USD792255S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD792255S1
USD792255S1 US29/563,347 US201629563347F USD792255S US D792255 S1 USD792255 S1 US D792255S1 US 201629563347 F US201629563347 F US 201629563347F US D792255 S USD792255 S US D792255S
Authority
US
United States
Prior art keywords
probe pin
view
probe
pin
design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/563,347
Inventor
Hirotada Teranishi
Takahiro Sakai
Makoto Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TERANISHI, HIROTADA, KONDO, MAKOTO, SAKAI, TAKAHIRO
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Publication of USD792255S1 publication Critical patent/USD792255S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevational view thereof, a rear elevational view being a mirror image thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan view thereof.
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown and described.
US29/563,347 2015-11-12 2016-05-04 Probe pin Active USD792255S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2015-25355F JP1558740S (en) 2015-11-12 2015-11-12
JP2015-025355 2015-11-12

Publications (1)

Publication Number Publication Date
USD792255S1 true USD792255S1 (en) 2017-07-18

Family

ID=56884960

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/563,347 Active USD792255S1 (en) 2015-11-12 2016-05-04 Probe pin

Country Status (2)

Country Link
US (1) USD792255S1 (en)
JP (1) JP1558740S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6784680B2 (en) * 2000-06-01 2004-08-31 Sumitomo Electric Industries, Ltd. Contact probe with guide unit and fabrication method thereof
US7190179B2 (en) * 2001-04-13 2007-03-13 Sumitomo Electric Industries, Ltd. Contact probe

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6784680B2 (en) * 2000-06-01 2004-08-31 Sumitomo Electric Industries, Ltd. Contact probe with guide unit and fabrication method thereof
US7190179B2 (en) * 2001-04-13 2007-03-13 Sumitomo Electric Industries, Ltd. Contact probe

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
U.S. Appl. No. 29/563,343, filed May 4, 2016; Teranishi et al.
U.S. Appl. No. 29/563,345, filed May 4, 2016; Teranishi et al.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
JP1558740S (en) 2016-09-12

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