US8081101B2 - Analog-to-digital converter using oscillators - Google Patents
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- US8081101B2 US8081101B2 US12/701,549 US70154910A US8081101B2 US 8081101 B2 US8081101 B2 US 8081101B2 US 70154910 A US70154910 A US 70154910A US 8081101 B2 US8081101 B2 US 8081101B2
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- 238000005070 sampling Methods 0.000 claims description 2
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- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
- H03M1/1042—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables the look-up table containing corrected values for replacing the original digital values
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/60—Analogue/digital converters with intermediate conversion to frequency of pulses
Definitions
- the present invention relates to analog-to-digital converters (ADCs) using oscillators.
- analog-to-digital converters convert analog signals to digital signals using a voltage controlled oscillator.
- VCO voltage controlled oscillator
- the digital output value is determined based on the output of the VCO, which may for example involve a counting of pulses output by the VCO.
- analog-to-digital converters are limited by non-linearities of the VCO.
- analog feedback or digital calibration are sometimes used.
- Analog feedback uses a large silicon area and increases the power consumption. The reduction of the non-linearity by digital calibration may be not sufficient for some applications.
- FIG. 1 shows a block diagram of an apparatus according to an embodiment.
- FIG. 2 shows a block diagram of an apparatus according to another embodiment.
- FIG. 3 shows a portion of an oscillator according to some embodiments.
- FIG. 4 shows an example implementation of an inverter of FIG. 3 .
- FIG. 5 shows an example for a sampling circuit of some embodiments.
- FIGS. 6 and 7 show graphs for illustrating the functioning of a distortion correction according to some embodiments.
- any direct connection or coupling between functional blocks, devices, components, circuit elements or other physical or functional units shown in the drawings or described herein could also be implemented by an indirect connection or coupling, i.e. a connection or coupling comprising one or more intervening elements.
- functional blocks or units shown in the drawings may be implemented as separate circuits in some embodiments, but may also be fully or partially implemented in a common circuit in other embodiments.
- the description of various functional blocks is intended to give a clear understanding of various functions performed in a device or system shown and is not to be construed as indicating that these functional blocks have to be implemented as separate physical units.
- one or more functional units may be implemented by programming a processor like a single digital signal processor accordingly.
- connection which is described as being wire-based in the following specification may also be implemented as a wireless connection and vice versa unless noted to the contrary.
- Analog-to-digital converters generally are devices which convert one or more analog input signals, for example voltage signals or current signals, to one or more digital output signals.
- Controllable oscillators generally are oscillators which output one or more oscillating signals, also referred to as oscillations, the one or more signals having a frequency which is dependent on a control signal supplied to the controllable oscillator.
- One common class of controllable oscillators are voltage controlled oscillators (VCOs). It should be noted that such a voltage controllable oscillator may e.g. be converted to a current controlled oscillator by adding a current-to-voltage converter.
- FIG. 1 an analog-to-digital converter according to an embodiment is shown.
- the apparatus shown in FIG. 1 comprises a first analog input 10 for receiving a first analog input signal IN 1 and a second analog input 13 to receive a second analog input signal IN 2 .
- Signals IN 1 , IN 2 may for example be voltage signals or current signals.
- IN 1 and IN 2 are two part signals of a differential signal.
- IN 2 is the negative of IN 1 .
- First analog input 10 is coupled to a first signal path 11 , first signal path 11 comprising a first controllable oscillator 12 .
- Controllable oscillator 12 is configured to generate one or more output signals the frequency of which depends on first analog input signal IN 1 .
- First signal path 11 is further configured to generate a first digital output signal OUT 1 based on the output signals of first controllable oscillator 12 .
- Second analog input 13 is coupled to a second signal path 14 comprising a second controllable oscillator 15 .
- Second controllable oscillator 15 is configured to output one or more output signals the frequency of which depends on second analog input signal IN 2 .
- Second signal path 14 is further configured to generate a second digital output signal OUT 2 based on the signal(s) output from second controllable oscillator 15 .
- the apparatus of FIG. 1 further comprises a combiner 16 which combines first digital output signal 1 and second digital output signal 2 , for example by subtraction or addition, and generates a further digital output signal OUT which constitutes the output signal of the analog-to-digital converter.
- FIG. 2 an analog-to-digital converter according to a further embodiment of the invention is shown.
- the apparatus shown in FIG. 2 comprises a first analog signal input 20 and a second analog signal input 23 to receive a positive part signal V inp and a negative part signal V inn , respectively, of a differential input voltage signal. Furthermore, the apparatus of FIG. 2 comprises a first calibration input 21 and a second calibration input 24 . A switch 22 is provided to switch between first analog input 20 and first calibration input 21 , and a switch 25 is provided to switch between second analog signal input 23 and second calibration input 24 .
- Switch 22 is further coupled to an input of a first voltage-controlled oscillator (VCO) 26 .
- VCO voltage-controlled oscillator
- first voltage-controlled oscillator 26 is configured to output 64 output signals having different phases, but the same frequency, the frequency being determined by the signal supplied via first switch 22 .
- one of the signals output by first VCO 26 is fed to a first path comprising a first asynchronous counter 27 which counts the periods of the signal received from first VCO 26 .
- first asynchronous counter 27 may count rising edges or falling edges of the signal received from first VCO 26 .
- asynchronous counter 27 counts a number of full periods of the output signal.
- asynchronous counter 27 is a 6-bit counter outputting a 6-bit digital signal. This 6-bit digital signal is fed to a first 6-fold sample and hold unit 28 of the first path (one sample and hold circuit for each bit) clocked by a clock signal clk.
- the output of the first 6-fold sample and hold unit 28 represents upper 6 bits, numbered 6 to 11 in the embodiment of FIG. 2 , of a first digital output signal phasep.
- All 64 output signals of first VCO 26 are fed to a second path comprising a first 32-fold sample and hold unit 29 , wherein two output signals are fed to each sample and hold circuit of 32-fold sample and hold unit 29 , which is also clocked by clock signal clk.
- First 32-fold sample and hold unit 29 outputs a 32-bit output signal to a first thermometer to binary encoder 210 of the second path, which converts the 32-bit signal to a 6-bit value representing lower 6 bits, i.e. bits numbers 0 to 5 , of first digital output signal phasep.
- first 32-fold sample and hold unit 29 and first thermometer to binary encoder 28 basically determine a value corresponding to a fractional portion of a period of the output signals of VCO 26 .
- First VCO 26 , first asynchronous counter 27 , first 6-fold sample and hold unit 28 , first 32-fold sample and hold unit 29 and first thermometer to binary encoder 210 form a first signal path comprising the above-explained first and second paths.
- a second signal path operating in the same manner on a signal received via second switch 25 is formed by a second VCO 211 , a second asynchronous counter 212 , a second 6-fold sample and hold unit 213 , a second 32-fold sample and hold unit 214 and a second thermometer to binary encoder 215 , which generates a second digital output signal phasen.
- the operation of the second signal path corresponds to the operation of the first signal path described above and will therefore not be described again.
- First digital output signal phasep is fed to a positive input of a subtractor 216
- second digital output signal phasen is fed to a negative input of subtractor 216 , which subtractor 216 generates as an output a 12-bit signal the difference phasep-phasen.
- This difference signal is fed to a first order differentiator 217 which outputs a 12-bit output signal freq in FIG. 2 .
- Signal freq via a switch 218 is fed to a digital distortion correction 219 using a lookup-table which digital distortion correction 219 may for example correct for non-linearities of first VCO 26 and second VCO 211 .
- switch 218 may be switched to feed signal freq to a distortion estimation unit 220 .
- Digital distortion correction unit 219 then outputs a 12-bit output signal out which is a digital representation of the analog differential input signal V inp , V inn .
- FIG. 2 represents a 12-bit analog-to-digital converter, but other bit widths are equally possible by adjusting e.g. the number of output signals of first VCO 26 and second VCO 211 and the number of sample and hold circuits in units 28 , 29 , 213 and 214 accordingly.
- FIGS. 3 to 5 examples for implementations of some elements of some embodiments will be described with reference to FIGS. 3 to 5 . It should be noted that the elements of FIGS. 1 and 2 are not restricted to the ones described in the following, but the following additional description serves merely illustrative purposes.
- oscillators like first VCO 26 , second VCO 211 oscillator 12 and/or oscillator 15 may be implemented as a ring oscillator using a chain of inverters.
- a ring of 16 differential inverters 31 with local interpolation may be used, each inverter outputting four of the output signals of first VCO 26 or second VCO 211 .
- the number of inverters may vary, and in other embodiments instead of inverters with interpolation invertors without interpolation with a corresponding increased number of inverters or oscillators other than ring oscillators may be used.
- inverter 31 outputs output signals number 1 , 2 , 33 and 34 , signals number 33 and 34 being the inverse of signals number 1 and 2 .
- Inverter 32 outputs signals number 3 , 4 , 35 and 36 , signals number 35 and 36 being the inverse of signals number 3 and 4 , up to inverter 33 , which outputs output signals number 31 , 32 , 63 and 0 , signals 63 and 0 being the inverse of signals 31 and 32 , respectively.
- the signal V in is the respective analog input signal, e.g. V inp or V inn in the embodiment of FIG. 2 .
- FIG. 4 An example implementation of interpolating inverters 31 , 32 and/or 33 is shown in FIG. 4 .
- an inverter comprising PMOS transistors 41 , 42 and NMOS transistors 43 , 44 .
- the voltage V in is fed to the gates of PMOS transistors 41 and 42 .
- An input signal which corresponds to an output signal of a previous inverter in the ring shown in FIG. 3 , is fed to the gates of NMOS transistors 43 and 44 , in for example corresponding to the signal output from the output marked with a “+” in FIG. 3 and in corresponds to the signal from the output marked with a “ ⁇ ” in FIG. 3 .
- An output signal out and its inverted version out can be tapped at nodes between PMOS transistor 41 and NMOS transistor 44 for the signal out and between PMOS transistor 42 and NMOS transistor 43 for the signal out .
- the input signals and the output signals are used to form interpolated signals outi, outi as shown in FIG. 4 .
- the signal in would correspond to signal number 2
- the signal in would correspond to signal number 34
- the signal outi would correspond to signal number 3
- the signal outi would correspond to signal 35
- the signal out would correspond to signal number 4
- the signal out would correspond to signal number 36 .
- FIG. 4 is only one implementation of an inverter which is usable in a ring up implementation, and other implementations, in particular implementations without interpolation, are also possible as explained above.
- the example implementation of a sample and hold circuit shown in FIG. 5 comprises PMOS transistors 51 to 54 and 510 to 513 and 516 , NMOS transistors 55 to 58 and 514 , 515 , 517 to 519 .
- 50 denotes a positive supply voltage, for example VDD
- 59 denotes a negative supply voltage, for example VSS or ground.
- clk denotes a clock signal.
- the input signals to the sample and hold circuit of FIG. 5 are denoted D and D , D being the inverse of D.
- 32-fold sample and hold unit 214 of FIG. 2 may comprise 32 circuits as shown in FIG. 5 , a first one of these circuits receiving output signals number 1 and 33 as shown in FIG. 3 , a second one receiving output signals 2 and 34 as shown in FIG. 3 as D and D , respectively, etc.
- the corresponding output signals are labeled Q and Q in FIG. 5 .
- FIG. 5 serves merely as an example, and other sample and hold circuits known in the art may be used as well.
- switches 22 , 25 and 218 are in the position shown in FIG. 2 , and the analog input signal V inp , V inn is converted to a digital output signal out.
- switch 22 couples input 21 with first oscillator 26
- switch 25 couples input 24 with second oscillator 211
- switch 21 couples distortion estimated unit 220 with the output of differentiator 217 .
- a “DC sweep” is performed, i.e. a series of predetermined DC voltages is input.
- the thus applied predetermined input values are converted to signal freq as explained above, and distortion estimation unit 220 compares the signal freq with a target value which target value corresponds to the predetermined analog input value at the corresponding time and, in case the value of freq deviates from the target value, stores a corresponding correction value in a lookup-table which later in the regular mode of operation is used by digital distortion correction unit 219 to correct the output signal. This is performed for a predetermined number of correction points.
- FIG. 6 a digital output value depending on the input signal, i.e. the difference of the input signals applied to inputs 21 and 24 , for a specific implementation of an embodiment are shown.
- a solid line shows the result without correction
- circles show the calibration points and a dashed line then shows the result with correction.
- FIG. 7 shows the non-linearity for the implementation in units of the least significant bit (LSB, i.e. if the non-linearity is e.g. 10 LSB, this means that a digital code output deviates from the “correct” result by 10 LSB) with and without such a correction.
- LSB least significant bit
- the linearity is increased.
- the correction may also be omitted in some embodiments if the linearity without the correction is sufficient for a given application.
- switches 22 , 25 may also be omitted and the same inputs may be used for regular conversion or for calibration.
- bit width shown in FIG. 2 serves only as an example, and other bit widths for the converter are equally possible.
- the number of calibration shown in FIG. 6 also serves only as an example, and any desired number of calibration points to obtain a desired accuracy of calibration may be used.
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8711027B1 (en) * | 2012-11-19 | 2014-04-29 | Western Digital Technologies, Inc. | Analog-to-digital converter with input voltage biasing DC level of resonant oscillator |
US8902529B1 (en) | 2012-11-20 | 2014-12-02 | Western Digital Technologies, Inc. | Dual frequency crystal oscillator |
US9407276B1 (en) * | 2015-06-23 | 2016-08-02 | Silicon Laboratories Inc. | Reducing distortion in an analog-to-digital converter |
US9903892B2 (en) | 2014-09-08 | 2018-02-27 | Qualcomm Incorporated | Low power small area oscillator-based ADC |
US10303125B2 (en) * | 2017-08-25 | 2019-05-28 | Seiko Epson Corporation | Time-to-digital converter, circuit device, physical quantity measuring device, electronic apparatus, and vehicle |
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US8669891B2 (en) * | 2011-07-19 | 2014-03-11 | Lsi Corporation | Systems and methods for ADC based timing and gain control |
EP3035844B1 (en) | 2013-08-20 | 2020-07-15 | The Regents of The University of California | Circuit for electrocorticography signal acquisition |
EP3438620B1 (en) * | 2017-08-02 | 2020-09-30 | Melexis Technologies NV | Closed-loop oscillator based sensor interface circuit |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3514705A (en) * | 1965-08-04 | 1970-05-26 | Collins Radio Co | Digital subtractor circuit |
US3833903A (en) * | 1973-01-02 | 1974-09-03 | Gordon Eng Co | Compensated voltage-controlled oscillator particularly for analog to digital converters |
US5092330A (en) * | 1978-07-20 | 1992-03-03 | Medtronic, Inc. | Analog to digital converter |
US6111533A (en) * | 1998-01-19 | 2000-08-29 | Myson Technology, Inc. | CMOS analog-to-digital converter and temperature sensing device using the same |
US20040155805A1 (en) * | 2003-02-05 | 2004-08-12 | Alcatel | Digital to analog converter, phase control circuit, transmission unit recognition circuit |
US6784822B1 (en) * | 2002-08-20 | 2004-08-31 | Xilinx, Inc. | Method and circuit for folded analog-to-digital converter (ADC) using frequency detectors and time detectors |
US20080036633A1 (en) * | 2006-08-14 | 2008-02-14 | George Stennis Moore | Multiple FM Dither |
US20080084247A1 (en) * | 2006-10-10 | 2008-04-10 | Advantest Corporation | Sigma delta modulator, fractional frequency synthesizer and sigma delta modulating method |
-
2010
- 2010-02-06 US US12/701,549 patent/US8081101B2/en not_active Expired - Fee Related
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3514705A (en) * | 1965-08-04 | 1970-05-26 | Collins Radio Co | Digital subtractor circuit |
US3833903A (en) * | 1973-01-02 | 1974-09-03 | Gordon Eng Co | Compensated voltage-controlled oscillator particularly for analog to digital converters |
US5092330A (en) * | 1978-07-20 | 1992-03-03 | Medtronic, Inc. | Analog to digital converter |
US6111533A (en) * | 1998-01-19 | 2000-08-29 | Myson Technology, Inc. | CMOS analog-to-digital converter and temperature sensing device using the same |
US6784822B1 (en) * | 2002-08-20 | 2004-08-31 | Xilinx, Inc. | Method and circuit for folded analog-to-digital converter (ADC) using frequency detectors and time detectors |
US20040155805A1 (en) * | 2003-02-05 | 2004-08-12 | Alcatel | Digital to analog converter, phase control circuit, transmission unit recognition circuit |
US20080036633A1 (en) * | 2006-08-14 | 2008-02-14 | George Stennis Moore | Multiple FM Dither |
US20080084247A1 (en) * | 2006-10-10 | 2008-04-10 | Advantest Corporation | Sigma delta modulator, fractional frequency synthesizer and sigma delta modulating method |
Non-Patent Citations (11)
Title |
---|
Ahmed, 1.; Mulder, J.; Johns, D.A., "A 50MS/s 9.9m W pipelined ADC with 58dB SNDR in 0.1 8micro-m CMOS using capacitive charge-pumps," Solid-State Circuits Conference-Digest of Technical Papers, 2009. ISSCC 2009. IEEE International, vol., no., pp. 164-165,165a, Feb. 8-12, 2009. |
Brooks, L.; Hae-Seung Lee, "A 12b 50MS/s fully differential zero-crossing-based ADC without CMFB," Solid-State Circuits Conference-Digest of Technical Papers, 2009. ISSCC 2009. IEEE International, vol., no., pp. 166-167,167a, S-12 Feb. 2009. |
Daniels, J.; Dehaene, W.; Steyaert, M.; Wiesbauer, A., "A 350-MHz combined TDC-DTC With 61 ps resolution for asynchronous delta-sigma ADC applications," Solid State Circuits Conference, 2008. A-SSCC 'OS. IEEE Asian, vol., no., pp. 365-368, Nov. 3-5, 2008. |
Daniels, J.; Dehaene, W.; Steyaert, M.; Wiesbauer, A., "A 350-MHz combined TDC-DTC With 61 ps resolution for asynchronous delta-sigma ADC applications," Solid State Circuits Conference, 2008. A-SSCC 'OS. IEEE Asian, vol., no., pp. 365-368, Nov. 3-5, 200S. |
Daniels, J.; Dehaene, W.; Steyaert, M.; Wiesbauer, A., "AID conversion using an Asynchronous Delta-Sigma Modulator and a time-to-digital converter," Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on, vol., no., pp. 164S-1651, IS-May 21, 2008. |
Dhanasekaran, V.; Gambhir, M.; Elsayed, M.M.; Sanchez-Sinencio, E.; Silva Martinez, J.; Mishra, C.; Lei Chen; Pankratz, E., "A 20MHz BW 6SdB DR CT delta-sigma ADC based on a multi-bit time-domain quantizer and feedback element," Solid-State Circuits Conference-Digest of Technical Papers, 2009. ISSCC 2009. IEEE International, vol., no., pp. 174-175,175a, Feb. 8-12, 2009. |
Henzler, S.; Koeppe, S.; Kamp, W.; Mulatz, H.; Schruitt-Landsiedel, D., "90nm 4.7ps-Resolution 0.7-LSB Single-Shot Precision and 19pJ-per-Shot Local Passive Interpolation Time-to-Digital Converter with On-Chip Characterization," Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International, vol., no., pp. 548-635, Feb. 3-7, 2008. |
Henzler, S.; Koeppe, S.; Lorenz, D.; Kamp, W.; Kuenemund, R.; Schmitt-Landsiedel, D., "A Local Passive Time Interpolation Concept for Variation-Tolerant High-Resolution Time-to-Digital Conversion", IEEE Journal of Solid-State Circuits, vol. 43, No. 7, pp. 1666-1676, Jul. 2008. |
Kim, J.; Jang, T.-K.; Yoon, Y.-G.; Cho, S.-H., "Analysis and Design of Voltage Controlled Oscillator-Based Analog-to-Digital Converter," Circuits and Systems I: Regular Papers, IEEE Transactions on : Accepted for future publication vol. PP, Forthcoming, 2009 pp. 1-1. |
Naraghi, S.; Courcy, M.; Flynn, M.P., "A 9b 14microW 0.06mm2 PPM ADC in 90nm digital CMOS," Solid-State Circuits Conference-Digest of Technical Papers, 2009. ISSCC 2009. IEEE International, vol., no., pp. 168-169,169a, Feb. 8-12, 2009. |
Park, M.; Perrott, M., "A O.13micro-m CMOS 78dB SNDR 87mW 20MHz BW CT delta-sigma ADC with VCO-based integrator and quantizer," Solid-State Circuits Conference-Digest of Technical Papers, 2009. ISSCC 2009. IEEE International, vol., no., pp. 170-171,I71a, Feb. 8-12, 2009. |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8711027B1 (en) * | 2012-11-19 | 2014-04-29 | Western Digital Technologies, Inc. | Analog-to-digital converter with input voltage biasing DC level of resonant oscillator |
CN103825613A (en) * | 2012-11-19 | 2014-05-28 | 西部数据技术公司 | Analog-to-digital converter with input voltage biasing dc level of resonant oscillator |
US8902529B1 (en) | 2012-11-20 | 2014-12-02 | Western Digital Technologies, Inc. | Dual frequency crystal oscillator |
US9903892B2 (en) | 2014-09-08 | 2018-02-27 | Qualcomm Incorporated | Low power small area oscillator-based ADC |
US9407276B1 (en) * | 2015-06-23 | 2016-08-02 | Silicon Laboratories Inc. | Reducing distortion in an analog-to-digital converter |
US20160380643A1 (en) * | 2015-06-23 | 2016-12-29 | Silicon Laboratories Inc. | Reducing Distortion In An Analog-To-Digital Converter |
CN106301365A (en) * | 2015-06-23 | 2017-01-04 | 硅实验室公司 | Reduce the distortion in analog-digital converter |
US9748963B2 (en) * | 2015-06-23 | 2017-08-29 | Silicon Laboratories Inc. | Reducing distortion in an analog-to-digital converter |
CN106301365B (en) * | 2015-06-23 | 2019-09-03 | 硅实验室公司 | Reduce the distortion in analog-digital converter |
US10303125B2 (en) * | 2017-08-25 | 2019-05-28 | Seiko Epson Corporation | Time-to-digital converter, circuit device, physical quantity measuring device, electronic apparatus, and vehicle |
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