 2 1 3 を発生する結果、 アナ Πグスィ ッチ 7 3は オン状態に設定される一方、 フ リ ップフ口 ップ回路 1 5 9 はリ セ ッ トされる 。 フ リ ツアフロ ッ フ回路 1 5 9の リセ ツ トによ り論理 1 の信号 2 1 1 は消失し、 アナ σグスィ ッ千 3 8 、 5 6及び 7 9は夫々オフ状態に設定される 。  When the egg 8 rolling in its own weight and moving in the direction 9 falls on the -th flat surface 6, the impact body 3 receives the impact of the fall of the egg 8, and the impact sensors 12 And generates an electrical signal. This electric signal is supplied to the amplifiers 29 and 47 as the signal 201 or 202 via the amplifier 24 and the filter 25, and is also supplied to the amplifier via the resistor 66. 67, and further to control signal generation circuits 39 and 58. At time t1, when the signal 201 or 202 becomes more than the minute voltage defined by the resistors 68 and 69, the output terminal of the amplifier 67 becomes logic 1 and the gate is thereby turned on. The output terminal of 72 also generates the signal 2 13 of logic 1, and as a result, the analog switch 73 is set to the on state, while the flip-flop circuit 159 is reset. . The reset of the flip-flop circuit 159 causes the signal 2 11 of logic 1 to disappear, and the analog σ switches 38, 56, and 79 to be turned off.
ゲー ト 7 2 の出力端子から論理 1 の信号 2 1 3が発生さ れる と 、 これを受信する制御信号発生回路 3 9は、 出力端 子に論理 1の信号 2 1 4を出力 し、 これによ り アナログス ィ ツチ 3 3はオン状態に設定され、 キャパシタ 3 5は増幅 器 2 9及びダイオード 3 1 を介して供給される信号 2 0 1 又は 2 0 2の正の部分の電圧で充電され、 この電圧は増幅 器 3 6から順次出力される 。 制御信号発生回路 3 9は、 信 号 2 1 3の受信後、 信号 2 0 1又は 2 0 2を観測し、 信号 2 0 1又は 2 0 2において最初のピークレベルの到来を検 出し、 時刻 t 2でこの最初のピーク レベルを検出する と 、 論理 1の信号 2 1 4の送出を停止する 。 信号 2 1 4の消失 でアナログスィ ッチ 3 3はオフ状態にされ、 この結果キヤ ノ、。シタ 3 5は信号 2 0 1又は 2 0 2のピークレベル L 1 の 電圧を保持する。 A logic 1 signal 2 1 3 is generated from the output terminal of gate 7 2. Then, the control signal generating circuit 39 receiving this outputs a signal 2 14 of logic 1 to the output terminal, whereby the analog switch 33 is set to the ON state, and the capacitor 35 Is charged with the voltage of the positive portion of the signal 201 or 202 supplied through the amplifier 29 and the diode 31, and this voltage is sequentially output from the amplifier 36. After receiving the signal 21, the control signal generator 39 observes the signal 201 or 202, detects the arrival of the first peak level in the signal 201 or 202, and detects the time t. When the first peak level is detected in 2, the transmission of the logic 1 signal 2 14 is stopped. With the disappearance of the signal 2 14, the analog switch 33 is turned off, and as a result, canon. The shifter 35 holds the voltage of the peak level L 1 of the signal 201 or 202.
制御信号発生回路 5 8は、 信号 2 1 3の受信後、 信号 2 0 1 又は 2 0 2を観測し、 信号 2 0 1又は 2 0 2において 最初のピーク レベルの到来を検出し、 時刻 t 2でこの最初 のピーク レベルを検出する と 、 論理 1 の信号 2 1 5 を送出 する 。 論理 1 の信号 2 1 5 を受信するアナログスィ ツチ 5 1はこれによ りオン状態にされ、 アナログスィ ッチ 5 6が 時刻 t 1 以後オフ状態に設定されているため、 キャパシタ 5 3は増幅器 4 7及びダイ オード 4 9 を介して供給される 信号 2 0 1又は 2 0 2の負の部分の電圧で充電され、 この 電圧は増幅器 54 を介して順次出力される 。 制御信号発生 回路 5 8は、 信号 2 1 5 を送出後、 更に信号 2 0 1 又は 2 0 2 を観測し、 信号 2 0 1 又は 2 0 2 において次のピーク レベル (図示の信号 2 0 1 又は 2 0 2の場合には最初の負 のピーク レベル) の到来を検出し、 時刻 t 4でこのピーク レベルを検出する と 、 論理 1 の信号 2 1 5の送出を停止す る 。 信号 2 1 5の消失でアナログスィ ツチ 5 1 はオフ状態 にされ、 この結果キヤノヽ 'シタ 5 3は信号 2 0 1 又は 2 0 2 の第 2のピーク レベル L 2の電圧を保持する 。 After receiving the signal 2 13, the control signal generation circuit 58 observes the signal 201 or 202, detects the arrival of the first peak level in the signal 201 or 202, and detects the time t 2 When this first peak level is detected, a signal 2 15 of logic 1 is transmitted. As a result, the analog switch 51 receiving the signal 2 15 of the logic 1 is turned on, and the analog switch 56 is set to the off state after the time t1, so that the capacitor 53 is connected to the amplifier 53. It is charged with the voltage of the negative part of the signal 201 or 202 supplied via the diode 47 and the diode 49, and this voltage is output in turn via the amplifier 54. Control signal generation After sending out the signal 2 15, the circuit 58 observes the signal 201 or 202 further, and detects the next peak level in the signal 201 or 202 (the signal 201 or 200 2 shown in the figure). In this case, the arrival of the first negative peak level) is detected, and when this peak level is detected at time t4, the transmission of the logic 1 signal 215 is stopped. With the disappearance of the signal 215, the analog switch 51 is turned off, so that the channel 53 holds the voltage of the second peak level L2 of the signal 201 or 202.
時刻 t 1 でアナログスィ ツチ 7 3がオン状態に、 アナ口 グスィ ッチ 7 9がオフ状態にされる と 、 キャパシタ 7 7が 直流電源 7 4の電圧によ り 、 信号 2 0 1 又は 2 0 2が再び 抵抗 6 8及び 6 9で規定される電圧まで、 すなわち、 増幅 器 6 7が論理 0の信号を出力 して信号 2 1 3が消失する時 刻 t 3 まで充電される 。 したがって、 信号 2 1 3が生じて いる期間は時間間隔 Tに対応し、 キャパシタ 7 7は、 直流 電源 7 4の電圧を時間間隔 Tの間充電する結果、 増幅器 7 8の出力端子に送出される電圧のレベルは、 時間間隔丁に 比例した値 L Tとなる 。 信号 2 1 5が供耠されるフ リ ップ フロ ップ回路' 1 2 2は、 信号 2 1 5の消失時点 t 4で D端 子 D 1 〜 D 5 に供給されている増幅器 9 7 、 1 0 0 、 1 0 5 、 1 1 0及び 1 1 5からの演算結果信号を記憶して、 そ れを夫々 Q 1 〜Q 5端子に出力する。 同じ く信号 2 1 5が 供給されている フ リ ッ プフ ロ ップ回路 1 6 0は、 信号 2 1 5の消失時点 t 4でリセ ッ ト され、 Q端子からの信号 2 1 2の送出を停止する。 信号 2 1 2が消失する と 、 ゲー ト 7 2の一方の入力端子は論理 0 となる。 フ リ ップフ D ップ回 路 1 2 2の Q端子 Q 1 〜Q 5 に生じる信号は、 ェクスクル ーシブオアゲート 1 2 3〜 1 2 7及びオアゲー ト 1 4 5 を 介して卵の排出機構 (図示せず〉 に供給される 。 従って フ リ ツアフ ロ ップ回路 1 2 2 の D端子に一つでも論理 1 の信 号を時刻 t 4で受信する と 、 卵の排出機楕ではひび割れ卵 と して処理する。 When the analog switch 73 is turned on and the analog switch 79 is turned off at time t 1, the capacitor 777 is turned on by the voltage of the DC power supply 74 to output the signal 201 or 20. 2 is charged again up to the voltage specified by the resistors 68 and 69, that is, until the amplifier 67 outputs a signal of logic 0 and the signal 2 13 disappears at time t3. Therefore, the period during which the signal 2 13 occurs corresponds to the time interval T, and the capacitor 77 charges the voltage of the DC power supply 74 for the time interval T, and as a result, is sent to the output terminal of the amplifier 78. The voltage level has a value LT proportional to the time interval. The flip-flop circuit '12 2 to which the signal 215 is supplied is connected to the amplifier 97, which is supplied to the D terminals D 1 to D 5 at the time t 4 when the signal 215 disappears, The operation result signals from 100, 105, 110, and 115 are stored and output to the Q1 to Q5 terminals, respectively. Similarly, the flip-flop circuit 160 to which the signal 2 15 is supplied is connected to the signal 2 1 The signal is reset at the time point t4 when the disappearance of 5, and the transmission of the signal 2 12 from the Q terminal is stopped. When the signal 2 12 disappears, one input terminal of the gate 72 becomes logic 0. The signals generated at the Q terminals Q1 to Q5 of the flip-flop D-pump circuit 122 are fed to the egg discharge mechanism (not shown) via the exclusive OR gates 123 to 127 and the OR gate 144. Therefore, when at least one signal of logic 1 is received at time t4 at the D terminal of the flip-flop circuit 122, it is treated as a cracked egg by the egg ejector ellipse. I do.
次に、 卵 8が第一番目の平面 6 を転がりながら通過して 第二番目の平面 6 に落下する よ う になる と 、 再び信号 2 1 0が端子 1 5 1 に供給され、 以下前記と 同じ動作が繰り返 され、 この動作は、 第 5番目の平面 6 を卵 8が自重によ り 転がりながら通過する まで行われる 。 卵排出機構は、 一つ の卵 8に対して第 5番目までの動作が完了する までオアゲ ー ト 1 4 5の出力信号を観測して 、 一つでも論理 1 の信号 がオアゲー ト 1 4 5から得られる と 、 その卵 8の殻は、 ひ びを有している ものと して排出する 。 尚、 ダイ オー ド 1 4 0〜 1 4 4及び 1 4 7 にて論理 1 の生起を 目視する こ とが でき る 。  Next, when the egg 8 rolls over the first plane 6 and falls on the second plane 6, the signal 210 is again supplied to the terminal 151, and The same operation is repeated, and this operation is performed until the egg 8 passes through the fifth plane 6 while rolling under its own weight. The egg ejection mechanism observes the output signal of OR gate 144 until the operation up to the fifth for one egg 8 is completed, and outputs at least one logical 1 signal to OR gate 14 5 , The shell of the egg 8 is discharged as having cracks. The occurrence of logic 1 can be visually observed with diodes 140 to 144 and 1407.
次に新たな卵 8が送 り 出 しコ ンベア 1 6から第一番目の 平面 6に供給される と 、 前記と同様の動作が繰 り返される 尚、 前記具体例では、 一部材からなる衝撃体 3で衝撃手 段を形成したが、 本発明はこれに限定されず、 例えば第 8 図及び第 9図に示すよ う に、 5個の個別のほぼ直方体の衝 擊体 3 0 1 を準備し、 衝擊体 3 0 1 の夫々 を段差 3 0 2 を 有する基台 3 0 3に、 個別の弾性部材 3 0 5を介して取り 付け、 各衝撃体 3 0 1 の各平面 3 0 6 を段差 3 0 7 を介し て配列して個別に衝撃体 3 0 1が衝擊を受ける よ う に衝擊 手段を形成しても よ く 、 この場合各衝撃感知器 3 0 9を平 面 3 0 6に対向する各衝撃体 3 0 1 の裏面に取 り付け、 衝 撃感知器 3 0 9の電気信号を決定装置 2 1 の増幅器 24に 供給する 。 この場合、 衝撃感知器 3 0 9からの各電気信号 は、 バッ フ ァ増幅器 3 1 0 を介して増幅器 24に供耠する と よ い。 Next, when a new egg 8 is sent out and supplied from the conveyor 16 to the first plane 6, the same operation as described above is repeated. Shock hand with body 3 Although a step was formed, the present invention is not limited to this. For example, as shown in FIGS. 8 and 9, five individual substantially rectangular parallelepiped bodies 301 were prepared, and 0 1 is attached to the base 300 having a step 302 via a separate elastic member 310, and each plane 300 of each impact body 301 is connected to the base 300 via a step 330. The impact means may be formed so that the impact bodies 301 are individually subjected to impact by arranging them in this case. In this case, each of the impact sensors 309 is connected to each of the impact bodies 3 opposed to the flat surface 306. The electric signal of the impact detector 309 is supplied to the amplifier 24 of the determination device 21. In this case, each electric signal from the shock detector 309 may be supplied to the amplifier 24 via the buffer amplifier 310.
また、 平面 6又は 3 0 6は、 水平に配置する必要はなく 卵 8の移動方向 9に関して下降するよ う に傾斜して配置し ても よ く 、 このよ う にする と卵 8の自重によ る転が り移動 が確実になる 。  Also, the plane 6 or 30 6 does not need to be arranged horizontally, and may be arranged so as to descend in the moving direction 9 of the egg 8. As a result, the rolling movement is ensured.
加えて 、 前記具体例では、 卵 8の転がり移動を保持しつ つ異なる複数部位で卵 8を落下せしめていたが、 本発明は これに限定されず、 例えば第 1 0図に示すよ う に、 段差 3 2 0 を介して連結された平面 3 2 1 を有した多角形体 3 2 2を準備し、 平面 3 2 1 に対向する多角形体 3 2 2の中心 孔 3 2 3に衝撃感知器 3 2 4 を取 り付け、 この衝擊体と し ての多角形体 3 2 2 を弾性部材 3 2 5 を介して回転軸 3 2 6に装着して衝擊手段を形成し、 回転軸 3 2 6の方向 3 2 7の回転によ り多角形体 3 2 2 を方向 3 2 7 に回転させ、 この回転で卵 8がー定位置で回転しつつ段差 3 2 0で落下 して平面 3 2 1 に衝突する よ う にして も よ い。 この場合、 一の卵 8の検査中、 卵 8が移動しないよ う に移動阻止部材 3 2 8及び 3 2 9 を多角形体 3 2 2の両側に配置する 。 In addition, in the above specific example, the egg 8 was dropped at a plurality of different sites while maintaining the rolling movement of the egg 8, but the present invention is not limited to this.For example, as shown in FIG. A polygon 3 2 2 having a plane 3 2 1 connected via a step 3 2 0 is prepared, and a shock sensor 3 is provided in the center hole 3 2 3 of the polygon 3 2 2 facing the plane 3 2 1. 2 4 All the polygons 3 2 2 are attached to the rotating shaft 3 2 6 via the elastic members 3 2 5 to form an impinging means, and the polygon 3 2 2 is rotated by the rotation 3 2 7 in the direction of the rotating shaft 3 2 6. 2 may be rotated in the direction 3 2 7, and this rotation may cause the egg 8 to rotate at a fixed position and fall on the step 3 20 to collide with the plane 3 2 1. In this case, during the inspection of one egg 8, the movement preventing members 328 and 329 are arranged on both sides of the polygonal body 322 so that the egg 8 does not move.
尚、 第 1 0図に示す具体例では、 衝撃体 3 2 2に複数の 衝撃感知器 3 2 4 を取 り付けたが、 これに代えて 、 第 1 1 図に示すよ う に、 回転軸 3 2 6の軸受 3 3 0に衝撃感知器 3 3 1 を取り付け、 軸受 3 3 0 を弾性部材 3 3 2 を介して 基台 3 3 3に装着して もよ く 、 この場合、 回転軸 3 2 6 と 衝撃体 3 2 2 とは弾性部材 3 2 5 を介する こ と なしに衝撃 体 3 2 2の中心孔 3 2 3で直接連結し得る 。  In the specific example shown in FIG. 10, a plurality of impact sensors 3 24 are mounted on the impact body 32 2, but instead of this, as shown in FIG. The impact sensor 3 3 1 may be attached to the 3 3 6 bearing 3 3 0, and the bearing 3 3 0 may be attached to the base 3 3 3 via the elastic member 3 3 2 .In this case, the rotating shaft 3 26 and the impacting body 322 can be directly connected to each other through the center hole 3233 of the impacting body 322 without passing through the elastic member 325.
更に、 前記具体例では、 卵 8の落下によ るエネルギを利 用して.卵 8を移動させているが、 第 1 2図及び第 1 3図に 示すよ う に、 無端チェーン 3 4 0 と無端チェーン 3 4 0 に 互いに平行となるよ う に取 り付けられた一対のローラ 3 4 1 群とからなる搬送装置 3 4 2によ り卵 8 を強制的に方向 9に転がせながら移動させて もよ く 、 この場合、 基台 3 4 3 に各弾性部材 3 4 4 を介して支持された各衝撃体 3 4 5 を傾かせてほぼ同位置に配置し、 進行方向 9 に鬨して上 り 坂と なる よ う に平面 3 4 6 を設定し、 これによ り段差 3 4 7 を形成する よ う に して も よ い。 卵 8は、 一対のローラ 3 4 1 と他の一対の α—ラ 3 4 1 との間に配置されて搬送さ れるが、 上流側の送 り 出し台 3 4 8及び下流側の受け台 3 4 9のそれぞれを一対の長尺部材で形成し、 こ の一対の長 尺部材間に空間 3 5 0及び 3 5 1 を形成して、 卵 8がその 長径を横にして転がりながら搬送されやすくする。 Further, in the specific example, the energy of the falling of the egg 8 is used to move the egg 8, but as shown in FIGS. 12 and 13, the endless chain 3 40 The egg 8 is forcibly moved while being rolled in the direction 9 by a conveying device 342 comprising a pair of rollers 341, which are attached to the endless chain 3410 so as to be parallel to each other. In this case, each impact body 345 supported by the base 3443 via the elastic member 3444 is tilted and disposed at almost the same position, Up The plane 346 may be set so as to become a slope, and a step 347 may be formed by this. The eggs 8 are conveyed while being arranged between a pair of rollers 34 1 and another pair of α-rollers 34 1, and the upstream delivery tray 34 8 and the downstream receiving tray 3 4 Each of 4 9 is formed of a pair of long members, and spaces 350 and 35 1 are formed between the pair of long members so that the eggs 8 can be easily transported while rolling with their long diameters lying sideways. I do.
第 1 2図及び第 1 3図に示す具体例では、 回転自在な一 対のローラ 3 4 1 群によ り卵 8 を転がせながら移動させて 各段差 3 4 7 を通過させているが、 ローラ 3 4 1 群の夫々 は必ずしも回転自在である必要はなく 、 単なる丸棒でも よ く 、 加えて、 第 1 4図に示すよ う に、 無端チェーン 3 4 0 に一対の押し板 3 5 5群を互いに平行となるよ う に取り付 けて卵 8の搬送装置を形成して も よ く 、 一対の押し板 3 5 5 と他の一対の押し板 3 5 5間に配置された卵 8は、 押し 板 3 5 5 に押されながら方向 9 に沿って搬送されて 、 段差 3 4 7で落下して衝撃体 3 4 5 に衝撃を発生させる 。  In the specific examples shown in FIGS. 12 and 13, the eggs 8 are moved while rolling by a pair of rotatable rollers 341 to pass through each step 347. Each of the 3 4 1 groups does not necessarily need to be rotatable, but may be a simple round bar. In addition, as shown in FIG. 14, a pair of push plates 3 5 5 is attached to an endless chain 3 40. May be attached so as to be parallel to each other to form a transfer device for the eggs 8, and the eggs 8 arranged between the pair of push plates 35 5 and the other pair of push plates 35 5 The sheet is conveyed along the direction 9 while being pushed by the push plate 355, and falls at the step 347 to generate an impact on the impact body 345.
また、 前記具体例では、 段差を介して配列された卵 8が 衝突する各 ®を連続する一平面でも って形成したが、 第 1 5図に示すよ う に、 段差 3 6 1 を介して配列される各面を Further, in the above-described specific example, each of the colliding eggs 8 arranged via the step is formed by a continuous one plane. However, as shown in FIG. 15, as shown in FIG. Each face to be arranged
—対の曲面 3 6 2 と して、 一対の曲面 3 6 2 を一対の平行 に配置された半円柱状部材 3 6 3及び 3 6 4で形成して も よ く 、 この場合、 半円柱状部材 3 6 3及び 3 6 4 を互い違 いに弾性部材 3 6 5 を介して基台 3 6 6 に支持し、 その他 の半円柱状部材 3 6 3及び 3 6 4 を直接基台 3 6 6 に支持 し、 弾性部材 3 6 5 を介して基台 3 6 6に支持された半円 柱状部材 3 6 3及び 3 6 4 にのみ衢撃感知器を取り付けて これら衝撃感知器からの電気信号のみを利用するよ う にし ても よい。 —As a pair of curved surfaces 36 2, a pair of curved surfaces 36 2 may be formed by a pair of semi-cylindrical members 36 3 and 36 4 arranged in parallel. In this case, the semi-cylindrical members 36 3 and 36 4 are alternately supported on the base 36 6 via the elastic members 365, and the other semi-cylindrical members 36 3 and 3 6 4 is directly supported on the base 36 6, and the striking detector is mounted only on the semi-cylindrical members 36 3 and 36 4 supported on the base 36 6 via the elastic member 36 5. Only the electric signals from these shock sensors may be used.
そ して又、 第 1 6図に示すよ う に、 卵 8の移動方向 9 に 沿って複数列、 本例では 3列の卵移動案内部材 3 7 1 、 3 7 2及び 3 7 3 を設け、 領域 3 7 4では、 案内部材 3 7 1 に、 領域 3 7 5では、 案内部材 3 7 2 に、 領域 3 7 6では 案内部材 3 7 3にそれぞれ複数の段差 3 7 7 を形成し、 領 域 3 7 4 を卵 8が転がりながら移動する際には、 卵 8の鋭 端 3 7 8近傍が案内部材 3 7 1 の段差 3 7 7 を介して落下 し、 領域 3 7 5 を卵 8が転がりながら移動する際には、 卵 8の中央部 3 7 9が案内部材 3 7 2の段差 3 7 7 を介して 落下し、 領域 3 7 6 を卵 8が転がりながら移動する際には 卵 8の鈍端 3 8 0近傍が案内部材 3 7 3の段差 3 7 7 を介 して落下する よ う にして、 卵 8の鋭端 3 7 8近傍、 中央部 3 7 9 、 鈍端 3 8 0近傍等の各部位の周囲、 好ま しく は全 周囲のひび割れの有無を個別に検出するよ う にして も よ い 更に、 衝撃を感知する手段と しては、 前記の例に限定さ れず、 例えば、 渦電流形変位ピッ クア ップ、 動電形速度ピ ッ ク アップ等の種々の感知器を用いる こ とができ る 。 Also, as shown in Fig. 16, a plurality of rows, in this example, three rows of egg movement guide members 371, 372, and 373 are provided along the movement direction 9 of the eggs 8. A plurality of steps 3777 are formed in the guide member 371, in the region 3774, in the guide member 372 in the region 3775, and in the guide member 3773 in the region 3776. When the egg 8 moves while rolling in the area 3 7 4, the vicinity of the sharp end 3 7 8 of the egg 8 falls through the step 3 77 of the guide member 37 1, and the egg 8 moves in the area 3 7 5 When moving while rolling, the central portion 379 of the egg 8 falls through the step 377 of the guide member 372, and when moving while rolling the egg 8 in the area 3776, the egg 8 So that the vicinity of the blunt end 380 of the egg 8 falls through the step 377 of the guide member 377, the vicinity of the sharp end 378 of the egg 8, the central portion 379, and the blunt end 380 Cracks around each part such as the vicinity, and preferably around the whole Further but it may also be in earthenware pots by individually detecting, in a means for sensing an impact, is limited to the examples of the Instead, for example, various sensors such as an eddy current displacement pickup and an electrokinetic velocity pickup can be used.
加えて 、 ひび割れの有無の決定において 、 第 2のピーク レベル L 2を用いたが、 本発明はこれに限定されず、 レべ ル L 2 と して第 1 のピーク と第 2のピーク との差、 すなわ ちいわゆる第 6図に示すピークからピーク までのレベル L 3を用いて も よい。  In addition, although the second peak level L2 was used in determining the presence or absence of cracks, the present invention is not limited to this, and the level L2 is defined as the difference between the first peak and the second peak. The difference, that is, the level L3 from peak to peak shown in FIG. 6 may be used.
一方、 具体例では比し 1 Z L 2 、 L 1 Z L T、 値 L丁 、 L 1 及び L 2の全てによって卵 8の殻のひび割れの有無を 決定したが、 スィ ッチ 1 3 0〜 1 3 4及び 1 3 5〜 1 3 9 のオン、 オフ状態を適宜選択設定して比 L 1 Z L 2 、 L 1 Z L T、 値 L T、 L 1 及び L 2のう ちの必要なものから卵 8の殻のひび割れの有無を決定するよ う にして も よ く 、 例 えば、 比 L 1 Z L 2 と予め設定された値と の比較のみから 又は比 L 1 / L 3 と予め設定された値との比較のみから卵 8の殻のひび割れの有無を決定するよ う に して も よ い。  On the other hand, in the specific example, the presence or absence of cracks in the shell of egg 8 was determined by all of 1 ZL 2, L 1 ZLT, values L, L 1, and L 2, but switches 13 0 to 13 4 And the on / off state of 135 to 13 9 as appropriate, and set the ratios L 1 ZL 2, L 1 ZLT, values LT, L 1 and L 2 to the required number of cracks in the shell of egg 8 May be determined, for example, only by comparing the ratio L 1 ZL 2 with a preset value or only by comparing the ratio L 1 / L 3 with a preset value. You may decide to determine if the shell of egg 8 is cracked.
以上のよ う に本発明によれば、 卵が落下する段差に続い て卵が衝突する面が設けられているため、 卵の殻のひび割 れの有無に鬨する信号を複数回に直って確実に得る こ とが でき 、 卵の殻のひび割れの有無を確実に検出するこ とがで さ る 。  As described above, according to the present invention, since the surface on which the egg collides is provided following the step where the egg falls, a signal that fights for the presence or absence of cracks in the egg shell can be corrected multiple times. It can be obtained reliably, and the presence or absence of cracks in the eggshell can be reliably detected.
加えて 、 単に衝撃面を複数配設したものであるから機械 的信頼性を極めて高く しえ 、 長期に亘つて卵の殻のひび割 れの有無を高い信頼度を も って検出し得る 。 In addition, simply because multiple impact surfaces are arranged Thus, the reliability of the eggshell can be extremely high, and the presence or absence of cracks in the eggshell can be detected with high reliability over a long period of time.

Claims

求 の 範 囲 Range of request
1 - 自重によ り卵を転がり移動させ、 この転が り移動中、 複数部位で卵を落下せしめ、 この各落下において所与の面 で卵を衝突させ、 この衝突によ り 当該面に生じる衝撃を感 知し、 この感知した衝撃から卵の殻のひび割れを検出する 方法。 . 1-The egg rolls under its own weight, causing the egg to fall at multiple locations during this rolling movement, causing the egg to collide with a given surface in each of the falls, resulting in this collision on the surface A method that senses impact and detects cracks in the eggshell from this sensed impact. .
2 - 卵を一定位置で転がせつつ複数回一定位置で卵を落下 せしめ、 この各落下において所与の面で卵を衝突させ、 こ の衝突によ り 当該面に生じる衝撃を感知し、 この感知した 衝撃から卵の殻のひび割れを検出する方法。  2-The egg is dropped at a certain position several times while rolling the egg at a certain position.Each fall causes the egg to collide with a given surface, and the impact generated by the collision on the surface is sensed. How to detect cracks in egg shells from impact.
3 . 卵を強制的に転がせながら搬送し、 この転がされなが ら搬送される卵を当該搬送中、 複数回落下せしめて卵を複 数回所与の面で衝突させ、 この衝突によ り 当該面に生じる 衝撃を感知し、 この感知した衝撃から卵の殻のひび割れを 検出する方法。  3. The egg is transported while being rolled forcibly, and the egg transported while being rolled is dropped a plurality of times during the transport to collide the egg multiple times on a given surface. A method of detecting the impact generated on the surface and detecting cracks in the egg shell from the detected impact.
4 . 自重によ り転がりつつある卵の当該転がり移動を保持 しつつ複数部位で卵を落下せしめて卵を複数回所与の面で 衝突させ、 この衝突によ り衝撃を受ける手段と 、 この衝撃 を受ける手段における所与の面への卵の衝突によ り生じる 衝撃を感知する手段と 、 この感知する手段から送出される 衝撃感知信号によ り卵の殻のひび割れの有無を決定する手 段と を具備する卵の殻のひび割れを検出する装置。 4. While keeping the rolling movement of the egg being rolled by its own weight, drop the egg at a plurality of portions to collide the egg with a given surface a plurality of times, and a means for receiving an impact by the collision, Means for sensing the impact caused by the impact of the egg on a given surface in the means for receiving the impact, and means for determining the presence or absence of cracks in the egg shell based on the impact sensing signal sent from the sensing means An apparatus for detecting cracks in an egg shell, comprising: a step;
5 . 衝撃を受ける手段は、 基台と 、 複数部位で卵を落下せ しめて卵を複数回衝突させるベく 、 段差を介して連結され た複数の面を有する単一部材からなる衝撃体と 、 基台に対 して衝撃体を弾性的に保持すべく 、 基台と衝撃体との間に 設けられている弾性部材どを具備してお り 、 衝撃を感知す る手段は、 衝撃体に取 り付けられている請求項 4の卵の殻 のひび割れを検出する装置。  5. The means for receiving the impact includes: a base; an impact body made of a single member having a plurality of surfaces connected via steps to drop the egg at a plurality of sites to collide the egg a plurality of times; In order to elastically hold the impact body with respect to the base, an elastic member is provided between the base and the impact body, and the means for sensing the impact is provided on the impact body. The device for detecting cracks in an egg shell according to claim 4, which is attached.
6 . 衝撃を受ける手段は、 基台と 、 夫々が所与の面を有し た複数の衝撃体と 、 基台に対して複数の衝撃体の夫々 を独 立に弾性-的に保持すべく 、 基台と各衝撃体との間に設けら れている弾性部材と を具備してお り 、 所与の面は、 複数部 位で卵を落下せしめて卵を複数回衝突させるベく 、 段差を もって配列されてお り 、 衝撃を感知する手段は、 各衝撃体 に取 り付けられた衝撃感知器からなる請求項 4の卵の殻の ひび割れを検出する装置。  6. The means for receiving an impact includes a base, a plurality of impact bodies each having a given surface, and a plurality of impact bodies independently elastically held against the base. And a resilient member provided between the base and each impacting body, wherein the given surface is configured to drop the egg at a plurality of positions to collide the egg multiple times, 5. The device for detecting cracks in an egg shell according to claim 4, wherein the device is arranged with a step and the means for detecting an impact comprises an impact sensor attached to each impacting body.
7 - 所与の面は、 卵の移動方向に鬨して水平に設けられて いる請求項 4から 6のいずれかの卵の殻のひび割れを検出 する装置。  7-The device for detecting cracks in an egg shell according to any one of claims 4 to 6, wherein the given surface is provided horizontally in a direction of movement of the egg.
8 . 所与の面は、 卵の移動方向に鬨して傾斜して設けられ ている請求項 4から 6のいずれかの卵の殻のひび割れを検 出する装置。 9 - 決定する手段は、 感知された信号のう ち不要な高周波 信号を除去する手段と 、 この除去する手段からの不要な高 周波信号が除去された信号において最初のピーク レベルと これに続く次のピーク レベルに関連したレベルとの比と予 め設定された値と を比較する手段と を具備し、 ft較する手 段の比較結果に基づいて卵の殻のひびの有無を決定する よ う に構成されている請求項 4から 6のいずれかの卵の殻の ひび割れを検出する装置。 8. The device for detecting cracks in an egg shell according to any one of claims 4 to 6, wherein the given surface is provided so as to be inclined in a moving direction of the egg. 9-The means for determining comprises: means for removing unwanted high-frequency signals from the sensed signal; the first peak level in the signal from which unwanted high-frequency signals have been removed from the sensed signal; Means for comparing the ratio of the level associated with the peak level of the egg with a preset value, and determining the presence or absence of cracks in the egg shell based on the result of the ft comparison. An apparatus for detecting cracks in an egg shell according to any one of claims 4 to 6, wherein the crack is detected.
1 0 . 卵を強制的に転がせながら搬送する手段と 、 この搬 送する手段によ り転がされながら搬送される卵を当該搬送 中、 複数回落下せしめて卵を複数回所与の面で衝突させ、 この衝突によ り衝撃を受ける手段と 、 この衝撃を受ける手 段における所与の面への卵の衝突によ り生じる衝撃を感知 する手段と 、 この感知する手段から送出される衝撃感知信 号によ り卵の殻のひび割れの有無を決定する手段と を具備 する卵の殻のひび割れを検出する装置。  10. Means for forcibly transporting the egg while rolling it, and dropping the egg conveyed while being rolled by the transporting means a plurality of times during the transportation so that the egg can be transported multiple times on the given surface. Means for colliding and receiving an impact from the collision, means for sensing the impact caused by the impact of the egg on a given surface in the means for receiving the impact, and impact transmitted from the sensing means Means for determining the presence or absence of cracks in the eggshell based on the sensing signal. A device for detecting cracks in the eggshell.
1 1 . 衝撃を受ける手段は、 基台 と 、 異なる複数部位で卵 を落下せしめて卵を複数回衝突させるベく 、 段差を介して 連結された複数の面を有する単一部材からなる衝撃体と 、 基台に対して衝撃体を弾性的に保持すべく 、 基台と衝撃体 との間に設けられている弾性部材と を具備している請求項 1 0の卵の殻のひび割れを検出する装置。 11 1. The means for receiving the impact is a base and an impact body made of a single member having a plurality of surfaces connected via steps to drop the eggs at a plurality of different portions and collide the eggs multiple times. 10. The egg shell of claim 10, further comprising: an elastic member provided between the base and the impact body to elastically hold the impact body with respect to the base. Equipment to do.
1 2 . 衝撃を受ける手段は、 基台と 、 夫々が所与の面を有 した複数の衝撃体と 、 基台に対して複数の衝撃体の夫々 を 独立に弾性的に保持すべく 、 基台と各衝撃体との間に設け られている弾性部材と を具備してお り 、 所与の面は、 複数 部位で卵を落下せしめて卵を複数回衝突させるベく 、 段差 をも って配列されている請求項 1 0の卵の殻のひび割れを 検出する装置。 1 2. The means for receiving an impact includes a base, a plurality of impact bodies each having a given surface, and a base for independently and elastically holding each of the plurality of impact bodies with respect to the base. An elastic member is provided between the table and each impacting body, and the given surface has a step to drop the egg at a plurality of portions and collide the egg multiple times. 10. The device for detecting cracks in an egg shell according to claim 10, which is arranged in a row.
1 3 . 卵を強制的に転がせながら搬送する手段は、 互いに 平行に配置された複数のローラを有してお り 、 このローラ の間に卵を配置して卵を搬送する よ う に構成されている請 求項 1 0の卵の殻のひび割れを検出する装置。  1 3. The means for forcibly rolling and transporting the eggs has a plurality of rollers arranged in parallel with each other, and is configured to transport the eggs by arranging the eggs between these rollers. Claim 10 A device that detects cracks in the eggshell.
1 4 . 卵を強制的に転がせながら搬送する手段は、 互いに 平行に配置された複数の押し板を有してお り 、 この押し板 の間に卵を配置して卵を搬送する よ う に構成されている請 求項 1 0の卵の殻のひび割れを検出する装置。  1 4. The means for forcibly rolling and transporting the eggs has a plurality of push plates arranged in parallel with each other, and arranges the eggs between the push plates so that the eggs are transported. A device for detecting cracks in the eggshell of claim 10 which is constituted.
1 5 - 所与の面は、 卵の移動方向に鬨して水平に設けられ ている請求項 1 0から 1 4のいずれかの卵の殻のひび割れ を検出する装置。  15. The device for detecting cracks in an egg shell according to any one of claims 10 to 14, wherein the given surface is provided horizontally in a direction of movement of the egg.
1 6 . 所与の面は、 卵の移動方向に鬨して傾斜して設けら れている請求項 1 0から 1 4のいずれかの卵の殻のひび割 れを検出する装置。  16. The device for detecting cracks in an egg shell according to any one of claims 10 to 14, wherein the given surface is provided so as to be inclined in a direction of movement of the egg.
1 7 . 決定する手段は、 感知された信号のう ち不要な高周 波信号を除去する手段と 、 この除去する手段からの不要な 高周波信号が除去された信号において最初のピーク レベル と これに続く 次のピーク レベルに関連したレベルとの比と 予め設定された値と を比較する手段と を具備し、 比較する 手段の比較結果に基づいて卵のひびの有無を決定するよ う に構成されている請求項 1 0から 1 4の卵の殻のひび割れ を検出する装置。 17. Means to determine are unnecessary high frequencies among the sensed signals. Means for removing the wave signal, and a ratio between the first peak level and the level related to the next peak level following the signal in which the unnecessary high-frequency signal has been removed from the means for removing the wave signal, and a preset value. The apparatus for detecting cracks in an egg shell according to any one of claims 10 to 14, further comprising means for comparing the egg shells, wherein the apparatus is configured to determine the presence or absence of a crack in the egg based on a comparison result of the means for comparing. .
1 8 . 卵を一定位置で転がせつつ複数回一定位置で卵を落 下せしめ、 この各落下において所与の面で卵を衝突させ、 この衝突によ り衝撃を受ける手段と 、 、 この衝撃を受ける 手段における所与の面への卵の衝突によ り生じる衝撃を感 知する手段と 、 この感知する手段から送出される衝撃感知 信号によ り卵の殻のひび割れの有無を決定する手段と を具 備する卵の殻のひび割れを検出する装置。  18. Rolling the egg at a certain position several times while rolling the egg at a certain position, causing the egg to collide with a given surface in each of the drops, and a means for receiving an impact by the collision; Means for sensing the impact caused by the impact of the egg on a given surface in the receiving means, and means for determining the presence or absence of cracks in the egg shell based on the impact sensing signal sent from the sensing means A device that detects cracks in egg shells.
1 9 . 衝撃を受ける手段は、 複数の面を有し、 各面が段差 を介して連結された多角形体と 、 この多角形体の中心孔に 揷入された回転軸と 、 多角形体を弾性的に支持すべく 、 多 角形体の中心孔において回転軸と多角形体との間に設けら れた弾性体と'を具備してお り 、 感知する手段'は、 多角形体 に設けられている請求項 1 8の卵の殻のひび割れを検出す る装置。  19. The means for receiving an impact includes a polygon having a plurality of surfaces, each surface being connected via a step, a rotation axis inserted into a center hole of the polygon, and an elastic body. And an elastic body provided between the rotation axis and the polygonal body in the center hole of the polygonal body to support the polygonal body. The means for sensing is provided in the polygonal body. Item 18 A device for detecting cracks in egg shells.
2 0 . 衝撃を受ける手段は、 基台と 、 複数の面を有し、 各 面が段差を介して連結された多角形体と 、 この多角形体の 中心孔に揷入された回転軸と 、 この回転軸を回転自在に支 持する軸受と 、 軸受を弾性的に支持すべく 、 軸受と基台 と の間に設けられた弾性体と を具備してお り 、 感知する手段 は、 軸受に設けられている請求項 1 8の卵の殻のひび割れ を検出する装置。 20. The means for receiving an impact has a base and a plurality of surfaces. A polygon whose surfaces are connected via a step, a rotating shaft inserted into a central hole of the polygon, a bearing rotatably supporting the rotating shaft, and a bearing for elastically supporting the bearing. 19. The device for detecting cracks in an egg shell according to claim 18, comprising: an elastic body provided between the bearing and the base; and the means for sensing is provided on the bearing.
PCT/JP1990/001065 1989-11-06 1990-08-22 Method of and device for detecting crack in eggshell WO1991006211A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP1/288197 1989-11-06
JP1288197A JPH03147724A (en) 1989-11-06 1989-11-06 Method for sensing crack of hen's egg and apparatus therefor
JP34489489 1989-12-29
JP1/344894 1989-12-29

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Cited By (5)

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Publication number Priority date Publication date Assignee Title
NL9401388A (en) * 1994-08-26 1996-04-01 Leuven K U Res & Dev Device for checking eggs
JP2014060957A (en) * 2012-09-21 2014-04-10 Naberu:Kk Egg inspection apparatus
CN109496908A (en) * 2018-12-11 2019-03-22 湖南芭颉生态农牧有限公司 Egg screening plant
CN109526805A (en) * 2018-12-11 2019-03-29 湖南芭颉生态农牧有限公司 Egg screening system
CN109526804A (en) * 2018-12-11 2019-03-29 湖南芭颉生态农牧有限公司 Egg screening technique

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JPS58170416A (en) * 1982-03-15 1983-10-07 野口 昌巳 Egg distinguishing apparatus
JPS62151749A (en) * 1985-12-26 1987-07-06 Noboru Fukuma Flaw detecting method for egg

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Publication number Priority date Publication date Assignee Title
JPS58170416A (en) * 1982-03-15 1983-10-07 野口 昌巳 Egg distinguishing apparatus
JPS62151749A (en) * 1985-12-26 1987-07-06 Noboru Fukuma Flaw detecting method for egg

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL9401388A (en) * 1994-08-26 1996-04-01 Leuven K U Res & Dev Device for checking eggs
US5696325A (en) * 1994-08-26 1997-12-09 K. U. Leuven Research & Development Apparatus for testing eggs
JP2014060957A (en) * 2012-09-21 2014-04-10 Naberu:Kk Egg inspection apparatus
CN109496908A (en) * 2018-12-11 2019-03-22 湖南芭颉生态农牧有限公司 Egg screening plant
CN109526805A (en) * 2018-12-11 2019-03-29 湖南芭颉生态农牧有限公司 Egg screening system
CN109526804A (en) * 2018-12-11 2019-03-29 湖南芭颉生态农牧有限公司 Egg screening technique
CN109526805B (en) * 2018-12-11 2022-04-08 上海夏实科技集团有限公司 Egg screening system

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