US8927933B1 - Dual-band wide-angle absorber/thermal emitter - Google Patents
Dual-band wide-angle absorber/thermal emitter Download PDFInfo
- Publication number
- US8927933B1 US8927933B1 US13/398,579 US201213398579A US8927933B1 US 8927933 B1 US8927933 B1 US 8927933B1 US 201213398579 A US201213398579 A US 201213398579A US 8927933 B1 US8927933 B1 US 8927933B1
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- layer
- absorber
- emitter
- wavelength band
- reflective
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- 239000006096 absorbing agent Substances 0.000 title claims abstract description 40
- 239000000463 material Substances 0.000 claims description 30
- 238000010521 absorption reaction Methods 0.000 claims description 24
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical group [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 10
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 9
- 239000002131 composite material Substances 0.000 claims description 5
- 230000000694 effects Effects 0.000 claims description 4
- 230000010287 polarization Effects 0.000 claims description 4
- 239000003989 dielectric material Substances 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 44
- 230000005855 radiation Effects 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000862 absorption spectrum Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005681 electric displacement field Effects 0.000 description 1
- 230000005274 electronic transitions Effects 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003306 harvesting Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/046—Materials; Selection of thermal materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
- G01J5/024—Special manufacturing steps or sacrificial layers or layer structures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/58—Radiation pyrometry, e.g. infrared or optical thermometry using absorption; using extinction effect
Definitions
- the invention generally relates to absorbers and emitters, and more particularly, to a new way to achieve dual-band wide-angle absorption or thermal emission in thin materials.
- FIG. 1 is a perspective view of a dual-band wide-angle absorber/thermal emitter, according to embodiments of the invention.
- FIG. 2A is a graphical comparison of emissivity as a function of emission angle at the perfect emission wavelength of the shorter wavelength band, according to embodiments of the invention.
- FIG. 2B is a graphical comparison of emissivity as a function of emission angle at the perfect emission wavelength of the longer wavelength band, according to embodiments of the invention.
- FIG. 2C is a graphical comparison of emissivity as a function of wavelength at one of the perfect emission angles, according to embodiments of the invention.
- the invention generally relates to absorbers and emitters, and more particularly, to a new way to achieve dual-band wide-angle absorption or thermal emission in thin materials.
- Embodiments of the invention are based on bi-layer structures composed a highly or totally reflective natural or engineered material substrate and other natural or engineered dielectric materials with permittivity described by the Drude-Lorentz model.
- Drude-Lorentz model A person having ordinary skill in the art will recognize the Drude-Lorentz model as an electrical conduction model explaining transport properties of electrons in materials.
- the composite structure associated with embodiments of the invention yields dual-band wide-angle emission or absorption around the Drude-Lorentz resonance for thin overall composite structures. Two thermal emission or absorption bands coexist when the material is described by the Drude-Lorentz model.
- FIG. 1 illustrates a perspective view of a dual-band wide-angle absorber/thermal emitter, according to embodiments of the invention.
- Reference character 100 depicts an apparatus of embodiments of the invention.
- the apparatus 100 a dual-band wide-angle absorber/thermal emitter is an absorber/emitter that may also be referred to as a bi-layer absorber/emitter.
- the apparatus 100 is viewed relative to the x-axis 102 , y-axis 104 , and z-axis 106 .
- a radiation wave vector, k, 108 is shown.
- An emission/absorption angle, ⁇ , 110 is the angle between the z-axis 106 and the radiation wave vector 108 .
- Embodiments of the invention generally relate to an absorber/emitter, including at least one primary layer 112 having a permittivity described by the Drude-Lorentz model. At least one reflective secondary layer 114 is associated with the at least one primary layer 112 .
- a natural dielectric material may be used as the primary layer 112 , such as, for example, glass, silicon carbide (Si—C), diamond, silicon, and silica.
- An engineered material may also be used as the primary layer 112 .
- Appropriate examples of suitable engineered materials include composites and metamaterials.
- the association between the primary 112 and secondary 114 layers is by bonding.
- Another embodiment of the invention generally relates to a bi-layer absorber/emitter, including, at least one natural dielectric layer 112 .
- the natural dielectric layer 112 has a permittivity described by the Drude-Lorentz model.
- At least one reflective layer 114 is bonded to the natural dielectric layer 112 .
- the natural dielectric layer 112 is silicon carbide.
- the invention generally relates to a bi-layer absorber/emitter, including, at least one engineered material layer 112 having a permittivity described by the Drude-Lorentz model. At least one reflective layer 114 is bonded to the engineered-material layer 112 .
- the invention generally relates to an absorber/emitter, including: a silicon carbide layer 112 .
- the thickness of the silicon carbide layer 112 is less than one-tenth of the absorption wavelength of the absorber/emitter.
- a copper layer 114 is bonded to the silicon carbide layer 112 .
- the silicon carbide layer 112 has a permittivity described by the Drude-Lorentz model.
- the primary layer 112 may be referred to as the natural dielectric layer or engineered material layer without detracting from the merits or generality of embodiments of the invention. Additionally, although depicted as a single layer in FIG. 1 , the primary layer 112 and the reflective secondary layer 114 may include additional layers. Likewise, the reflective secondary layer 114 may be referred to as the reflective layer without detracting from the merits or generality of embodiments of the invention.
- layer thicknesses are based on application-specific conditions and are affected by material electromagnetic wavelengths.
- the thickness of the primary layer 112 is less than one-tenth of the absorption wavelength of the absorber/emitter (also referred to as bi-layer absorber/emitter).
- numerous orientations of the apparatus 100 and respective layers 112 and 114 are possible dependent on the direction of the radiation wave vector, k, 108 .
- dual-band wide-angle absorption occurs at a shorter and a longer wavelength band.
- the shorter and longer bands reside at different sides of the Drude-Lorentz frequency.
- the longer wavelength band is polarization insensitive and is associated with a surge of refractive index near the Lorentzian resonance. High absorption can exist for a broad range of angles with a minimal shift in the center frequency which can be tuned by tuning the Drude-Lorentz resonance.
- the shorter wavelength band results from the ⁇ -near-zero effect occurring for p-polarized waves as the result of field enhancement due to the continuity of the electric displacement field normal to the surface.
- the emission property can be deduced using Kirchoff's law which directly relates the absorptance with the emissivity.
- the absorption can be calculated from the Poynting vector by solving Maxwell's equations.
- the desired emission peak and spectral features can be engineered by properly tuning the resonant frequency and the damping factor. This feature was demonstrated in simulated silicon carbide/copper bi-layers.
- Reference characters 272 and 274 depict the shorter and longer wavelength bands discussed above and illustrated in FIG. 2C .
- the shorter wavelength band 272 has a smaller wavelength than the longer wavelength band 274 , hence the designation of shorter and longer, respectively.
- the shorter wavelength band 272 and the longer wavelength band 274 may also be referred to as a first and a second wavelength band, respectively.
- the reflective secondary layer 114 is selected from the group consisting of natural reflective materials and engineered reflective materials.
- natural reflective materials include metals in the long wavelength region such as, for example, infrared, microwave, and radio frequency waves.
- engineered reflective materials include photonic bandgap materials and metamaterials. Other materials may be used without detracting from the merits or generality of embodiments of the invention.
- the mechanism of absorption in bi-layer absorbers/emitters is the interaction between resonant transmission and reflection.
- the primary layer 112 outputs resonant transmission signals while the secondary layer 114 acts as a mirror to strongly or totally reflect the transmission signals of the primary layer. Therefore, absorption can occur as the consequence of multiple resonant transmission and total reflection, resulting in repeated absorption.
- Embodiments of the invention yield two absorption band outputs.
- dual-band wide-angle absorption/thermal emission is demonstrated around the Drude-Lorentz resonance in bi-layer absorbers/emitters.
- Many engineered materials including nanoplasmonic composite structures and metamaterials can be effectively described by the Drude-Lorentz mode, thus embodiments of the invention are applicable for a broad range of materials.
- the geometry allows easy integration and the dual-band emission/absorption is a desired feature for multi-functional devices including, but not limited to, thermal emitters, IR sensors, photodetectors, absorbers, and bolometers.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
Description
Claims (14)
Priority Applications (1)
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US13/398,579 US8927933B1 (en) | 2012-02-16 | 2012-02-16 | Dual-band wide-angle absorber/thermal emitter |
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US13/398,579 US8927933B1 (en) | 2012-02-16 | 2012-02-16 | Dual-band wide-angle absorber/thermal emitter |
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US8927933B1 true US8927933B1 (en) | 2015-01-06 |
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US13/398,579 Expired - Fee Related US8927933B1 (en) | 2012-02-16 | 2012-02-16 | Dual-band wide-angle absorber/thermal emitter |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8995055B1 (en) * | 2011-11-21 | 2015-03-31 | The United States Of America As Represented By The Secretary Of The Navy | Angular and spectral selective absorber in ultrathin metamaterials |
WO2016139233A1 (en) * | 2015-03-03 | 2016-09-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Arrangement for spatially resolved determination of the specific electrical resistance and/or the specific electrical conductivity of samples |
CN107634346A (en) * | 2017-08-07 | 2018-01-26 | 西安电子科技大学 | The super surface interlayers of ENZ for the transmission of TE and TM polarized waves multi-angle |
US10466274B2 (en) | 2015-03-03 | 2019-11-05 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Arrangement for spatially resolved determination of the specific electrical resistance and/or the specific electrical conductivity of samples |
CN111029788A (en) * | 2019-12-11 | 2020-04-17 | 中国电子科技集团公司第十四研究所 | Broadband metamaterial wave-absorbing structure with angle and polarization insensitivity |
-
2012
- 2012-02-16 US US13/398,579 patent/US8927933B1/en not_active Expired - Fee Related
Non-Patent Citations (9)
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Alu et al., Epsilon-Near-Zero (ENZ) Metamaterials and Electromagnetic Sources: Tailoring the Radiation Phase Pattern, Apr. 15, 2007, Physical Review B, vol. 75, pp. 155410-1 to 155410-13. * |
Baldi et al., Mg-Ti-H thin films as switchable solar absorbers, 2008, International Journal of Hydrogen Energy, vol. 33, pp. 3188-3192. * |
Baldi et al., Mg—Ti—H thin films as switchable solar absorbers, 2008, International Journal of Hydrogen Energy, vol. 33, pp. 3188-3192. * |
Feng et al., Perfect Absorption in Ultrathin Epsilon-Near-Zero Metamaterials Induced by Fast-Wave Non-Radiative Modes, Dec. 6, 2011, Physics Optics, pp. 1-4. * |
Huang et al., Multi-Band and Polarization Insensitive Metamaterial Absorber, Jan. 2011, Progress in Electromagnetics Research, vol. 113, pp. 103-110. * |
Nefzaoui et al., Selective emitters design and optimization for thermophotovoltaic applications, Feb. 15, 2012, pp. 1-12. * |
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Silveirinha et al., Design of matched zero-index metamaterials using nonmagnetic inclusions in epsilon-near-zero media, Feb. 2007, Physics Review B, vol. 75, pp. 075119-1 to 075119-10. * |
Vial et al., Improved analytical fit of gold dispersion: Application to the modeling of extinction spectra with a finite-difference time-domain method, Feb. 23, 2005, Physical Review B, vol. 71, pp. 085416-1 to 085416-7. * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8995055B1 (en) * | 2011-11-21 | 2015-03-31 | The United States Of America As Represented By The Secretary Of The Navy | Angular and spectral selective absorber in ultrathin metamaterials |
WO2016139233A1 (en) * | 2015-03-03 | 2016-09-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Arrangement for spatially resolved determination of the specific electrical resistance and/or the specific electrical conductivity of samples |
US10466274B2 (en) | 2015-03-03 | 2019-11-05 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Arrangement for spatially resolved determination of the specific electrical resistance and/or the specific electrical conductivity of samples |
CN107634346A (en) * | 2017-08-07 | 2018-01-26 | 西安电子科技大学 | The super surface interlayers of ENZ for the transmission of TE and TM polarized waves multi-angle |
CN111029788A (en) * | 2019-12-11 | 2020-04-17 | 中国电子科技集团公司第十四研究所 | Broadband metamaterial wave-absorbing structure with angle and polarization insensitivity |
CN111029788B (en) * | 2019-12-11 | 2021-06-01 | 中国电子科技集团公司第十四研究所 | Broadband metamaterial wave-absorbing structure with angle and polarization insensitivity |
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