US9052335B2 - Method and system for quadrature error compensation - Google Patents

Method and system for quadrature error compensation Download PDF

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US9052335B2
US9052335B2 US13/481,391 US201213481391A US9052335B2 US 9052335 B2 US9052335 B2 US 9052335B2 US 201213481391 A US201213481391 A US 201213481391A US 9052335 B2 US9052335 B2 US 9052335B2
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compensation
quadrature error
electrodes
movement
mass
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US20130133396A1 (en
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Luca Coronato
Gabriele CAZZANIGA
Carlo Caminada
Manuel Santoro
Luciano Prandi
Demetre Kondylis
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Maxim Integrated Products Inc
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Maxim Integrated Products Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
    • G01C25/005—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/02—Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00—Specific applications of microelectromechanical systems
    • B81B2201/02—Sensors
    • B81B2201/0228—Inertial sensors
    • B81B2201/0242—Gyroscopes

Definitions

  • Specific embodiments of the invention pertain to gyroscopes or gyroscope devices and/or methods and systems for quadrature error compensation, for example, in gyroscopes or gyroscope devices.
  • a quadrature error for example, can be an interfering signal superimposed on a useful rotation rate signal.
  • Quadrature errors are caused by inaccuracies and asymmetries in the geometry of the moving mass of the gyroscope.
  • the amplitude of such a quadrature error can be 10 to 100 times the typical gyroscope full deflections.
  • the quality of the gyroscope device is influenced by the quadrature error, for example, in the following parameters:
  • the present invention concerns a method for compensation of a quadrature error on an MEMS sensor, which is intended to detect movements of a substrate, especially accelerations and/or rotation rates.
  • At least one mass arranged on the substrate and mounted to move relative to it is driven by means of drive electrodes.
  • the mass/es execute a movement deviating from the prescribed movement owing to a quadrature error.
  • a deflection of the mass/es occurring because of Coriolis force and quadrature error is detected with detection electrodes.
  • the quadrature error caused, for example, by small design tolerances in production of the sensor and/or non-uniform temperature expansion means that the moving mass deviates from its ideal theoretically stipulated movement direction. Signals are generated in the detection electrodes because of this, which overlap the signals for detecting accelerations or rotation rates of the sensor and prevent correct detection.
  • a capacitance change be detected as a function of the drive movement of the mass/es by means of compensation electrodes.
  • a compensation charge dependent on the quadrature error of the MEMS sensor, especially proportional to the quadrature error, is generated on the compensation electrodes.
  • the distorted or incorrect charge generated in the detection electrodes by the quadrature error is compensated with the compensation charge for compensation.
  • the compensation charge be added only to the detected distorted or incorrect charge without changing the deviating movement of the mass/es caused by the quadrature error.
  • the incorrect movement is retained and only compensation of the detected charge occurs with the compensation charge.
  • the movement of the mass be influenced so that it largely corresponds to the ideal movement and a more or less correct signal is generated on the detection electrodes.
  • neither the movement of the mass nor the charge on the detection electrodes is influenced by compensation. Compensation only occurs later, namely after detection of the incorrect signal. The incorrect signal is compensated and not the movement of the mass.
  • a predetermined voltage dependent on the quadrature error of the MEMS sensor is advantageously applied to the compensation electrodes.
  • both the compensation charge and the charge of the detection electrodes are fed to evaluation electronics and further processed there. Superposition therefore only occurs in this evaluation electronics.
  • the evaluation electronics or device in this case receives the signal of the compensation charge, on the one hand, and also the signal of the actually detected detection charge. The two signals are then further processed in the electronics to compensate for the quadrature error.
  • the compensation charge is regulated as a function of quadrature error. Regulation can directly act on an altered quadrature error and change the compensation signal accordingly. This is advantageous in extremely precisely operating sensors or sensors that might change over time, for example, from extreme temperature changes, which influence the quadrature error.
  • the quadrature error of the MEMS sensor and/or the voltage dependent on the quadrature error in an advantageous embodiment is determined right after production of the MEMS sensor, the error present for this special MEMS sensor can be established very simply and a fixed compensation voltage incorporated for this error.
  • the quadrature error of the MEMS sensor and/or the voltage dependent on the quadrature error is advantageously determined during operation of the MEMS sensor.
  • the compensation voltage could then be changed, as required, for example, when a fixed tolerance is surpassed.
  • An MEMS sensor is used to detect movements of a substrate, especially accelerations and/or rotation rates. It has a substrate and at least one mass arranged on the substrate and at least one mass mounted to move relative to this substrate and driven by means of drive electrodes. At least one fixed detection electrode is arranged on the substrate, which cooperates with at least one electrode arranged on the mass to detect a deflection of the mass due to Coriolis force and a quadrature error. A device for compensation of the quadrature error is also provided. The device for compensation of the quadrature error has at least one compensation electrode arranged fixed on the substrate, which cooperates with at least one electrode arranged on the mass to detect a capacitance change as a function of the drive movement of the mass/es.
  • a voltage source is also provided, which applies a predetermined voltage dependent on the quadrature error to the compensation electrodes to generate a compensation charge.
  • a connection exists between the compensation electrodes and the detection electrodes and/or the compensation electrodes and an evaluation device to compensate for the charge generated by the quadrature error in the detection electrode with the compensation charge.
  • the detection electrodes and an evaluation device are also connected to each other in order to be able to send their signals to the evaluation device or electronics.
  • the MEMS sensor is equipped accordingly so that it can send either a single already compensated signal or a specified charge of the electrodes to the evaluation electrodes.
  • it sends two signals to the evaluation electronics, namely a signal of the compensation device, on the one hand, and a signal of the detection electrodes, on the other, which is still distorted because of a quadrature error.
  • the MEMS sensor can advantageously be operated very precisely. Changes occurring during operation of the sensor and which can have an effect on the quadrature error are also allowed for by this. Compensation of the quadrature error can therefore be modified and adapted.
  • the MEMS sensor is advantageously a one- or multidimensional sensor. Both one- or multidimensional acceleration sensors and also one- or multidimensional rotation rate sensors or combinations thereof can be equipped with quadrature error compensation according to the invention.
  • a compensation device is preferably provided for each detection dimension being compensated. However, compensation devices that produce a compensation signal for several dimensions can also be arranged on the MEMS sensor.
  • the electrodes of the compensation device are advantageously provided to detect and evaluate the drive movement and/or to drive the mass/es.
  • a very compact and relatively inexpensive sensor can therefore be created.
  • FIG. 1 is a depiction showing how a quadrature error occurs in a capacitive gyroscope.
  • FIG. 2 is a depiction showing how detection is read out.
  • FIG. 3 is a depiction showing a proposed solution for quadrature signal compensation in conjunction with a practical example of the invention.
  • FIG. 4 is a depiction showing detection readout with quadrature signal compensation in conjunction with one embodiment.
  • FIG. 5 is a depiction showing quadrature signal compensation with a closed control loop conjunction with an embodiment of the invention.
  • FIG. 1 is a depiction showing how a quadrature error occurs in a capacitive gyroscope.
  • Rot in FIG. 1 denotes the rotor or moving mass, “D” the drive electrodes, “SD” or “S 2a ” and “S 2b ” the drive detection electrodes, “S” the detection electrodes, “ ⁇ ” the rotation rate, “x” the drive device and “y” the detection device.
  • the rotor “Rot” is mounted to move on a substrate “Sub” by means of springs “F”.
  • the electrodes “D”, “SD” and “S 2a ” and “S 2b ” can serve as compensation electrodes, since they can detect the movement of the mass Rot, to which the quadrature error is proportional.
  • FIG. 2 shows a depiction of a detection output, especially for the real and ideal system as shown in FIG. 1 .
  • the quadrature error has almost the same phase as the drive movement, whereas the rotation rate signal has the same phase as the drive speed.
  • the quadrature error causes a movement of the drive mass deviating from the ideal, linear drive movement, for example, yawing.
  • a charge amplifier is used, with which charges that are generated in the rotor are read out in an electronic interface (E).
  • ⁇ denotes the drive frequency
  • C 0 the static capacitance on the detection electrodes S 1
  • ⁇ the capacitance deviation due to the quadrature error
  • FIG. 3 is a depiction of a proposed solution for quadrature error compensation in conjunction with an embodiment of the invention.
  • the quadrature signal charge which is generated by the interfering detection movement on the rotor, is compensated by generation of an opposite charge, in which an additional pair of electrodes (S 2a , S 2b ) is used.
  • an additional pair of electrodes S 2a , S 2b
  • the capacitance on the electrodes must be varied only with the drive movement.
  • FIG. 4 is a diagram shown a detection output with quadrature signal compensation in conjunction with an embodiment of the invention.
  • V 2a , V 2b The signal on V 2a , V 2b is the same as V 1a , V 1b with the calibrated fraction.
  • X 0 is the capacitance deviation due to the drive movement.
  • the proposed solution requires an electrode capable of reading out the drive movement. This electrode can be
  • the solution is applicable to 1 ⁇ -, 2 ⁇ - or 3 ⁇ -gyroscopes.
  • each detection axis requires a different calibration voltage.
  • the compensation signals can be applied to different electrodes (one for each detection axis) or to the same electrode for all axes (summing of the different compensation signals).
  • the solution is also applicable to sensors that detect linear accelerations in one or more directions. Here again movements of the drive masses can be compensated by corresponding signals that compensate for the quadrature error.
  • FIG. 5 shows a regulated quadrature signal compensation agreeing with one embodiment of the invention.

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Abstract

Disclosed are a MEMS sensor and methods to compensate a quadrature error on the sensor. The sensor detects movements of a substrate, especially accelerations and rotation rates. At least one mass arranged on the substrate and mounted to move relative to it is driven by drive electrodes. The mass executes a movement deviating from the prescribed movement due to a quadrature error. A deflection of the mass occurring due to Coriolis force and quadrature error is detected with detection electrodes. A capacitance change is detected as a function of drive movement of the mass by using compensation electrodes. A compensation charge dependent on the quadrature error of the MEMS sensor is generated on the compensation electrodes. For compensation, the distorted or incorrect charge generated by the quadrature error in the detection electrodes is compensated with the compensation charge.

Description

CROSS REFERENCE TO RELATED APPLICATIONS
This application claims priority under 35 U.S.C. §119 to European Patent Application No. 11004355.1, filed on May 26, 2011.
BACKGROUND
A. Technical Field
Specific embodiments of the invention pertain to gyroscopes or gyroscope devices and/or methods and systems for quadrature error compensation, for example, in gyroscopes or gyroscope devices.
B. Background of the Invention
A problem to be solved exists in gyroscope devices in the occurrence of quadrature errors. A quadrature error, for example, can be an interfering signal superimposed on a useful rotation rate signal.
Quadrature errors are caused by inaccuracies and asymmetries in the geometry of the moving mass of the gyroscope. The amplitude of such a quadrature error can be 10 to 100 times the typical gyroscope full deflections.
The quality of the gyroscope device is influenced by the quadrature error, for example, in the following parameters:
    • dynamic range of the charge amplifier
    • output noise and/or
    • temperature deviations of the null rate level.
Methods and devices for compensation of quadrature errors are known, for example, from documents U.S. Pat. No. 6,067,858, EP 1 752 733 A2, US 2006/0213265 A1 and US 2010/0132461 A1. It is proposed in all these documents to influence the real movement of the driven mass, which might deviate from the ideal movement because of quadrature error of the sensor, so that it corresponds as much as possible to the ideal movement.
Additional restrictions and shortcomings of conventional and traditional approaches are disclosed to one with average skill in the art by a comparison of such methods and systems with some aspects of the present invention, as are described in the rest of the present application and the drawings.
SUMMARY OF THE INVENTION
The present invention concerns a method for compensation of a quadrature error on an MEMS sensor, which is intended to detect movements of a substrate, especially accelerations and/or rotation rates. At least one mass arranged on the substrate and mounted to move relative to it is driven by means of drive electrodes. The mass/es execute a movement deviating from the prescribed movement owing to a quadrature error. A deflection of the mass/es occurring because of Coriolis force and quadrature error is detected with detection electrodes.
The quadrature error caused, for example, by small design tolerances in production of the sensor and/or non-uniform temperature expansion means that the moving mass deviates from its ideal theoretically stipulated movement direction. Signals are generated in the detection electrodes because of this, which overlap the signals for detecting accelerations or rotation rates of the sensor and prevent correct detection.
It is proposed according to the invention that a capacitance change be detected as a function of the drive movement of the mass/es by means of compensation electrodes. A compensation charge dependent on the quadrature error of the MEMS sensor, especially proportional to the quadrature error, is generated on the compensation electrodes. The distorted or incorrect charge generated in the detection electrodes by the quadrature error is compensated with the compensation charge for compensation.
It is essential here that the compensation charge be added only to the detected distorted or incorrect charge without changing the deviating movement of the mass/es caused by the quadrature error. The incorrect movement is retained and only compensation of the detected charge occurs with the compensation charge. In contrast to this, it is always proposed in the prior art that the movement of the mass be influenced so that it largely corresponds to the ideal movement and a more or less correct signal is generated on the detection electrodes. In the present invention, on the other hand, neither the movement of the mass nor the charge on the detection electrodes is influenced by compensation. Compensation only occurs later, namely after detection of the incorrect signal. The incorrect signal is compensated and not the movement of the mass.
It is particularly advantageous if the charge generated in the detection electrodes by the quadrature error and the compensation charge essentially fully cancel each other out. The effect of the quadrature error is therefore completely eliminated and the most accurate measurement result is obtained.
To generate a compensation charge a predetermined voltage dependent on the quadrature error of the MEMS sensor is advantageously applied to the compensation electrodes.
If the compensation charge and the charge of the detection electrodes in an advantageous embodiment of the invention are superimposed one on the other, a new signal consisting of both signals is present, which has compensated for the quadrature error and corresponds to a virtual ideal movement.
If the already superimposed charge in an advantageous embodiment is fed to evaluation electronics, charge signals that compensate for the actual movement deviation of the mass and therefore simulate an ideal movement are sent to the evaluation electronics assigned to the sensor. The compensation charge and the fraction of the detected charge caused by the quadrature error mutually cancel each other out so that only the value that would be detected during an ideal movement is sent. The evaluation device or electronics in this case merely reports an already compensated signal.
In another advantageous embodiment of the invention both the compensation charge and the charge of the detection electrodes are fed to evaluation electronics and further processed there. Superposition therefore only occurs in this evaluation electronics. The evaluation electronics or device in this case receives the signal of the compensation charge, on the one hand, and also the signal of the actually detected detection charge. The two signals are then further processed in the electronics to compensate for the quadrature error.
It is particularly advantageous that the compensation charge is regulated as a function of quadrature error. Regulation can directly act on an altered quadrature error and change the compensation signal accordingly. This is advantageous in extremely precisely operating sensors or sensors that might change over time, for example, from extreme temperature changes, which influence the quadrature error.
If the quadrature error of the MEMS sensor and/or the voltage dependent on the quadrature error in an advantageous embodiment is determined right after production of the MEMS sensor, the error present for this special MEMS sensor can be established very simply and a fixed compensation voltage incorporated for this error.
The quadrature error of the MEMS sensor and/or the voltage dependent on the quadrature error is advantageously determined during operation of the MEMS sensor. The compensation voltage could then be changed, as required, for example, when a fixed tolerance is surpassed.
An MEMS sensor according to the invention is used to detect movements of a substrate, especially accelerations and/or rotation rates. It has a substrate and at least one mass arranged on the substrate and at least one mass mounted to move relative to this substrate and driven by means of drive electrodes. At least one fixed detection electrode is arranged on the substrate, which cooperates with at least one electrode arranged on the mass to detect a deflection of the mass due to Coriolis force and a quadrature error. A device for compensation of the quadrature error is also provided. The device for compensation of the quadrature error has at least one compensation electrode arranged fixed on the substrate, which cooperates with at least one electrode arranged on the mass to detect a capacitance change as a function of the drive movement of the mass/es. A voltage source is also provided, which applies a predetermined voltage dependent on the quadrature error to the compensation electrodes to generate a compensation charge. Moreover, a connection exists between the compensation electrodes and the detection electrodes and/or the compensation electrodes and an evaluation device to compensate for the charge generated by the quadrature error in the detection electrode with the compensation charge. The detection electrodes and an evaluation device are also connected to each other in order to be able to send their signals to the evaluation device or electronics.
The MEMS sensor is equipped accordingly so that it can send either a single already compensated signal or a specified charge of the electrodes to the evaluation electrodes. As an alternative or in addition it sends two signals to the evaluation electronics, namely a signal of the compensation device, on the one hand, and a signal of the detection electrodes, on the other, which is still distorted because of a quadrature error.
If the evaluation device or electronics has a regulation device, the MEMS sensor can advantageously be operated very precisely. Changes occurring during operation of the sensor and which can have an effect on the quadrature error are also allowed for by this. Compensation of the quadrature error can therefore be modified and adapted.
The MEMS sensor is advantageously a one- or multidimensional sensor. Both one- or multidimensional acceleration sensors and also one- or multidimensional rotation rate sensors or combinations thereof can be equipped with quadrature error compensation according to the invention. A compensation device is preferably provided for each detection dimension being compensated. However, compensation devices that produce a compensation signal for several dimensions can also be arranged on the MEMS sensor.
The electrodes of the compensation device are advantageously provided to detect and evaluate the drive movement and/or to drive the mass/es. A very compact and relatively inexpensive sensor can therefore be created.
A system and/or method are proposed for quadrature error compensation, especially as shown and/or described in conjunction with at least one of the figures and also in the claims. These and other advantages, aspects and new features of the present invention, as well as details of a practical example of this, are further explained in the following description and drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a depiction showing how a quadrature error occurs in a capacitive gyroscope.
FIG. 2 is a depiction showing how detection is read out.
FIG. 3 is a depiction showing a proposed solution for quadrature signal compensation in conjunction with a practical example of the invention.
FIG. 4 is a depiction showing detection readout with quadrature signal compensation in conjunction with one embodiment.
FIG. 5 is a depiction showing quadrature signal compensation with a closed control loop conjunction with an embodiment of the invention.
 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
Specific embodiments of the invention can be found in a method and system for quadrature error compensation, for example, in but not restricted to gyroscope devices.
FIG. 1 is a depiction showing how a quadrature error occurs in a capacitive gyroscope.
“Rot” in FIG. 1 denotes the rotor or moving mass, “D” the drive electrodes, “SD” or “S2a” and “S2b” the drive detection electrodes, “S” the detection electrodes, “Ω” the rotation rate, “x” the drive device and “y” the detection device. The rotor “Rot” is mounted to move on a substrate “Sub” by means of springs “F”. The electrodes “D”, “SD” and “S2a” and “S2b” can serve as compensation electrodes, since they can detect the movement of the mass Rot, to which the quadrature error is proportional.
As is apparent from FIG. 1, an ideal system is present if Ω=0 and Δy=0. No detection output is then present.
In contrast to this, in a real system, if Ω=0, Δy≠. An interfering detection output signal then occurs.
FIG. 2 shows a depiction of a detection output, especially for the real and ideal system as shown in FIG. 1.
As shown in FIG. 2, the corresponding drive movement X═X0*sin(ωt).
The quadrature error has almost the same phase as the drive movement, whereas the rotation rate signal has the same phase as the drive speed. The quadrature error causes a movement of the drive mass deviating from the ideal, linear drive movement, for example, yawing.
As also follows from FIG. 2, a charge amplifier is used, with which charges that are generated in the rotor are read out in an electronic interface (E).
The detection output in the ideal system by the rotor (Rot) is only dependent on a rotation rate signal:
    • C 1a =C 0+Ω*cos(ωt) C 1b =C 0−Ω*cos(ωt)
    • Q1a=(C0+Ω*cos(ωt))*V1a Q1b=(C0−Ω*cos(ωt))*V1b
In contrast to this, in a real system:
    • C 1a =C 0+Quad*sin(ωt)+Ω*cos(ωt) C 1b =C 0−Quad*sin(ωt)−Ω*cos(ωt)
    • C 1a=(C 0+Quad*sin(ωt)+Ω*cos(ωt))*V 1a Q 1b=(C 0−Quad*sin(ωt)−Ω*cos(ωt))*V 1b
Here “ω” denotes the drive frequency, “C0” the static capacitance on the detection electrodes S1, “Quad” the capacitance deviation due to the quadrature error and “Ω” the capacitance deviation due to the rotation rate.
FIG. 3 is a depiction of a proposed solution for quadrature error compensation in conjunction with an embodiment of the invention.
In the proposed solution the quadrature signal charge, which is generated by the interfering detection movement on the rotor, is compensated by generation of an opposite charge, in which an additional pair of electrodes (S2a, S2b) is used. To generate a signal that is capable of compensating the quadrature with this method, the capacitance on the electrodes must be varied only with the drive movement.
FIG. 4 is a diagram shown a detection output with quadrature signal compensation in conjunction with an embodiment of the invention.
As follows from FIG. 4, in a compensated system:
    • C 2a =C 0.2 +X 0*sin(ωt) C 2b =C 0.2 −X 0*sin(ωt)
    • Q 2a=(C 0.2 +X 0*sin(ωt))*V 2a Q 2b=(C 0.2 −X 0*sin(ωt)*V 2b
    • C 1a =C 0+Quad*sin(ωt)+Ω*cos(ωt) C 1b =C 0−Quad*sin(ωt)−Ω*cos(ωt)
    • Q 1a=(C 0+Quad*sin(ωt)+Ω*cos(ωt))*V 1a Q 1b=(C 0−Quad*sin(ωt)−Ω*cos(ωt))*V 2b
      Q tot =Q 1a +Q 1b +Q 2a +Q 2b =C 0 *V 1a +C 0 *V 1b +C 0.2 *V 2a +C 0.2 *V 2b+Ω*cos(ωt)*(V 1a −V 1b)++sin(ωt)*(Quad*V 1a +X 0 *V 2a−Quad*V 1b −X 0 *V 2b)
The quadrature signal is extinguished accordingly with an appropriate calibration:
V 2a =−V 1a*(Quad/X 0) and V 2b =−V 1b*(Quad/X 0)
The signal on V2a, V2b is the same as V1a, V1b with the calibrated fraction.
X0 is the capacitance deviation due to the drive movement.
The proposed solution requires an electrode capable of reading out the drive movement. This electrode can be
    • an electrode prescribed for this purpose,
    • the same electrode already present on the gyroscope for the drive control in order to detect the drive movement (SD),
    • the same electrode already present on the gyroscope for the drive control in order to produce the drive movement (D).
The solution is applicable to 1×-, 2×- or 3×-gyroscopes. In multiple-axis gyroscopes each detection axis requires a different calibration voltage. The compensation signals can be applied to different electrodes (one for each detection axis) or to the same electrode for all axes (summing of the different compensation signals). If necessary, the solution is also applicable to sensors that detect linear accelerations in one or more directions. Here again movements of the drive masses can be compensated by corresponding signals that compensate for the quadrature error.
The compensation voltage can be altered during operation of the device in order to be able to control the quadrature error. In this case a quadrature error drift can also be compensated during the lifetime of the sensor. For this purpose, FIG. 5 shows a regulated quadrature signal compensation agreeing with one embodiment of the invention.
Whereas the present invention was described with reference to specific embodiments, it is self-evident to one skilled in the art that different changes can be made and equivalent features replaced without deviating from the scope of the present invention. Many modifications can also be made in order to adapt to a special situation or a special material without deviating from the instructions of the present invention. The intention is therefore that the present invention is not restricted to a particular depicted embodiment but that the present invention also includes all embodiments that fall within the scope of the corresponding claims.

Claims (13)

We claim:
1. A method for compensation of a quadrature error on an MEMS sensor, the method comprising:
reading out a drive movement using detection electrodes;
detecting a movement of at least one mass arranged on a substrate and mounted to move relative to drive electrodes, the movement deviating from a prescribed movement due to a quadrature error;
identifying a capacitance change as a function of drive movement of the at least one mass using a plurality of compensation electrodes;
generating a compensation charge on the compensation electrodes, the compensation charge being dependent on the quadrature error; and
wherein the quadrature error in the detection electrodes is compensated using the compensation charge without changing a deviating movement of the mass caused by the quadrature error.
2. The method of claim 1 wherein the capacitance change generated by the quadrature error and the compensation charge essentially cancel each other out.
3. The method of claim 1 wherein a predetermined voltage dependent on the quadrature error is applied to the compensation electrodes to generate the compensation charge.
4. The method of claim 1 wherein the compensation charge and the capacitance change of the detection electrodes are superimposed one on the other.
5. The method of claim 4 wherein a result from superimposing the capacitance change and the compensation charge is provided to evaluation electronics.
6. The method of claim 1 wherein the compensation charge and the capacitance change are provided to evaluation electronics.
7. The method of claim 1 wherein the compensation charge is regulated as a function of quadrature error.
8. The method of claim 1 wherein the quadrature error of the MEMS sensor or a voltage dependent on the quadrature error are determined after production of the MEMS sensor.
9. The method of claim 1 wherein the quadrature error of the MEMS sensor or a voltage dependent on the quadrature error are determined during operation of the MEMS sensor.
10. A MEMS sensor for detection of movements of a substrate the sensor comprising:
a substrate;
at least one mass arranged on the substrate and mounted to move relative to a movement of the substrate and driven by drive electrodes;
at least one detection electrode arranged on the substrate, the at least one detection electrode detecting a deflection of the at least one mass due to a Coriolis force and a quadrature error;
at least one compensation electrode arranged on the substrate to record a capacitance change as a function of a drive movement of the at least one mass; and
a voltage source, which applies a predetermined voltage dependent on the quadrature error to the at least one compensation electrode to generate a compensation charge that is used to compensate for at least a portion of the quadrature error.
11. The sensor of claim 10 wherein an evaluation device uses the compensation charge to compensate for the at least portion of the quadrature error.
12. The sensor of claim 10 wherein the MEMS sensor is a one- or multidimensional sensor.
13. The sensor of claim 10 further comprising a compensation electrode device to detect and evaluate a drive movement and/or to drive the at least one mass.
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130269413A1 (en) * 2012-04-12 2013-10-17 Fairchild Semiconductor Corporation Mems quadrature cancellation and signal demodulation
US9618361B2 (en) 2012-04-05 2017-04-11 Fairchild Semiconductor Corporation MEMS device automatic-gain control loop for mechanical amplitude drive
US9644963B2 (en) 2013-03-15 2017-05-09 Fairchild Semiconductor Corporation Apparatus and methods for PLL-based gyroscope gain control, quadrature cancellation and demodulation
US9802814B2 (en) 2012-09-12 2017-10-31 Fairchild Semiconductor Corporation Through silicon via including multi-material fill
US9856132B2 (en) 2010-09-18 2018-01-02 Fairchild Semiconductor Corporation Sealed packaging for microelectromechanical systems
US10050155B2 (en) 2010-09-18 2018-08-14 Fairchild Semiconductor Corporation Micromachined monolithic 3-axis gyroscope with single drive
US10060757B2 (en) 2012-04-05 2018-08-28 Fairchild Semiconductor Corporation MEMS device quadrature shift cancellation
US10065851B2 (en) 2010-09-20 2018-09-04 Fairchild Semiconductor Corporation Microelectromechanical pressure sensor including reference capacitor

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013216935A1 (en) * 2013-08-26 2015-02-26 Robert Bosch Gmbh Rotation rate sensor with pre-set quadrature offset
CN103808331B (en) * 2014-03-05 2016-10-26 北京理工大学 A kind of MEMS three-axis gyroscope error calibrating method
CN103983257B (en) * 2014-05-06 2017-02-22 华侨大学 Signal processing method capable of eliminating quadrature errors of micro-machined gyroscope
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CN104807452B (en) * 2015-04-29 2017-07-18 东南大学 Honeycomb fashion MEMS resonant silicon micro-gyroscope and its processing method
US11740088B2 (en) 2020-11-27 2023-08-29 Stmicroelectronics S.R.L. Microelectromechanical gyroscope and method for compensating an output thermal drift in a microelectromechanical gyroscope

Citations (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5400269A (en) 1993-09-20 1995-03-21 Rockwell International Corporation Closed-loop baseband controller for a rebalance loop of a quartz angular rate sensor
US6067858A (en) 1996-05-31 2000-05-30 The Regents Of The University Of California Micromachined vibratory rate gyroscope
DE19939998A1 (en) 1999-08-24 2001-03-01 Bosch Gmbh Robert Device for generating bias voltage for a vibrating yaw rate sensor
US20030151394A1 (en) 2000-04-12 2003-08-14 Jens Mohaupt Sensor-independent oscillation amplitude control
DE10360963A1 (en) 2003-12-23 2005-07-28 Litef Gmbh Method for measuring rotation rates / accelerations using a yaw rate Coriolis gyro and suitable Coriolis gyro
DE102004061804A1 (en) 2004-12-22 2006-07-06 Robert Bosch Gmbh Micromechanical rotation rate sensor with error suppression
US20060213265A1 (en) 2005-03-22 2006-09-28 Honeywell International Inc Quadrature reduction in mems gyro devices using quad steering voltages
EP1752733A2 (en) 2005-08-08 2007-02-14 Litton Systems, Inc. Bias and quadrature reduction in class II Coriolis vibratory gyros
US20070056370A1 (en) * 2005-08-19 2007-03-15 Honeywell International Inc. Mems sensor package
US20070193353A1 (en) * 2004-09-30 2007-08-23 Kim Eun S Silicon inertial sensors formed using MEMS
US7290435B2 (en) 2006-02-06 2007-11-06 Invensense Inc. Method and apparatus for electronic cancellation of quadrature error
US7707885B2 (en) * 2005-02-25 2010-05-04 Sagem Defense Securite Method for temperature-compensated gyrometric measurement and gyrometric measurement device using same
US20100132461A1 (en) 2008-11-25 2010-06-03 Joerg Hauer Quadrature compensation for a rotation-rate sensor
US20110167891A1 (en) * 2009-10-20 2011-07-14 Analog Devices, Inc. Apparatus and Method for Calibrating MEMS Inertial Sensors
US20120096943A1 (en) * 2010-10-25 2012-04-26 Rosemount Aerospace Inc. Mems gyros with quadrature reducing springs
US8215151B2 (en) * 2008-06-26 2012-07-10 Analog Devices, Inc. MEMS stiction testing apparatus and method
US20120272711A1 (en) * 2011-04-27 2012-11-01 Honeywell International Inc. Adjusting a mems gyroscope to reduce thermally varying bias
US20130031948A1 (en) * 2010-04-16 2013-02-07 Sagem Defense Securite' Gyroscopic measurement in a navigation system
US20130199263A1 (en) * 2010-03-17 2013-08-08 Continental Teves Ag & Co. Ohg Method for the decoupled control of the quadrature and the resonance frequency of a micro-mechanical gyroscope
US20130269413A1 (en) * 2012-04-12 2013-10-17 Fairchild Semiconductor Corporation Mems quadrature cancellation and signal demodulation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5067858A (en) 1991-04-10 1991-11-26 Cook Warren R Multiple faced cutter insert
DE10360962B4 (en) * 2003-12-23 2007-05-31 Litef Gmbh Method for quadrature bias compensation in a Coriolis gyro and suitable Coriolis gyro
DE102009000743B4 (en) * 2009-02-10 2024-01-18 Robert Bosch Gmbh Vibration compensation for rotation rate sensors

Patent Citations (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5400269A (en) 1993-09-20 1995-03-21 Rockwell International Corporation Closed-loop baseband controller for a rebalance loop of a quartz angular rate sensor
US6067858A (en) 1996-05-31 2000-05-30 The Regents Of The University Of California Micromachined vibratory rate gyroscope
DE19939998A1 (en) 1999-08-24 2001-03-01 Bosch Gmbh Robert Device for generating bias voltage for a vibrating yaw rate sensor
US20030151394A1 (en) 2000-04-12 2003-08-14 Jens Mohaupt Sensor-independent oscillation amplitude control
DE10360963A1 (en) 2003-12-23 2005-07-28 Litef Gmbh Method for measuring rotation rates / accelerations using a yaw rate Coriolis gyro and suitable Coriolis gyro
US20070193353A1 (en) * 2004-09-30 2007-08-23 Kim Eun S Silicon inertial sensors formed using MEMS
DE102004061804A1 (en) 2004-12-22 2006-07-06 Robert Bosch Gmbh Micromechanical rotation rate sensor with error suppression
US7707885B2 (en) * 2005-02-25 2010-05-04 Sagem Defense Securite Method for temperature-compensated gyrometric measurement and gyrometric measurement device using same
US20060213265A1 (en) 2005-03-22 2006-09-28 Honeywell International Inc Quadrature reduction in mems gyro devices using quad steering voltages
EP1752733A2 (en) 2005-08-08 2007-02-14 Litton Systems, Inc. Bias and quadrature reduction in class II Coriolis vibratory gyros
US20070056370A1 (en) * 2005-08-19 2007-03-15 Honeywell International Inc. Mems sensor package
US7290435B2 (en) 2006-02-06 2007-11-06 Invensense Inc. Method and apparatus for electronic cancellation of quadrature error
US8215151B2 (en) * 2008-06-26 2012-07-10 Analog Devices, Inc. MEMS stiction testing apparatus and method
US20100132461A1 (en) 2008-11-25 2010-06-03 Joerg Hauer Quadrature compensation for a rotation-rate sensor
US20110167891A1 (en) * 2009-10-20 2011-07-14 Analog Devices, Inc. Apparatus and Method for Calibrating MEMS Inertial Sensors
US20130199263A1 (en) * 2010-03-17 2013-08-08 Continental Teves Ag & Co. Ohg Method for the decoupled control of the quadrature and the resonance frequency of a micro-mechanical gyroscope
US20130031948A1 (en) * 2010-04-16 2013-02-07 Sagem Defense Securite' Gyroscopic measurement in a navigation system
US20120096943A1 (en) * 2010-10-25 2012-04-26 Rosemount Aerospace Inc. Mems gyros with quadrature reducing springs
US20120272711A1 (en) * 2011-04-27 2012-11-01 Honeywell International Inc. Adjusting a mems gyroscope to reduce thermally varying bias
US20130269413A1 (en) * 2012-04-12 2013-10-17 Fairchild Semiconductor Corporation Mems quadrature cancellation and signal demodulation

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Search Report for German Application No. 10 2012 104 358.2, mailed on Mar. 4, 2013.

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9856132B2 (en) 2010-09-18 2018-01-02 Fairchild Semiconductor Corporation Sealed packaging for microelectromechanical systems
US10050155B2 (en) 2010-09-18 2018-08-14 Fairchild Semiconductor Corporation Micromachined monolithic 3-axis gyroscope with single drive
US10065851B2 (en) 2010-09-20 2018-09-04 Fairchild Semiconductor Corporation Microelectromechanical pressure sensor including reference capacitor
US9618361B2 (en) 2012-04-05 2017-04-11 Fairchild Semiconductor Corporation MEMS device automatic-gain control loop for mechanical amplitude drive
US10060757B2 (en) 2012-04-05 2018-08-28 Fairchild Semiconductor Corporation MEMS device quadrature shift cancellation
US20130269413A1 (en) * 2012-04-12 2013-10-17 Fairchild Semiconductor Corporation Mems quadrature cancellation and signal demodulation
US9625272B2 (en) * 2012-04-12 2017-04-18 Fairchild Semiconductor Corporation MEMS quadrature cancellation and signal demodulation
US9802814B2 (en) 2012-09-12 2017-10-31 Fairchild Semiconductor Corporation Through silicon via including multi-material fill
US9644963B2 (en) 2013-03-15 2017-05-09 Fairchild Semiconductor Corporation Apparatus and methods for PLL-based gyroscope gain control, quadrature cancellation and demodulation

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