WO1984001622A1

WO1984001622A1 - Apparatus for detecting unevenness in thickness of thread

Info

Publication number: WO1984001622A1
Application number: PCT/JP1983/000343
Authority: WO
Inventors: Kimio Nishitani
Original assignee: Aichi Spinning Co
Priority date: 1982-10-13
Filing date: 1983-10-13
Publication date: 1984-04-26
Also published as: JPS5968606A

Abstract

An apparatus photoelectrically detects any unevenness in the thickness of a thread formed of silver, roving or yarn, independently of environmental conditions such as temperature. A light-emitting element is provided with two light-beam outlets, and two light-receiving elements are arranged so as to correspond to the ligh-beam outlets. In this case, the light beams from one of the light-beam outlets reaches the corresponding light-receiving element through a thread, while the light beams from the other light-beam outlet reaches the other light-receiving element directly. The two light-receiving elements are positioned within the same environment, and the difference in the quantity of light received by the two light-receiving elements is employed to detect unevenness in the thickness of the thread.

Description

Specification .

Detecting device for uneven thickness of thread

Technical field

The present invention relates to a device for detecting uneven thickness of a thread body.o

Background art

The term “thread body” as used herein generally means a sliver, a roving or a thread made of fiber. At present, as a device for measuring the thickness unevenness of a thread, particularly a shaper, a device for detecting a change in the capacitance of the thread or a thread having a predetermined cross-sectional area is passed through the thread. A device for detecting a change in air pressure that occurs at the time is known. In these known devices, the influence of atmospheric humidity on the detected value cannot be ignored. In other words, in the device that uses the capacitance to detect uneven thickness: the moisture content of the fiber changes when the humidity in the atmosphere changes, and the capacitance between the resulting electrodes Fluctuates. On the other hand, in a device that detects uneven thickness by using air pressure, when the humidity in the atmosphere changes, the resistance of the airflow passing through the gap between the iron fibers in the filament changes. As a result, the air pressure fluctuates. Therefore, the detected value of the thickness unevenness of the thread deviates from a correct value due to the fluctuation of the capacitance or the air pressure.

Light is used as a device to detect uneven thickness of other filaments. A device using a wire, that is, a photoelectric thickness unevenness detecting device is known. Although this device can remove the effect of humidity by using light, it is said that the light-emitting element of this detector is unstable with respect to changes in the temperature in the spinning room. It has disadvantages. For example, when measuring the thickness of a thread having the same thickness using the same light source, if there is a temperature difference in the environment where the light emitting element is placed, the signal emitted from the light receiving element The values are different. Also, the light-receiving element is affected by temperature, although its value is lower than the light-emitting element. Therefore, it is impossible to detect the correct value of the thickness of the filament using a light beam under the condition where the temperature changes. In addition, if the thickness unevenness is controlled on the textile machine based on the value of the thickness unevenness of the filament detected using the light beam, a new value generated based on the temperature characteristics of the light receiving element and the like is obtained. ¾Variation may be added to the thread processed by the textile machine.

Disclosure of the invention

SUMMARY OF THE INVENTION An object of the present invention is to eliminate the disadvantages of the known thread thickness unevenness detection system and to be affected by environmental changes such as humidity and temperature in a spinning room. A device for detecting the

An object of the present invention is a device * for detecting uneven thickness of a running filament,

― CMFI The device includes a light emitting element having a first light beam emitting port and a second light beam emitting port for emitting light beams in two different directions, respectively, and travels the light beam from the first light beam emitting port as an object to be measured. A first light receiving element for receiving light through the filament, a second light receiving element for directly receiving light from the second light emitting port, and a light receiving element coupled to the first light receiving element and the second light receiving element. A measuring and calculating device for comparing and calculating the signals from the respective light receiving elements and calculating the difference as a variation in the thickness of the filament.

The first and second light receiving elements are arranged in the same environment, and the object is achieved by a yarn thickness unevenness detecting device, which is characterized by the following.

In the thickness unevenness detection device according to the present invention, the first light receiving element receiving light emitted from the light emitting element and arriving via the filament and the second light receiving element receiving light arriving directly from the light emitting element are the same. Since it is located in the environment, the effect of the temperature * applied to the first light receiving element and the temperature applied to the second light receiving element when the temperature of the spinning chamber changes are the same. In addition, in the detection amount of the thread thickness unevenness according to the present invention, the thread thickness unevenness is based on a difference between a signal from the first light receiving element and a signal from the second light receiving element. Since it is configured to be calculated as follows, the effect of the temperature applied to the light emitting element is compensated.

Light emission from the device for detecting unevenness in the thickness of the thread's strip according to the present invention

_ OMFI wi? O There are several methods for disposing the element, the first light receiving element, and the second light receiving element. One of these methods is a method in which the above three elements are arranged near the outer wall of a reducer of a textile machine such as a drawing machine. In this case, the position where the first light-receiving element, which receives the light beam emitted from the first light-emitting / emitting port of the light-emitting element through the running thread, for example, the driver, is mounted on the laser, Opposite the location where the element is mounted.

The arrangement of the three elements may be set at a position distant from the reducer and in the same environment by using an optical fiber. In this case, at least the first light receiving element and the second light receiving element need to be kept in the same environment. The other end of each optical fiber having one end connected to the first light receiving element and the second light receiving element arranged at an appropriate place inside the steel machine or outside the steel machine is a steel machine, for example, a kneading machine. Open towards the inside of the reducer of Article ¾. In this case, in order to eliminate the effect of the decrease in the amount of light that occurs throughout the length of the optical fiber, the length from the first light emitting port of the light emitting element to the first light receiving element and the second light emitting port of the light emitting element are removed. A means for substantially equalizing the length from the first light-receiving element to the second light-receiving element, or for eliminating the effect caused by the difference in the length of the optical fiber, for example, in an arithmetic unit. In addition, a device that can perform zero point correction for one of the two signals from the light receiving element is added. May be good.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram showing a thickness unevenness of a thread obtained by a known photoelectric thickness unevenness detecting device.

FIG. 2 is a diagram showing an uneven thickness of a thread obtained by the uneven thickness detecting device according to the present invention.

FIG. 3 is a schematic diagram showing one embodiment of the thickness unevenness detecting device according to the present invention.

FIG. 4 is a longitudinal sectional view of a laser used in the embodiment shown in FIG.

FIG. 5 is a perspective view showing the arrangement of the thickness unevenness detecting device of the present invention in the embodiment shown in FIG.

FIG. 6 is a schematic diagram showing another embodiment of the thickness unevenness detecting device according to the present invention.

FIG. 7 is a perspective view showing the arrangement of the thickness unevenness detecting device of the present invention in the embodiment shown in FIG.

BEST MODE FOR CARRYING OUT THE INVENTION

In the case where a conventionally known photoelectric thickness unevenness detecting device * is used for the strip, the light-emitting element and the light-receiving element are arranged on both sides in the traveling direction of the slider in the reducer. It has been. Therefore, the light emitted from the light emitting element is absorbed by the striper and the remaining light arrives at the light receiving element, and as a result, the thickness of the fiber is increased by the amount of absorbed light. Unevenness is detected. This well-known photoelectric type

C PI In the detection device, when the temperature changes from the start of use of the device, the output of the light receiving element fluctuates even when a slicer of the same thickness is used.

For example, suppose that the temperature of the environment in which the light emitting element and the light receiving element are arranged has changed from 25 to 35 by 1 O :. Such a temperature change is caused by an increase in temperature due to the operation of the machine base and an increase in temperature due to frictional heat of the slider with the laser. In the light emitting device (infrared emitting diode manufactured by Sharp Corporation) used in the uneven thickness detection device of the filament of the present invention, the radiant flux of the light emitting device is-temperature rises by 1 O: Then it will decrease about 14 times. On the other hand, the light receiving element (Pin Silicon Photodai S-118, manufactured by Hamamatsu Photonics) used in the uneven thickness detection device of the present invention has a light receiving element. Sensitivity increases by about 2% as temperature increases. Therefore, when a detector is manufactured by combining the light emitting element and the light receiving element, the output from the light receiving element decreases by about 10 to 12 for a temperature rise of 1 o: It rises by about 10 to 12 for a 0 degree decrease in the degree of the Phoenix.

In m 1, the influence of the temperature change in the aforementioned environment on the thickness unevenness diagram of the filament obtained by the conventionally known photoelectric thickness unevenness detecting device * is shown. In FIG. 1, in the vertical axis, the signal from the light receiving element is amplified and is shown in mV as a numerical value indicating the uneven thickness. Indicates a time axis. In Fig. 1, the drawing machine starts at time TQ. First by the Hare Nim et line shown in FIG. FIG drops immediately after the time T _0. This indicates that, as described above, the output from the light receiving element decreases due to an increase in the temperature of the area where the light emitting element and the light receiving element are arranged. In time. About 10 days after, the environment stabilizes at a high temperature, and thereafter, the graph fluctuates at a low level.

-Assume that the temperature of the environment drops by about 10 from time τ. If this becomes the this change a high-les bell Remind as al diagram drink time between tau ₂ from the time the first FIG. Such temperature changes are always present during the operation of a spinning mill.

Therefore, with the conventionally known photoelectric thickness unevenness detecting device, not only does the level of the unevenness diagram decrease at the start of the spinning machine, but also the unevenness of the unevenness diagram due to the change in the environment during operation. When the level fluctuates, it is possible to correctly grasp the thickness unevenness of the resulting filamentous body.

According to the present invention, the light emitting element and the light receiving element are arranged as shown in FIG. 2 by using the uneven thickness detecting device for the thread body described in claim 1. Even if the temperature of the environment changes, an unevenness diagram can be obtained at the same level.

The present invention will be described with reference to FIGS. 3, 4, and 5.

Ο ΡΙ An example in which an embodiment of the apparatus for detecting unevenness in the thickness of a thread body used in a drawing machine will be described.

As shown in FIG. 5, the web 16 sent from the pair of front rollers 17 of the drawing machine is slurried through the top calendar rollers 18. The driver 2 and the driver 2 pass through the laser 1 attached to the laser support plate 24, and are driven by the port and the tom calender roller 19. It is sent down. As shown in FIG. 3, a light beam passage hole is provided in a cylindrical portion below the laser 1 in a direction substantially perpendicular to the axial direction of the laser 1. The light emitting element 3 is arranged on one side of the laser 1 in the axial direction of the light beam passage hole, and the first light receiving element 6 is arranged on the other side. As shown in FIG. 3, the light emitting element 3 is provided with two light emitting ports, that is, a first light emitting port 14 and a second light emitting port 15. Then, a second light receiving element 7 is arranged in front of the second light emitting port 15 of the light emitting element 3. Accordingly, the light beam 4 emitted from the first light emitting port 14 of the light emitting element 3 reaches the first light receiving element 6 through the slider 2 of the laser 1 circle. In this case, the light beam 4 is absorbed by the taper 2 of the reducer 1 and its light quantity is reduced. On the other hand, the light beam 5 emitted from the second light beam emitting port 15 of the light emitting element 3 directly reaches the second light receiving element 7.

FIG. 4 shows an embodiment of the thickness unevenness detecting apparatus according to the present invention. FIG. 3 is a cross-sectional view of a laser 1 used. The light-emitting element 3, the first light-receiving element 6, and the second light-receiving element 7 shown in FIG. 3 are housed in a cylindrical portion below the laser 1 as shown in FIG. ing . The size of the laser user 1 shown in FIG. 4 is, for example, a maximum diameter of 50 square meters and a length of 33 m, and is a downstream laser when viewed in the traveling direction of the slideshower indicated by arrow A. The light-emitting element 3, the first light-receiving element 6, and the second light-receiving element 7 are accommodated in the cylindrical portion (the length is about 10 mm) below the user 1, so that When a temperature change occurs in the laser sensor, the temperatures received by the light-emitting element 3, the first light-receiving element 6, and the second light-receiving element 7 can be kept substantially the same. . The light emitting element 3, the first light receiving element 6, and the second light receiving element 7 are provided with terminals 31, 61, 71, respectively.

The light emitting element 3 is energized by connecting a conductor 20 of a power source (not shown) to a terminal 31. On the other hand, the amount of light received by the first light receiving element 6 is converted into a current, and from the terminal 6 1 to the measurement and calculation device 10 via the conductor 22, and the amount of light received by the second light receiving element 7 is converted into a current and converted into a terminal. From 7 1, it reaches the measurement and calculation device 10 via the conductor 23. The measurement operation device 10 shown in FIG. 3 includes the operation device 11. Arithmetic unit 11 was obtained via lead 22 and light quantity of first light receiving element 6 obtained via lead 22

OMPI

,> V / IFO The difference between the light amounts of the second light receiving element 7 is electrically calculated. If necessary, a known display device 12 is connected by a conductor wire 210 to display the calculation result of the calculation device 11. As shown in FIG. 5, it is preferable to arrange the arithmetic unit 11 and the display unit 12 separately in the measurement arithmetic unit 10 that is actually used. That is, the arithmetic unit 11 is arranged on the frame 25 of the drawing machine, while the display unit 12 is arranged at an appropriate position in the drawing machine, and the space between the arithmetic unit 11 and the display unit 12 is provided. A current is supplied from a power supply (not shown) to the arithmetic unit connected via the conductor 210 via the conductor 100. Note that a lead wire 200 including the conductors 20, 21, and 23 is disposed between the laser user 3 and the arithmetic device 11.

The display device 12 is a device that shows an irregular diagram as a graph with time. However, in the uneven thickness detecting device of the thread according to the present invention, the display device 12 is not an essential component, but a numerical value calculated by the device 11 of the uneven thickness detecting device 10. May be transmitted to a mechanism other than the apparatus of the present invention, such as a control mechanism for uneven thickness of the filament, and used for controlling the uneven thickness of the filament.

In the above-described embodiment of the uneven thickness detecting apparatus according to the present invention, the light receiving element 3, the first light receiving element 6, and the second light receiving element 7 are located in a very close area as shown in FIG. It is arranged so that the temperature change in the spinning room Even if there is a change in the environment such as temperature, etc.

The environment such as the temperature received by the three elements 3, 6, 7 is kept substantially the same. In addition, since the uneven thickness detection device according to the present invention detects uneven thickness using the difference between the amount of light received by the first light receiving element 6 and the amount of light received by the second light receiving element 7, the light element 3 = It can compensate for the effects of temperature.

As the light emitting element 3 and the light receiving elements 6 and 7, various elements can be used. For example, as the light emitting element 3, an infrared light emitting diode manufactured by Sharp Corporation

Use the GL-450 and use the Hamamatsu Photonics PIN Silicon Photo Die PS-118 as the first and second light receiving elements 6 and 7. And mosquitoes.

Next, with reference to FIGS. 6 and 7, a description will be given of a case where another embodiment of the apparatus for detecting uneven thickness of a thread according to the present invention is used in a drawing machine. In the configuration of this other embodiment, as shown in FIG. 6, the light beam from the light emitting element 3 is transmitted to the first light receiving element by using optical fibers 32, 33, and 34. The configuration is the same as the embodiment shown in FIGS. 3, 4, and 5 except for the configuration guided to 6 and the second light receiving element 7. That is, as shown in FIG. 6, the light beam from the first light beam emitting port 14 of the light emitting element 3 reaches the laser 1 through the optical fiber 32, and is After passing through the slider 2 in the fuser 1, it passes through the optical fiber 33.

O PI

, WIPO

' To the first light receiving element 6. On the other hand, the light beam from the second light emitting port 15 of the light emitting element 3 directly reaches the second light receiving element 7 through the optical fiber 34. The difference between the amounts of light reaching the first light receiving element 6 and the second light receiving element 7 is electrically calculated by the arithmetic unit 11 in the measurement arithmetic unit 10 in the same manner as in the above-described embodiment, and is a known display device. In the case where the device of the embodiment shown in FIG. 12 and used in the embodiment shown in FIG. 6 is used for a stripping machine, as shown in FIG. 7, the photoelectric device housing device 41 and the arithmetic device 11 are connected. It is said that it is housed in the processing device 40 arranged on the machine stand 25 of the drawing machine. Optical fibers 32 and 33 are connected between the processing device 40 and the laser 1. The light emitting element 3 and the second light receiving element 7 are connected by an optical fiber 34 as shown in FIG. However, if the light emitting element 3 and the second light receiving element 7 can be arranged close to each other in the photoelectric element housing device 41, the light emitting element 3 and the second light receiving element 7 can be directly connected without using the optical fiber 34. Is also good.

In the embodiment shown in FIGS. 6 and 7, the light emitting element 3, the first light receiving element 6, and the second light receiving element 7 are arranged in a further close positional relation by using an optical fiber. It is possible to place it. If necessary, it can be placed in a specific container as shown in Fig. 7, so that the same environment can be maintained. It is not necessary for the light emitting element 3 to be in the same environment as the first light receiving element 6 and the second light receiving element 7 as the thickness unevenness detecting device of the present invention, but it is dustproof. Considering other conditions, it is preferable to be in the same environment.

Since the optical fiber used in the embodiment shown in FIGS. 6 and 7 has a relatively short distance (approximately: lw), various commercially available optical fibers can be used. Can be used. For example, ST-200H (loss 15 dB / Km) manufactured by Nippon Sheet Glass can be used. If an optical fiber having a large loss is used, the lengths of the optical fibers 32 and 33 may be made substantially the same. If necessary, a device capable of zero-point correction for one of the two signals from the light-receiving element may be added to the measurement and calculation device.

Industrial applicability

The yarn thickness unevenness detecting device according to the present invention is configured as described above, so that the effect of temperature on the light receiving element is compensated, and the yarn is affected by temperature and humidity. This is a device for detecting uneven thickness of the striated body. Also, the device of the present invention requires only a light receiving element and some other devices compared to the conventional photoelectric measuring device, so that the structure is simple and can be manufactured at low cost. In addition, when an optical fiber is used, for example, an empty space in which the tip of the optical fiber can be placed near the outer wall of the laser.

_Ο? Ι As long as there is enough space, the yarn thickness unevenness detection device of the present invention can be attached to various types of spinning machines without restriction on the installation location.

U o—

Claims

The scope of the claims

1. A device that detects uneven thickness of the running thread body.

A light-emitting element including a first light-emitting port and a second light-emitting port for emitting light in two different directions, and a device that emits light from the first light-emitting port as an object to be measured. A first light receiving element for receiving light through a thread body, a second light receiving element for directly receiving a light ray from the second light ray exit, and the first light receiving element and the second light receiving element. And a measuring and calculating device for comparing and calculating the signals from the respective light receiving elements and calculating the difference as a variation in the thickness of the filament.

The uneven thickness of the thread body, wherein the first light receiving element and the second light receiving element are arranged in the same environment.

2. The uneven thickness detecting device according to claim 1, wherein the thread is a sliper.

3. The light emitting element and the two light receiving elements are arranged near an outer wall of a spinning user, and the first light receiving element is a first light emitting port of the light emitting element with respect to a sliper. 3. The thickness unevenness detecting device according to claim 2, wherein the thickness unevenness detecting device is arranged at a position on an opposite side.

4. From the three light paths in the thickness unevenness detecting device, that is, from the first light emitting port of the light emitting element

_〇M? I A first light path that reaches the inside of the laser, a second light path that reaches the first light receiving element from the inside of the laser, and a second light receiving element that passes from the second light emitting and emitting port of the light emitting element An optical fiber is used in at least the first light path and the second light path in the third light path that reaches the optical element, so that the first light receiving element and the second light receiving element are close to each other. 3. The unevenness detecting device according to claim 2, wherein the numerical value calculated as the unevenness in the thickness of the filament is displayed as an unevenness curve. The thickness unevenness detecting device according to any one of claims 1 to 4, wherein the thickness unevenness detecting device is configured to include: