USD632323S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD632323S1
USD632323S1 US29/356,731 US35673110F USD632323S US D632323 S1 USD632323 S1 US D632323S1 US 35673110 F US35673110 F US 35673110F US D632323 S USD632323 S US D632323S
Authority
US
United States
Prior art keywords
electron microscope
view
elevational view
ornamental design
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/356,731
Inventor
Mitsuru Oonuma
Akira Omachi
Masahiko Ajima
Tomohisa Ohtaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AJIMA, MASAHIKO, OHTAKI, TOMOHISA, OMACHI, AKIRA, OONUMA, MITSURU
Application granted granted Critical
Publication of USD632323S1 publication Critical patent/USD632323S1/en
Assigned to HITACHI HIGH-TECH CORPORATION reassignment HITACHI HIGH-TECH CORPORATION CHANGE OF NAME AND ADDRESS Assignors: HITACHI HIGH-TECHNOLOGIES CORPORATION
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines form no part of the claimed design.

Claims (1)

  1. We claim the ornamental design for an electron microscope, as shown and described.
US29/356,731 2009-09-30 2010-03-02 Electron microscope Expired - Lifetime USD632323S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009-022636 2009-02-03
JP2009022636 2009-09-30

Publications (1)

Publication Number Publication Date
USD632323S1 true USD632323S1 (en) 2011-02-08

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ID=43532420

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/356,731 Expired - Lifetime USD632323S1 (en) 2009-09-30 2010-03-02 Electron microscope

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US (1) USD632323S1 (en)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD656978S1 (en) * 2010-10-08 2012-04-03 NT-MDT Service & Logistics Ltd. Microscope
USD657407S1 (en) * 2009-12-15 2012-04-10 Sanyo Electric Co., Ltd. Microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD697118S1 (en) * 2012-03-30 2014-01-07 Jeol Ltd. Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD933730S1 (en) * 2020-02-18 2021-10-19 Shimadzu Corporation Mass microscope
USD973745S1 (en) * 2019-10-07 2022-12-27 Shimadzu Corporation Probe microscope
USD1109207S1 (en) * 2024-02-06 2026-01-13 Jeol Ltd. Electron microscope

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) * 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
US3202047A (en) * 1961-06-21 1965-08-24 Bausch & Lomb Inverted microscope with u-shaped optical path and tubular mounts for objective and relay lens systems
US3551019A (en) * 1967-11-21 1970-12-29 Zeiss Stiftung Universal microscope
US4210384A (en) * 1976-09-11 1980-07-01 Carl Zeiss-Stiftung Inverted-design optical microscope
USD299861S (en) * 1986-11-19 1989-02-14 Spacelabs, Inc. Medical monitor
US4812029A (en) * 1987-02-19 1989-03-14 Onanhian Richard A Microscope system
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
USD491272S1 (en) * 2002-12-13 2004-06-08 Immunivest Corporation Autoprep instrument
USD516121S1 (en) * 2004-02-04 2006-02-28 Seiko Epson Corporation Printer
USD572464S1 (en) * 2007-04-27 2008-07-08 Honda Motor Co., Ltd. Walking assistance device
USD574280S1 (en) * 2007-01-23 2008-08-05 Nihon Dempa Kogyo Co., Ltd. Temperature controlled oven for bio-sensor
USD591864S1 (en) * 2007-12-10 2009-05-05 Dako Denmark A/S Housing for a biological sample processing apparatus
USD607569S1 (en) * 2008-11-18 2010-01-05 Panasonic Corporation Biochemical analyzer
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2424791A (en) * 1942-12-01 1947-07-29 Gen Electric Electron microscope apparatus
US3202047A (en) * 1961-06-21 1965-08-24 Bausch & Lomb Inverted microscope with u-shaped optical path and tubular mounts for objective and relay lens systems
US3551019A (en) * 1967-11-21 1970-12-29 Zeiss Stiftung Universal microscope
US4210384A (en) * 1976-09-11 1980-07-01 Carl Zeiss-Stiftung Inverted-design optical microscope
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD299861S (en) * 1986-11-19 1989-02-14 Spacelabs, Inc. Medical monitor
US4812029A (en) * 1987-02-19 1989-03-14 Onanhian Richard A Microscope system
USD332616S (en) * 1990-01-26 1993-01-19 Hitachi, Ltd. Electronic microscope
USD491272S1 (en) * 2002-12-13 2004-06-08 Immunivest Corporation Autoprep instrument
USD516121S1 (en) * 2004-02-04 2006-02-28 Seiko Epson Corporation Printer
USD574280S1 (en) * 2007-01-23 2008-08-05 Nihon Dempa Kogyo Co., Ltd. Temperature controlled oven for bio-sensor
USD572464S1 (en) * 2007-04-27 2008-07-08 Honda Motor Co., Ltd. Walking assistance device
USD591864S1 (en) * 2007-12-10 2009-05-05 Dako Denmark A/S Housing for a biological sample processing apparatus
USD607569S1 (en) * 2008-11-18 2010-01-05 Panasonic Corporation Biochemical analyzer
USD623211S1 (en) * 2009-03-19 2010-09-07 Hitachi High-Technologies Corporation Electron microscope

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
U.S. Patent Application of Oonuma et al., U.S. Appl. No. 29/343,661, filed Sep. 17, 2009.

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD657407S1 (en) * 2009-12-15 2012-04-10 Sanyo Electric Co., Ltd. Microscope
USD663338S1 (en) 2009-12-15 2012-07-10 Panasonic Healthcare Co., Ltd. Microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD656978S1 (en) * 2010-10-08 2012-04-03 NT-MDT Service & Logistics Ltd. Microscope
USD674830S1 (en) * 2011-07-08 2013-01-22 NT-MDT Service & Logistics Ltd. Microscope
USD697118S1 (en) * 2012-03-30 2014-01-07 Jeol Ltd. Electron microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708245S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Cover for an electron microscope
USD711950S1 (en) * 2012-11-30 2014-08-26 Hitachi High-Technologies Corporation Portion of a cover for an electron microscope
USD715843S1 (en) * 2013-02-22 2014-10-21 Shimadzu Corporation Mass microscope
USD724128S1 (en) * 2013-09-03 2015-03-10 Shimadzu Corporation Probe microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD973745S1 (en) * 2019-10-07 2022-12-27 Shimadzu Corporation Probe microscope
USD933730S1 (en) * 2020-02-18 2021-10-19 Shimadzu Corporation Mass microscope
USD1109207S1 (en) * 2024-02-06 2026-01-13 Jeol Ltd. Electron microscope

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