USD441310S1 - Electrical test probe - Google Patents

Electrical test probe Download PDF

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Publication number
USD441310S1
USD441310S1 US29/121,319 US12131900F USD441310S US D441310 S1 USD441310 S1 US D441310S1 US 12131900 F US12131900 F US 12131900F US D441310 S USD441310 S US D441310S
Authority
US
United States
Prior art keywords
test probe
electrical test
view
probe
seen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/121,319
Inventor
Thomas F. Bauman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Crawford United Corp
Original Assignee
Hickok Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hickok Inc filed Critical Hickok Inc
Priority to US29/121,319 priority Critical patent/USD441310S1/en
Assigned to HICKOK, INC., A CORPORATION OF OHIO reassignment HICKOK, INC., A CORPORATION OF OHIO ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: BAUMAN, THOMAS F.
Application granted granted Critical
Publication of USD441310S1 publication Critical patent/USD441310S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of the electrical test probe of this invention showing a detachable primary probe point detached to reveal a non-detachable secondary sharp probe point;
FIG. 2 is a top view thereof with the secondary probe point covered;
FIG. 3 is a top view thereof to clearly illustrate the location of views shown in FIGS. 8, 9 and 10;
FIG. 4 is a front view thereof with the secondary probe point covered, the back view being a mirror image of the front view;
FIG. 5 is a bottom view thereof with the secondary probe point covered;
FIG. 6 is a left side view thereof;
FIG. 7 is a right side view thereof;
FIG. 8 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 8—8;
FIG. 9 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 9—9; and,
FIG. 10 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 10—10.

Claims (1)

  1. The ornamental design for an electrical test probe, as shown and described.
US29/121,319 2000-04-06 2000-04-06 Electrical test probe Expired - Lifetime USD441310S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/121,319 USD441310S1 (en) 2000-04-06 2000-04-06 Electrical test probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/121,319 USD441310S1 (en) 2000-04-06 2000-04-06 Electrical test probe

Publications (1)

Publication Number Publication Date
USD441310S1 true USD441310S1 (en) 2001-05-01

Family

ID=22395911

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/121,319 Expired - Lifetime USD441310S1 (en) 2000-04-06 2000-04-06 Electrical test probe

Country Status (1)

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US (1) USD441310S1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060061367A1 (en) * 2004-09-17 2006-03-23 Chenn Ieon C Test light/circuit tester
USD669083S1 (en) * 2010-11-16 2012-10-16 Tru-Test Limited Wireless tag reader
USD731270S1 (en) * 2013-09-20 2015-06-09 The Patent Store Llc Pocket field tool bit
USD892341S1 (en) * 2018-07-10 2020-08-04 Edan Instruments, Inc. Intracavitary ultrasonic probe

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060061367A1 (en) * 2004-09-17 2006-03-23 Chenn Ieon C Test light/circuit tester
USD669083S1 (en) * 2010-11-16 2012-10-16 Tru-Test Limited Wireless tag reader
USD731270S1 (en) * 2013-09-20 2015-06-09 The Patent Store Llc Pocket field tool bit
USD892341S1 (en) * 2018-07-10 2020-08-04 Edan Instruments, Inc. Intracavitary ultrasonic probe

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