USD472171S1 - Measurement instrument housing - Google Patents

Measurement instrument housing Download PDF

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Publication number
USD472171S1
USD472171S1 US29/152,697 US15269701F USD472171S US D472171 S1 USD472171 S1 US D472171S1 US 15269701 F US15269701 F US 15269701F US D472171 S USD472171 S US D472171S
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US
United States
Prior art keywords
measurement instrument
instrument housing
housing
measurement
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/152,697
Inventor
Jerry L. Wrisley
James H. Mc Grath, Jr.
Kevin C. Ayers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/152,697 priority Critical patent/USD472171S1/en
Assigned to TEKTRONIX INC. reassignment TEKTRONIX INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AYERS, KEVIN C., MCGRATH, JAMES H., JR., WRISLEY, JERRY L.
Application granted granted Critical
Publication of USD472171S1 publication Critical patent/USD472171S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

The ornamental design disclosed in this application is for a measurement instrument housing having a rectangular protrusion extending from a portion of a curved rear surface.
FIG. 1 is a perspective view of a measurement instrument housing;
FIG. 2 is a front elevation view of the measurement instrument housing;
FIG. 3 is a top plan view of the measurement instrument housing;
FIG. 4 is a bottom plan view of the measurement instrument housing;
FIG. 5 is a left side elevation view of the measurement instrument housing;
FIG. 6 is a right side elevation view of the measurement instrument housing; and,
FIG. 7 is a rear elevation view of the measurement instrument housing.

Claims (1)

  1. The ornamental design of a measurement instrument housing, as shown and described.
US29/152,697 2001-12-20 2001-12-20 Measurement instrument housing Expired - Lifetime USD472171S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/152,697 USD472171S1 (en) 2001-12-20 2001-12-20 Measurement instrument housing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/152,697 USD472171S1 (en) 2001-12-20 2001-12-20 Measurement instrument housing

Publications (1)

Publication Number Publication Date
USD472171S1 true USD472171S1 (en) 2003-03-25

Family

ID=22544021

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/152,697 Expired - Lifetime USD472171S1 (en) 2001-12-20 2001-12-20 Measurement instrument housing

Country Status (1)

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US (1) USD472171S1 (en)

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD499658S1 (en) 2004-04-30 2004-12-14 Tektronix, Inc. Waveform generator
USD500694S1 (en) * 2004-04-30 2005-01-11 Tektronix, Inc. Housing for test and measurement instruments
USD500695S1 (en) * 2004-04-30 2005-01-11 Tektronix, Inc. Housing for test and measurement instruments
USD500957S1 (en) * 2004-04-30 2005-01-18 Tektronix, Inc. Housing for test and measurement instruments
USD504080S1 (en) * 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD504079S1 (en) * 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD508426S1 (en) * 2004-04-30 2005-08-16 Tektronix, Inc. Housing for test and measurement instruments
USD514004S1 (en) 2004-04-30 2006-01-31 Tektronix, Inc. Waveform generator
USD553520S1 (en) * 2005-11-16 2007-10-23 Lecroy Corporation Housing for test and measurement instrument
USD578911S1 (en) * 2008-02-04 2008-10-21 Lecroy Corporation Housing for test and measurement instrument
USD581821S1 (en) * 2008-02-04 2008-12-02 Lecroy Corporation Housing for test and measurement instrument
USD599832S1 (en) * 2008-02-25 2009-09-08 Advanced Liquid Logic, Inc. Benchtop instrument housing
USD820127S1 (en) 2014-11-21 2018-06-12 Tektronix, Inc. Housing for a test and measurement instrument
USD821234S1 (en) * 2016-07-11 2018-06-26 Tektronix, Inc. Multi-channel measurement instrument housing
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4972138A (en) 1987-05-11 1990-11-20 Hewlett Packard Co. Oscilloscope-like user-interface for a logic analyzer
US4977514A (en) 1987-05-08 1990-12-11 Hewlett Packard Company Overlaid digital waveforms display
US5003248A (en) 1986-11-10 1991-03-26 Hewlett-Packard Company Probability density histogram display
US5247287A (en) 1990-09-24 1993-09-21 Snap-On Tools Corporation Digital engine analyzer
USD413823S (en) 1998-07-28 1999-09-14 Tektronix, Inc. Electronic test and measurement instrument

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5003248A (en) 1986-11-10 1991-03-26 Hewlett-Packard Company Probability density histogram display
US4977514A (en) 1987-05-08 1990-12-11 Hewlett Packard Company Overlaid digital waveforms display
US4972138A (en) 1987-05-11 1990-11-20 Hewlett Packard Co. Oscilloscope-like user-interface for a logic analyzer
US5247287A (en) 1990-09-24 1993-09-21 Snap-On Tools Corporation Digital engine analyzer
USD413823S (en) 1998-07-28 1999-09-14 Tektronix, Inc. Electronic test and measurement instrument

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD499658S1 (en) 2004-04-30 2004-12-14 Tektronix, Inc. Waveform generator
USD500694S1 (en) * 2004-04-30 2005-01-11 Tektronix, Inc. Housing for test and measurement instruments
USD500695S1 (en) * 2004-04-30 2005-01-11 Tektronix, Inc. Housing for test and measurement instruments
USD500957S1 (en) * 2004-04-30 2005-01-18 Tektronix, Inc. Housing for test and measurement instruments
USD504080S1 (en) * 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD504079S1 (en) * 2004-04-30 2005-04-19 Tektronix, Inc. Oscilloscope instrument
USD508426S1 (en) * 2004-04-30 2005-08-16 Tektronix, Inc. Housing for test and measurement instruments
USD514004S1 (en) 2004-04-30 2006-01-31 Tektronix, Inc. Waveform generator
USD553520S1 (en) * 2005-11-16 2007-10-23 Lecroy Corporation Housing for test and measurement instrument
USD578911S1 (en) * 2008-02-04 2008-10-21 Lecroy Corporation Housing for test and measurement instrument
USD581821S1 (en) * 2008-02-04 2008-12-02 Lecroy Corporation Housing for test and measurement instrument
USD599832S1 (en) * 2008-02-25 2009-09-08 Advanced Liquid Logic, Inc. Benchtop instrument housing
USD820127S1 (en) 2014-11-21 2018-06-12 Tektronix, Inc. Housing for a test and measurement instrument
USD820129S1 (en) 2014-11-21 2018-06-12 Tektronix, Inc. Front panel for a measurement instrument
USD821234S1 (en) * 2016-07-11 2018-06-26 Tektronix, Inc. Multi-channel measurement instrument housing
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly

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