USD218717S - Portable sewing machine - Google Patents

Description

United States Patent 0 "ice 218,717 PORTABLE SEWING MACHINE Marcel Fresard, Petit-Lancy, Switzerland, assignor to Mefina S.A., Fribourg, Switzerland, a corporation of Switzerland Filed Aug. 12, 1969, Ser. No. 18,650

Claims priority, application Switzerland Mar. 20, 1969 Term of patent 14 years Int. Cl. D1509 US. Cl. D70--1 I I lrl Des. 218,717

Patented Sept. 15, 1970 Des. 218,717

PAGE 11 FIG. 1 is a front elevational view of a portable sewing machine showing my new design in a closed position;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a side elevational view;

FIG. 4 is a side elevational view of the side opposite that shown in FIG. 3;

FIG. 5 is a top plan view;

FIG. 6 is a bottom plan view;

FIG. 7 is a top plan view on a reduced scale of the portable sewing machine in an opened position of use;

FIG. 8 is a bottom plan view thereof;

FIG. 9 is a rear perspective view;

FIG. 10 is a side perspective view of the portable sewing machine in a closed position of storage;

FIG. 11 is a front perspective view of the portable sewing machine in an open position of use;

FIG. 12 is a front perspective view of the portable sewing machine in a closed position;

FIG. 13 is a side elevational view of the portable sew ing machine in an open position of use;

FIG. 14 is a side elevational view of the side opposite that shown in FIG. 13;

FIG. 15 is a front elevational view thereof;

FIG. 16 is a rear elevational view;

FIG. 17 is a side perspective view;

FIG. 18 is a side perspective view of the portable sewing machine in a closed position;

FIG. 19 is a rear perspective view of the portable sewing machine in a position of use; and

FIG. 20 is a rear perspective view of the portable sewing machine in a closed position of storage.

I claim:

The ornamental design for a portable sewing machine, substantially as shown.

References Cited UNITED STATES PATENTS D. 183,235 7/1958 Arbib D1 D. 183,236 7/1958 Arbib D70--l D. 210,256 2/1968 Fresard D701 EDWIN H. HUNTER, Primary Examiner LOIS S. LANIER, Assistant Examiner

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