US7217922B2 - Planar micro-miniature ion trap devices - Google Patents
Planar micro-miniature ion trap devices Download PDFInfo
- Publication number
- US7217922B2 US7217922B2 US11/079,861 US7986105A US7217922B2 US 7217922 B2 US7217922 B2 US 7217922B2 US 7986105 A US7986105 A US 7986105A US 7217922 B2 US7217922 B2 US 7217922B2
- Authority
- US
- United States
- Prior art keywords
- electrode
- electrodes
- ion trap
- micro
- multiplicity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005040 ion trap Methods 0.000 title claims abstract description 62
- 239000000758 substrate Substances 0.000 claims abstract description 22
- 150000002500 ions Chemical class 0.000 claims description 17
- 230000005684 electric field Effects 0.000 claims description 11
- 239000002245 particle Substances 0.000 description 17
- 235000012431 wafers Nutrition 0.000 description 10
- 238000009826 distribution Methods 0.000 description 9
- 239000004020 conductor Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000003754 machining Methods 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000005405 multipole Effects 0.000 description 2
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- 241000819038 Chichester Species 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000005094 computer simulation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000005297 pyrex Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
- H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
Definitions
- Exemplary ion traps are described, for example, by W. Paul et al. in U.S. Pat. No. 2,939,952 issued Jun. 7, 1960.
- One such ion trap known as a quadrupole, is described by R. E. March in “Quadrupole Ion Trap Mass Spectrometer,” Encyclopedia of Analytical Chemistry , R. A. Meyers (Ed.), pp. 11848–11872, John Wiley & Sons, Ltd., Chichester (2000). Both of these documents are incorporated herein by reference.
- Typical trapping cavities 18 have a shape ratio, r 0 /z 0 , that satisfies: (r 0 /z 0 ) 2 ⁇ 2, but the ratio may be smaller to compensate for the finite size of the electrodes 12 – 14 .
- Typical cavities 18 have a size that is described by a value of r 0 in the approximate range of about 0.707 centimeters (cm) to about 1.0 cm. We refer to cavities of this approximate size as macro-cavities.
- electrodes 12 – 14 produce an electric field with a quadrupole distribution inside trapping cavity 18 .
- One way to produce such an electric field involves grounding the end cap electrodes 12 – 13 and applying a radio frequency (RF) voltage to the central ring-shaped electrode 14 .
- RF radio frequency
- ionized particles with small M/Q ratios will propagate along stable trajectories.
- the cavity 18 is voltage-biased as described above, and ionized particles are introduced into the trapping cavity 18 via ion generator 19 . 1 coupled to entrance port 19 . 2 in top end cap electrode 12 .
- the trapping cavity 18 is maintained with a low background pressure; e.g., about 10 ⁇ 3 Torr of helium (He) gas. Then, collisions between the background He atoms and ionized particles lower the particles' momenta, thereby enabling trapping of such particles in the central region of the trapping cavity 18 .
- a low background pressure e.g., about 10 ⁇ 3 Torr of helium (He) gas.
- a small RF voltage may be applied to the bottom end cap electrode 13 while ramping the small voltage so that stored particles are ejected through exit orifice 19 . 4 selectively according to their M/Q ratios.
- ions can be ejected by changing the amplitude of the RF voltage applied to the ring electrode 14 . As the amplitude changes, different orbits corresponding to different M/Q ratios become unstable, and ions are ejected along the z-axis. Ions can also be excited by application of DC and AC voltages to the end cap electrodes 12 – 13 . In any case, the ejected ions are then incident on a utilization device 19 . 3 (e.g., an ion collector), which is coupled to orifice 19 . 4 .
- a utilization device 19 . 3 e.g., an ion collector
- the trapping cavity's height-to-diameter ratio will reduce the magnitude of higher multipole contributions to the created electric field distribution.
- the height-to-diameter ratio is between about 0.83 and 1.00, the octapole contribution to the field distribution is small; e.g., this contribution vanishes if the ratio is about 0.897.
- the effects of higher multipole distribution are often small enough so that the macro-cavity is able to trap and store ionized particles. See, for example, J. M. Ramsey et al., U.S. Pat. No. 6,469,298 issued on Nov. 22, 2002 and M. Wells et al., Analytical Chem ., Vol. 70, No. 3, pp. 438–444 (1998), both which are incorporated herein by reference.
- FIG. 1 is a schematic, cross sectional view of a prior art ion trap having a hyperbolic macro-cavity
- FIG. 2 is a schematic, cross sectional view of a prior art ion trap having a cylindrical macro-cavity
- FIG. 3A is a schematic, cross-sectional view of the device of FIG. 3 taken along line A—A;
- FIG. 5 is a graph showing the calculated potential of a three-electrode structure of the type depicted in FIG. 3 ;
- FIG. 6 is schematic, side view of a portion of a micro-miniature ion trap device showing how vias are used to gain electrical access to the completely annular electrodes of the type shown in FIG. 3 , for example, in accordance with yet another embodiment of our invention;
- FIG. 7 is a schematic, top view of a micro-miniature ion trap device in accordance with one embodiment of our invention in which two concentric electrodes are completely annular;
- FIG. 8 is a graph showing the calculated potential of a two-electrode structure of the type depicted in FIG. 7 ;
- FIG. 10 is a schematic, top view of an array of micro-miniature ion trap devices of the type shown in FIG. 9 , in accordance with still another embodiment of our invention.
- FIG. 11 is a schematic, top view of a micro-miniature ion trap electrode structure in which the first electrode is completely annular and square, whereas the second electrode has a partially annular, C-shaped configuration, which is also square, in accordance with another embodiment of our invention
- FIG. 12 is a schematic, top view of a micro-miniature ion trap electrode structure in which the first electrode is completely annular and hyperbolic, whereas the second electrode has a partially annular, C-shaped configuration, which is also hyperbolic, in accordance with another embodiment of our invention.
- the substrate or wafer 30 . 4 may comprise a semiconductor or dielectric material.
- semiconductor materials include silicon-based semiconductors (e.g., Si or SiC) and Group III-V compound semiconductors (e.g., InP or GaAs).
- Group III-V compound semiconductors e.g., InP or GaAs.
- dielectric materials include ceramics (e.g., alumina) and glasses (e.g., pyrex or quartz).
- substrates that are a combination of such materials are also suitable (e.g., SOI substrates known as silicon-on-insulator wafers).
- the width of the electrode 30 . 2 is twice that of electrode 30 . 1
- the width of electrode 30 . 3 is three times that of electrode 30 . 2 .
- the electrodes are separated from one another by a constant gap distance g, and the electrodes are separated from the substrate by a distance d; then we prefer that r 1 ⁇ d and g ⁇ r 1 .
- first and second electrodes may be completely annular in that the annulus of each electrode forms a closed geometric figure, as shown, for example, in FIGS. 3 and 7 ; or the first electrode may be completely annular, but the second electrode only partially annular, in that it does not form a closed geometric shape; that is, the annulus of the second electrode has a slot or opening allowing electrical access to the first electrode, as shown, for example, in FIGS. 9–12 and described hereinafter.
- FIG. 6 illustrates the use of vias, which is particularly suited for designs that include completely annular outer electrodes
- FIGS. 9–12 illustrate the use of a C-shaped, partially annular outer electrode, which obviates the need for vias in two-annular-electrode designs.
- FIG. 6 can readily be extended to ion trap devices that have only two annular electrodes or to such devices having more than three annular electrodes.
- FIGS. 9–12 we show two-electrode, concentric designs in FIGS. 9–12 in which the inner electrode is still completely annular but the outer electrode is partially annular (e.g., C-shaped). (For simplicity the substrate, wafer and any other supporting layers lying beneath the electrodes have been omitted.) More specifically, in FIG. 9 the inner electrode 90 . 1 is completely annular and circular, whereas outer electrode 90 . 2 is C-shaped and circular. Thus, the C-shaped electrode 90 .
- the angle subtended by the C-shape should be greater than 180 degrees and not so large that the requisite quadrupole potential for ion trapping cannot be attained.
- the opening should be made as small as possible so that, on the one hand, a conductor (e.g., 90 . 3 , 110 . 3 , 120 . 3 ) can still reach the inner electrode ( 90 . 1 , 110 . 1 , 120 . 1 ) without shorting against the edges of the outer electrode ( 90 . 2 , 110 . 2 , 120 . 2 ) at the mouth of the opening and, on the other hand, should allow the requisite quadrupole potential for ion trapping to be attained.
- a conductor e.g., 90 . 3 , 110 . 3 , 120 . 3
- an array of detectors may be coupled to the array of ion trap devices (e.g., each detector coupled to at least one ion trap device), or a single broad area detector may be coupled to the entire array of ion trap devices.
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
Claims (19)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/079,861 US7217922B2 (en) | 2005-03-14 | 2005-03-14 | Planar micro-miniature ion trap devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/079,861 US7217922B2 (en) | 2005-03-14 | 2005-03-14 | Planar micro-miniature ion trap devices |
Publications (2)
Publication Number | Publication Date |
---|---|
US20060219888A1 US20060219888A1 (en) | 2006-10-05 |
US7217922B2 true US7217922B2 (en) | 2007-05-15 |
Family
ID=37069180
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/079,861 Active US7217922B2 (en) | 2005-03-14 | 2005-03-14 | Planar micro-miniature ion trap devices |
Country Status (1)
Country | Link |
---|---|
US (1) | US7217922B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
EP2390899A1 (en) | 2010-05-27 | 2011-11-30 | Universität Innsbruck | Apparatus and method for trapping charged particles and performing controlled interactions between them |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US10141178B2 (en) | 2013-03-15 | 2018-11-27 | The University Of North Carolina At Chapel Hill | Miniature charged particle trap with elongated trapping region for mass spectrometry |
US10242857B2 (en) | 2017-08-31 | 2019-03-26 | The University Of North Carolina At Chapel Hill | Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2632578A1 (en) * | 2005-12-13 | 2007-08-09 | Brigham Young University | Miniature toroidal radio frequency ion trap mass analyzer |
WO2012167125A1 (en) * | 2011-06-03 | 2012-12-06 | Purdue Research Foundation | Ion traps and methods of use thereof |
US8859961B2 (en) * | 2012-01-06 | 2014-10-14 | Agilent Technologies, Inc. | Radio frequency (RF) ion guide for improved performance in mass spectrometers |
US8637817B1 (en) * | 2013-03-01 | 2014-01-28 | The Rockefeller University | Multi-pole ion trap for mass spectrometry |
US9711341B2 (en) | 2014-06-10 | 2017-07-18 | The University Of North Carolina At Chapel Hill | Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods |
US9558908B2 (en) * | 2015-04-30 | 2017-01-31 | Honeywell International Inc. | Apparatuses, systems, and methods for ion traps |
US9406492B1 (en) * | 2015-05-12 | 2016-08-02 | The University Of North Carolina At Chapel Hill | Electrospray ionization interface to high pressure mass spectrometry and related methods |
CN104900474B (en) * | 2015-05-26 | 2017-02-01 | 清华大学深圳研究生院 | Serially-connected ion trap |
US11348778B2 (en) * | 2015-11-02 | 2022-05-31 | Purdue Research Foundation | Precursor and neutral loss scan in an ion trap |
CN110164749B (en) * | 2019-04-30 | 2024-06-07 | 宁波大学 | Asymmetric triangular electrode structure ion trap |
CN110164750B (en) * | 2019-04-30 | 2024-06-07 | 宁波大学 | Asymmetric triangular electrode structure ion trap |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2939952A (en) | 1953-12-24 | 1960-06-07 | Paul | Apparatus for separating charged particles of different specific charges |
US3065640A (en) | 1959-08-27 | 1962-11-27 | Thompson Ramo Wooldridge Inc | Containment device |
US5248883A (en) * | 1991-05-30 | 1993-09-28 | International Business Machines Corporation | Ion traps of mono- or multi-planar geometry and planar ion trap devices |
US6469298B1 (en) | 1999-09-20 | 2002-10-22 | Ut-Battelle, Llc | Microscale ion trap mass spectrometer |
-
2005
- 2005-03-14 US US11/079,861 patent/US7217922B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2939952A (en) | 1953-12-24 | 1960-06-07 | Paul | Apparatus for separating charged particles of different specific charges |
US3065640A (en) | 1959-08-27 | 1962-11-27 | Thompson Ramo Wooldridge Inc | Containment device |
US5248883A (en) * | 1991-05-30 | 1993-09-28 | International Business Machines Corporation | Ion traps of mono- or multi-planar geometry and planar ion trap devices |
US6469298B1 (en) | 1999-09-20 | 2002-10-22 | Ut-Battelle, Llc | Microscale ion trap mass spectrometer |
Non-Patent Citations (6)
Title |
---|
C. Pai et al., U.S. Appl. No. 10/656,432, filed on Sep. 5, 2003 (no copy enclosed). |
C. Pai et al., U.S. Appl. No. 10/789,091, filed on Feb. 27, 2004 (no copy enclosed). |
J. Chiaverini et al., "Dense Coding Demonstration and Microfabricated Ion Traps," presented at the Workshop on Trapped Ion Quantum Computing, May 13-15, 2004, University of Michigan, Ann Arbor; see the NIST Boulder website at URL www. boulder.nist.gov/timefreq/ion/tiqc1.pdf. |
J. M. Wells et al., "A Quadrupole Ion Trap with Cylindrical Geometry Operated in the Mass-Selective Instability Mode," Analytical Chem., vol. 70, No. 3, pp. 438-444 (Feb. 1998). |
R. E. March, "Quadrupole Ion Trap Mass Spectrometer," Encyclopedia of Analytical Chemistry, R. A. Meyers (Ed.), pp. 11848-11872, John Wiley & Sons, Ltd., Chichester (2000). |
S. Pau et al., U.S. Appl. No. 11/048,229, filed on Feb. 1, 2005 (no copy enclosed). |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US8704168B2 (en) | 2007-12-10 | 2014-04-22 | 1St Detect Corporation | End cap voltage control of ion traps |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
EP2390899A1 (en) | 2010-05-27 | 2011-11-30 | Universität Innsbruck | Apparatus and method for trapping charged particles and performing controlled interactions between them |
US20110290995A1 (en) * | 2010-05-27 | 2011-12-01 | Universitat Innsbruck | Apparatus and method for trapping charged particles and performing controlled interactions between them |
US8426809B2 (en) * | 2010-05-27 | 2013-04-23 | Universität Innsbruck | Apparatus and method for trapping charged particles and performing controlled interactions between them |
US10141178B2 (en) | 2013-03-15 | 2018-11-27 | The University Of North Carolina At Chapel Hill | Miniature charged particle trap with elongated trapping region for mass spectrometry |
US11158496B2 (en) | 2013-03-15 | 2021-10-26 | The University Of North Carolina At Chapel Hill | Miniature charged particle trap with elongated trapping region for mass spectrometry |
US10242857B2 (en) | 2017-08-31 | 2019-03-26 | The University Of North Carolina At Chapel Hill | Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods |
US10937640B2 (en) | 2017-08-31 | 2021-03-02 | The University Of North Carolina At Chapel Hill | Ion traps with y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods |
Also Published As
Publication number | Publication date |
---|---|
US20060219888A1 (en) | 2006-10-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7217922B2 (en) | Planar micro-miniature ion trap devices | |
US8193489B2 (en) | Converging multipole ion guide for ion beam shaping | |
US7154088B1 (en) | Microfabricated ion trap array | |
US6870158B1 (en) | Microfabricated cylindrical ion trap | |
US9053915B2 (en) | Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure | |
US6075244A (en) | Mass spectrometer | |
US20170372883A1 (en) | Ion Trap Mass Spectrometer | |
US8859961B2 (en) | Radio frequency (RF) ion guide for improved performance in mass spectrometers | |
US9129787B2 (en) | Mass spectrometer | |
US6911650B1 (en) | Method and apparatus for multiple frequency multipole | |
US8927940B2 (en) | Abridged multipole structure for the transport, selection and trapping of ions in a vacuum system | |
US9184040B2 (en) | Abridged multipole structure for the transport and selection of ions in a vacuum system | |
EP1623445A2 (en) | Asymmetric-field ion guiding devices | |
US7227138B2 (en) | Virtual ion trap | |
US20050061767A1 (en) | Wafer-based ion traps | |
CA2217255A1 (en) | Quadrupole mass spectrometers | |
US12119214B2 (en) | Ion guide with varying multipoles | |
EP0878828B1 (en) | Method and apparatus for analysing and detecting a charge-neutral liquid or gas sample | |
Cruz et al. | Design, microfabrication, and analysis of micrometer-sized cylindrical ion trap arrays | |
US7012250B1 (en) | Wafer supported, out-of-plane ion trap devices | |
US20130009050A1 (en) | Abridged multipole structure for the transport, selection, trapping and analysis of ions in a vacuum system | |
US20220367164A1 (en) | Microfabricated ion trap with improved thermal characteristics | |
US8314385B2 (en) | System and method to eliminate radio frequency coupling between components in mass spectrometers | |
CA2837873C (en) | Abridged multipole structure for the transport, selection and trapping of ions in a vacuum system | |
BE1003551A3 (en) | CYCLOTRONS FOCUSED BY SECTORS. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: LUCENT TECHNOLOGIES INC., NEW JERSEY Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:JACHOWSKI, MATTHEW DOUGLAS APAU;LOW, YEE LENG;PAU, STANLEY;REEL/FRAME:017986/0782;SIGNING DATES FROM 20050308 TO 20050309 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
AS | Assignment |
Owner name: PROVENANCE ASSET GROUP LLC, CONNECTICUT Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:NOKIA TECHNOLOGIES OY;NOKIA SOLUTIONS AND NETWORKS BV;ALCATEL LUCENT SAS;REEL/FRAME:043877/0001 Effective date: 20170912 Owner name: NOKIA USA INC., CALIFORNIA Free format text: SECURITY INTEREST;ASSIGNORS:PROVENANCE ASSET GROUP HOLDINGS, LLC;PROVENANCE ASSET GROUP LLC;REEL/FRAME:043879/0001 Effective date: 20170913 Owner name: CORTLAND CAPITAL MARKET SERVICES, LLC, ILLINOIS Free format text: SECURITY INTEREST;ASSIGNORS:PROVENANCE ASSET GROUP HOLDINGS, LLC;PROVENANCE ASSET GROUP, LLC;REEL/FRAME:043967/0001 Effective date: 20170913 |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 12 |
|
AS | Assignment |
Owner name: ALCATEL-LUCENT USA INC., NEW JERSEY Free format text: CHANGE OF NAME;ASSIGNOR:LUCENT TECHNOLOGIES INC.;REEL/FRAME:049887/0613 Effective date: 20081101 |
|
AS | Assignment |
Owner name: NOKIA US HOLDINGS INC., NEW JERSEY Free format text: ASSIGNMENT AND ASSUMPTION AGREEMENT;ASSIGNOR:NOKIA USA INC.;REEL/FRAME:048370/0682 Effective date: 20181220 |
|
AS | Assignment |
Owner name: PROVENANCE ASSET GROUP LLC, CONNECTICUT Free format text: RELEASE BY SECURED PARTY;ASSIGNOR:CORTLAND CAPITAL MARKETS SERVICES LLC;REEL/FRAME:058983/0104 Effective date: 20211101 Owner name: PROVENANCE ASSET GROUP HOLDINGS LLC, CONNECTICUT Free format text: RELEASE BY SECURED PARTY;ASSIGNOR:CORTLAND CAPITAL MARKETS SERVICES LLC;REEL/FRAME:058983/0104 Effective date: 20211101 Owner name: PROVENANCE ASSET GROUP LLC, CONNECTICUT Free format text: RELEASE BY SECURED PARTY;ASSIGNOR:NOKIA US HOLDINGS INC.;REEL/FRAME:058363/0723 Effective date: 20211129 Owner name: PROVENANCE ASSET GROUP HOLDINGS LLC, CONNECTICUT Free format text: RELEASE BY SECURED PARTY;ASSIGNOR:NOKIA US HOLDINGS INC.;REEL/FRAME:058363/0723 Effective date: 20211129 |
|
AS | Assignment |
Owner name: RPX CORPORATION, CALIFORNIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:PROVENANCE ASSET GROUP LLC;REEL/FRAME:059352/0001 Effective date: 20211129 |
|
AS | Assignment |
Owner name: BARINGS FINANCE LLC, AS COLLATERAL AGENT, NORTH CAROLINA Free format text: PATENT SECURITY AGREEMENT;ASSIGNOR:RPX CORPORATION;REEL/FRAME:063429/0001 Effective date: 20220107 |
|
AS | Assignment |
Owner name: RPX CORPORATION, CALIFORNIA Free format text: RELEASE OF LIEN ON PATENTS;ASSIGNOR:BARINGS FINANCE LLC;REEL/FRAME:068328/0278 Effective date: 20240802 |
|
AS | Assignment |
Owner name: BARINGS FINANCE LLC, AS COLLATERAL AGENT, NORTH CAROLINA Free format text: PATENT SECURITY AGREEMENT;ASSIGNORS:RPX CORPORATION;RPX CLEARINGHOUSE LLC;REEL/FRAME:068328/0674 Effective date: 20240802 |