USD780927S1 - Fluorescent X-ray coating thickness gauge - Google Patents

Fluorescent X-ray coating thickness gauge Download PDF

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Publication number
USD780927S1
USD780927S1 US29/529,938 US201529529938F USD780927S US D780927 S1 USD780927 S1 US D780927S1 US 201529529938 F US201529529938 F US 201529529938F US D780927 S USD780927 S US D780927S
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US
United States
Prior art keywords
fluorescent
coating thickness
thickness gauge
ray coating
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/529,938
Inventor
Ai Masuda
Hiroyuki Noda
Toshiyuki Takahara
Isao Yagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
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Hitachi High Tech Science Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Science Corp filed Critical Hitachi High Tech Science Corp
Assigned to HITACHI HIGH-TECH SCIENCE CORPORATION reassignment HITACHI HIGH-TECH SCIENCE CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TAKAHARA, TOSHIYUKI, YAGI, ISAO, MASUDA, AI, NODA, HIROYUKI
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Description

This application contains subject matter related to the following co-pending U.S. design patent application:
Application Ser. No. 29/529,941, filed herewith and entitled “Fluorescent X-ray Coating Thickness Gauge”.
FIG. 1 is a perspective view of a fluorescent X-ray coating thickness gauge according to the design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a partially enlarged view of FIG. 2 showing the “power up” mode. The eleven circular elements within the interior rectangular feature are only visible in the “power-up” mode.
The dash-dot-dash broken lines shown in FIG. 2 and FIG. 8 are to identify the portion of the design shown in the enlarged view of FIG. 8. All other broken lines illustrate environmental subject matter and are for illustrative purposes only. The broken lines form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a fluorescent X-ray coating thickness gauge, as shown and described.
US29/529,938 2014-12-12 2015-06-11 Fluorescent X-ray coating thickness gauge Active USD780927S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2014-27854F JP1527802S (en) 2014-12-12 2014-12-12
JP2014-027854 2014-12-12

Publications (1)

Publication Number Publication Date
USD780927S1 true USD780927S1 (en) 2017-03-07

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US29/529,938 Active USD780927S1 (en) 2014-12-12 2015-06-11 Fluorescent X-ray coating thickness gauge

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US (1) USD780927S1 (en)
JP (1) JP1527802S (en)
TW (1) TWD175726S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD811595S1 (en) * 2016-01-07 2018-02-27 R&A Negatoscope
USD907244S1 (en) * 2019-06-14 2021-01-05 Emd Millipore Corporation Cell imager

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD247226S (en) * 1976-05-24 1978-02-14 Baxter Travenol Laboratories, Inc. Spectrophotofluorometer
USD320450S (en) * 1989-02-24 1991-10-01 Abbott Laboratories Biological analyzer or the like
USD515707S1 (en) * 2003-09-01 2006-02-21 Matsushita Electric Industrial Co., Ltd. Fluorescent reader
USD702350S1 (en) * 2012-02-01 2014-04-08 Olympus Ndt, Inc. Bench top X-ray fluorescence (XRF) instrument
USD724214S1 (en) * 2013-08-27 2015-03-10 Shimadzu Corporation Analyzing machine having X-ray

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD247226S (en) * 1976-05-24 1978-02-14 Baxter Travenol Laboratories, Inc. Spectrophotofluorometer
USD320450S (en) * 1989-02-24 1991-10-01 Abbott Laboratories Biological analyzer or the like
USD515707S1 (en) * 2003-09-01 2006-02-21 Matsushita Electric Industrial Co., Ltd. Fluorescent reader
USD702350S1 (en) * 2012-02-01 2014-04-08 Olympus Ndt, Inc. Bench top X-ray fluorescence (XRF) instrument
USD724214S1 (en) * 2013-08-27 2015-03-10 Shimadzu Corporation Analyzing machine having X-ray

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD811595S1 (en) * 2016-01-07 2018-02-27 R&A Negatoscope
USD907244S1 (en) * 2019-06-14 2021-01-05 Emd Millipore Corporation Cell imager

Also Published As

Publication number Publication date
JP1527802S (en) 2015-06-29
TWD175726S (en) 2016-05-21

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