USD1044751S1 - Compliant ground block and testing system for testing integrated circuits - Google Patents

Compliant ground block and testing system for testing integrated circuits Download PDF

Info

Publication number
USD1044751S1
USD1044751S1 US29/766,911 US202129766911F USD1044751S US D1044751 S1 USD1044751 S1 US D1044751S1 US 202129766911 F US202129766911 F US 202129766911F US D1044751 S USD1044751 S US D1044751S
Authority
US
United States
Prior art keywords
testing
integrated circuits
ground block
compliant ground
testing system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/766,911
Inventor
Valts Treibergs
Pat Joyal
Leslie Fliegelman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnstech International Corp
Original Assignee
Johnstech International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnstech International Corp filed Critical Johnstech International Corp
Priority to US29/766,911 priority Critical patent/USD1044751S1/en
Assigned to JOHNSTECH INTERNATIONAL CORPORATION reassignment JOHNSTECH INTERNATIONAL CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: JOYAL, Pat, FLIEGELMAN, Leslie, TREIBERGS, VALTS
Priority to TW111303419F priority patent/TWD223708S/en
Priority to TW111303418F priority patent/TWD224736S/en
Priority to TW110303723F priority patent/TWD223374S/en
Application granted granted Critical
Publication of USD1044751S1 publication Critical patent/USD1044751S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Description

FIG. 1 is a Top Perspective view of a compliant ground block and testing system for testing integrated circuits showing the new design;
FIG. 2 is a Bottom Perspective view thereof;
FIG. 3 is a Front view thereof;
FIG. 4 is a Back view thereof;
FIG. 5 is a Left view thereof;
FIG. 6 is a Right view thereof;
FIG. 7 is a Top view thereof; and,
FIG. 8 is a Bottom view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a compliant ground block and testing system for testing integrated circuits, as shown and described.
US29/766,911 2021-01-19 2021-01-19 Compliant ground block and testing system for testing integrated circuits Active USD1044751S1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US29/766,911 USD1044751S1 (en) 2021-01-19 2021-01-19 Compliant ground block and testing system for testing integrated circuits
TW111303419F TWD223708S (en) 2021-01-19 2021-07-19 Compliant ground block for testing integrated circuits
TW111303418F TWD224736S (en) 2021-01-19 2021-07-19 Compliant ground block for testing integrated circuits
TW110303723F TWD223374S (en) 2021-01-19 2021-07-19 Compliant ground block for testing integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/766,911 USD1044751S1 (en) 2021-01-19 2021-01-19 Compliant ground block and testing system for testing integrated circuits

Publications (1)

Publication Number Publication Date
USD1044751S1 true USD1044751S1 (en) 2024-10-01

Family

ID=88878936

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/766,911 Active USD1044751S1 (en) 2021-01-19 2021-01-19 Compliant ground block and testing system for testing integrated circuits

Country Status (2)

Country Link
US (1) USD1044751S1 (en)
TW (3) TWD223708S (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1044751S1 (en) * 2021-01-19 2024-10-01 Johnstech International Corporation Compliant ground block and testing system for testing integrated circuits

Citations (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6299459B1 (en) 2001-02-02 2001-10-09 Agilent Technologies, Inc. compressible conductive interface
US20030232516A1 (en) 2002-04-19 2003-12-18 Bedell Arden C. Electrical connector with resilient contact
US6861667B2 (en) 2002-07-15 2005-03-01 Johnstech International Corporation Grounding inserts
US6979595B1 (en) * 2000-08-24 2005-12-27 Micron Technology, Inc. Packaged microelectronic devices with pressure release elements and methods for manufacturing and using such packaged microelectronic devices
US7074049B2 (en) 2004-03-22 2006-07-11 Johnstech International Corporation Kelvin contact module for a microcircuit test system
USD548201S1 (en) * 2006-01-31 2007-08-07 Smart Parts, Inc. Ion solenoid circuit board
US20080297142A1 (en) 2007-02-02 2008-12-04 Alladio Patrick J Contact insert for a microcircuit test socket
USD605613S1 (en) * 2008-05-15 2009-12-08 Adc Gmbh Printed circuit board for electrical connector
US7862391B2 (en) 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
US8460010B2 (en) 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
USD691101S1 (en) * 2011-11-08 2013-10-08 Seiko Epson Corporation Circuit board for an ink cartridge
USD695231S1 (en) * 2012-04-28 2013-12-10 Jixun Shen Overcurrent protection circuit-breaker
USD742338S1 (en) * 2014-08-27 2015-11-03 Apple Inc. MLB module for electronic device
USD757666S1 (en) * 2014-10-16 2016-05-31 Japan Aviation Electronics Industry, Limited Flexible printed circuit
US9476936B1 (en) * 2013-03-15 2016-10-25 Johnstech International Corporation Thermal management for microcircuit testing system
USD773404S1 (en) * 2014-06-13 2016-12-06 Lsis Co., Ltd. Circuit breaker
US9606143B1 (en) * 2011-04-21 2017-03-28 Johnstech International Corporation Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
USD879787S1 (en) * 2017-11-21 2020-03-31 Hangzhou Chipjet Technology Co., Ltd. Data processing equipment
USD880484S1 (en) * 2018-04-26 2020-04-07 Hangzhou Chipjet Technology Co., Ltd. Data processing equipment
KR102121754B1 (en) 2018-12-19 2020-06-11 주식회사 오킨스전자 Device for test socket pin having single coil spring divided into upper and lower regions
TWD205153S (en) 2019-08-14 2020-06-11 浩暘工業股份有限公司 Connector contact
US11293968B2 (en) * 2020-05-12 2022-04-05 Johnstech International Corporation Integrated circuit testing for integrated circuits with antennas
US20220107359A1 (en) * 2020-10-06 2022-04-07 Johnstech International Corporation Compliant ground block and testing system having compliant ground block
TWD223374S (en) * 2021-01-19 2023-02-01 美商瓊斯科技國際公司 美國 Compliant ground block for testing integrated circuits
US20230056822A1 (en) * 2021-08-18 2023-02-23 Borgwarner Inc. Circuit board interconnection device and circuit board assembly

Patent Citations (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6979595B1 (en) * 2000-08-24 2005-12-27 Micron Technology, Inc. Packaged microelectronic devices with pressure release elements and methods for manufacturing and using such packaged microelectronic devices
US6299459B1 (en) 2001-02-02 2001-10-09 Agilent Technologies, Inc. compressible conductive interface
US20030232516A1 (en) 2002-04-19 2003-12-18 Bedell Arden C. Electrical connector with resilient contact
US6861667B2 (en) 2002-07-15 2005-03-01 Johnstech International Corporation Grounding inserts
US7074049B2 (en) 2004-03-22 2006-07-11 Johnstech International Corporation Kelvin contact module for a microcircuit test system
US7255576B2 (en) 2004-03-22 2007-08-14 Johnstech International Corporation Kelvin contact module for a microcircuit test system
USD548201S1 (en) * 2006-01-31 2007-08-07 Smart Parts, Inc. Ion solenoid circuit board
US20080297142A1 (en) 2007-02-02 2008-12-04 Alladio Patrick J Contact insert for a microcircuit test socket
US7862391B2 (en) 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
USD605613S1 (en) * 2008-05-15 2009-12-08 Adc Gmbh Printed circuit board for electrical connector
US8460010B2 (en) 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US9606143B1 (en) * 2011-04-21 2017-03-28 Johnstech International Corporation Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
USD691101S1 (en) * 2011-11-08 2013-10-08 Seiko Epson Corporation Circuit board for an ink cartridge
USD695231S1 (en) * 2012-04-28 2013-12-10 Jixun Shen Overcurrent protection circuit-breaker
US9476936B1 (en) * 2013-03-15 2016-10-25 Johnstech International Corporation Thermal management for microcircuit testing system
USD773404S1 (en) * 2014-06-13 2016-12-06 Lsis Co., Ltd. Circuit breaker
USD742338S1 (en) * 2014-08-27 2015-11-03 Apple Inc. MLB module for electronic device
USD757666S1 (en) * 2014-10-16 2016-05-31 Japan Aviation Electronics Industry, Limited Flexible printed circuit
USD879787S1 (en) * 2017-11-21 2020-03-31 Hangzhou Chipjet Technology Co., Ltd. Data processing equipment
USD880484S1 (en) * 2018-04-26 2020-04-07 Hangzhou Chipjet Technology Co., Ltd. Data processing equipment
KR102121754B1 (en) 2018-12-19 2020-06-11 주식회사 오킨스전자 Device for test socket pin having single coil spring divided into upper and lower regions
TWD205153S (en) 2019-08-14 2020-06-11 浩暘工業股份有限公司 Connector contact
US11293968B2 (en) * 2020-05-12 2022-04-05 Johnstech International Corporation Integrated circuit testing for integrated circuits with antennas
US20220107359A1 (en) * 2020-10-06 2022-04-07 Johnstech International Corporation Compliant ground block and testing system having compliant ground block
TWD223374S (en) * 2021-01-19 2023-02-01 美商瓊斯科技國際公司 美國 Compliant ground block for testing integrated circuits
TWD223708S (en) * 2021-01-19 2023-02-11 美商瓊斯科技國際公司 美國 Compliant ground block for testing integrated circuits
TWD224736S (en) * 2021-01-19 2023-04-11 美商瓊斯科技國際公司 美國 Compliant ground block for testing integrated circuits
US20230056822A1 (en) * 2021-08-18 2023-02-23 Borgwarner Inc. Circuit board interconnection device and circuit board assembly

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
LGA Sockets, Land Gris Array Sockts—Te.com, No Announcement Date [online], retrieved on Aug. 3, 2023, retrieved from internet, https://www.te.com/usa-en/products/connectors/sockets/ic-sockets/lga-sockets.html?tab=pgp-story (Year: 2023). *
Office Action issued in Taiwan Design Patent Application No. 110303723, Apr. 11, 2022, with summary translation (4 pages).
Products—Johnstech.com, No Announcement Date [online], retrieved on Aug. 3, 2023, retrieved from internet, https://www.johnstech.com/products/ (Year: 2023). *

Also Published As

Publication number Publication date
TWD223708S (en) 2023-02-11
TWD223374S (en) 2023-02-01
TWD224736S (en) 2023-04-11

Similar Documents

Publication Publication Date Title
USD988238S1 (en) Tire
USD932929S1 (en) Analytical instrument
USD875951S1 (en) Magnetometer
USD920336S1 (en) Ipad case
USD978353S1 (en) Electronic sphygmomanometer
USD938607S1 (en) Diagnostic test device
USD1018354S1 (en) Bracelet
USD1006652S1 (en) Soil tester
USD891435S1 (en) Tablet case
USD963794S1 (en) Shower
USD923977S1 (en) Cabinet
USD988234S1 (en) Tire
USD983992S1 (en) Assay device
USD972826S1 (en) Insole
USD936466S1 (en) Caster
USD926002S1 (en) Stake install adapter
USD928601S1 (en) Securing device
USD985681S1 (en) Block
USD921497S1 (en) Inspection system
USD1065080S1 (en) Adapter
USD924563S1 (en) Tool chest
USD897546S1 (en) Positional sleeping aid
USD1013037S1 (en) Marker
USD996643S1 (en) Epitachophoresis device
USD1063897S1 (en) Earbud

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: SMALL ENTITY

FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO SMALL (ORIGINAL EVENT CODE: SMAL); ENTITY STATUS OF PATENT OWNER: SMALL ENTITY