USD931228S1 - Electrical contact - Google Patents

Electrical contact Download PDF

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Publication number
USD931228S1
USD931228S1 US29/713,906 US201929713906F USD931228S US D931228 S1 USD931228 S1 US D931228S1 US 201929713906 F US201929713906 F US 201929713906F US D931228 S USD931228 S US D931228S
Authority
US
United States
Prior art keywords
electrical contact
view
design
dash
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/713,906
Inventor
Yasutaka Kishi
Masahiro Wakazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Assigned to KABUSHIKI KAISHA NIHON MICRONICS reassignment KABUSHIKI KAISHA NIHON MICRONICS ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KISHI, YASUTAKA, WAKAZAWA, MASAHIRO
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Publication of USD931228S1 publication Critical patent/USD931228S1/en
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Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front view of an electrical contact according to the claimed design.
FIG. 2 is a rear view of the electrical contact.
FIG. 3 is a right side view of the electrical contact.
FIG. 4 is a left side view of the electrical contact.
FIG. 5 is a bottom view of the electrical contact.
FIG. 6 is a top view of the electrical contact; and,
FIG. 7 is a perspective view of the electrical contact.
The dash-dash broken lines in the drawings illustrate portions of the electrical contact that form no part of the claimed design.
The dash-dot broken boundary lines in FIGS. 1-2 and 5-7 form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an electrical contact, as shown and described.
US29/713,906 2019-05-21 2019-11-19 Electrical contact Active USD931228S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019-011016 2019-05-21
JP2019011016F JP1646397S (en) 2019-05-21 2019-05-21

Publications (1)

Publication Number Publication Date
USD931228S1 true USD931228S1 (en) 2021-09-21

Family

ID=68610810

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/713,906 Active USD931228S1 (en) 2019-05-21 2019-11-19 Electrical contact

Country Status (3)

Country Link
US (1) USD931228S1 (en)
JP (1) JP1646397S (en)
TW (1) TWD209939S (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1715945S (en) * 2021-10-27 2022-05-26 Electrical contact
JP1769756S (en) 2023-08-04 2024-05-07 Continuity test probe pin
TWD233186S (en) 2023-08-04 2024-08-21 日商歐姆龍股份有限公司 (日本) Probe pin for conducting test
JP1769757S (en) 2023-08-04 2024-05-07 Continuity test probe pin

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080197869A1 (en) * 2007-02-19 2008-08-21 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US7449906B2 (en) * 2003-05-13 2008-11-11 Kabushiki Kaisha Nihon Micronics Probe for testing an electrical device
US20090051382A1 (en) * 2005-03-07 2009-02-26 Kabushiki Kaisha Nihon Micronics Probe for electrical test and electrical connecting apparatus using it
US20090160473A1 (en) * 2007-12-21 2009-06-25 Kabushiki Kaisha Nihon Micronics Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
US20100033201A1 (en) * 2008-08-05 2010-02-11 Tseng-Yang Hsu Mems probe fabrication on a reusable substrate for probe card application
US7736690B2 (en) * 2007-02-01 2010-06-15 Kabushiki Kaisha Nihon Micronics Method for manufacturing an electrical test probe
US7924038B2 (en) * 2007-01-22 2011-04-12 Kabushiki Kaisha Nihon Micronics Probe and electrical connecting apparatus using it
US8063651B2 (en) * 2008-05-02 2011-11-22 Kabushiki Kaisha Nihon Micronics Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same
USD665361S1 (en) * 2011-02-15 2012-08-14 Omron Corporation Electric connector terminal
USD702646S1 (en) * 2012-08-29 2014-04-15 Kabushiki Kaisha Nihon Micronics Electric contact
US8975908B2 (en) * 2010-09-17 2015-03-10 Kabushiki Kaisha Nihon Micronics Electrical test probe and probe assembly with improved probe tip
US20210041480A1 (en) * 2019-08-09 2021-02-11 Kabushiki Kaisha Nihon Micronics Electrical contactor and electrical connecting apparatus
US20210041482A1 (en) * 2019-08-09 2021-02-11 Kabushiki Kaisha Nihon Micronics Electrical contactor and electrical connecting apparartus

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7449906B2 (en) * 2003-05-13 2008-11-11 Kabushiki Kaisha Nihon Micronics Probe for testing an electrical device
US20090051382A1 (en) * 2005-03-07 2009-02-26 Kabushiki Kaisha Nihon Micronics Probe for electrical test and electrical connecting apparatus using it
US7679389B2 (en) * 2005-03-07 2010-03-16 Kabushiki Kaisha Nihon Micronics Probe for electrical test and electrical connecting apparatus using it
US7924038B2 (en) * 2007-01-22 2011-04-12 Kabushiki Kaisha Nihon Micronics Probe and electrical connecting apparatus using it
US7736690B2 (en) * 2007-02-01 2010-06-15 Kabushiki Kaisha Nihon Micronics Method for manufacturing an electrical test probe
US20080197869A1 (en) * 2007-02-19 2008-08-21 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus
US20090160473A1 (en) * 2007-12-21 2009-06-25 Kabushiki Kaisha Nihon Micronics Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
US7960988B2 (en) * 2007-12-21 2011-06-14 Kabushiki Kaisha Nihon Micronics Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
US8063651B2 (en) * 2008-05-02 2011-11-22 Kabushiki Kaisha Nihon Micronics Contact for electrical test of electronic devices, probe assembly and method for manufacturing the same
US20100033201A1 (en) * 2008-08-05 2010-02-11 Tseng-Yang Hsu Mems probe fabrication on a reusable substrate for probe card application
US8975908B2 (en) * 2010-09-17 2015-03-10 Kabushiki Kaisha Nihon Micronics Electrical test probe and probe assembly with improved probe tip
USD665361S1 (en) * 2011-02-15 2012-08-14 Omron Corporation Electric connector terminal
USD702646S1 (en) * 2012-08-29 2014-04-15 Kabushiki Kaisha Nihon Micronics Electric contact
US20210041480A1 (en) * 2019-08-09 2021-02-11 Kabushiki Kaisha Nihon Micronics Electrical contactor and electrical connecting apparatus
US20210041482A1 (en) * 2019-08-09 2021-02-11 Kabushiki Kaisha Nihon Micronics Electrical contactor and electrical connecting apparartus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Electrical contacts. (Design—© Questel) orbit.com. [Online PDF compilation of references] 13 pgs. Print Dates Range Jul. 16, 2013-Jun. 5, 2020 [Retrieved Mar. 1, 2021] https://www.orbit.com/export/UCZAH96B/pdf4/59ff9031-3303-4e2a-ad86-a96ee5817655-191103.pdf (Year: 2021). *

Also Published As

Publication number Publication date
TWD209939S (en) 2021-02-21
JP1646397S (en) 2019-11-25

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