USD413823S - Electronic test and measurement instrument - Google Patents

Electronic test and measurement instrument Download PDF

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Publication number
USD413823S
USD413823S US29/091,418 US9141898F USD413823S US D413823 S USD413823 S US D413823S US 9141898 F US9141898 F US 9141898F US D413823 S USD413823 S US D413823S
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US
United States
Prior art keywords
measurement instrument
electronic test
instrument
elevation view
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/091,418
Inventor
Kenneth P. Dobyns
William R. Pooley
Scott Ketterer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/091,418 priority Critical patent/USD413823S/en
Assigned to TEKTRONIX, INC. reassignment TEKTRONIX, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DOBYNS, KENNETH P., KETTERER, SCOTT, POOLEY, WILLIAM R.
Application granted granted Critical
Publication of USD413823S publication Critical patent/USD413823S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of the electronic test and measurement instrument showing our new design;
FIG. 2 is a front elevation view of the instrument showing in dotted lines an example of front panel knobs and buttons which may be used with the subject design;
FIG. 3 is a right side elevation view of the instrument;
FIG. 4 is a left side elevation view of the instrument;
FIG. 5 is a top end elevation view of the instrument;
FIG. 6 is a bottom end elevation view of the instrument;
FIG. 7 is a back elevation view of the instrument; and,
FIG. 8 is a front elevation view of the instrument.

Claims (1)

  1. The ornamental design for an electronic test and measurement instrument, as shown and described.
US29/091,418 1998-07-28 1998-07-28 Electronic test and measurement instrument Expired - Lifetime USD413823S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/091,418 USD413823S (en) 1998-07-28 1998-07-28 Electronic test and measurement instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/091,418 USD413823S (en) 1998-07-28 1998-07-28 Electronic test and measurement instrument

Publications (1)

Publication Number Publication Date
USD413823S true USD413823S (en) 1999-09-14

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ID=71659073

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/091,418 Expired - Lifetime USD413823S (en) 1998-07-28 1998-07-28 Electronic test and measurement instrument

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US (1) USD413823S (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD423383S (en) * 1999-06-30 2000-04-25 Hewlett-Packard Company Instrument front panel
US7654281B2 (en) 2004-01-22 2010-02-02 Rochester Gauges, Inc. Gauge assembly having a stop fill device
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4972138A (en) * 1987-05-11 1990-11-20 Hewlett Packard Co. Oscilloscope-like user-interface for a logic analyzer
USD335093S (en) * 1991-09-23 1993-04-27 Snap-On Tools Corporation Digital oscilloscope
USD377319S (en) * 1995-06-14 1997-01-14 Advantest Corporation Network analyzer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4972138A (en) * 1987-05-11 1990-11-20 Hewlett Packard Co. Oscilloscope-like user-interface for a logic analyzer
USD335093S (en) * 1991-09-23 1993-04-27 Snap-On Tools Corporation Digital oscilloscope
USD377319S (en) * 1995-06-14 1997-01-14 Advantest Corporation Network analyzer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD423383S (en) * 1999-06-30 2000-04-25 Hewlett-Packard Company Instrument front panel
US7654281B2 (en) 2004-01-22 2010-02-02 Rochester Gauges, Inc. Gauge assembly having a stop fill device
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly

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