USD827459S1 - Probe for remote coordinate measuring machine - Google Patents
Probe for remote coordinate measuring machine Download PDFInfo
- Publication number
- USD827459S1 USD827459S1 US29/593,538 US201729593538F USD827459S US D827459 S1 USD827459 S1 US D827459S1 US 201729593538 F US201729593538 F US 201729593538F US D827459 S USD827459 S US D827459S
- Authority
- US
- United States
- Prior art keywords
- probe
- measuring machine
- coordinate measuring
- remote coordinate
- remote
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The broken lines depict unclaimed parts of the probe, and thus form no part of the claimed design.
Claims (1)
- The ornamental design for a probe for remote coordinate measuring machine, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-020567 | 2016-09-26 | ||
JPD2016-20567F JP1578944S (en) | 2016-09-26 | 2016-09-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD827459S1 true USD827459S1 (en) | 2018-09-04 |
Family
ID=59011610
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/593,538 Active USD827459S1 (en) | 2016-09-26 | 2017-02-09 | Probe for remote coordinate measuring machine |
Country Status (2)
Country | Link |
---|---|
US (1) | USD827459S1 (en) |
JP (1) | JP1578944S (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220221261A1 (en) * | 2019-06-25 | 2022-07-14 | Asanuma Giken Co., Ltd. | Inspection master |
TWD222756S (en) | 2021-11-15 | 2022-12-21 | 南韓商OKins電子股份有限公司 | Probe for measuring electrical characteristics |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4523450A (en) * | 1981-11-07 | 1985-06-18 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Method of calibrating probe pins on multicoordinate measurement machines |
US4578873A (en) * | 1984-05-15 | 1986-04-01 | Mauser-Werke Oberndorf Gmbh | Sensor head with stop elements for establishing stable rest position |
USD327854S (en) * | 1989-04-22 | 1992-07-14 | Renishaw Plc | Coordinate positioning probe head |
US5446971A (en) * | 1993-01-14 | 1995-09-05 | Leitz Messtechnik Gmbh | Method for the dimensional measurement of workpieces |
US5524354A (en) * | 1992-12-21 | 1996-06-11 | Carl Zeiss Jena Gmbh | Probe element for coordinate measurement systems |
US6360176B1 (en) * | 1998-04-14 | 2002-03-19 | Mitutoyo Corporation | Touch signal probe |
US6678966B1 (en) * | 1999-06-16 | 2004-01-20 | Mitutoyo Corporation | Reseat system of touch signal probe |
US8122610B2 (en) * | 2008-03-28 | 2012-02-28 | Hexagon Metrology, Inc. | Systems and methods for improved coordination acquisition member comprising calibration information |
USD666513S1 (en) * | 2010-10-21 | 2012-09-04 | Mitutoyo Corporation | Remote probe for a coordinate measuring machine |
USD731904S1 (en) * | 2014-03-19 | 2015-06-16 | Hexagon Metrology Vision GmbH | Coordinate measuring machine |
US9354042B2 (en) * | 2014-05-07 | 2016-05-31 | Mitutoyo Corporation | Coordinate measuring system, coordinate measuring method, and probe |
US20160258738A1 (en) * | 2015-03-05 | 2016-09-08 | Mitutoyo Corporation | Measuring probe |
US9618312B2 (en) * | 2015-03-05 | 2017-04-11 | Mitutoyo Corporation | Measuring probe |
US9759540B2 (en) * | 2014-06-11 | 2017-09-12 | Hexagon Metrology, Inc. | Articulating CMM probe |
US9810529B2 (en) * | 2015-03-05 | 2017-11-07 | Mitotoyo Corporation | Measuring probe for measuring a three-dimensional shape of an object to be measured |
-
2016
- 2016-09-26 JP JPD2016-20567F patent/JP1578944S/ja active Active
-
2017
- 2017-02-09 US US29/593,538 patent/USD827459S1/en active Active
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4523450A (en) * | 1981-11-07 | 1985-06-18 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Method of calibrating probe pins on multicoordinate measurement machines |
US4578873A (en) * | 1984-05-15 | 1986-04-01 | Mauser-Werke Oberndorf Gmbh | Sensor head with stop elements for establishing stable rest position |
USD327854S (en) * | 1989-04-22 | 1992-07-14 | Renishaw Plc | Coordinate positioning probe head |
US5524354A (en) * | 1992-12-21 | 1996-06-11 | Carl Zeiss Jena Gmbh | Probe element for coordinate measurement systems |
US5446971A (en) * | 1993-01-14 | 1995-09-05 | Leitz Messtechnik Gmbh | Method for the dimensional measurement of workpieces |
US6360176B1 (en) * | 1998-04-14 | 2002-03-19 | Mitutoyo Corporation | Touch signal probe |
US6678966B1 (en) * | 1999-06-16 | 2004-01-20 | Mitutoyo Corporation | Reseat system of touch signal probe |
US8122610B2 (en) * | 2008-03-28 | 2012-02-28 | Hexagon Metrology, Inc. | Systems and methods for improved coordination acquisition member comprising calibration information |
USD666513S1 (en) * | 2010-10-21 | 2012-09-04 | Mitutoyo Corporation | Remote probe for a coordinate measuring machine |
USD731904S1 (en) * | 2014-03-19 | 2015-06-16 | Hexagon Metrology Vision GmbH | Coordinate measuring machine |
US9354042B2 (en) * | 2014-05-07 | 2016-05-31 | Mitutoyo Corporation | Coordinate measuring system, coordinate measuring method, and probe |
US9759540B2 (en) * | 2014-06-11 | 2017-09-12 | Hexagon Metrology, Inc. | Articulating CMM probe |
US20160258738A1 (en) * | 2015-03-05 | 2016-09-08 | Mitutoyo Corporation | Measuring probe |
US9618312B2 (en) * | 2015-03-05 | 2017-04-11 | Mitutoyo Corporation | Measuring probe |
US9810529B2 (en) * | 2015-03-05 | 2017-11-07 | Mitotoyo Corporation | Measuring probe for measuring a three-dimensional shape of an object to be measured |
Non-Patent Citations (2)
Title |
---|
http://www.ndigital.com/msci/products/procmm/. |
Multi-Sided Probe. NDI (Northern Digital Inc.). Jul. 2008. NDI P/N 8300220. |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220221261A1 (en) * | 2019-06-25 | 2022-07-14 | Asanuma Giken Co., Ltd. | Inspection master |
US11781849B2 (en) * | 2019-06-25 | 2023-10-10 | Asanuma Giken Co., Ltd. | Inspection master |
TWD222756S (en) | 2021-11-15 | 2022-12-21 | 南韓商OKins電子股份有限公司 | Probe for measuring electrical characteristics |
USD1024815S1 (en) | 2021-11-15 | 2024-04-30 | Okins Electronics Co., Ltd. | Probe for measuring electrical characteristics |
Also Published As
Publication number | Publication date |
---|---|
JP1578944S (en) | 2017-06-12 |
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