US8780622B2 - Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance - Google Patents
Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance Download PDFInfo
- Publication number
- US8780622B2 US8780622B2 US13/860,724 US201313860724A US8780622B2 US 8780622 B2 US8780622 B2 US 8780622B2 US 201313860724 A US201313860724 A US 201313860724A US 8780622 B2 US8780622 B2 US 8780622B2
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- United States
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- data
- bits
- polarity
- circuit
- difference
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0035—Evaluating degradation, retention or wearout, e.g. by counting writing cycles
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0411—Online error correction
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
- G11C2211/564—Miscellaneous aspects
- G11C2211/5647—Multilevel memory with bit inversion arrangement
Definitions
- FIG. 2 is a block diagram of a data storage structure shown in FIG. 1 ;
- FIG. 9 is a block diagram of the Grey code increment circuit shown in FIG. 7 ;
- the PCM apparatus 100 further includes command buffers 108 for receiving the command signals 110 .
- the command signals are conventional and their functions are well known in the art.
- the command signals 110 include CE (Chip Enable), WE (Write Enable), OE (Output Enable), and CLK (Clock).
- the command buffers 108 provide buffered command signals 111 to a control circuit.
- a high voltage generator 118 provides a boosted voltage signal 119 for use in the row decoder 124 , column selector 128 , and write driver 1000 .
- data from the data structure 200 is pre-read before writing data to the data structure 200 .
- this read data will be referred to as previous data bits 302 and previous polarity bits 304 as well as collectively shown in the Figures as data bits and polarity bits 150 .
- data and polarity bits that are written to the data structure are referred to as new data bits 314 and new polarity bits 320 as well as collectively shown in the Figures as new data and new polarity bits 152 .
- the data/polarity circuit 300 further includes a write data compare circuit 500 for receiving the previous polarity flag 312 , the previous data bits 302 , and the data bits to be written to array 115 to the data structure 200 in the array 106 ; and providing new data bits 314 , a data mask 316 , and a new polarity flag 318 . Further details of the write data bit compare circuit 500 are described herein below with reference to FIGS. 5 and 6
- the memory module 1100 may be, for example, a memory stick, a solid state disk (SSD), a laptop computer, a desktop computer, a personal digital assistant (PDA), audio player, or the like where the advantages of embodiments of the present invention as described herein are especially beneficial.
- SSD solid state disk
- PDA personal digital assistant
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Read Only Memory (AREA)
- Signal Processing For Digital Recording And Reproducing (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/860,724 US8780622B2 (en) | 2010-04-13 | 2013-04-11 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US32340110P | 2010-04-13 | 2010-04-13 | |
| US13/085,863 US8432729B2 (en) | 2010-04-13 | 2011-04-13 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
| US13/860,724 US8780622B2 (en) | 2010-04-13 | 2013-04-11 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/085,863 Continuation US8432729B2 (en) | 2010-04-13 | 2011-04-13 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20130215677A1 US20130215677A1 (en) | 2013-08-22 |
| US8780622B2 true US8780622B2 (en) | 2014-07-15 |
Family
ID=45925029
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/085,863 Expired - Fee Related US8432729B2 (en) | 2010-04-13 | 2011-04-13 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
| US13/860,724 Active US8780622B2 (en) | 2010-04-13 | 2013-04-11 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/085,863 Expired - Fee Related US8432729B2 (en) | 2010-04-13 | 2011-04-13 | Phase-change memory with multiple polarity bits having enhanced endurance and error tolerance |
Country Status (1)
| Country | Link |
|---|---|
| US (2) | US8432729B2 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012124643A (en) * | 2010-12-07 | 2012-06-28 | Fuji Xerox Co Ltd | Receiving device and data transfer device |
| JP2012124642A (en) * | 2010-12-07 | 2012-06-28 | Fuji Xerox Co Ltd | Receiving device, data transfer device, and program |
| KR102049281B1 (en) | 2012-10-23 | 2019-11-27 | 삼성전자주식회사 | Memory system including nonvolatile memory and controller and programming method of programming data into nonvolatile memory |
| US8913425B2 (en) * | 2013-03-12 | 2014-12-16 | Intel Corporation | Phase change memory mask |
| US9613675B2 (en) * | 2013-12-14 | 2017-04-04 | Qualcomm Incorporated | System and method to perform low power memory operations |
| KR20160093430A (en) * | 2015-01-29 | 2016-08-08 | 에스케이하이닉스 주식회사 | Semiconductor memory appartus and data input/output method thereof |
| JP6517385B1 (en) * | 2018-02-07 | 2019-05-22 | ウィンボンド エレクトロニクス コーポレーション | Semiconductor memory device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7561464B2 (en) * | 2005-07-25 | 2009-07-14 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
| US7952923B2 (en) * | 2008-07-02 | 2011-05-31 | Mosaid Technologies Incorporated | Multiple bit per cell non volatile memory apparatus and system having polarity control and method of programming same |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5296716A (en) | 1991-01-18 | 1994-03-22 | Energy Conversion Devices, Inc. | Electrically erasable, directly overwritable, multibit single cell memory elements and arrays fabricated therefrom |
| US5673224A (en) | 1996-02-23 | 1997-09-30 | Micron Quantum Devices, Inc. | Segmented non-volatile memory array with multiple sources with improved word line control circuitry |
| US7272773B2 (en) * | 2003-04-17 | 2007-09-18 | International Business Machines Corporation | Cache directory array recovery mechanism to support special ECC stuck bit matrix |
| KR100688524B1 (en) | 2005-01-25 | 2007-03-02 | 삼성전자주식회사 | Biasing Method of Memory Cell Array and Semiconductor Memory Device |
| KR100674992B1 (en) | 2005-09-08 | 2007-01-29 | 삼성전자주식회사 | Phase change memory device that can change drive voltage level |
| KR100764738B1 (en) | 2006-04-06 | 2007-10-09 | 삼성전자주식회사 | Phase change memory device with improved reliability, its writing method, and system including it |
| KR100827702B1 (en) | 2006-11-01 | 2008-05-07 | 삼성전자주식회사 | Variable resistance semiconductor memory device |
| KR100819061B1 (en) | 2007-03-06 | 2008-04-03 | 한국전자통신연구원 | Data writing device and method in phase change memory through write power calculation and data reversal function |
| US7783846B2 (en) | 2007-08-09 | 2010-08-24 | International Business Machines Corporation | Method, apparatus and computer program product providing energy reduction when storing data in a memory |
| KR101281685B1 (en) | 2007-10-04 | 2013-07-03 | 삼성전자주식회사 | Method for writing and reading data of phase-change random access memory and apparatus thereof |
| JP2009238256A (en) | 2008-03-25 | 2009-10-15 | Toshiba Corp | Semiconductor memory device |
-
2011
- 2011-04-13 US US13/085,863 patent/US8432729B2/en not_active Expired - Fee Related
-
2013
- 2013-04-11 US US13/860,724 patent/US8780622B2/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7561464B2 (en) * | 2005-07-25 | 2009-07-14 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
| US7952923B2 (en) * | 2008-07-02 | 2011-05-31 | Mosaid Technologies Incorporated | Multiple bit per cell non volatile memory apparatus and system having polarity control and method of programming same |
Also Published As
| Publication number | Publication date |
|---|---|
| US8432729B2 (en) | 2013-04-30 |
| US20130215677A1 (en) | 2013-08-22 |
| US20120087182A1 (en) | 2012-04-12 |
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