USD947693S1 - Measurement probe head assembly - Google Patents

Measurement probe head assembly Download PDF

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Publication number
USD947693S1
USD947693S1 US29/706,540 US201929706540F USD947693S US D947693 S1 USD947693 S1 US D947693S1 US 201929706540 F US201929706540 F US 201929706540F US D947693 S USD947693 S US D947693S
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United States
Prior art keywords
head assembly
probe head
measurement probe
view
measurement
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Active
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US29/706,540
Inventor
David Thomas Engquist
Heather J. Vermilyea
Karl A. Rinder
Michael J. Mende
Tony Lee Tarr
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Tektronix Inc
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Tektronix Inc
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Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/706,540 priority Critical patent/USD947693S1/en
Assigned to TEKTRONIX, INC reassignment TEKTRONIX, INC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: RINDER, KARL A., MENDE, MICHAEL J., VERMILYEA, HEATHER J., Engquist, David Thomas, Tarr, Tony Lee
Priority to JPD2020-5355F priority patent/JP1664106S/ja
Priority to JPD2020-5354F priority patent/JP1664105S/ja
Priority to US29/832,636 priority patent/USD992437S1/en
Application granted granted Critical
Publication of USD947693S1 publication Critical patent/USD947693S1/en
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FIG. 1 is a front-side isometric view of a measurement probe head assembly in an operating environment.
FIG. 2 is a front-side isometric view of the measurement probe head assembly of FIG. 1 resting in a stand.
FIG. 3 is a front-side isometric view of a measurement probe head assembly of FIG. 1.
FIG. 4 is a front view of the measurement probe head assembly of FIG. 1.
FIG. 5 is a rear view of the measurement probe head assembly of FIG. 1.
FIG. 6 is a top view of the measurement probe head assembly of FIG. 1.
FIG. 7 is a first-side view of the measurement probe head assembly of FIG. 1.
FIG. 8 is a bottom view of the measurement probe head assembly of FIG. 1; and,
FIG. 9 is a second-side view of the measurement probe head assembly of FIG. 1.
Environmental portions of the measurement probe head assembly and stand are shown in broken lines and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a measurement probe head assembly, as shown and described.
US29/706,540 2019-09-20 2019-09-20 Measurement probe head assembly Active USD947693S1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US29/706,540 USD947693S1 (en) 2019-09-20 2019-09-20 Measurement probe head assembly
JPD2020-5355F JP1664106S (en) 2019-09-20 2020-03-19
JPD2020-5354F JP1664105S (en) 2019-09-20 2020-03-19
US29/832,636 USD992437S1 (en) 2019-09-20 2022-03-29 Tip cable component of a measurement probe head assembly

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Application Number Priority Date Filing Date Title
US29/706,540 USD947693S1 (en) 2019-09-20 2019-09-20 Measurement probe head assembly

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US29/832,636 Division USD992437S1 (en) 2019-09-20 2022-03-29 Tip cable component of a measurement probe head assembly

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US29/706,540 Active USD947693S1 (en) 2019-09-20 2019-09-20 Measurement probe head assembly
US29/832,636 Active USD992437S1 (en) 2019-09-20 2022-03-29 Tip cable component of a measurement probe head assembly

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US29/832,636 Active USD992437S1 (en) 2019-09-20 2022-03-29 Tip cable component of a measurement probe head assembly

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JP (2) JP1664106S (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD968987S1 (en) * 2022-02-21 2022-11-08 Kaichun Lin Soil tester
USD991058S1 (en) * 2021-10-12 2023-07-04 Shenzhen Hypersynes Co., Ltd. Probe
USD992437S1 (en) * 2019-09-20 2023-07-18 Tektronix, Inc. Tip cable component of a measurement probe head assembly
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1081421S1 (en) * 2023-04-17 2025-07-01 Suzhou Techmax E-Commerce Co., Ltd. Test light
USD1116877S1 (en) * 2024-08-01 2026-03-10 Yanqing TAN Probe
USD1116879S1 (en) * 2022-09-07 2026-03-10 Tektronix, Inc. Measurement probe head

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USD1030526S1 (en) * 2022-03-18 2024-06-11 Therm-O-Disc, Incorporated Single probe sensor
USD1031467S1 (en) * 2022-03-18 2024-06-18 Therm-O-Disc, Incorporated Dual probe sensor

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US10559173B2 (en) * 2015-03-11 2020-02-11 James Hickman Non-contact voltage detector

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD992437S1 (en) * 2019-09-20 2023-07-18 Tektronix, Inc. Tip cable component of a measurement probe head assembly
USD991058S1 (en) * 2021-10-12 2023-07-04 Shenzhen Hypersynes Co., Ltd. Probe
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
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USD1081421S1 (en) * 2023-04-17 2025-07-01 Suzhou Techmax E-Commerce Co., Ltd. Test light
USD1116877S1 (en) * 2024-08-01 2026-03-10 Yanqing TAN Probe

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