USD829117S1 - Spectrometer - Google Patents

Spectrometer Download PDF

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Publication number
USD829117S1
USD829117S1 US35/355,031 US35503185F USD829117S US D829117 S1 USD829117 S1 US D829117S1 US 35503185 F US35503185 F US 35503185F US D829117 S USD829117 S US D829117S
Authority
US
United States
Prior art keywords
spectrometer
partial enlarged
view
design
perspective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US35/355,031
Other versions
USD836229S1 (en
USD826704S1 (en
USD827029S1 (en
USD829582S1 (en
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USD829116S1 (en
USD835417S1 (en
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USD824124S1 (en
USD836578S1 (en
USD836607S1 (en
USD862722S1 (en
USD829115S1 (en
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USD824112S1 (en
Inventor
Masaki Hirose
Katsumi Shibayama
Takashi Kasahara
Toshimitsu Kawai
Hiroki Oyama
Yumi TERAMACHI
Takafumi Yokino
Katsuhiko Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Assigned to HAMAMATSU PHOTONICS K.K. reassignment HAMAMATSU PHOTONICS K.K. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KATO, KATSUHIKO, KAWAI, TOSHIMITSU, OYAMA, HIROKI, YOKINO, TAKAFUMI, HIROSE, MASAKI, KASAHARA, TAKASHI, TERAMACHI, YUMI, SHIBAYAMA, KATSUMI
Application granted granted Critical
Publication of USD829117S1 publication Critical patent/USD829117S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

1. Spectrometer
1.1 : Perspective
1.2 : Front
1.3 : Back
1.4 : Top
1.5 : Bottom
1.6 : Left
1.7 : Right
1.8 : Partial enlarged cross-sectional view
1.9 : Partial enlarged top view
1.10 : Partial enlarged perspective view
The broken line showing is included for the purpose of illustrating portions of the “article” and forms no part of the claimed design. The dash-dot-dash lines represent the boundary of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a spectrometer, as shown and described.
US35/355,031 2016-06-14 2016-12-13 Spectrometer Active USD829117S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-012703 2016-06-14
JPD2016-12703F JP1569272S (en) 2016-06-14 2016-06-14

Publications (1)

Publication Number Publication Date
USD829117S1 true USD829117S1 (en) 2018-09-25

Family

ID=57982588

Family Applications (1)

Application Number Title Priority Date Filing Date
US35/355,031 Active USD829117S1 (en) 2016-06-14 2016-12-13 Spectrometer

Country Status (2)

Country Link
US (1) USD829117S1 (en)
JP (1) JP1569272S (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD843013S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrates for spectroscopic analysis
USD843012S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843010S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843011S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843594S1 (en) * 2017-01-25 2019-03-19 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD854184S1 (en) * 2017-01-25 2019-07-16 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855207S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855205S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855206S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855208S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855209S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855210S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD878226S1 (en) 2016-03-15 2020-03-17 Hamamatsu Photonics K.K. Spectrometer

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6686998B2 (en) * 2001-11-30 2004-02-03 Wisconsin Alumni Research Foundation Method and apparatus for glow discharges with liquid microelectrodes
USD603280S1 (en) * 2009-03-11 2009-11-03 Hamamatsu Photonics K.K. Spectrometer
USD603729S1 (en) * 2009-03-11 2009-11-10 Hamamatsu Photonics K.K. Spectrometer
USD603730S1 (en) * 2009-03-11 2009-11-10 Hamamatsu Photonics K.K. Spectrometer
USD603731S1 (en) * 2009-03-11 2009-11-10 Hamamatsu Photonics K.K. Spectrometer
USD730217S1 (en) * 2014-02-04 2015-05-26 Hamamatsu Photonics K.K. Spectrometer
USD733599S1 (en) * 2014-02-04 2015-07-07 Hamamatsu Photonics K.K. Spectrometer
US9746616B2 (en) * 2010-04-29 2017-08-29 Oto Photonics Inc. Optical module of micro spectrometer with tapered slit and slit structure thereof

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6686998B2 (en) * 2001-11-30 2004-02-03 Wisconsin Alumni Research Foundation Method and apparatus for glow discharges with liquid microelectrodes
USD603280S1 (en) * 2009-03-11 2009-11-03 Hamamatsu Photonics K.K. Spectrometer
USD603729S1 (en) * 2009-03-11 2009-11-10 Hamamatsu Photonics K.K. Spectrometer
USD603730S1 (en) * 2009-03-11 2009-11-10 Hamamatsu Photonics K.K. Spectrometer
USD603731S1 (en) * 2009-03-11 2009-11-10 Hamamatsu Photonics K.K. Spectrometer
US9746616B2 (en) * 2010-04-29 2017-08-29 Oto Photonics Inc. Optical module of micro spectrometer with tapered slit and slit structure thereof
USD730217S1 (en) * 2014-02-04 2015-05-26 Hamamatsu Photonics K.K. Spectrometer
USD733599S1 (en) * 2014-02-04 2015-07-07 Hamamatsu Photonics K.K. Spectrometer
USD744878S1 (en) * 2014-02-04 2015-12-08 Hamamatsu Photonics K.K. Spectrometer

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD878226S1 (en) 2016-03-15 2020-03-17 Hamamatsu Photonics K.K. Spectrometer
USD933509S1 (en) 2016-03-15 2021-10-19 Hamamatsu Photonics K.K. Spectrometer
USD933510S1 (en) 2016-03-15 2021-10-19 Hamamatsu Photonics K.K. Spectrometer
USD913826S1 (en) 2016-03-15 2021-03-23 Hamamatsu Photonics K.K. Spectrometer
USD913132S1 (en) 2016-03-15 2021-03-16 Hamamatsu Photonics K.K. Spectrometer
USD911194S1 (en) 2016-03-15 2021-02-23 Hamamatsu Photonics K.K. Spectrometer
USD910471S1 (en) 2016-03-15 2021-02-16 Hamamatsu Photonics K.K. Spectrometer
USD883116S1 (en) 2016-03-15 2020-05-05 Hamamatsu Photonics K.K. Spectrometer
USD883117S1 (en) 2016-03-15 2020-05-05 Hamamatsu Photonics K.K. Spectrometer
USD880323S1 (en) * 2016-03-15 2020-04-07 Hamamatsu Photonics K.K. Spectrometer
USD854184S1 (en) * 2017-01-25 2019-07-16 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855210S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855209S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855208S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855206S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855205S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD855207S1 (en) * 2017-01-25 2019-07-30 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843013S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrates for spectroscopic analysis
USD843594S1 (en) * 2017-01-25 2019-03-19 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843011S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843010S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis
USD843012S1 (en) * 2017-01-25 2019-03-12 Hamamatsu Photonics K.K. Substrate for spectroscopic analysis

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Publication number Publication date
JP1569272S (en) 2017-02-13

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