USD1001657S1 - Image measuring device - Google Patents

Image measuring device Download PDF

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Publication number
USD1001657S1
USD1001657S1 US29/806,814 US202129806814F USD1001657S US D1001657 S1 USD1001657 S1 US D1001657S1 US 202129806814 F US202129806814 F US 202129806814F US D1001657 S USD1001657 S US D1001657S
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United States
Prior art keywords
measuring device
image measuring
view
image
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/806,814
Inventor
Kenji Iwamoto
Ryohei KANNO
Atsushi Hattori
Junsuke YASUNO
Takaharu Imura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HATTORI, ATSUSHI, IMURA, TAKAHARU, IWAMOTO, KENJI, KANNO, RYOHEI, Yasuno, Junsuke
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Description

FIG. 1 is a front, right-side, top perspective view of an image measuring device, showing the new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left-side elevational view thereof;
FIG. 5 is a right-side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is a rear, left-side, top perspective view thereof.
The broken lines depict parts of the image measuring device that form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an image measuring device, as shown and described.
US29/806,814 2021-03-05 2021-09-07 Image measuring device Active USD1001657S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021-004637D 2021-03-05
JP2021004637F JP1705501S (en) 2021-03-05 2021-03-05 Image measuring machine

Publications (1)

Publication Number Publication Date
USD1001657S1 true USD1001657S1 (en) 2023-10-17

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ID=80217652

Family Applications (1)

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US29/806,814 Active USD1001657S1 (en) 2021-03-05 2021-09-07 Image measuring device

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US (1) USD1001657S1 (en)
JP (1) JP1705501S (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1022739S1 (en) * 2019-08-23 2024-04-16 Nanalysis Corp. NMR spectrometer

Citations (19)

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Publication number Priority date Publication date Assignee Title
JP2003139520A (en) 2001-11-06 2003-05-14 Mitsutoyo Corp Image measuring device, image measuring method and image measuring program
US20100241267A1 (en) * 2009-03-20 2010-09-23 Mori Seiki Co., Ltd. Apparatus for and method of measuring workpiece on machine tool
US20110128427A1 (en) * 2009-11-30 2011-06-02 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd Focus apparatus of image measuring system
USD659575S1 (en) * 2011-04-22 2012-05-15 Mitutoyo Corporation Measuring head
USD713745S1 (en) * 2013-01-23 2014-09-23 Hon Hai Precision Industry Co., Ltd. Coordinate measuring machine
USD714168S1 (en) * 2013-05-31 2014-09-30 Hexagon Metrology S.P.A. Measuring machine
USD719039S1 (en) 2013-07-08 2014-12-09 Hon Hai Precision Industry Co., Ltd. Image measuring device
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
US20170061614A1 (en) * 2015-08-31 2017-03-02 Mitutoyo Corporation Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded
USD783424S1 (en) 2016-03-04 2017-04-11 Mitutoyo Corporation Image measuring device
US20170241759A1 (en) * 2014-10-07 2017-08-24 Carl Zeiss Industrielle Messtechnik Gmbh Identification of geometric deviations of a motion guide in a coordinate-measuring machine or in a machine tool
US20170248416A1 (en) * 2016-02-25 2017-08-31 Mitutoyo Corporation Surface texture measuring apparatus and method
US20170363411A1 (en) * 2016-06-17 2017-12-21 Mitutoyo Corporation Interference measuring device and method of measurement using the same device
USD806586S1 (en) 2016-03-04 2018-01-02 Mitutoyo Corporation Image measuring device
USD806585S1 (en) 2016-03-04 2018-01-02 Mitutoyo Corporation Image measuring device
USD847676S1 (en) * 2017-07-14 2019-05-07 Mitutoyo Corporation Hardness tester
USD848883S1 (en) * 2017-07-14 2019-05-21 Mitutoyo Corporation Hardness tester
US20190220185A1 (en) 2018-01-12 2019-07-18 Mitutoyo Corporation Image measurement apparatus and computer readable medium
US20210033377A1 (en) * 2019-07-29 2021-02-04 Mitutoyo Corporation Profile measuring machine and profile measuring method

Patent Citations (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003139520A (en) 2001-11-06 2003-05-14 Mitsutoyo Corp Image measuring device, image measuring method and image measuring program
US20100241267A1 (en) * 2009-03-20 2010-09-23 Mori Seiki Co., Ltd. Apparatus for and method of measuring workpiece on machine tool
US20110128427A1 (en) * 2009-11-30 2011-06-02 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd Focus apparatus of image measuring system
USD659575S1 (en) * 2011-04-22 2012-05-15 Mitutoyo Corporation Measuring head
USD713745S1 (en) * 2013-01-23 2014-09-23 Hon Hai Precision Industry Co., Ltd. Coordinate measuring machine
USD714168S1 (en) * 2013-05-31 2014-09-30 Hexagon Metrology S.P.A. Measuring machine
USD719039S1 (en) 2013-07-08 2014-12-09 Hon Hai Precision Industry Co., Ltd. Image measuring device
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
US20170241759A1 (en) * 2014-10-07 2017-08-24 Carl Zeiss Industrielle Messtechnik Gmbh Identification of geometric deviations of a motion guide in a coordinate-measuring machine or in a machine tool
US20170061614A1 (en) * 2015-08-31 2017-03-02 Mitutoyo Corporation Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded
US20170248416A1 (en) * 2016-02-25 2017-08-31 Mitutoyo Corporation Surface texture measuring apparatus and method
USD783424S1 (en) 2016-03-04 2017-04-11 Mitutoyo Corporation Image measuring device
USD806586S1 (en) 2016-03-04 2018-01-02 Mitutoyo Corporation Image measuring device
USD806585S1 (en) 2016-03-04 2018-01-02 Mitutoyo Corporation Image measuring device
US20170363411A1 (en) * 2016-06-17 2017-12-21 Mitutoyo Corporation Interference measuring device and method of measurement using the same device
USD847676S1 (en) * 2017-07-14 2019-05-07 Mitutoyo Corporation Hardness tester
USD848883S1 (en) * 2017-07-14 2019-05-21 Mitutoyo Corporation Hardness tester
US20190220185A1 (en) 2018-01-12 2019-07-18 Mitutoyo Corporation Image measurement apparatus and computer readable medium
JP2019124688A (en) 2018-01-12 2019-07-25 株式会社ミツトヨ Image measuring instrument and program
US20210033377A1 (en) * 2019-07-29 2021-02-04 Mitutoyo Corporation Profile measuring machine and profile measuring method

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Title
Gear Technology,Mitutoyo America Corporation Introduces Quick Vision Pro Series,Date first available Jul. 12, 2022, [online] retrieved Dec. 16, 2022,available from https://www.geartechnology.com/articles/29973-mitutoyo-america-corporation-introduces-quick-vision-pro-series (Year: 2022). *
Jan. 4, 2022 Office Action issued in Japanese Patent Application No. 2021-004637.
Japanese Design Registration No. 1158477 S, registered Sep. 27, 2002.
Japanese Design Registration No. 1158478 S, registered Sep. 27, 2002.
Japanese Design Registration No. 1159682 S, registered Oct. 11, 2002.
Japanese Design Registration No. 1161722 S, registered Nov. 1, 2002.
Japanese Design Registration No. 1258752 S, registered Nov. 4, 2005.
Japanese Design Registration No. 1321309 S, registered Jan. 11, 2008.
Japanese Design Registration No. 1321710 S, registered Jan. 11, 2008.
Japanese Publication Material No. HC1402794700.
Japanese Publication Material No. HC2400889500, published on Sep. 5, 2012.
Mitutoyo,Mitutoyo America Corporation Introduces Formtracer Avant Series, Date first available Oct. 1, 2020, [online] retrieved Dec. 16, 2022,available from https://www.businesswire.com/news/home/20201001005006/en/Mitutoyo-America-Corporation-Introduces-FORMTRACER-Avant-Series (Year: 2020). *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1022739S1 (en) * 2019-08-23 2024-04-16 Nanalysis Corp. NMR spectrometer

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