USD984288S1 - Inspection gauge for coordinate measuring machine - Google Patents

Inspection gauge for coordinate measuring machine Download PDF

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Publication number
USD984288S1
USD984288S1 US29/783,792 US202129783792F USD984288S US D984288 S1 USD984288 S1 US D984288S1 US 202129783792 F US202129783792 F US 202129783792F US D984288 S USD984288 S US D984288S
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United States
Prior art keywords
measuring machine
coordinate measuring
inspection gauge
gauge
inspection
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Active
Application number
US29/783,792
Inventor
Tetsuro Hidaka
Kengo Hirata
Shingo Kiyotani
Kanae KOBAYASHI
Mitsuru Fukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
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Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FUKUDA, MITSURU, HIDAKA, TETSURO, HIRATA, KENGO, KIYOTANI, SHINGO, KOBAYASHI, KANAE
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FIG. 1 is a front, right-side, top perspective view of the inspection gauge for coordinate measuring machine, showing the new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left-side elevational view thereof;
FIG. 5 is a right-side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a rear, right-side, bottom perspective view thereof; and,
FIG. 9 is a cross-sectional view taken along line 9-9 in FIG. 2 .
The evenly-spaced-dashed lines depict internal parts of the inspection gauge that form no part of the claimed design. The long-short-dashed lines depict the cross-section location and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an inspection gauge for coordinate measuring machine, as shown and described.
US29/783,792 2020-11-16 2021-05-14 Inspection gauge for coordinate measuring machine Active USD984288S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2020-24629F JP1691006S (en) 2020-11-16 2020-11-16
JP2020-024629D 2020-11-16

Publications (1)

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USD984288S1 true USD984288S1 (en) 2023-04-25

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US29/783,792 Active USD984288S1 (en) 2020-11-16 2021-05-14 Inspection gauge for coordinate measuring machine

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JP (1) JP1691006S (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012137301A (en) * 2010-12-24 2012-07-19 Tokyo Metropolitan Industrial Technology Research Institute Simple inspection gauge for three-dimensional coordinate measuring machine
WO2016132407A1 (en) 2015-02-18 2016-08-25 株式会社浅沼技研 Right angle step gauge
CN108534676A (en) * 2018-04-20 2018-09-14 西京学院 A kind of coordinate measuring machine measures the method for inspection of space error in space
US20190274654A1 (en) 2018-03-12 2019-09-12 Mitutoyo Corporation Measuring x-ray ct apparatus and tomographic image generating method
WO2020004222A1 (en) 2018-06-28 2020-01-02 株式会社浅沼技研 Inspection master
JP2020027087A (en) 2018-08-17 2020-02-20 地方独立行政法人東京都立産業技術研究センター Calibration gauge and calibration method
WO2020261623A1 (en) 2019-06-25 2020-12-30 株式会社浅沼技研 Inspection master

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012137301A (en) * 2010-12-24 2012-07-19 Tokyo Metropolitan Industrial Technology Research Institute Simple inspection gauge for three-dimensional coordinate measuring machine
WO2016132407A1 (en) 2015-02-18 2016-08-25 株式会社浅沼技研 Right angle step gauge
US20190274654A1 (en) 2018-03-12 2019-09-12 Mitutoyo Corporation Measuring x-ray ct apparatus and tomographic image generating method
JP2019158534A (en) 2018-03-12 2019-09-19 株式会社ミツトヨ X-ray ct apparatus for measurement and method for generating fault image
CN108534676A (en) * 2018-04-20 2018-09-14 西京学院 A kind of coordinate measuring machine measures the method for inspection of space error in space
CN108534676B (en) * 2018-04-20 2020-12-29 西京学院 A method for checking the spatial error in the measurement space of a coordinate measuring machine
WO2020004222A1 (en) 2018-06-28 2020-01-02 株式会社浅沼技研 Inspection master
JP2020027087A (en) 2018-08-17 2020-02-20 地方独立行政法人東京都立産業技術研究センター Calibration gauge and calibration method
WO2020261623A1 (en) 2019-06-25 2020-12-30 株式会社浅沼技研 Inspection master

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Asanuma Giken Co., Ltd.; Quality Master T Instructions Manual; obtained 2021.
Jun. 29, 2021 Decision to Grant issued in Japanese Patent Application No. 2020-024629.
Jun. 29, 2021 Decision to Grant issued in Japanese Patent Application No. 2020-027087.

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