USD708245S1 - Cover for an electron microscope - Google Patents

Cover for an electron microscope Download PDF

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Publication number
USD708245S1
USD708245S1 US29/456,325 US201329456325F USD708245S US D708245 S1 USD708245 S1 US D708245S1 US 201329456325 F US201329456325 F US 201329456325F US D708245 S USD708245 S US D708245S
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US
United States
Prior art keywords
cover
electron microscope
view
perspective
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/456,325
Inventor
Kosuke Matoba
Hiroyuki Suzuki
Hirofumi Sato
Naoki Sakamoto
Toshiyuki Moriya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SATO, HIROFUMI, SAKAMOTO, NAOKI, SUZUKI, HIROYUKI, MATOBA, KOSUKE, MORIYA, TOSHIYUKI
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Publication of USD708245S1 publication Critical patent/USD708245S1/en
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Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Description

FIG. 1 is a front, top and right side perspective view of a cover for an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a perspective view thereof shown in an opened position; and,
FIG. 9 is a perspective view thereof shown in another opened position.

Claims (1)

    CLAIM
  1. We claim the ornamental design for a cover for an electron microscope, as shown and described.
US29/456,325 2012-11-30 2013-05-30 Cover for an electron microscope Active USD708245S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012029393 2012-11-30
JP2012-029393 2012-11-30

Publications (1)

Publication Number Publication Date
USD708245S1 true USD708245S1 (en) 2014-07-01

Family

ID=50982582

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/456,325 Active USD708245S1 (en) 2012-11-30 2013-05-30 Cover for an electron microscope

Country Status (1)

Country Link
US (1) USD708245S1 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD841069S1 (en) * 2016-02-02 2019-02-19 Shimadzu Corporation Infrared microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD928983S1 (en) * 2019-10-01 2021-08-24 Laxco Incorporated Microscope cartridge rack
USD1058853S1 (en) * 2020-01-10 2025-01-21 Leica Microsystems Cms Gmbh Laboratory device
USD1064023S1 (en) * 2021-10-05 2025-02-25 Leica Microsystems Cms Gmbh Accessory for a microscope
USD1109207S1 (en) * 2024-02-06 2026-01-13 Jeol Ltd. Electron microscope
USD1117392S1 (en) * 2021-04-06 2026-03-10 Leica Microsystems Cms Gmbh Combination of accessories for a microscope

Citations (30)

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US3814356A (en) * 1970-10-02 1974-06-04 J Coleman Electron microscope
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
USD264752S (en) * 1979-08-10 1982-06-01 Warner-Lambert Company Pharmaceutical dispensing cabinet
US4523094A (en) * 1981-02-27 1985-06-11 Carl-Zeiss-Stiftung, Heidenheim/Brenz Evaluation device for electron-optical images
US4669790A (en) * 1984-12-11 1987-06-02 Briggs Sharon L Multipurpose cabinet
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope
US5577817A (en) * 1995-07-31 1996-11-26 Reynolds; Cory Portable paints and supplies storage and work enclosure
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
US5864138A (en) * 1995-09-14 1999-01-26 Hitachi, Ltd. Electron Microscope
US20030227236A1 (en) * 2002-06-06 2003-12-11 Brooks David W. Modular safety station
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
US20080150404A1 (en) * 2006-12-20 2008-06-26 Keiichi Ono Safety cabinet
USD599688S1 (en) * 2009-04-28 2009-09-08 Shiseido Co., Ltd. Spectrophotometer
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope
USD632323S1 (en) * 2009-09-30 2011-02-08 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD635168S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD635167S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD684609S1 (en) * 2011-12-22 2013-06-18 Lg Electronics Inc. Refrigerator
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope

Patent Citations (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3297284A (en) * 1964-11-06 1967-01-10 Pellerin Corp Milnor Suspension system for machines
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
US3814356A (en) * 1970-10-02 1974-06-04 J Coleman Electron microscope
USD264752S (en) * 1979-08-10 1982-06-01 Warner-Lambert Company Pharmaceutical dispensing cabinet
US4523094A (en) * 1981-02-27 1985-06-11 Carl-Zeiss-Stiftung, Heidenheim/Brenz Evaluation device for electron-optical images
US4669790A (en) * 1984-12-11 1987-06-02 Briggs Sharon L Multipurpose cabinet
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
US5350921A (en) * 1992-07-29 1994-09-27 Hitachi, Ltd. Analytical electron microscope and a method of operating such an electron microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
US5577817A (en) * 1995-07-31 1996-11-26 Reynolds; Cory Portable paints and supplies storage and work enclosure
US5864138A (en) * 1995-09-14 1999-01-26 Hitachi, Ltd. Electron Microscope
US6084239A (en) * 1995-09-14 2000-07-04 Hitachi, Ltd. Electron microscope
US20030227236A1 (en) * 2002-06-06 2003-12-11 Brooks David W. Modular safety station
USD571385S1 (en) * 2006-06-19 2008-06-17 Hitachi High-Technologies Corporation Electron microscope
US20080150404A1 (en) * 2006-12-20 2008-06-26 Keiichi Ono Safety cabinet
USD608810S1 (en) * 2008-07-15 2010-01-26 NT-MDT Service & Logistics Ltd. Microscope
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope
USD625749S1 (en) * 2009-03-19 2010-10-19 Hitachi High-Technologies Corporation Electron microscope
USD599688S1 (en) * 2009-04-28 2009-09-08 Shiseido Co., Ltd. Spectrophotometer
USD635167S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD635168S1 (en) * 2009-09-25 2011-03-29 Hitachi High-Technologies Corporation Portion of an electron microscope
USD633538S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD633537S1 (en) * 2009-09-30 2011-03-01 Hitachi High-Technologies Corporation Electron microscope
USD632323S1 (en) * 2009-09-30 2011-02-08 Hitachi High-Technologies Corporation Electron microscope
USD626579S1 (en) * 2009-09-30 2010-11-02 Hitachi High-Technologies Corporation Electron microscope
USD636005S1 (en) * 2010-01-08 2011-04-12 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD684609S1 (en) * 2011-12-22 2013-06-18 Lg Electronics Inc. Refrigerator
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
Imaging & Microscopy, Imaging-GIT.com, Fei Ultra-High Resolution Titan, Issue 1, Nov. 1, 2007, in English.
Jeol News, Introduction of New Products, High Throughput Electron Microscope, Jem-2800, Jul. 2011, vol. 46, No. 1, in English.

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD841069S1 (en) * 2016-02-02 2019-02-19 Shimadzu Corporation Infrared microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD928983S1 (en) * 2019-10-01 2021-08-24 Laxco Incorporated Microscope cartridge rack
USD1058853S1 (en) * 2020-01-10 2025-01-21 Leica Microsystems Cms Gmbh Laboratory device
USD1069876S1 (en) * 2020-01-10 2025-04-08 Leica Microsystems Cms Gmbh Laboratory device
USD1117392S1 (en) * 2021-04-06 2026-03-10 Leica Microsystems Cms Gmbh Combination of accessories for a microscope
USD1064023S1 (en) * 2021-10-05 2025-02-25 Leica Microsystems Cms Gmbh Accessory for a microscope
USD1109207S1 (en) * 2024-02-06 2026-01-13 Jeol Ltd. Electron microscope

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