USD806892S1 - Tip of a sample holder - Google Patents

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Publication number
USD806892S1
USD806892S1 US29/494,233 US201429494233F USD806892S US D806892 S1 USD806892 S1 US D806892S1 US 201429494233 F US201429494233 F US 201429494233F US D806892 S USD806892 S US D806892S
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US
United States
Prior art keywords
tip
sample holder
holder
sample
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/494,233
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English (en)
Inventor
II Franklin Stampley WALDEN
Daniel Stephen GARDINER
John Damiano, Jr.
David P. Nackashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Protochips Inc
Original Assignee
Protochips Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Protochips Inc filed Critical Protochips Inc
Priority to US29/494,233 priority Critical patent/USD806892S1/en
Assigned to PROTOCHIPS, INC. reassignment PROTOCHIPS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DAMIANO, JOHN, JR., GARDINER, Daniel Stephen, NACKASHI, DAVID P., WALDEN, FRANKLIN STAMPLEY, II
Priority to JPD2014-28000F priority patent/JP1536854S/ja
Assigned to SALEM INVESTMENT PARTNERS IV, LIMITED PARTNERSHIP reassignment SALEM INVESTMENT PARTNERS IV, LIMITED PARTNERSHIP SECURITY INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: PROTOCHIPS, INC.
Application granted granted Critical
Publication of USD806892S1 publication Critical patent/USD806892S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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US29/494,233 2014-06-18 2014-06-18 Tip of a sample holder Active USD806892S1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US29/494,233 USD806892S1 (en) 2014-06-18 2014-06-18 Tip of a sample holder
JPD2014-28000F JP1536854S (xx) 2014-06-18 2014-12-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/494,233 USD806892S1 (en) 2014-06-18 2014-06-18 Tip of a sample holder

Publications (1)

Publication Number Publication Date
USD806892S1 true USD806892S1 (en) 2018-01-02

Family

ID=54353812

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/494,233 Active USD806892S1 (en) 2014-06-18 2014-06-18 Tip of a sample holder

Country Status (2)

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US (1) USD806892S1 (xx)
JP (1) JP1536854S (xx)

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD841183S1 (en) * 2016-03-08 2019-02-19 Protochips, Inc. Window E-chip for an electron microscope
USD867612S1 (en) 2018-01-19 2019-11-19 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD867613S1 (en) 2018-01-19 2019-11-19 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD887576S1 (en) * 2018-01-19 2020-06-16 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD891635S1 (en) * 2018-01-19 2020-07-28 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD893746S1 (en) * 2018-01-19 2020-08-18 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD893742S1 (en) 2018-01-19 2020-08-18 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD894421S1 (en) * 2018-01-19 2020-08-25 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895138S1 (en) * 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895142S1 (en) * 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895143S1 (en) 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895836S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895832S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895834S1 (en) * 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895833S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895835S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD898940S1 (en) 2018-01-19 2020-10-13 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD901715S1 (en) 2018-01-19 2020-11-10 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4974244A (en) * 1988-08-04 1990-11-27 Angelo M. Torrisi Sample positioning method and system for X-ray spectroscopic analysis
USD320269S (en) * 1987-12-10 1991-09-24 Dart Industries Inc. Test strip
US5084910A (en) * 1990-12-17 1992-01-28 Dow Corning Corporation X-ray diffractometer sample holder
US5127039A (en) * 1991-01-16 1992-06-30 The United States Of America As Represented By The United States Department Of Energy Sample holder for X-ray diffractometry
US5350923A (en) * 1992-02-06 1994-09-27 Northern Telecom Limited Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods
US5359640A (en) * 1993-08-10 1994-10-25 Siemens Industrial Automation, Inc. X-ray micro diffractometer sample positioner
US5367171A (en) * 1991-10-24 1994-11-22 Hitachi, Ltd. Electron microscope specimen holder
US5698856A (en) * 1996-08-05 1997-12-16 Frasca; Peter Specimen holder for electron microscope
US6968037B2 (en) * 2002-04-10 2005-11-22 Bristol-Myers Squibb Co. High throughput X-ray diffraction filter sample holder
US7471766B2 (en) * 2006-08-01 2008-12-30 Rigaku Corporation X-ray diffraction apparatus
USD628709S1 (en) * 2007-11-30 2010-12-07 X-Ray Optical Systems, Inc. Sample cell for x-ray analyzer
US7986005B2 (en) * 2007-07-27 2011-07-26 Infineon Technologies Austria Ag Short circuit limiting in power semiconductor devices

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD320269S (en) * 1987-12-10 1991-09-24 Dart Industries Inc. Test strip
US4974244A (en) * 1988-08-04 1990-11-27 Angelo M. Torrisi Sample positioning method and system for X-ray spectroscopic analysis
US5084910A (en) * 1990-12-17 1992-01-28 Dow Corning Corporation X-ray diffractometer sample holder
US5127039A (en) * 1991-01-16 1992-06-30 The United States Of America As Represented By The United States Department Of Energy Sample holder for X-ray diffractometry
US5367171A (en) * 1991-10-24 1994-11-22 Hitachi, Ltd. Electron microscope specimen holder
US5350923A (en) * 1992-02-06 1994-09-27 Northern Telecom Limited Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods
US5359640A (en) * 1993-08-10 1994-10-25 Siemens Industrial Automation, Inc. X-ray micro diffractometer sample positioner
US5698856A (en) * 1996-08-05 1997-12-16 Frasca; Peter Specimen holder for electron microscope
US6968037B2 (en) * 2002-04-10 2005-11-22 Bristol-Myers Squibb Co. High throughput X-ray diffraction filter sample holder
US7471766B2 (en) * 2006-08-01 2008-12-30 Rigaku Corporation X-ray diffraction apparatus
US7986005B2 (en) * 2007-07-27 2011-07-26 Infineon Technologies Austria Ag Short circuit limiting in power semiconductor devices
USD628709S1 (en) * 2007-11-30 2010-12-07 X-Ray Optical Systems, Inc. Sample cell for x-ray analyzer

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD841183S1 (en) * 2016-03-08 2019-02-19 Protochips, Inc. Window E-chip for an electron microscope
USD867612S1 (en) 2018-01-19 2019-11-19 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD867613S1 (en) 2018-01-19 2019-11-19 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD887576S1 (en) * 2018-01-19 2020-06-16 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD891635S1 (en) * 2018-01-19 2020-07-28 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD893746S1 (en) * 2018-01-19 2020-08-18 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD893742S1 (en) 2018-01-19 2020-08-18 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD894421S1 (en) * 2018-01-19 2020-08-25 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895138S1 (en) * 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895142S1 (en) * 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895143S1 (en) 2018-01-19 2020-09-01 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895836S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895832S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895834S1 (en) * 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895833S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD895835S1 (en) 2018-01-19 2020-09-08 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD898940S1 (en) 2018-01-19 2020-10-13 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD901715S1 (en) 2018-01-19 2020-11-10 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD936857S1 (en) 2018-01-19 2021-11-23 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis
USD936858S1 (en) 2018-01-19 2021-11-23 Hamamatsu Photonics K.K. Sample holder for ionized sample analysis

Also Published As

Publication number Publication date
JP1536854S (xx) 2015-11-02

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