USD764332S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD764332S1
USD764332S1 US29/528,960 US201529528960F USD764332S US D764332 S1 USD764332 S1 US D764332S1 US 201529528960 F US201529528960 F US 201529528960F US D764332 S USD764332 S US D764332S
Authority
US
United States
Prior art keywords
probe pin
view
figures show
probe
design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/528,960
Inventor
Hirotada Teranishi
Takahiro Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SAKAI, TAKAHIRO, TERANISHI, HIROTADA
Application granted granted Critical
Publication of USD764332S1 publication Critical patent/USD764332S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a top front perspective view of a probe pin showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.
The dot-dash broken lines in the figures show boundaries of the claimed design.
The shade lines in the figures show contour and not surface ornamentation.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown and described.
US29/528,960 2014-12-04 2015-06-02 Probe pin Active USD764332S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2014-27122F JP1529604S (en) 2014-12-04 2014-12-04
JP2014-027122 2014-12-04

Publications (1)

Publication Number Publication Date
USD764332S1 true USD764332S1 (en) 2016-08-23

Family

ID=53764631

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/528,960 Active USD764332S1 (en) 2014-12-04 2015-06-02 Probe pin

Country Status (3)

Country Link
US (1) USD764332S1 (en)
JP (1) JP1529604S (en)
TW (1) TWD180901S (en)

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD325564S (en) * 1989-10-11 1992-04-21 Lemke Irvin A Retainer for securing electrical plugs to an outlet
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2007097559A1 (en) 2006-02-20 2007-08-30 Saehanmicrotech Co., Ltd Probe pin assembly and method for manufacturing the same
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD325564S (en) * 1989-10-11 1992-04-21 Lemke Irvin A Retainer for securing electrical plugs to an outlet
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
WO2007097559A1 (en) 2006-02-20 2007-08-30 Saehanmicrotech Co., Ltd Probe pin assembly and method for manufacturing the same
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Korean Office Action issued in KR Appl. No. 30-2015-0027089.
Search Report dated Sep. 11, 2015 for Taiwanese Application No. 104302991 with Translation.
U.S. Appl. No. 29/528,956, filed Jun. 2, 2015; Teranishi et al.
U.S. Appl. No. 29/528,958, filed Jun. 2, 2015; Teranishi et al.

Also Published As

Publication number Publication date
JP1529604S (en) 2015-07-27
TWD180901S (en) 2017-01-21

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