USB485926I5 - - Google Patents
Info
- Publication number
- USB485926I5 USB485926I5 US48592674A USB485926I5 US B485926 I5 USB485926 I5 US B485926I5 US 48592674 A US48592674 A US 48592674A US B485926 I5 USB485926 I5 US B485926I5
- Authority
- US
- United States
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP48076632A JPS5026470A (fr) | 1973-07-09 | 1973-07-09 | |
JA48-76632 | 1973-07-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
USB485926I5 true USB485926I5 (fr) | 1976-03-23 |
US4006357A US4006357A (en) | 1977-02-01 |
Family
ID=13610735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US05/485,926 Expired - Lifetime US4006357A (en) | 1973-07-09 | 1974-07-05 | Apparatus for displaying image of specimen |
Country Status (2)
Country | Link |
---|---|
US (1) | US4006357A (fr) |
JP (1) | JPS5026470A (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL7800869A (nl) * | 1978-01-25 | 1979-07-27 | Philips Nv | Elektronenmikroskoop. |
JPS58155636A (ja) * | 1982-03-12 | 1983-09-16 | Hitachi Ltd | ホログラフイ電子顕微鏡 |
JPS5918555A (ja) * | 1982-07-22 | 1984-01-30 | Erionikusu:Kk | 荷電粒子線取扱方法および装置 |
EP0200893A1 (fr) * | 1985-03-22 | 1986-11-12 | Siemens Aktiengesellschaft | Méthode pour faire ressortir une partie de l'objet sur la surface d'un échantillon balayé par le faisceau primaire d'un microscope à balayage et dispositif pour sa mise en oeuvre |
CA1308203C (fr) * | 1989-06-01 | 1992-09-29 | Nanoquest (Canada) Inc. | Dispositif compensateur d'amplification |
US4990779A (en) * | 1989-06-06 | 1991-02-05 | Nippon Steel Corporation | Method and apparatus for evaluating strains in crystals |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3812288A (en) * | 1972-11-21 | 1974-05-21 | Edax Int Inc | Television display system |
-
1973
- 1973-07-09 JP JP48076632A patent/JPS5026470A/ja active Pending
-
1974
- 1974-07-05 US US05/485,926 patent/US4006357A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS5026470A (fr) | 1975-03-19 |
US4006357A (en) | 1977-02-01 |