USD441310S1 - Electrical test probe - Google Patents
Electrical test probe Download PDFInfo
- Publication number
- USD441310S1 USD441310S1 US29/121,319 US12131900F USD441310S US D441310 S1 USD441310 S1 US D441310S1 US 12131900 F US12131900 F US 12131900F US D441310 S USD441310 S US D441310S
- Authority
- US
- United States
- Prior art keywords
- test probe
- electrical test
- view
- probe
- seen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Description
FIG. 1 is a perspective view of the electrical test probe of this invention showing a detachable primary probe point detached to reveal a non-detachable secondary sharp probe point;
FIG. 2 is a top view thereof with the secondary probe point covered;
FIG. 3 is a top view thereof to clearly illustrate the location of views shown in FIGS. 8, 9 and 10;
FIG. 4 is a front view thereof with the secondary probe point covered, the back view being a mirror image of the front view;
FIG. 5 is a bottom view thereof with the secondary probe point covered;
FIG. 6 is a left side view thereof;
FIG. 7 is a right side view thereof;
FIG. 8 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 8—8;
FIG. 9 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 9—9; and,
FIG. 10 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 10—10.
Claims (1)
- The ornamental design for an electrical test probe, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/121,319 USD441310S1 (en) | 2000-04-06 | 2000-04-06 | Electrical test probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/121,319 USD441310S1 (en) | 2000-04-06 | 2000-04-06 | Electrical test probe |
Publications (1)
Publication Number | Publication Date |
---|---|
USD441310S1 true USD441310S1 (en) | 2001-05-01 |
Family
ID=22395911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/121,319 Expired - Lifetime USD441310S1 (en) | 2000-04-06 | 2000-04-06 | Electrical test probe |
Country Status (1)
Country | Link |
---|---|
US (1) | USD441310S1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060061367A1 (en) * | 2004-09-17 | 2006-03-23 | Chenn Ieon C | Test light/circuit tester |
USD669083S1 (en) * | 2010-11-16 | 2012-10-16 | Tru-Test Limited | Wireless tag reader |
USD731270S1 (en) * | 2013-09-20 | 2015-06-09 | The Patent Store Llc | Pocket field tool bit |
USD892341S1 (en) * | 2018-07-10 | 2020-08-04 | Edan Instruments, Inc. | Intracavitary ultrasonic probe |
-
2000
- 2000-04-06 US US29/121,319 patent/USD441310S1/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060061367A1 (en) * | 2004-09-17 | 2006-03-23 | Chenn Ieon C | Test light/circuit tester |
USD669083S1 (en) * | 2010-11-16 | 2012-10-16 | Tru-Test Limited | Wireless tag reader |
USD731270S1 (en) * | 2013-09-20 | 2015-06-09 | The Patent Store Llc | Pocket field tool bit |
USD892341S1 (en) * | 2018-07-10 | 2020-08-04 | Edan Instruments, Inc. | Intracavitary ultrasonic probe |
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