US9916903B2 - OTPROM for post-process programming using selective breakdown - Google Patents
OTPROM for post-process programming using selective breakdown Download PDFInfo
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- US9916903B2 US9916903B2 US14/514,289 US201414514289A US9916903B2 US 9916903 B2 US9916903 B2 US 9916903B2 US 201414514289 A US201414514289 A US 201414514289A US 9916903 B2 US9916903 B2 US 9916903B2
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- integrated circuit
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
- G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
- G11C17/12—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/18—Auxiliary circuits, e.g. for writing into memory
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- H01L27/11233—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B20/00—Read-only memory [ROM] devices
- H10B20/27—ROM only
- H10B20/30—ROM only having the source region and the drain region on the same level, e.g. lateral transistors
- H10B20/36—Gate programmed, e.g. different gate material or no gate
Definitions
- the present disclosure relates to the manufacture of sophisticated semiconductor devices, and, more specifically, to various methods and structures for a novel one-time-only programmable read-only memory (OTPROM) that provides for post-process programming using selective breakdown of dielectric.
- OTPROM one-time-only programmable read-only memory
- the manufacture of semiconductor devices requires a number of discrete process steps to create a packaged semiconductor device from raw semiconductor material.
- the various processes from the initial growth of the semiconductor material, the slicing of the semiconductor crystal into individual wafers, the fabrication stages (etching, doping, ion implanting, or the like), to the packaging and final testing of the completed device, are so different from one another and specialized that the processes may be performed in different manufacturing locations that contain different control schemes.
- a set of processing steps is performed on a group of semiconductor wafers, sometimes referred to as a lot, using semiconductor-manufacturing tools, such as exposure tool or a stepper.
- semiconductor-manufacturing tools such as exposure tool or a stepper.
- an etch process may be performed on the semiconductor wafers to shape objects on the semiconductor wafer, such as polysilicon lines, each of which may function as a gate electrode for a transistor.
- a plurality of metal lines e.g., aluminum or copper, may be formed that serve as conductive lines that connect one conductive region on the semiconductor wafer to another.
- integrated circuit chips may be fabricated.
- integrated circuit or chips may comprise various devices that work together based upon a hard-coded program.
- ASIC application-specific integrated circuit
- ASIC application-specific integrated circuit
- the program code in the form of binary data, is hard-coded into the integrated circuit chips.
- FIG. 1 a flowchart depiction of a prior art process of hard-code programming of an integrated circuit device is illustrated.
- An integrated circuit device is fabricated up to a layer below the programming layer (block 110 ).
- the programming layer includes transistors that are configured to hold bits of data for hard-coding or hard-wiring a program code.
- processing of the integrated circuit is suspended until the program code for performing the hard-coding is received (block 120 ).
- a semiconductor device manufacturer has to suspend processing operations until a customer or a third party provides the program code. This protocol may cause delays in the processing operation.
- process operations are significantly delayed at timeline 125 , wherein process operations are paused until program code for hard-coding a program into the integrated circuit device is received.
- the program code is received, which is in the form of binary data, it is hard-coded in the programming layer (block 130 ). Subsequently, the manufacturing process is continued for fabricating the remaining layers over the programming layers (block 140 ). Upon completion, the tape-out results are provided (block 150 ).
- One problem associated with the prior art includes a delay in time-to-market cause by the pause when waiting for the program code.
- the processing of the integrated circuit device is interrupted by this pause. In some cases, completing processing of the device may take months due to this interruption.
- the present disclosure may address and/or at least reduce one or more of the problems identified above.
- the present disclosure is directed to various methods, apparatus and system for hard-coding data into an integrated circuit device.
- An integrated circuit device provided. Data for hard-wiring information into a portion of the integrated circuit device is received.
- a stress voltage signal is provided to a portion of a transistor of the integrated circuit device for causing a dielectric breakdown of the portion of the transistor for hard-wiring the data.
- FIG. 1 illustrates flowchart depiction of a prior art process of hard-code programming of an integrated circuit device
- FIG. 2 illustrates a flowchart depiction of the steps for performing a hard-code programming of a semiconductor devices, in accordance with embodiments herein;
- FIG. 3 illustrates a stylized block diagram depiction of a system in accordance with some embodiments herein, is illustrated
- FIG. 4 illustrates a stylized block diagram depiction of the programming unit of FIG. 3 , in accordance with embodiments herein;
- FIG. 5 illustrates a stylized depiction of an ROM architecture in accordance with a first embodiment
- FIG. 6 illustrates a stylized depiction of an ROM architecture in accordance with a second embodiment
- FIG. 7 illustrates a stylized depiction of an ROM architecture in accordance with a third embodiment
- FIG. 8 illustrates a stylized depiction of a cross-sections view of a FinFET that may be implemented into the ROM architecture of FIG. 7 , in accordance with embodiments herein.
- Embodiments herein provide for performing hard-coded programming of an integrated circuit device in a post-processing manner. That is, embodiments herein provide for substantially completing processing of semiconductor devices prior to hard-code or hard-wiring program code into the devices.
- stress voltages may be used to configure various devices, e.g., transistors, in semiconductor devices in an addressable scheme such that binary data representing a program code may be hard-coded into the programming layer even after the processing of the semiconductor devices is complete.
- the stress voltages may be used to selectively cause a breakdown of certain portions of the dielectric in discrete devices (e.g., transistors) in a strategic manner so that certain states of the discrete devices after the selective breakdown provide binary data representations.
- a semiconductor device manufacturing system may perform fabrication of a plurality of semiconductor devices (block 210 ).
- semiconductor devices for a plurality of customers that require disparate programming may be fabricated together.
- program code for hard-coding or hard-wiring the devices are received (block 220 ).
- external sources such as customers of the semiconductor devices or third parties may provide the program code.
- a delay in receiving the program code is less intrusive to the fabrication process since fabrication of the semiconductor devices is substantially complete at this point.
- a hard-coding process using selective stress programming may be performed (block 230 ).
- the hard-coding or hard-wiring of the program code is performed after the fabrication of the semiconductor devices is complete.
- a stress voltage process for stressing selective portions of transistors to cause targeted breakdown of dielectric (e.g., gate oxide) regions may be performed.
- binary data may be hard-coded, and read by one or portions of an integrated circuit device.
- existing testing system for performing stress test may be configured to perform the selective programming using targeted gate oxide breakdown described herein, may be used.
- TDDB time dependent dielectric breakdown
- a tape out of a plurality of integrated circuit device may be provided (block 240 ). Accordingly, since all fabrication steps to be performed on the semiconductor devices are completed up to the point the process reaches a timeline 225 , the only process left to perform is the hard-coding of the program. Therefore, time to market of the finished integrated circuit devices, is only affected by the wait of receiving the program code. Once program code is received and the integrated circuit devices are programmed, there is no further delay in the time to market.
- the system 400 may comprise a semiconductor device processing system 410 .
- the semiconductor device processing system 410 may comprise various processing stations, such as etch process stations, photolithography process stations, CMP process stations, etc.
- One or more of the processing steps performed by the processing system 410 may be controlled by the processing controller 420 .
- the processing controller 420 may be a workstation computer, a desktop computer, a laptop computer, a tablet computer, or any other type of computing device comprising one or more software products that are capable of controlling processes, receiving process feedback, receiving test results data, performing learning cycle adjustments, performing process adjustments, etc.
- the items labeled “ 415 ” may represent individual wafers, and in other embodiments, the items 415 may represent a group of semiconductor wafers, e.g., a “lot” of semiconductor wafers.
- the integrated circuit or device 415 may be a transistor, a capacitor, a resistor or a memory cell. In one embodiment, the device 415 is a transistor and the dielectric layer is a gate insulation layer for the transistor.
- the system may also comprise a programming unit 440 .
- the programming unit 440 is capable of hard-coding a program code in various semiconductor devices 415 .
- the programming unit 440 is capable of providing stress voltages to targeted portions of the device (e.g., programming layer) in the integrated circuit such that gate oxide breakdown of portions of a discrete device (e.g., a transistor) may be selectively performed for storing binary data that represents a program.
- the programming unit 440 may perform this stress programming based upon program data that may be received from an external source.
- the programming unit 440 may be part of a testing system (e.g., a TDDB testing system) that is capable of providing stress data for selective breakdown of gate oxide regions.
- one or more portions of the programming unit 440 may be fabricated into the semiconductor device 415 . A more detailed description of the programming unit 440 is provided in FIG. 4 and accompanying description below.
- the system 400 may be capable of performing analysis for various products involving various technologies.
- the system 400 may provide test data for CMOS technology, Flash technology, BiCMOS technology, power devices, memory devices (e.g., DRAM devices), NAND memory devices, and/or various other semiconductor technologies.
- the programming unit 440 may comprise a stress voltage supply 470 .
- the stress voltage supply 470 may provide stress voltage signals for performing selective stress breakdown for portions of a transistor.
- the stress voltage supply 470 may control the bias voltage signals that are provided to the transistors targeted for selective breakdown.
- the programming unit 440 may comprise an address unit 480 that is capable of determining the addresses of portions of the transistors in which a selective breakdown is to be performed.
- the addresses may include wire-select signals that are able to address a gate, source and/or drain region of a transistor for dielectric breakdown.
- the address unit 480 may receive program data, which may be used to select transistors in the programming layer of an integrated circuit device for selective breakdown of dielectric, e.g., gate oxide. That is, the gate, source, and/or drain regions of a transistor in the programming layer, may be subjected to a breakdown. Under certain bias conditions (a “read” bias condition), this breakdown may cause the voltage level at the targeted breakdown region to be high, i.e., a logic “1” or logic high.
- the areas that are not subjected to a dielectric breakdown may indicate a low voltage level under a read bias condition, thereby indicating a logic “0” or logic low.
- transistors in the programming layer may be written using stress breakdown under a “write” bias condition. Data stored in theses transistors may be read under read bias condition, as exemplified below.
- the programming unit 440 may also comprise a stress unit 490 that is capable of providing various signals that may be used to target and stress selected portions of transistors for hard-coding a program.
- the stress unit 490 may receive addressing information from the address unit 480 , as well as bias voltage signals from the stress voltage supply 470 . Based upon this information, the stress unit 490 is capable of generating various address signals (e.g., word line (WL) signals, word line select (WS) signals, and bit line (BL) signals. These signals may generate a bias write condition to hard-code data into the device, or a bias read condition to read the stored data.
- one or more portions of the programming unit 440 may be fabricated into the semiconductor device 415 . Using the WL, WS, and the BL signals, targeted transistors in the programming layer may be selected to stress breakdown programming, or a read bias condition may be provided for reading the hard-coded data.
- the exemplary circuit 500 of FIG. 5 illustrates a 4-bit memory that can be hard-wired into a programming layer of an integrated circuit in a post-processing step.
- the circuit 500 may be a memory cell, and may be part of a larger memory structure.
- the circuit 500 of FIG. 5 comprises four thick oxide NFET devices ( 510 , 512 , 514 , and 516 ) that are not programmed. Coupled to the source of a thick NFET 510 is the gate of a thin oxide NFET device 520 . Coupled to source of a thick NFET 512 is the gate of a thin oxide NFET device 522 . Coupled to the source of a thick NFET 514 is the gate of a thin oxide NFET device 530 . Coupled to the source of a thick NFET 516 is the gate of a thin oxide NFET device 532 .
- the thin NFETs 520 - 532 are programmed by providing a stress voltage for prompting selective breakdown of the gate oxides of the NFETs 520 - 532 , wherein the thick NFETs 510 - 516 are immune to breakdown as a result of the stress voltage.
- Each pair of thin and thick NFETs are capable of storing one bit of data. Data is stored at the gate oxide location of each of the thin NFETs 520 - 532 , as indicated by black squares.
- the operations of the circuit 500 may be controlled by the word line select signals (WS 0 - 1 ), the word line signals (WL 0 - 1 ), and the bit line signals (BL 0 - 1 ). For example, if a logic “1” (i.e., logic high) is to be stored into the gate of NFET 520 , WS 0 is asserted, BL 0 is set at +V DD , and WL is set. In this case, the gate oxide experiences a voltage differential of twice the value of V DD (i.e., the differential between at ⁇ V DD and +V DD ) and thus, experiences a breakdown.
- a logic “1” i.e., logic high
- WS 0 is asserted
- BL 0 is set at +V DD
- WL is set.
- the gate oxide experiences a voltage differential of twice the value of V DD (i.e., the differential between at ⁇ V DD and +V DD ) and thus, experiences
- a logic “0” i.e., logic low
- the values of BL 1 , WS 0 and WL 0 would be set such that a breakdown is not experienced by the gate oxide of NFET 522 . Therefore, if data to be stored is logic “0”, the gate oxide thin NFET is prevented from experiencing a breakdown, but if data to be stored is logic “1”, the breakdown of the gate oxide of the thin NFET is prompted.
- the signals WS, WL, and BL are capable of generating a write bias condition and/or a read bias condition.
- the write biasing condition include setting the target WS signals to have one V DD at a time, while the remaining WS signals are set at V SS .
- One WL signal corresponding to the selected WS signal is set at ⁇ V DD while the rest are all set to V SS .
- the BL line is set to +V DD where a logic “1” is to be stored and set to ⁇ V SS where a logic “0” is to be stored.
- the read biasing condition includes setting the target WS signal to V DD , while all other WS lines are set to V SS .
- the WL signal corresponding to the selected WS signal is set to V SS , while all other WL signals are set to V DD .
- all BL signals are charged to V DD .
- individual voltage levels of the gate oxides of the thin NFETs 520 - 532 may be detected and interpreted as logic “1” or logic “0.”
- PFET transistors may also be used with opposite values for the WL and BL signals, while remaining within the scope of embodiments herein.
- FIG. 6 a stylized depiction of an ROM architecture in accordance with a second embodiment, is illustrated.
- the architecture of FIG. 6 calls for performing local breakdown limited to the drain and/or source regions of transistors using targeted bias voltages.
- the circuit 600 of FIG. 6 comprises four transistor pairs. Each of the transistor pairs are capable of storing two bits, one in the source region and the other in the drain region of a thin transistor.
- the circuit 600 of FIG. 6 comprises four thick oxide NFET devices ( 610 , 612 , 614 , and 616 ) that are not programmed and four thin NFET devices ( 620 , 622 , 630 , 632 ) that are programmable for hard-coding a program.
- the thin NFET devices are susceptible to breakdown at a voltage level at which the thick NFET devices are immune to breakdown.
- the circuit 600 may be a memory cell, and may be part of a larger memory structure.
- the source of the thick NFET 610 is coupled to the thin oxide NFET device 520 .
- the source of the thick NFET 612 is coupled to the gate of the thin oxide NFET device 622 .
- the drain of the thick NFET 614 is coupled to the gate of the thin oxide NFET device 630 .
- the source of the thick NFET 616 is coupled to the gate of the thin oxide NFET device 632 .
- the source and drain nodes of the thin NFETs 620 - 632 are hard-wire programmed by providing a stress voltage for prompting selective local breakdown of the dielectric (e.g., gate oxide regions) of the source and drain nodes of NFETs 620 - 632 .
- the thick NFETs 610 - 616 are immune to breakdown as a result of the stress voltage.
- Each pair of thin and thick NFETs are capable of storing two bits of data. Data is stored at the source and drain nodes of each of the thin NFETs 660 - 632 , as indicated by black squares.
- the signals that control the four pairs of NFET devices in the circuit 600 include the BL 0 - 1 and the WS 0 - 1 signals described above, as well as the two word line signals.
- the word line signals differ from the signals described above in that there are two word line signals, WL a and WL b in the circuit 600 .
- the word line signal WL a is coupled to the source nodes of the NFET 620 and the NFET 622 .
- the word line signal WL b is coupled to the drain nodes of the NFETs 630 and 632 .
- a write bias condition is prompted by setting the target WS signals to have one V DD at a time while the remaining WS signals are set at V SS .
- the BL line is set to +V DD where a logic “1” is to be stored, and set to ⁇ V SS where a logic “0” is to be stored.
- the word line signal WL a is set to ⁇ V DD for storing a logic “1” into a source node, and is set to V SS for storing a logic “0” in a source node.
- the word line signal WL b is set to ⁇ V DD for storing a logic “1” in a drain node, and is set to V SS for storing a logic “0” in a drain node.
- a read biasing condition includes setting the target WS signal to V DD , while all other WS lines are set to V SS . If data from the source nodes are being read, the WL a signal is set at V SS , while the WL b signal is set at V DD . If data from the drain nodes are being read, the WL b signal is set at V SS , while the WL a signal is set at V DD . In the read mode, all BL signals are pre-charged to V DD .
- BL 1 is set to V DD
- BL 1 is set to zero
- WS 0 is set to V DD
- WL a is set to zero
- WL b is set to ⁇ V DD
- WS 1 is set to zero.
- the drain location of NFET 620 will experience a stress voltage of two times V DD , which would be sufficient to cause a gate dielectric breakdown of the drain location.
- drain and source electrical connections should be avoided in order to reduce the probability of uncertain breakdown between gate and drain or between gate and source.
- one or more channel implants may be added.
- an extra masking step may be used to add the channel implants.
- BL 1 and BL 2 will be set to V DD
- WS 0 is set to V DD
- WL a is set to V DD
- WL b is set to zero
- WS 1 is set to zero.
- the voltage of the source region of NFET 620 will be interpreted as a logic “1.”
- BL 1 and BL 2 will be set to V DD
- WS 0 is set to zero
- WL a is set to zero
- WL b is set to V DD
- WS 1 is set to V DD .
- the voltage of the drain region of NFET 630 will be interpreted as a logic “0.”
- individual voltage levels of the source and drain regions of the thin NFETs 620 - 632 may be detected and interpreted as either logic “1” or logic “0.”
- FIG. 7 a stylized depiction of an ROM architecture in accordance with a third embodiment, is illustrated.
- the architecture of FIG. 7 calls for performing local breakdown limited to the drain and/or source regions of transistors using targeted write bias voltage conditions. This process may be performed in a similar manner as described above with respect to FIG. 6 .
- the circuit 700 of FIG. 7 comprises four transistor pairs. Each of the transistor pairs are capable of storing two bits, one in the source region and the other in the drain region of a thin transistor.
- the 700 may be a memory cell, and may be part of a larger memory structure.
- the circuit 700 of FIG. 7 comprises four thick oxide NFET devices ( 710 , 712 , 714 , and 716 ) that are not programmed.
- the embodiment of FIG. 7 utilizes two separate gate capacitors for each equivalent programmable FET, a gate-to-source capacitor (i.e., source region) and a gate-to-drain capacitor (i.e., drain region) to providing the equivalent FETs ( 720 - 732 ).
- the source and drain regions of the gate capacitor devices ( 720 - 732 ) are susceptible to breakdown at a voltage level at which the thick NFET devices are immune to breakdown.
- the configuration of FIG. 7 can be programmed and read in similar fashion as described above with regard to FIG. 6 .
- the configuration of FIG. 7 may provide for a reduction in uncertain breakdown between gate-to-drain, or between gate-to-source. Further stray currents between the drain regions and WL a , as well as between the source regions and WL b , may be reduced using the configuration of FIG. 7 .
- the configuration of FIG. 7 may also provide for a reduction in noise.
- FIG. 8 a stylized depiction of a cross-sections view of a FinFET that may be implemented into the ROM architecture of FIG. 7 , in accordance with embodiments herein, is illustrated.
- a FinFET device may be used in place of the gate capacitors for providing the source and drain regions that may be programmed using the targeted breakdown process described above.
- a FinFET device In a FinFET device, a generally vertically positioned, fin-shaped active area is formed and a gate electrode encloses both of the sides and the upper surface of the fin-shaped active area to form a tri-gate structure so as to use a channel having a 3-dimensional structure instead of a planar structure.
- an insulating cap layer e.g., silicon nitride, is positioned at the top of the fin and the FinFET device only has a dual-gate structure.
- FinFET designs use “fins” that may be formed on the surface of a semiconductor wafer using selective-etching processes.
- the fins may be used to form a raised channel between the gate and the source and drain of a transistor.
- the gate is then deposited such that it wraps around the fin to form a frigate structure. Since the channel is extremely thin, the gate would generally have a greater control over the carriers within. However, when the transistor is switched on, the shape of the channel may limit the current flow.
- two separate gate-to-drain and gate-to-source capacitors may be formed by utilizing a fin-cut masking step.
- the fin-cut masking step may be used to separate the fin channel.
- a fin of the FinFET may be cut in such a way that two separate gate capacitors (gate-to-drain and gate-to-source capacitors) are formed.
- FIG. 8 illustrates a punch stop region 820 above a substrate 810 .
- a dielectric layer 825 may be formed over the punch stop region 820 .
- the cross-sectional diagram illustrates two fins 830 , 840 coupled to the gate region 850 .
- the fins 830 , 840 of the FinFETs may be cut in such a manner that source and drain region pairs ( 720 - 732 ) are formed ( FIG. 7 ).
- the drain and source regions are substantially isolated by junctions.
- the drain and source regions are substantially isolated by an oxide region.
- each of the circuits of FIGS. 5-7 may represent a memory cell or a portion of a memory cell.
- each of the circuits of FIGS. 5-8 maybe a hard-wire memory cell that is part of a larger array of memory cells in which data may be hard-coded or hard-wired.
- One or more portions of an integrated circuit device may be able to address and read the hard-wired stored data.
- the stored data may comprise a program code that may be executed (e.g., boot-up execution sequence) by another portion (e.g., a processor, a controller, a micro-controller, etc.) of the integrated circuit device.
- the system 400 may be capable of manufacturing and testing various products that include transistors with active and inactive gates involving various technologies.
- the system 900 may provide for manufacturing and testing products relating to CMOS technology, Flash technology, BiCMOS technology, power devices, memory devices (e.g., DRAM devices), NAND memory devices, and/or various other semiconductor technologies.
- the methods described above may be governed by instructions that are stored in a non-transitory computer readable storage medium and that are executed by, e.g., a processor in a computing device.
- Each of the operations described herein (e.g., FIG. 2 ) may correspond to instructions stored in a non-transitory computer memory or computer readable storage medium.
- the non-transitory computer readable storage medium includes a magnetic or optical disk storage device, solid state storage devices such as flash memory, or other non-volatile memory device or devices.
- the computer readable instructions stored on the non-transitory computer readable storage medium may be in source code, assembly language code, object code, or other instruction format that is interpreted and/or executable by one or more processors.
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US15/881,356 US10147496B2 (en) | 2014-10-14 | 2018-01-26 | OTPROM for post-process programming using selective breakdown |
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US20180233216A1 (en) * | 2017-02-10 | 2018-08-16 | Globalfoundries Inc. | Circuit and method for detecting time dependent dielectric breakdown (tddb) shorts and signal-margin testing |
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US20160104541A1 (en) | 2016-04-14 |
US20180151238A1 (en) | 2018-05-31 |
US10147496B2 (en) | 2018-12-04 |
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