USD689387S1 - Mass analyzer - Google Patents

Mass analyzer Download PDF

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Publication number
USD689387S1
USD689387S1 US29/426,374 US201229426374F USD689387S US D689387 S1 USD689387 S1 US D689387S1 US 201229426374 F US201229426374 F US 201229426374F US D689387 S USD689387 S US D689387S
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US
United States
Prior art keywords
mass analyzer
view
mass
analyzer
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/426,374
Inventor
Hiroshi Muraoka
Kazuhisa Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Assigned to SHIMADZU CORPORATION reassignment SHIMADZU CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MURAOKA, HIROSHI, SATO, KAZUHISA
Application granted granted Critical
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Description

FIG. 1 is a perspective view of a mass analyzer showing a first embodiment of our new design;
FIG. 2 is a front view of the first embodiment;
FIG. 3 is a rear view of the first embodiment;
FIG. 4 is a left side view of the first embodiment;
FIG. 5 is a right side view of the first embodiment;
FIG. 6 is a top view of the first embodiment;
FIG. 7 is a bottom view of the first embodiment;
FIG. 8 is a perspective view of a mass analyzer showing a second embodiment of our new design;
FIG. 9 is a front view of the second embodiment;
FIG. 10 is a rear view of the second embodiment;
FIG. 11 is a left side view of the second embodiment;
FIG. 12 is a right side view of the second embodiment;
FIG. 13 is a top view of the second embodiment; and,
FIG. 14 is a bottom view of the second embodiment.

Claims (1)

    CLAIM
  1. The ornamental design for a mass analyzer, as shown and described.
US29/426,374 2012-05-09 2012-07-05 Mass analyzer Active USD689387S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012-010718 2012-01-23
JP2012010718 2012-05-09

Publications (1)

Publication Number Publication Date
USD689387S1 true USD689387S1 (en) 2013-09-10

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Family Applications (1)

Application Number Title Priority Date Filing Date
US29/426,374 Active USD689387S1 (en) 2012-05-09 2012-07-05 Mass analyzer

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US (1) USD689387S1 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD711264S1 (en) * 2013-03-20 2014-08-19 Thermo Finnigan Llc Mass spectrometer
USD711265S1 (en) * 2013-03-20 2014-08-19 Thermo Finnigan Llc Mass spectrometer
USD747227S1 (en) * 2014-02-28 2016-01-12 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD758221S1 (en) * 2014-02-28 2016-06-07 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD870311S1 (en) * 2018-01-26 2019-12-17 Shimadzu Corporation Sample supply apparatus
USD915914S1 (en) * 2018-11-29 2021-04-13 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD980730S1 (en) * 2020-06-02 2023-03-14 Tintometer Gmbh Measuring instrument housing
USD1105942S1 (en) * 2023-08-28 2025-12-16 Shimadzu Corporation Mass spectrometer

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD276315S (en) * 1982-04-07 1984-11-13 Miles Laboratories, Inc. Spectrophotometer
USD283107S (en) * 1983-07-29 1986-03-25 Miles Laboratories, Inc. Reflectance photometer
USD292979S (en) * 1985-04-26 1987-12-01 Prometrix Corporation Automatic semiconductor wafer tester
US6630663B2 (en) * 1998-10-21 2003-10-07 Raytheon Company Miniature ion mobility spectrometer
US20080087818A1 (en) * 2006-10-11 2008-04-17 Xue-Song Scott Li Ion trap mobility spectrometer calibration method and system
USD640581S1 (en) * 2010-02-26 2011-06-28 Hitachi High-Technologies Corporation Spectrophotometer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD276315S (en) * 1982-04-07 1984-11-13 Miles Laboratories, Inc. Spectrophotometer
USD283107S (en) * 1983-07-29 1986-03-25 Miles Laboratories, Inc. Reflectance photometer
USD292979S (en) * 1985-04-26 1987-12-01 Prometrix Corporation Automatic semiconductor wafer tester
US6630663B2 (en) * 1998-10-21 2003-10-07 Raytheon Company Miniature ion mobility spectrometer
US20080087818A1 (en) * 2006-10-11 2008-04-17 Xue-Song Scott Li Ion trap mobility spectrometer calibration method and system
USD640581S1 (en) * 2010-02-26 2011-06-28 Hitachi High-Technologies Corporation Spectrophotometer

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD711264S1 (en) * 2013-03-20 2014-08-19 Thermo Finnigan Llc Mass spectrometer
USD711265S1 (en) * 2013-03-20 2014-08-19 Thermo Finnigan Llc Mass spectrometer
USD747227S1 (en) * 2014-02-28 2016-01-12 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD758221S1 (en) * 2014-02-28 2016-06-07 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD870311S1 (en) * 2018-01-26 2019-12-17 Shimadzu Corporation Sample supply apparatus
USD915914S1 (en) * 2018-11-29 2021-04-13 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD980730S1 (en) * 2020-06-02 2023-03-14 Tintometer Gmbh Measuring instrument housing
USD1105942S1 (en) * 2023-08-28 2025-12-16 Shimadzu Corporation Mass spectrometer

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