US9580610B2 - Aluminium oxide pastes and process for the use thereof - Google Patents
Aluminium oxide pastes and process for the use thereof Download PDFInfo
- Publication number
- US9580610B2 US9580610B2 US14/003,467 US201214003467A US9580610B2 US 9580610 B2 US9580610 B2 US 9580610B2 US 201214003467 A US201214003467 A US 201214003467A US 9580610 B2 US9580610 B2 US 9580610B2
- Authority
- US
- United States
- Prior art keywords
- acid
- paste
- group
- paste according
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related, expires
Links
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 title claims abstract description 91
- 238000000034 method Methods 0.000 title claims abstract description 20
- 230000008569 process Effects 0.000 title claims abstract description 16
- 229910052593 corundum Inorganic materials 0.000 claims abstract description 48
- 229910001845 yogo sapphire Inorganic materials 0.000 claims abstract description 45
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 25
- 238000000576 coating method Methods 0.000 claims abstract description 21
- 238000001035 drying Methods 0.000 claims description 34
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 27
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 26
- 229910052710 silicon Inorganic materials 0.000 claims description 26
- 239000010703 silicon Substances 0.000 claims description 26
- 239000002253 acid Substances 0.000 claims description 23
- 238000004519 manufacturing process Methods 0.000 claims description 22
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 20
- YRKCREAYFQTBPV-UHFFFAOYSA-N acetylacetone Chemical compound CC(=O)CC(C)=O YRKCREAYFQTBPV-UHFFFAOYSA-N 0.000 claims description 20
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 19
- YGSDEFSMJLZEOE-UHFFFAOYSA-N salicylic acid Chemical compound OC(=O)C1=CC=CC=C1O YGSDEFSMJLZEOE-UHFFFAOYSA-N 0.000 claims description 18
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 claims description 14
- 239000002738 chelating agent Substances 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 14
- 239000002243 precursor Substances 0.000 claims description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 14
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 13
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 claims description 12
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 claims description 12
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 claims description 11
- QPCDCPDFJACHGM-UHFFFAOYSA-N N,N-bis{2-[bis(carboxymethyl)amino]ethyl}glycine Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(=O)O)CCN(CC(O)=O)CC(O)=O QPCDCPDFJACHGM-UHFFFAOYSA-N 0.000 claims description 11
- 150000004703 alkoxides Chemical class 0.000 claims description 11
- NFDRPXJGHKJRLJ-UHFFFAOYSA-N edtmp Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CCN(CP(O)(O)=O)CP(O)(O)=O NFDRPXJGHKJRLJ-UHFFFAOYSA-N 0.000 claims description 11
- 230000007062 hydrolysis Effects 0.000 claims description 11
- 238000006460 hydrolysis reaction Methods 0.000 claims description 11
- 150000007524 organic acids Chemical class 0.000 claims description 11
- 229960003330 pentetic acid Drugs 0.000 claims description 11
- 239000004065 semiconductor Substances 0.000 claims description 11
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 10
- 229940120146 EDTMP Drugs 0.000 claims description 10
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 10
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
- 230000004888 barrier function Effects 0.000 claims description 10
- 239000011248 coating agent Substances 0.000 claims description 10
- 229940090960 diethylenetriamine pentamethylene phosphonic acid Drugs 0.000 claims description 10
- DUYCTCQXNHFCSJ-UHFFFAOYSA-N dtpmp Chemical compound OP(=O)(O)CN(CP(O)(O)=O)CCN(CP(O)(=O)O)CCN(CP(O)(O)=O)CP(O)(O)=O DUYCTCQXNHFCSJ-UHFFFAOYSA-N 0.000 claims description 10
- 238000009792 diffusion process Methods 0.000 claims description 9
- 239000011521 glass Substances 0.000 claims description 9
- 235000005985 organic acids Nutrition 0.000 claims description 9
- FJKROLUGYXJWQN-UHFFFAOYSA-N papa-hydroxy-benzoic acid Natural products OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 claims description 9
- 238000002161 passivation Methods 0.000 claims description 9
- 229960004889 salicylic acid Drugs 0.000 claims description 9
- 239000002904 solvent Substances 0.000 claims description 9
- BRRSNXCXLSVPFC-UHFFFAOYSA-N 2,3,4-Trihydroxybenzoic acid Chemical compound OC(=O)C1=CC=C(O)C(O)=C1O BRRSNXCXLSVPFC-UHFFFAOYSA-N 0.000 claims description 8
- 238000005516 engineering process Methods 0.000 claims description 8
- 230000002378 acidificating effect Effects 0.000 claims description 7
- 229910052796 boron Inorganic materials 0.000 claims description 7
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 claims description 7
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 7
- 239000010409 thin film Substances 0.000 claims description 7
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 6
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 6
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 6
- 230000009471 action Effects 0.000 claims description 6
- 229910052785 arsenic Inorganic materials 0.000 claims description 6
- 230000002209 hydrophobic effect Effects 0.000 claims description 6
- 238000004377 microelectronic Methods 0.000 claims description 6
- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 claims description 6
- 229910052698 phosphorus Inorganic materials 0.000 claims description 6
- 239000011574 phosphorus Substances 0.000 claims description 6
- 235000019260 propionic acid Nutrition 0.000 claims description 6
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 claims description 6
- 229910052718 tin Inorganic materials 0.000 claims description 6
- 239000011135 tin Substances 0.000 claims description 6
- 229910052725 zinc Inorganic materials 0.000 claims description 6
- 239000011701 zinc Substances 0.000 claims description 6
- WXTMDXOMEHJXQO-UHFFFAOYSA-N 2,5-dihydroxybenzoic acid Chemical compound OC(=O)C1=CC(O)=CC=C1O WXTMDXOMEHJXQO-UHFFFAOYSA-N 0.000 claims description 5
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 claims description 5
- 229910052684 Cerium Inorganic materials 0.000 claims description 5
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 5
- 229910000831 Steel Inorganic materials 0.000 claims description 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 5
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 5
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 5
- 229910017052 cobalt Inorganic materials 0.000 claims description 5
- 239000010941 cobalt Substances 0.000 claims description 5
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 5
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 claims description 5
- 229910052733 gallium Inorganic materials 0.000 claims description 5
- 229910052732 germanium Inorganic materials 0.000 claims description 5
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 5
- 229910052742 iron Inorganic materials 0.000 claims description 5
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 229910052758 niobium Inorganic materials 0.000 claims description 5
- 239000010955 niobium Substances 0.000 claims description 5
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 5
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 claims description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 5
- 239000011734 sodium Substances 0.000 claims description 5
- 239000010959 steel Substances 0.000 claims description 5
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 claims description 5
- 229910052719 titanium Inorganic materials 0.000 claims description 5
- 239000010936 titanium Substances 0.000 claims description 5
- 229910052727 yttrium Inorganic materials 0.000 claims description 5
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 5
- 229910052726 zirconium Inorganic materials 0.000 claims description 5
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims description 4
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 229910052810 boron oxide Inorganic materials 0.000 claims description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 4
- 229910001392 phosphorus oxide Inorganic materials 0.000 claims description 4
- LFGREXWGYUGZLY-UHFFFAOYSA-N phosphoryl Chemical class [P]=O LFGREXWGYUGZLY-UHFFFAOYSA-N 0.000 claims description 4
- 239000002798 polar solvent Substances 0.000 claims description 4
- 239000011591 potassium Substances 0.000 claims description 4
- 229910052700 potassium Inorganic materials 0.000 claims description 4
- 229910052594 sapphire Inorganic materials 0.000 claims description 4
- 239000010980 sapphire Substances 0.000 claims description 4
- 229910052708 sodium Inorganic materials 0.000 claims description 4
- 239000007787 solid Substances 0.000 claims description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 3
- 150000001450 anions Chemical class 0.000 claims description 3
- 239000010431 corundum Substances 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 claims description 3
- 238000007254 oxidation reaction Methods 0.000 claims description 3
- 150000002433 hydrophilic molecules Chemical class 0.000 claims description 2
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 claims 2
- 239000010410 layer Substances 0.000 description 53
- 239000000203 mixture Substances 0.000 description 31
- 235000012431 wafers Nutrition 0.000 description 24
- 239000000499 gel Substances 0.000 description 16
- 239000004411 aluminium Substances 0.000 description 15
- 229910052782 aluminium Inorganic materials 0.000 description 15
- BTANRVKWQNVYAZ-UHFFFAOYSA-N butan-2-ol Chemical compound CCC(C)O BTANRVKWQNVYAZ-UHFFFAOYSA-N 0.000 description 15
- 238000007650 screen-printing Methods 0.000 description 15
- -1 siloxanes Chemical class 0.000 description 13
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 12
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 12
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 12
- 239000000243 solution Substances 0.000 description 9
- 238000003786 synthesis reaction Methods 0.000 description 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- DNIAPMSPPWPWGF-UHFFFAOYSA-N monopropylene glycol Natural products CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 8
- 238000007639 printing Methods 0.000 description 8
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 8
- 239000000654 additive Substances 0.000 description 7
- 238000009835 boiling Methods 0.000 description 7
- 238000009472 formulation Methods 0.000 description 7
- 238000010438 heat treatment Methods 0.000 description 7
- 239000000843 powder Substances 0.000 description 7
- 238000009736 wetting Methods 0.000 description 7
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 6
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 6
- 150000007513 acids Chemical class 0.000 description 6
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 6
- 238000003980 solgel method Methods 0.000 description 6
- 239000008139 complexing agent Substances 0.000 description 5
- 229960001484 edetic acid Drugs 0.000 description 5
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 5
- 239000000976 ink Substances 0.000 description 5
- 230000007774 longterm Effects 0.000 description 5
- 238000002156 mixing Methods 0.000 description 5
- DHMQDGOQFOQNFH-UHFFFAOYSA-N Glycine Chemical compound NCC(O)=O DHMQDGOQFOQNFH-UHFFFAOYSA-N 0.000 description 4
- AEMRFAOFKBGASW-UHFFFAOYSA-N Glycolic acid Chemical compound OCC(O)=O AEMRFAOFKBGASW-UHFFFAOYSA-N 0.000 description 4
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- UCMIRNVEIXFBKS-UHFFFAOYSA-N beta-alanine Chemical compound NCCC(O)=O UCMIRNVEIXFBKS-UHFFFAOYSA-N 0.000 description 4
- 239000002800 charge carrier Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 229910021419 crystalline silicon Inorganic materials 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 4
- ROBFUDYVXSDBQM-UHFFFAOYSA-N hydroxymalonic acid Chemical compound OC(=O)C(O)C(O)=O ROBFUDYVXSDBQM-UHFFFAOYSA-N 0.000 description 4
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N lactic acid Chemical compound CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- KHPXUQMNIQBQEV-UHFFFAOYSA-N oxaloacetic acid Chemical compound OC(=O)CC(=O)C(O)=O KHPXUQMNIQBQEV-UHFFFAOYSA-N 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 235000013772 propylene glycol Nutrition 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 3
- 239000001856 Ethyl cellulose Substances 0.000 description 3
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- FEWJPZIEWOKRBE-UHFFFAOYSA-N Tartaric acid Natural products [H+].[H+].[O-]C(=O)C(O)C(O)C([O-])=O FEWJPZIEWOKRBE-UHFFFAOYSA-N 0.000 description 3
- 150000001298 alcohols Chemical class 0.000 description 3
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 3
- 230000000536 complexating effect Effects 0.000 description 3
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- WZNJWVWKTVETCG-UHFFFAOYSA-N kojic acid Natural products OC(=O)C(N)CN1C=CC(=O)C(O)=C1 WZNJWVWKTVETCG-UHFFFAOYSA-N 0.000 description 3
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- WOZZOSDBXABUFO-UHFFFAOYSA-N tri(butan-2-yloxy)alumane Chemical compound [Al+3].CCC(C)[O-].CCC(C)[O-].CCC(C)[O-] WOZZOSDBXABUFO-UHFFFAOYSA-N 0.000 description 3
- BJEPYKJPYRNKOW-REOHCLBHSA-N (S)-malic acid Chemical compound OC(=O)[C@@H](O)CC(O)=O BJEPYKJPYRNKOW-REOHCLBHSA-N 0.000 description 2
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 2
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 2
- OHLSHRJUBRUKAN-UHFFFAOYSA-N 2,3-dihydroxyterephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C(O)=C1O OHLSHRJUBRUKAN-UHFFFAOYSA-N 0.000 description 2
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 2
- YQUVCSBJEUQKSH-UHFFFAOYSA-N 3,4-dihydroxybenzoic acid Chemical compound OC(=O)C1=CC=C(O)C(O)=C1 YQUVCSBJEUQKSH-UHFFFAOYSA-N 0.000 description 2
- XPCTZQVDEJYUGT-UHFFFAOYSA-N 3-hydroxy-2-methyl-4-pyrone Chemical compound CC=1OC=CC(=O)C=1O XPCTZQVDEJYUGT-UHFFFAOYSA-N 0.000 description 2
- ALRHLSYJTWAHJZ-UHFFFAOYSA-N 3-hydroxypropionic acid Chemical compound OCCC(O)=O ALRHLSYJTWAHJZ-UHFFFAOYSA-N 0.000 description 2
- WDJHALXBUFZDSR-UHFFFAOYSA-N Acetoacetic acid Natural products CC(=O)CC(O)=O WDJHALXBUFZDSR-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
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- JPUHCPXFQIXLMW-UHFFFAOYSA-N aluminium triethoxide Chemical compound CCO[Al](OCC)OCC JPUHCPXFQIXLMW-UHFFFAOYSA-N 0.000 description 1
- 150000003863 ammonium salts Chemical class 0.000 description 1
- 229940077746 antacid containing aluminium compound Drugs 0.000 description 1
- 239000000010 aprotic solvent Substances 0.000 description 1
- 239000008346 aqueous phase Substances 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 235000010233 benzoic acid Nutrition 0.000 description 1
- 150000001559 benzoic acids Chemical class 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- OWMVSZAMULFTJU-UHFFFAOYSA-N bis-tris Chemical compound OCCN(CCO)C(CO)(CO)CO OWMVSZAMULFTJU-UHFFFAOYSA-N 0.000 description 1
- 230000000740 bleeding effect Effects 0.000 description 1
- 239000000872 buffer Substances 0.000 description 1
- 230000009172 bursting Effects 0.000 description 1
- PVEOYINWKBTPIZ-UHFFFAOYSA-N but-3-enoic acid Chemical compound OC(=O)CC=C PVEOYINWKBTPIZ-UHFFFAOYSA-N 0.000 description 1
- YTIVTFGABIZHHX-UHFFFAOYSA-N butynedioic acid Chemical compound OC(=O)C#CC(O)=O YTIVTFGABIZHHX-UHFFFAOYSA-N 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- PFTAWBLQPZVEMU-UHFFFAOYSA-N catechin Chemical compound OC1CC2=C(O)C=C(O)C=C2OC1C1=CC=C(O)C(O)=C1 PFTAWBLQPZVEMU-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 1
- HJSLFCCWAKVHIW-UHFFFAOYSA-N cyclohexane-1,3-dione Chemical compound O=C1CCCC(=O)C1 HJSLFCCWAKVHIW-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 229940099217 desferal Drugs 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 229960003638 dopamine Drugs 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 150000002169 ethanolamines Chemical class 0.000 description 1
- 229940093503 ethyl maltol Drugs 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 239000001530 fumaric acid Substances 0.000 description 1
- 229950006191 gluconic acid Drugs 0.000 description 1
- 235000012208 gluconic acid Nutrition 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000000265 homogenisation Methods 0.000 description 1
- NBZBKCUXIYYUSX-UHFFFAOYSA-N iminodiacetic acid Chemical compound OC(=O)CNCC(O)=O NBZBKCUXIYYUSX-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- LDHQCZJRKDOVOX-IHWYPQMZSA-N isocrotonic acid Chemical compound C\C=C/C(O)=O LDHQCZJRKDOVOX-IHWYPQMZSA-N 0.000 description 1
- BEJNERDRQOWKJM-UHFFFAOYSA-N kojic acid Chemical compound OCC1=CC(=O)C(O)=CO1 BEJNERDRQOWKJM-UHFFFAOYSA-N 0.000 description 1
- 229960004705 kojic acid Drugs 0.000 description 1
- 229960000448 lactic acid Drugs 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 231100000053 low toxicity Toxicity 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 229940098895 maleic acid Drugs 0.000 description 1
- 229940043353 maltol Drugs 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- NXPPAOGUKPJVDI-UHFFFAOYSA-N naphthalene-1,2-diol Chemical compound C1=CC=CC2=C(O)C(O)=CC=C21 NXPPAOGUKPJVDI-UHFFFAOYSA-N 0.000 description 1
- MNZMMCVIXORAQL-UHFFFAOYSA-N naphthalene-2,6-diol Chemical compound C1=C(O)C=CC2=CC(O)=CC=C21 MNZMMCVIXORAQL-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- XEEVLJKYYUVTRC-UHFFFAOYSA-N oxomalonic acid Chemical compound OC(=O)C(=O)C(O)=O XEEVLJKYYUVTRC-UHFFFAOYSA-N 0.000 description 1
- 229960003540 oxyquinoline Drugs 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 229960005323 phenoxyethanol Drugs 0.000 description 1
- IUGYQRQAERSCNH-UHFFFAOYSA-N pivalic acid Chemical compound CC(C)(C)C(O)=O IUGYQRQAERSCNH-UHFFFAOYSA-N 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920000166 polytrimethylene carbonate Polymers 0.000 description 1
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 1
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 1
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- TVDSBUOJIPERQY-UHFFFAOYSA-N prop-2-yn-1-ol Chemical compound OCC#C TVDSBUOJIPERQY-UHFFFAOYSA-N 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- XPGAWFIWCWKDDL-UHFFFAOYSA-N propan-1-olate;zirconium(4+) Chemical compound [Zr+4].CCC[O-].CCC[O-].CCC[O-].CCC[O-] XPGAWFIWCWKDDL-UHFFFAOYSA-N 0.000 description 1
- GGOZGYRTNQBSSA-UHFFFAOYSA-N pyridine-2,3-diol Chemical class OC1=CC=CN=C1O GGOZGYRTNQBSSA-UHFFFAOYSA-N 0.000 description 1
- 229940107700 pyruvic acid Drugs 0.000 description 1
- MCJGNVYPOGVAJF-UHFFFAOYSA-N quinolin-8-ol Chemical compound C1=CN=C2C(O)=CC=CC2=C1 MCJGNVYPOGVAJF-UHFFFAOYSA-N 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000000518 rheometry Methods 0.000 description 1
- PUWVNTVQJFSBDH-RYUDHWBXSA-N rhodotorulic acid Chemical compound CC(=O)N(O)CCC[C@@H]1NC(=O)[C@H](CCCN(O)C(C)=O)NC1=O PUWVNTVQJFSBDH-RYUDHWBXSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 150000003333 secondary alcohols Chemical class 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 239000001648 tannin Substances 0.000 description 1
- 235000018553 tannin Nutrition 0.000 description 1
- 229920001864 tannin Polymers 0.000 description 1
- 150000003509 tertiary alcohols Chemical class 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- YNJBWRMUSHSURL-UHFFFAOYSA-N trichloroacetic acid Chemical compound OC(=O)C(Cl)(Cl)Cl YNJBWRMUSHSURL-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 229940005605 valeric acid Drugs 0.000 description 1
Images
Classifications
-
- C09D7/1216—
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/60—Additives non-macromolecular
- C09D7/61—Additives non-macromolecular inorganic
-
- H01L31/04—
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D1/00—Coating compositions, e.g. paints, varnishes or lacquers, based on inorganic substances
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/006—Anti-reflective coatings
-
- C09D7/1233—
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/60—Additives non-macromolecular
- C09D7/63—Additives non-macromolecular organic
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
- C23C18/1216—Metal oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1229—Composition of the substrate
- C23C18/1245—Inorganic substrates other than metallic
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1254—Sol or sol-gel processing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C24/00—Coating starting from inorganic powder
- C23C24/08—Coating starting from inorganic powder by application of heat or pressure and heat
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/2225—Diffusion sources
-
- H01L31/18—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- the present invention relates to aluminium oxide pastes and to a process for the use of the aluminium oxide pastes for the formation of Al 2 O 3 coatings or mixed Al 2 O 3 hybrid layers.
- sol-gel-based layers The synthesis of sol-gel-based layers is attaining ever-greater importance in industrial production owing to their variety of possible uses.
- functional layers or surface finishes and modifications can be built up or carried out by means of sol-gel technology:
- sol-gel processes known from the literature are based on the use of silicon and alkoxides thereof (siloxanes), the specific hydrolysis and condensation of which enables networks having various properties and coatings which can be derived therefrom to be synthesised very easily, and smooth or porous films, or films in which particles are embedded, can be produced in this way.
- silicon and alkoxides thereof siloxanes
- Al 2 O 3 serves either as diffusion barrier and/or sol-gel-based doping source
- Al 2 O 3 is also suitable, owing to the hardness of its crystalline modifications, for use as mechanical protection layer.
- paste-form mixtures based on the Al 2 O 3 sol-gel process which meet the rheological requirements of the screen-printing process.
- the paste-form mixtures can be applied surprisingly easily to silicon wafer surfaces in the screen-printing process, where they have high structure fidelity.
- sol-gel-based layers For use, in particular in the solar sector, sol-gel-based layers have to meet particular requirements, and thus so too do the pastes based on them, meaning that these requirement s also have to be taken into account in the formulation of compositions for the production of such layers.
- suitable solvents having properties which are advantageous for the use, such as, for example, no to low toxicity, adequate surface wetting, etc., should be selected.
- corrosive anions (Cl ⁇ or NO 3 ⁇ , etc.) should not be present in the pastes, since they would greatly limit the possible uses of the pastes.
- Corresponding pastes could, for example, corrode the printing and deposition equipment used, but also later undesirably promote corrosion of solder contacts when connecting up solar cells which are provided with such layers, which would consequently result in limited long-term stability of crystalline silicon solar cells.
- Zhou et al. have investigated, for example, the synthesis of a Cu 2 ZnSnS 4 paste. Elemental copper, zinc, tin and sulfur were ground in a ball mill with addition of ethanol. After subsequent drying, these were suspended in isopropanol and mixed with a 10% ethylcellulose mixture in isopropanol. This mixture was ground again in a ball mill with addition of terpineol, and the alcohol was removed in vacuo. The resultant viscous mass was employed for screen printing, and the layers obtained were investigated. ⁇ [1] Z. Zhou, Y. Wang, D. Xu, Y. Zhang, Solar Energy Materials and Solar Cells, in press, (2010) ⁇
- Hansch et al. in turn investigated the synthesis of a screen-printable Y 2 O 3 /ZrO 2 mixed oxide.
- a Y 2 O 3 /ZrO 2 sol was obtained by mixing zirconium n-propoxide stabilised by means of acetylacetone and carboxylic acid (acetic acid, propionic acid, caproic acid, nonanoic acid) in isopropanol and an aqueous yttrium nitrate solution.
- a calcined Y 2 O 3 /ZrO 2 powder was added to this sol (sol/powder 20/80-40/60 wt.
- pastes were prepared with addition of organic additives (terpineol or ethylcellulose), but a paste was also prepared only from the calcined oxide. These pastes were investigated for their suitability as electrolytic layer in fuel cells. ⁇ [2] R. Hansch, M. R. R. Chowdhury, N. H. Menzler, Ceramics International, 35 (2009), 803-811 ⁇
- Laobuthee et al. obtained an MgAl 2 O 4 (spinel) paste by mixing a ground (K + - or Na + -doped) MgAl 2 O 4 powder formed from a sol-gel synthesis with organic additives (butylcarbitol acetate, terpineol, ethylcellulose). This paste was applied to aluminium oxide substrates by means of screen printing. The layers obtained in this way were investigated for their suitability as atmospheric moisture sensors. ⁇ [3] A. Laobuthee, N. Koonsaeng, B. Ksapabutr, M. Panapoy, C. Veranitisagul, International Journal of Materials & Structural Reliability, 3 (2005), 95-103 ⁇
- sol-gel process After the classical sol-gel process, there is no stable state between sol (low viscosity ⁇ 100 mPas) and gel (high viscosity >100 Pas) for the production of Al 2 O 3 layers.
- the literature only mentions stabilised sols or high-viscosity gels for the formation of aluminium oxide fibres.
- Dressler et al. added ASB (Al tri-sec-butoxide) to an aqueous solution of aluminium nitrate. At high ASB concentrations, phase separation (2-butanol phase and aqueous phase) occurred. Polyvinylpyrrolidone was therefore added as binder. The rheology of the resultant sols and the chemical structure were investigated by means of NMR, and the correlating particle sizes were measured. ⁇ [5] M. Dressler, M. Nofz, J. Pauli, C. Jäger, Journal of Sol-Gel Science and Technology (2008) 47, 260-267 ⁇
- Glaubitt et al. modified ASB firstly by means of glycol ether and subsequently by means of propionic acid. After addition of 0.5 mol of water per mol of aluminium, the viscosity increased rapidly (>2000 Pas), while a clear sol(/gel) remained. The gel exhibited long stability, and long fibres could be drawn therefrom.
- the sol was investigated by means of 27 Al-NMR before each modification, and the drying was investigated by means of TGA. ⁇ [6] W. Glaubitt, D. Sporn, R. Jahn, Journal of Sol-Gel Science and Technology, 2 (1994), 525-528 ⁇
- the object of the present invention is therefore to develop and stabilise a screen-printable aluminium oxide paste while avoiding interfering, highly corrosive anions, such as, for example, chloride and nitrate, and further rheological additives, which can result in the introduction of further impurities, where the long-term stability of the paste should simultaneously be retained.
- Pastes according to the invention comprise precursors for the formation of Al 2 O 3 and one or more oxides of the elements selected from the group boron, gallium, silicon, germanium, zinc, tin, phosphorus, titanium, zirconium, yttrium, nickel, cobalt, iron, cerium, niobium, arsenic and lead, where the pastes are obtained by the introduction of corresponding precursors into the paste.
- pastes which are obtained by mixing with at least one hydrophobic component and at least one hydrophilic component and optionally with at least one chelating agent.
- these pastes comprise at least one hydrophobic component selected from the group 1,3-cyclohexadione, salicylic acid and structurally related compounds, and at least one hydrophilic compound selected from the group acetylacetone, dihydroxybenzoic acid and trihydroxybenzoic acid or structurally related compounds thereof, chelating agents, such as ethylenediaminetetraacetic acid (EDTA), diethylenetriaminepentaacetic acid (DETPA), nitrilotriacetic acid (NTA), ethylenediaminetetramethylene-phosphonic acid (EDTPA) and diethylenetriaminepentamethylenephosphonic acid (DETPPA) or structurally related complexing agents or corresponding chelating agents.
- EDTA ethylenediaminetetraacetic acid
- DETPA diethylenetriaminepentaacetic acid
- NTA nitri
- the pastes used comprise solvents selected from the group of low-boiling alcohols, preferably selected from the group ethanol and isopropanol, and at least one high-boiling solvent selected from the group of high-boiling glycol ethers, preferably selected from the group diethylene glycol monoethyl ether, ethylene glycol monobutyl ether and diethylene glycol monobutyl ether or mixtures thereof, and optionally polar solvents selected from the group acetone, DMSO, sulfolane and ethyl acetate, or similar polar solvents.
- solvents selected from the group of low-boiling alcohols preferably selected from the group ethanol and isopropanol
- at least one high-boiling solvent selected from the group of high-boiling glycol ethers, preferably selected from the group diethylene glycol monoethyl ether, ethylene glycol monobutyl ether and diethylene glycol monobutyl ether or mixtures
- pastes which have an acidic pH in the range 4-5 and comprise, as acids, one or more organic acids, preferably acetic acid, which result in residue-free drying.
- these pastes for the formation of impermeable, homogeneous layers, to which water for hydrolysis is added in the molar ratio of water to precursor in the range from 1:1 to 1:9 , preferably between 1:1.5 and 1:2.5, where the solids content is in the range 9 to 10% by weight.
- these pastes can be used for the production of a diffusion barrier, a printed dielectric, electronic and electrical passivation, an antireflection coating, a mechanical protection layer against wear or a chemical protection layer against oxidation or the action of acid.
- These pastes are furthermore suitable for the preparation of hybrid materials comprising simple and polymeric boron and phosphorus oxides and alkoxides thereof for the full-area and local doping of semiconductors, preferably silicon, or for the production of Al 2 O 3 layers as sodium and potassium diffusion barriers in LCD technology.
- the present invention also relates, in particular, to a process for the production of pure, residue-free, amorphous Al 2 O 3 layers on mono- or multicrystalline silicon wafers, sapphire wafers, thin-film solar modules, glasses coated with functional materials (for example ITO, FTO, AZO, IZO or the like), uncoated glasses, steel elements and alloys, and on other materials used in microelectronics, in which, after application of the paste, the drying is carried out at temperatures between 300 and 1000° C., preferably at 300 to 400° C., particularly preferably at 350° C.
- functional materials for example ITO, FTO, AZO, IZO or the like
- Drying and heat treatment of the printed-on pastes at temperatures from 1000° C. forms hard, crystalline layers having comparable properties to corundum.
- the process according to the invention preferably enables pure, residue-free, amorphous, structurable Al2O3 layers to be produced if, after application of a thin layer of paste, the drying is carried out at temperatures between 300 and 500° C.
- the drying is carried out at temperatures between 300 and 500° C.
- Correspondingly produced layers which have been dried at temperatures ⁇ 500° C. can be etched by most mineral acids, but preferably by HF and H 3 PO 4 , and by many organic acids, such as acetic acid or propionic acid, or post-structured.
- paste-form mixtures based on the Al 2 O 3 sol-gel process which meet the rheological requirements of the screen-printing process and can thus be found precisely in the viscosity window which is described above and has hitherto not been acquired/occupied.
- the paste-form mixtures can be deposited, for example on silicon wafer surfaces, by means of the screen-printing process on the one hand surprisingly easily and on the other hand very well with retention of high structure fidelity, corresponding to the screen definition or characteristic used for printing, as shown by the examples given below.
- Corresponding aluminium oxide pastes form impermeable, i.e.
- the pastes formed by a sol-gel process form stable and smooth layers which are free from organic contaminants after drying and heat treatment.
- the present invention thus relates to acidic, sterically stabilised Al 2 O 3 pastes having a pH in the range 4-5 , preferably having a pH ⁇ 4.5 , which comprise sterically stabilised Al 2 O 3 precursors with small amounts of polyoxylated solvents having very good wetting and adhesion properties on SiO 2 - and silane-terminated silicon wafer surfaces, and which result in the formation of homogeneous, impermeable, in particular diffusion-impermeable, layers.
- FIG. 1 shows a photomicrograph of an Al 2 O 3 layer according to the invention which has been applied by screen printing to a polished (100) silicon wafer and has a layer thickness of 600 nm at the crown. It is apparent to the person skilled in the art that the achievable layer thickness is variable through suitable and careful selection and setting of characteristic parameters of the paste used and through the choice of the screen used for the printing process.
- FIG. 1 shows in the present case a photomicrograph of a screen-printed Al 2 O 3 layout after drying for 5 minutes at 300° C. (left) and after 10 minutes at 600° C. (right).
- the very good resolution of the line (printed: 500 ⁇ m, after drying: 500 ⁇ m) is evident.
- the splinters within the screen-printed layer presumably arise through bursting of the layer with a thickness of about 600 nm.
- aluminium sols can be formulated using corresponding alkoxides of aluminium as precursors. These can be aluminium triethoxide, aluminium triisopropoxide and aluminium tri-sec-butoxide. Alternatively, readily soluble hydroxides and oxides of aluminium can be employed. All organic aluminium compounds which are suitable for the formation of Al 2 O 3 in the presence of water under acidic conditions at a pH in the range from about 4-5 are suitable per se as precursors in paste formulations.
- Corresponding alkoxides are preferably dissolved in a suitable solvent mixture.
- This solvent mixture may be composed both of polar protic solvents and also polar aprotic solvents, and mixtures thereof.
- the solvent mixtures can be adapted within broad limits by the addition of non-polar solvents, for example in order to influence their wetting behaviour.
- Suitable polar protic solvents can be:
- Suitable polar aprotic solvents can be:
- the synthesis of the sol furthermore requires the addition of water in order to achieve hydrolysis for the formation of the aluminium nuclei and precondensation thereof.
- the water required can be added in sub- to superstoichiometric amounts. Substoichiometric addition is preferred.
- the alkoxides liberated on hydrolysis of the aluminium nuclei are converted into the corresponding alcohols by addition of an organic acid and/or mixtures of organic acids.
- the acid or acid mixture is added in such a way that a pH in the range between 4-5, preferably ⁇ 4.5, can be achieved.
- the added acid and/or acid mixture acts as catalyst for the precondensation and crosslinking commencing therewith of the aluminium nuclei hydrolysed in the solution.
- Suitable organic acids can be:
- the stabilisation of the aluminium sol can be carried out either by means of the above-mentioned organic acids and mixtures thereof, or alternatively achieved or increased by the specific addition of complexing and/or chelating additives.
- Complexing agents for aluminium which can be used are the following substances:
- additives can be added to the aluminium sol for specific setting of desired properties, which can be, for example, surface tension, viscosity, wetting behaviour, drying behaviour and adhesion capacity.
- desired properties can be, for example, surface tension, viscosity, wetting behaviour, drying behaviour and adhesion capacity.
- additives can be:
- each print-coating method makes its own requirements of the paste to be printed and/or of the paste resulting from a corresponding ink.
- the individual parameters to be set for the paste relate to the surface tension, the viscosity and the total vapour pressure of the paste.
- the printable pastes can preferably be used in the electronics industry, and in particular here in the manufacture of microelectronic, photo-voltaic and microelectromechanical (MEMS) components.
- Photovoltaic components in this connection are taken to mean, in particular, solar cells and modules.
- the pastes according to the invention can be used for the manufacture of thin-film solar cells from thin-film solar modules, the production of organic solar cells, the production of printed circuits and organic electronics, the production of display elements based on the technologies of thin-film transistors (TFTs), liquid crystals (LCDs), organic light-emitting diodes (OLEDs) and contact-sensitive capacitive and resistive sensors.
- TFTs thin-film transistors
- LCDs liquid crystals
- OLEDs organic light-emitting diodes
- contact-sensitive capacitive and resistive sensors contact-sensitive capacitive and resistive sensors.
- the present invention thus also consists in the provision of printable, sterically stabilised pastes for the formation of Al 2 O 3 coatings and also mixed Al 2 O 3 hybrid layers.
- Suitable hybrid materials are mixtures of Al 2 O 3 with the oxides of the elements boron, gallium, silicon, germanium, zinc, tin, phosphorus, titanium, zirconium, yttrium, nickel, cobalt, iron, cerium, niobium, arsenic and lead, where the pastes are obtained by the introduction of the corresponding precursors into the paste.
- Steric stabilisation of the pastes is effected here by mixing with hydrophobic components, such as 1,3-cyclohexadione, salicylic acid and structural relatives, and moderately hydrophilic components, such as acetylacetone, dihydroxybenzoic acid, trihydroxybenzoic acid and structural relatives thereof, or with chelating agents, such as ethylenediamine-tetraacetic acid (EDTA), diethylenetriaminepentaacetic acid (DETPA), nitrilo-triacetic acid (NTA), ethylenediaminetetramethylenephosphonic acid (EDTPA), diethylenetriaminepentamethylenephosphonic acid (DETPPA) and structurally related complexing agents or chelating agents.
- hydrophobic components such as 1,3-cyclohexadione, salicylic acid and structural relatives
- moderately hydrophilic components such as acetylacetone, dihydroxybenzoic acid, trihydroxybenzoic acid and structural relatives thereof
- chelating agents such as ethylenediamine
- Solvents which can be employed in the pastes are mixtures of at least one low-boiling alcohol, preferably ethanol or isopropanol, and at least one high-boiling glycol ether, preferably diethylene glycol monoethyl ether, ethylene glycol monobutyl ether or diethylene glycol monobutyl ether, or a suitable pure glycol ether.
- low-boiling alcohol preferably ethanol or isopropanol
- glycol ether preferably diethylene glycol monoethyl ether, ethylene glycol monobutyl ether or diethylene glycol monobutyl ether, or a suitable pure glycol ether.
- other polar media such as acetone, DMSO, sulfolane or ethyl acetate and the like, can also be used.
- the coating property can be matched to the substrate through its mixing ratio.
- the pastes for precondensation are therefore in an acidic medium (pH 4-5).
- the acids used for adjustment of the pH can be organic acids, preferably acetic acid, which result in residue-free drying.
- water for hydrolysis is added, where the molar ratio of water to precursor is between 1:1 and 1:9 , preferably between 1:1.5 and 1:2.5.
- the layer-forming components are employed in a ratio to one another such that the solids content of the pastes is between 9 and 10% by weight.
- Suitable formulation of the compositions gives pastes having a storage stability of >3 months, where no detectable changes in the pastes with respect to viscosity, particle size or coating behaviour are detectable within this time.
- the residue-free drying of the pastes after coating of the surfaces results in amorphous Al 2 O 3 layers, where the drying is carried out at temperatures between 300 and 1000° C., preferably at about 350° C. On suitable coating, the drying takes place within ⁇ 5 minutes. If the drying is carried out under so-called heat-treatment conditions above 1000° C., hard, crystalline layers form which have a comparable structure to corundum.
- Al 2 O 3 (hybrid) layers which have been dried at temperatures ⁇ 500° C. can be etched using most inorganic mineral acids, but preferably using HF or H 3 PO 4 , but also by many organic acids, such as acetic acid, propionic acid and the like. Simple post-structuring of the layers obtained is thus possible.
- Suitable substrates for the coating with the pastes according to the invention are mono- or multicrystalline silicon wafers (cleaned with HF or RCA), sapphire wafers, thin-film solar modules, glasses coated with functional materials (for example ITO, FTO, AZO, IZO or the like), uncoated glasses, steel elements and alloys, especially in the automobile sector, and other surfaces used in microelectronics.
- the layers formed through the use of the pastes according to the invention can serve as diffusion barrier, printable dielectric, electronic and electrical passivation, antireflection coating, mechanical protection layer against wear, chemical protection layer against oxidation or the action of acid.
- the pastes according to the invention which are described here can be deposited in a simple manner on semiconducting materials, preferably on silicon, and particularly preferably on silicon wafers, where they induce electronic surface passivation after corresponding treatment. This already increases the charge-carrier lifetime, i.e. after application of a thin layer of paste and subsequent drying. If not only drying, but also so-called heat treatment is carried out at a temperature in the range 350-550° C., either in an oxygen, oxygen/nitrogen, nitrogen or forming-gas stream (for example 5% v/v of H 2 /95% v/v of N 2 ), the surface passivation of the underlying layer can be greatly increased.
- Pastes according to the invention in the form of hybrid materials comprising simple and polymeric boron and phosphorus oxides and alkoxides thereof can be used for the inexpensive full-area and local doping of semiconductors, preferably silicon, especially in the electrical and electronics industry in general, and in the photovoltaics industry, in particular in the production of crystalline silicon solar cells and solar modules.
- the pastes according to the invention are printable, and formulations and rheological properties thereof can be matched within broad limits to the needs necessary in each case of the printing method to be used. These pastes are preferably printed by means of flexographic and/or screen printing, particularly preferably by means of screen printing.
- the pastes according to the invention in the form of hybrid sols comprising Al 2 O 3 /B 2 O 3 can be employed for the specific doping of semiconductors, preferably of silicon wafers.
- Silicon wafers which can be employed for this purpose have preferably been cleaned with the RCA or an alternative comparable cleaning sequence. Suitable wafer surfaces may be in hydrophilically or hydrophobically terminated form. Simplified cleaning is preferably carried out before application of the Al 2 O 3 layer; the wafers to be treated are preferably cleaned and etched by means of HF solutions. The layer remaining on the wafer after the doping process can be removed simply by means of etching in dilute HF.
- Al 2 O 3 layers produced in this way can be used as sodium and potassium diffusion barrier in LCD technology.
- a thin layer of Al 2 O 3 on the cover glass of the display here can prevent diffusion of ions from the cover glass into the liquid-crystalline phase, enabling the lifetime of the LCDs to be increased considerably.
- FIG. 1 Photomicrograph of a screen-printed Al 2 O 3 layout after drying for 5 minutes at 300° C. (left) and after 10 minutes at 600° C. (right).
- FIG. 2 Photomicrograph of an Al 2 O 3 layout applied by screen printing after about 1000 pre-prints.
- FIG. 3 Change in viscosity of screen-printable aluminium oxide pastes in accordance with Examples 1 and 2
- FIG. 4 Charge-carrier lifetimes of p-doped FZ wafer samples in accordance with Example 5
- the viscous mass obtained exhibits a viscosity of 4.3 Pas.
- the resolution of the layout applied by screen printing exhibits slight“bleeding” of the paste, causing a printed 100 ⁇ m line to be about 150 ⁇ m wide after drying.
- a multicrystalline silicon wafer is printed with an aluminium oxide paste in accordance with Example 2 by means of screen printing.
- an aluminium oxide paste in accordance with Example 2 by means of screen printing.
- about 1000 pre-prints are carried outwit the paste before the actual print.
- the paste exhibits very good resolution even after this long-term test.
- FIG. 2 shows a photomicrograph of an Al 2 O 3 layout applied by screen printing after about 1000 pre-prints. The very good resolution even after long-term printing is evident in both pictures (left printed 50 ⁇ m, after drying about 53 ⁇ m; right printed 100 ⁇ m, after drying about 105 ⁇ m).
- FIG. 3 shows the change in viscosity of a paste in accordance with Examples 1 and 2.
- a p-doped (100) FZ silicon wafer piece polished on both sides is printed on both sides with an aluminium oxide sol paste in accordance with Examples 1 and 2 by means of screen printing, and each printed side is dried in each case at 450° C. for 30 minutes on a hotplate.
- the print layout consists of a square with an edge length of 4 cm.
- the charge-carrier lifetime of the wafer is subsequently investigated by means of a WCT-120 photoconductance lifetime tester (QSSPC, quasi steady-state photoconductance; measurement window 3 cm).
- QSSPC photoconductance lifetime tester
- the references used are identical wafer samples which are either uncoated or have been treated with the aid of the wet-chemical quinhydrone/methanol process.
- the quinhydrone/methanol process (mixture of 1,4-benzoquinone, 1,4-benzohydroquinone and methanol) is a wet-chemical and temporarily effective, i.e. non-long-term-stable, electronic surface passivation. All wafer samples are etched (pre-cleaned) in advance by means of dilute HF.
- FIG. 4 shows charge-carrier lifetimes of p-doped FZ wafer samples graphically: uncoated sample (yellow, bottom), sample coated with aluminium oxide (blue, middle) and chemically passivated sample (magenta, top).
- the life-times are, in this sequence (injection density: 1E+15 cm ⁇ 3 , equals carrier density): 8 ⁇ s, 275 ⁇ s and >>3000 ⁇ s.
- An increase in the lifetime by a factor of ⁇ 34 is determined compared with the uncoated sample.
- the increase in the carrier lifetime is at tributable to the action of the aluminium oxide as electronic surface passivation of the semi-conducting material.
- the sample is dried exclusively under ambient conditions.
- An increase in the carrier lifetime can be expected after treatment of the sample in either an oxygen, oxygen/nitrogen, nitrogen or forming-gas atmosphere (for example in 5% v/v of nH2/95% v/v of N2).
- edge effects and influences cannot be excluded in the passivation action, and an influence of potential flaws in the front and back coatings cannot be excluded.
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Abstract
Description
-
- antireflection coatings, for example for optical components and the like
- corrosion-protection coatings, for example of steels and the like
- scratch-protection coatings
- surface seals
- hydrophobisation or hydrophilisation of surfaces
- synthesis of membranes and membrane materials
- synthesis of support materials for catalytic applications
- precursors of sinter ceramics and sinter-ceramic components
- dielectric layers for electronic and microelectronic components having the following special applications, where the formation of one of the desired functionalities may be, but does not have to be, linked to specific heat treatment, such as, for example, in a stream of O2, N2, O2/N2 and/or forming gas:
- spin-on-glass (“SoG”) in the manufacture of integrated circuits
- dielectric buffer layers between individual metallisation planes in the manufacture of integrated circuits (“porous MSQ”)
- printable dielectric layers for printed circuits, printable electronics in general and printable organic electronics in particular
- diffusion-barrier layers (cf. MERCK SolarResist patent)
- for semiconductors in general
- for silicon in particular and especially for silicon wafers and in particular for those for the production of crystalline silicon solar cells
- matrices for the binding of dopants (for example B, Ga, P, As, etc.) for the specific full-area and/or local doping of
- semiconductors in general
- silicon in particular and especially for silicon wafers and in particular for those for the production of crystalline silicon solar cells
- electronic passivation of semiconductor surfaces in general and of silicon surfaces in particular, which results in a considerable reduction in the surface recombination speed.
-
- aliphatic, saturated and unsaturated, mono- to polybasic, functionalised and non-functionalised alcohols,
- such as methanol, ethanol, propanol, butanol, amyl alcohol, propargyl alcohol and homologues having C≦10
- such as alkylated, secondary and tertiary alcohols with any desired degree of branching, for example isopropanol, 2-butanol, isobutanol, tert-butanol and homologues, preferably isopropanol and 2-butanol
- such as glycol, pinacols, 1,2-propanediol, 1,3-propanediol, 1,2,3-propanetriol and further branched homologues
- such as monoethanolamine, diethanolamine and triethanolamine
- glycol ethers and condensed glycol ethers, and propylene glycol ethers and condensed propylene glycol ethers, and branched homologues thereof,
- such as methoxyethanol, ethoxyethanol, propoxyethanol, butoxyethanol, pentoxyethanol, phenoxyethanol and others
- diethylene glycol, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol monobutyl ether, diethylene glycol monopentyl ether, diethylene glycol dimethyl ether, diethylene glycol diethyl ether, diethylene glycol dipropyl ether, diethylene glycol dibutyl ether, diethylene glycol dipentyl ether and others
- propylene glycol, methoxy-2-propanol, propylene glycol monomethyl ether, propylene glycol dimethyl ether, propylene glycol monoethyl ether, propylene glycol diethyl ether, phenoxypropylene glycol and others.
- aliphatic, saturated and unsaturated, mono- to polybasic, functionalised and non-functionalised alcohols,
-
- dimethyl sulfoxide, sulfolane, 1,4-dioxane, 1,3-dioxane, acetone, acetyl-acetone, dimethylformamide, dimethylacetamide, ethyl methyl ketone, diethyl ketone and others.
-
- formic acid, acetic acid, acetoacetic acid, trifluoroacetic acid, mono-chloro- to trichloroacetic acid, phenoxyacetic acid, glycolic acid, pyruvic acid, glyoxylic acid, oxalic acid, propionic acid, chloropropionic acid, lactic acid, β-hydroxypropionic acid, glyceric acid, valeric acid, trimethylacetic acid, acrylic acid, methacrylic acid, vinylacetic acid, crotonic acid, isocrotonic acid, glycine and further α-amino acids, β-alanine, malonic acid, succinic acid, maleic and fumaric acid, malic acid, tartronic acid, mesoxalic acid, acetylenedicarboxylic acid, tartaric acid, citric acid, oxalacetic acid, benzoic acid, alkylated and halogenated, nitrated and hydroxylated benzoic acids, such as salicylic acid, and further homologues
-
- nitrilotriacetic acid, nitrilotris(methylenephosphonic acid). ethylene-diaminetetraacetic acid, ethylenediaminetetrakis(methylenephos-phonic acid), diethylene glycol diaminetetraacetic acid, diethylene-triaminepentaacetic acid, diethylene glycol triaminetetrakis(methylene-phosphonic acid),
- diethylenetetraminepentakis(methylenephosphonic acid), triethylene-tetraminehexaacetic acid, triethylenetetraminehexakis(methylene-phosphonic acid), cyclohexanediaminetetraacetic acid, cyclohexane-diaminetetrakis(methylenephosphonic acid), etidronic acid, imino-diacetic acid, iminobis(methylenephosphonic acid), hexamethylene-diaminetetrakis(methylenephosphonic acid), methyliminodiacetic acid, methyliminobis(methylenephosphonic acid), dimethyliminoacetic acid, dimethyliminomethylenephosphonic acid, hydroxyethyliminodiacetic acid, hydroxyethylethylenediaminetetraacetic acid, trimethylene-dinitrilotetraacetic acid, 2-hydroxytrimethylenedinitrilotetraacetic acid, maltol, ethylmaltol, isomaltol, kojic acid, mimosine, mimosinic acid, mimosine methyl ether, 1,2-dimethyl-3-hydroxy-4-pyridinone, 1,2-diethyl-3-hydroxy-4-pyridinone, 1-methyl-3-hydroxy-4-pyridinone, 1-ethyl-2-methyl-3-hydroxy-4-pyridinone, 1-methyl-2-ethyl-3-hydroxy-4-pyridinone, 1-propyl-3-hydroxy-4-pyridinone, 3-hydroxy-2-pyridinones, 3-hydroxy-1-pyridinethiones, 3-hydroxy-2-pyridinethiones, lactic acid, maleic acid, D-gluconic acid, tartaric acid, 8-hydroxyquinoline, catechol, 1,8-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, naphthalic acid (naphthalene-1,8-dicarboxylic acid), 3,4-dihydroxynaphthalene, 2-hydroxy-1-naphthoic acid, 2-hydroxy-3-naphthoic acid, dopamine, L-dopa, desferal or desferriferrioxamine-B, acetonehydroxamic acid, 1-propyl- and 1-butyl- and 1-hexyl-2-methyl-3-hydroxy-4-pyridinone, 1-phenyl- and 1-p-tolyl- and 1-p-methoxy-phenyl and 1-p-nitrophenyl-2-methyl-3-hydroxy-4-pyridinone, 2-(2′-hydroxyphenyl)-2-oxazoline, 2-(2′-hydroxyphenyl)-2-benzoxazole, 2, X-dihydroxybenzoic acid (where X=3, 4, 5, 6), other alkylated, halogenated, nitrated 2,X-dihydroxybenzoic acids, salicylic acid and alkylated, halogenated and nitrated derivatives thereof, such as 4-nitro- and 5-nitrosalicyic acid, 3,4-dihydroxybenzoic acid, other alkylated, halogenated, nitrated 3,4-dihydroxybenzoic acids, 2,3,4-trihydroxybenzoic acid, other alkylated, halogenated, nitrated 2,3,4-trihydroxybenzoic acids, 2,3-dihydroxyterephthalic acid, other alkylated, halogenated, nitrated 2,3-dihydroxyterephthalic acids, mono-, di- and trihydroxyphthalic acids, and other alkylated, halogenated, nitrated derivatives thereof, 2-(3′, 4′-dihydroxyphenyl)-3,4-dihydro-2H-1-benzopyran-3,5,7-triol (componentfrom tannin), malonic acid, oxydiacetic acid, oxal-acetic acid, tartronic acid, malic acid, succinic acid, hippuric acid, glycolic acid, citric acid, tartaric acid, acetoacetic acid, ethanolamines, glycine, alanine, β-alanine, alaninehydroxamic acid, α-aminohydroxamic acids, rhodotorulic acid, 1,1′,1″-nitrilo-2-propanol, N,N-bis(2-hydroxyethyl)glycine, bis(2-hydroxyethyl)iminotris(hydroxymethyl)-methane, N-(tris(hydroxymethyl)methyl)glycine, ethylenediaminetetra-2-propanol, N,N-bis(2-hydroxyethyl)-2-aminoethanesulfonic acid, N-(tris(hydroxymethyl)methyl)-2-aminoethanesulfonic acid, pentaerythritol, N-butyl-2,2′-iminodiethanol, monoethanolamine, diethanolamine, triethanolamine, acetylacetone, 1,3-cyclohexanedione.
- Furthermore, it is possible to employ substituted (for example alkylated, halogenated, nitrated, sulfonated, carboxylated) homologues and derivatives of the above-mentioned complexing and chelating agents, and salts thereof, preferably ammonium salts and complexing and chelating agents which are able to coordinate Al.
- nitrilotriacetic acid, nitrilotris(methylenephosphonic acid). ethylene-diaminetetraacetic acid, ethylenediaminetetrakis(methylenephos-phonic acid), diethylene glycol diaminetetraacetic acid, diethylene-triaminepentaacetic acid, diethylene glycol triaminetetrakis(methylene-phosphonic acid),
-
- surfactants and surface-active compounds for influencing the wetting and drying behaviour,
- antifoams and deaerating agents for influencing the drying behaviour,
- further high- and low-boiling polar protic and aprotic solvents for influencing the particle-size distribution, the degree of precondensation, the condensation, wetting and drying behaviour and the printing behaviour,
- further high- and low-boiling non-polar solvents for influencing the particle-size distribution, the degree of precondensation, the condensation, wetting and drying behaviour and the printing behaviour,
- polymers for influencing the rheological properties (structural viscosity, thixotropy, flow point, etc.),
- particulate additives for influencing the rheological properties,
- particulate additives (for example aluminium hydroxides and aluminium oxides, silicon dioxide) for influencing the dry-film thicknesses resulting after drying, and the morphology thereof,
- particulate additives (for example aluminium hydroxides and aluminium oxides, silicon dioxide) for influencing the scratch resistance of the dried films,
- oxides, hydroxides, basic oxides, alkoxides and precondensed alkoxides of the elements selected from the group boron, gallium, silicon, germanium, zinc, tin, phosphorus, titanium, zirconium, yttrium, nickel, cobalt, iron, cerium, niobium, arsenic, lead and further compounds and mixtures thereof which are suitable for the formulation of corresponding hybrid sols, enabling all mixed forms resulting therefrom to be possible. In particular, these are simple and polymeric oxides, hydroxides, alkoxides of boron and phosphorus for the formulation of formulations which have a doping action on semiconductors, in particular on silicon layers.
Claims (20)
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EP11001921 | 2011-03-08 | ||
EP11001921 | 2011-03-08 | ||
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EP11007205 | 2011-09-06 | ||
EP11007205 | 2011-09-06 | ||
EP11007205.5 | 2011-09-06 | ||
PCT/EP2012/000592 WO2012119686A2 (en) | 2011-03-08 | 2012-02-09 | Aluminium oxide pastes and method for the use thereof |
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AU2012224974B2 (en) * | 2011-03-08 | 2015-11-12 | Merck Patent Gmbh | Formulations of printable aluminium oxide inks |
JP6107033B2 (en) * | 2012-09-28 | 2017-04-05 | 日立化成株式会社 | Composition for forming semiconductor substrate passivation film, semiconductor substrate with passivation film and method for producing the same, solar cell element and method for producing the same |
JP6285095B2 (en) * | 2012-09-28 | 2018-02-28 | 日立化成株式会社 | Composition for forming semiconductor substrate passivation film, semiconductor substrate with passivation film and method for producing the same, solar cell element and method for producing the same |
SG10201705329RA (en) * | 2012-12-28 | 2017-07-28 | Merck Patent Gmbh | Oxide media for gettering impurities from silicon wafers |
JP6453023B2 (en) * | 2014-10-08 | 2019-01-16 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | Organoaluminum material |
WO2016150548A2 (en) * | 2015-03-23 | 2016-09-29 | Merck Patent Gmbh | Printable, pasty diffusion and alloy barrier for producing high-efficient crystalline silicon solar cells |
WO2016165812A1 (en) | 2015-04-15 | 2016-10-20 | Merck Patent Gmbh | Screen-printable boron doping paste with simultaneous inhibition of phosphorus diffusion in co-diffusion processes |
KR20170137837A (en) | 2015-04-15 | 2017-12-13 | 메르크 파텐트 게엠베하 | Sol-gel-based printable and parasitic diffusion-inhibiting doping media for local doping of silicon wafers |
CN106830734B (en) * | 2016-12-30 | 2019-07-23 | 哈尔滨天顺化工科技开发有限公司 | It is a kind of for produce it is non-evaporating pressure self-insulating light concrete segment rapid hardening reinforcing agent preparation method and rapid hardening reinforcing agent |
US11905420B2 (en) * | 2018-08-15 | 2024-02-20 | Dic Corporation | Tabular alumina particles and method of producing tabular alumina particles |
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TW201300321A (en) | 2013-01-01 |
EP2684222A2 (en) | 2014-01-15 |
US20140000481A1 (en) | 2014-01-02 |
CA2830479A1 (en) | 2012-09-13 |
MY166507A (en) | 2018-07-05 |
AU2012224975A1 (en) | 2013-10-24 |
SG10201601784WA (en) | 2016-04-28 |
WO2012119686A3 (en) | 2013-08-22 |
AU2016200116A1 (en) | 2016-02-04 |
JP6043302B2 (en) | 2016-12-14 |
WO2012119686A2 (en) | 2012-09-13 |
EP2684222B1 (en) | 2018-03-28 |
SG193303A1 (en) | 2013-10-30 |
CN103493220B (en) | 2017-03-01 |
KR20140027137A (en) | 2014-03-06 |
CN103493220A (en) | 2014-01-01 |
TWI537212B (en) | 2016-06-11 |
JP2014518559A (en) | 2014-07-31 |
KR101929183B1 (en) | 2019-03-14 |
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