USD412294S - Circuit tester - Google Patents

Circuit tester Download PDF

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Publication number
USD412294S
USD412294S US29/093,423 US9342398F USD412294S US D412294 S USD412294 S US D412294S US 9342398 F US9342398 F US 9342398F US D412294 S USD412294 S US D412294S
Authority
US
United States
Prior art keywords
circuit tester
view
cover
closed
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/093,423
Inventor
Hideo Kaise
Masazo Murase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kaise KK
Original Assignee
Kaise KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kaise KK filed Critical Kaise KK
Priority to US29/093,423 priority Critical patent/USD412294S/en
Assigned to KAISE KABUSHIKI KAISHA reassignment KAISE KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAISE, HIDEO, MURASE, MASAZO
Application granted granted Critical
Publication of USD412294S publication Critical patent/USD412294S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of a circuit tester showing my new design;
FIG. 2 is a perspective view thereof with the cover thereof closed;
FIG. 3 is a perspective view thereof with the test leads thereof pulled out;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a left side elevational view thereof;
FIG. 9 is a right side elevational view thereof;
FIG. 10 is a front elevational view thereof with the cover thereof closed;
FIG. 11 is a rear elevational view thereof with the cover thereof closed;
FIG. 12 is a top plan view thereof with the cover thereof closed;
FIG. 13 is a bottom plan view thereof with the cover thereof closed;
FIG. 14 is a left side elevational view thereof with the cover thereof closed;
FIG. 15 is a right side elevational view thereof with the cover thereof closed;
FIG. 16 is a front elevational view thereof in which the cover is turned until reaching a rear face of a body proper; and,
FIG. 17 is a bottom plan view thereof in which the cover is turned until reaching the rear face of the body proper.

Claims (1)

  1. The ornamental design for a circuit tester, as shown and described.
US29/093,423 1998-09-10 1998-09-10 Circuit tester Expired - Lifetime USD412294S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/093,423 USD412294S (en) 1998-09-10 1998-09-10 Circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/093,423 USD412294S (en) 1998-09-10 1998-09-10 Circuit tester

Publications (1)

Publication Number Publication Date
USD412294S true USD412294S (en) 1999-07-27

Family

ID=71724884

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/093,423 Expired - Lifetime USD412294S (en) 1998-09-10 1998-09-10 Circuit tester

Country Status (1)

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US (1) USD412294S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040012379A1 (en) * 2002-06-12 2004-01-22 Van Deursen Gary E. Foldable multimeter
US20130033253A1 (en) * 2011-08-07 2013-02-07 Chung Instrument Electronics Industrial Co., Ltd. Multimeter having clamping means for test probe

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD351185S (en) * 1992-06-25 1994-10-04 Casio Computer Co., Ltd. Combined electronic calculator and battery tester
USD352009S (en) * 1990-08-27 1994-11-01 Elkins Kenneth D Circuit analyzer
USD374699S (en) * 1995-04-10 1996-10-15 Inpro Corporation Electronic golfing aid
USD395834S (en) * 1996-08-29 1998-07-07 Hioki Denki Kabushiki Kaisha Insulation resistance tester
USD397049S (en) * 1997-06-13 1998-08-18 Telecommunications Techniques Corporation Modular test instrument
USD397050S (en) * 1997-06-13 1998-08-18 Telecommunications Techniques Corporation Application module for modular test instrument

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD352009S (en) * 1990-08-27 1994-11-01 Elkins Kenneth D Circuit analyzer
USD351185S (en) * 1992-06-25 1994-10-04 Casio Computer Co., Ltd. Combined electronic calculator and battery tester
USD374699S (en) * 1995-04-10 1996-10-15 Inpro Corporation Electronic golfing aid
USD395834S (en) * 1996-08-29 1998-07-07 Hioki Denki Kabushiki Kaisha Insulation resistance tester
USD397049S (en) * 1997-06-13 1998-08-18 Telecommunications Techniques Corporation Modular test instrument
USD397050S (en) * 1997-06-13 1998-08-18 Telecommunications Techniques Corporation Application module for modular test instrument

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040012379A1 (en) * 2002-06-12 2004-01-22 Van Deursen Gary E. Foldable multimeter
US7224159B2 (en) * 2002-06-12 2007-05-29 The Stanley Works Foldable multimeter
US20130033253A1 (en) * 2011-08-07 2013-02-07 Chung Instrument Electronics Industrial Co., Ltd. Multimeter having clamping means for test probe
US8570026B2 (en) * 2011-08-07 2013-10-29 Chung Instrument Electronics Industrial Co., Ltd. Multimeter having clamping means for test probe

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