USD838609S1 - Apparatus for detecting particle on test film - Google Patents

Apparatus for detecting particle on test film Download PDF

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Publication number
USD838609S1
USD838609S1 US29/617,261 US201729617261F USD838609S US D838609 S1 USD838609 S1 US D838609S1 US 201729617261 F US201729617261 F US 201729617261F US D838609 S USD838609 S US D838609S
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United States
Prior art keywords
test film
detecting particle
detecting
particle
test
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Active
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US29/617,261
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English (en)
Inventor
Jin Ho Kim
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Jedex Inc
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Jedex Inc
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Assigned to JEDEX INC. reassignment JEDEX INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KIM, JIN HO
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US29/617,261 2017-08-02 2017-09-13 Apparatus for detecting particle on test film Active USD838609S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20170035752 2017-08-02
KR30-2017-0035752 2017-08-02

Publications (1)

Publication Number Publication Date
USD838609S1 true USD838609S1 (en) 2019-01-22

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US29/617,261 Active USD838609S1 (en) 2017-08-02 2017-09-13 Apparatus for detecting particle on test film

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US (1) USD838609S1 (de)
JP (1) JP1601260S (de)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD858590S1 (en) * 2017-02-28 2019-09-03 Mitsubishi Heavy Industries Machine Tool Co., Ltd. Machine tool
USD884708S1 (en) * 2018-03-05 2020-05-19 Samsung Electronics Co., Ltd. Intelligent docking station
USD913519S1 (en) * 2019-12-11 2021-03-16 Robert Bosch Gmbh Diagnostic device
USD1035041S1 (en) * 2022-05-04 2024-07-09 Netzsch-Gerätebau GmbH Fixed apparatus and equipment for laboratories
USD1035040S1 (en) * 2022-04-11 2024-07-09 Netzsch-Gerätebau GmbH Fixed apparatus and equipment for laboratories
USD1035036S1 (en) * 2022-04-11 2024-07-09 Netzsch-Gerätebau GmbH Fixed apparatus and equipment for laboratories

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9599844B2 (en) * 2013-11-14 2017-03-21 Kabushiki Kaisha Nihon Micronics Inspection apparatus
US9983596B2 (en) * 2015-12-17 2018-05-29 Venturedyne, Ltd. Environmental sensor and method of operating the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9599844B2 (en) * 2013-11-14 2017-03-21 Kabushiki Kaisha Nihon Micronics Inspection apparatus
US9983596B2 (en) * 2015-12-17 2018-05-29 Venturedyne, Ltd. Environmental sensor and method of operating the same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD858590S1 (en) * 2017-02-28 2019-09-03 Mitsubishi Heavy Industries Machine Tool Co., Ltd. Machine tool
USD884708S1 (en) * 2018-03-05 2020-05-19 Samsung Electronics Co., Ltd. Intelligent docking station
USD913519S1 (en) * 2019-12-11 2021-03-16 Robert Bosch Gmbh Diagnostic device
USD1035040S1 (en) * 2022-04-11 2024-07-09 Netzsch-Gerätebau GmbH Fixed apparatus and equipment for laboratories
USD1035036S1 (en) * 2022-04-11 2024-07-09 Netzsch-Gerätebau GmbH Fixed apparatus and equipment for laboratories
USD1035041S1 (en) * 2022-05-04 2024-07-09 Netzsch-Gerätebau GmbH Fixed apparatus and equipment for laboratories

Also Published As

Publication number Publication date
JP1601260S (de) 2018-04-09

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