US4911905A - Method of forming stoichiometric II-VI compounds of high purity - Google Patents
Method of forming stoichiometric II-VI compounds of high purity Download PDFInfo
- Publication number
- US4911905A US4911905A US07/315,077 US31507789A US4911905A US 4911905 A US4911905 A US 4911905A US 31507789 A US31507789 A US 31507789A US 4911905 A US4911905 A US 4911905A
- Authority
- US
- United States
- Prior art keywords
- cadmium
- tellurium
- cadmium telluride
- chamber
- telluride
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims abstract description 24
- 150000001875 compounds Chemical class 0.000 title description 3
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims abstract description 61
- 229910052793 cadmium Inorganic materials 0.000 claims abstract description 60
- 229910052714 tellurium Inorganic materials 0.000 claims abstract description 57
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims abstract description 56
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims abstract description 54
- 239000012535 impurity Substances 0.000 claims abstract description 25
- 239000007789 gas Substances 0.000 claims abstract description 23
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 15
- 238000006243 chemical reaction Methods 0.000 claims abstract description 8
- 238000010438 heat treatment Methods 0.000 claims abstract description 8
- 239000000463 material Substances 0.000 claims description 9
- 239000001257 hydrogen Substances 0.000 claims description 6
- 229910052739 hydrogen Inorganic materials 0.000 claims description 6
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 5
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 5
- 229910052799 carbon Inorganic materials 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 229910052717 sulfur Inorganic materials 0.000 claims description 3
- 239000003039 volatile agent Substances 0.000 claims description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 2
- 239000011593 sulfur Substances 0.000 claims 2
- 229910052757 nitrogen Inorganic materials 0.000 claims 1
- 239000002244 precipitate Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 13
- 239000013078 crystal Substances 0.000 description 9
- 239000010453 quartz Substances 0.000 description 8
- 238000000746 purification Methods 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000005864 Sulphur Substances 0.000 description 3
- 239000003708 ampul Substances 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 238000009833 condensation Methods 0.000 description 3
- 230000005494 condensation Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- CXKCTMHTOKXKQT-UHFFFAOYSA-N cadmium oxide Inorganic materials [Cd]=O CXKCTMHTOKXKQT-UHFFFAOYSA-N 0.000 description 2
- CFEAAQFZALKQPA-UHFFFAOYSA-N cadmium(2+);oxygen(2-) Chemical class [O-2].[Cd+2] CFEAAQFZALKQPA-UHFFFAOYSA-N 0.000 description 2
- MCMSPRNYOJJPIZ-UHFFFAOYSA-N cadmium;mercury;tellurium Chemical compound [Cd]=[Te]=[Hg] MCMSPRNYOJJPIZ-UHFFFAOYSA-N 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 239000012467 final product Substances 0.000 description 2
- 229930195733 hydrocarbon Natural products 0.000 description 2
- 150000002430 hydrocarbons Chemical class 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 241000894007 species Species 0.000 description 2
- 239000012808 vapor phase Substances 0.000 description 2
- 238000009834 vaporization Methods 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B9/00—General processes of refining or remelting of metals; Apparatus for electroslag or arc remelting of metals
- C22B9/02—Refining by liquating, filtering, centrifuging, distilling, or supersonic wave action including acoustic waves
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B19/00—Selenium; Tellurium; Compounds thereof
- C01B19/007—Tellurides or selenides of metals
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B19/00—Selenium; Tellurium; Compounds thereof
- C01B19/02—Elemental selenium or tellurium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B17/00—Obtaining cadmium
- C22B17/06—Refining
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P10/00—Technologies related to metal processing
- Y02P10/20—Recycling
Definitions
- This invention relates to a method of purifying cadmium and tellurium and to a method of combining the purified cadmium and tellurium to form stoichiometric cadmium telluride.
- the cadmium telluride In the growth of mercury cadmium telluride liquid phase epitaxial films on cadmium telluride substrates, it is essential that the cadmium telluride be of the highest possible purity so that impurities from the cadmium telluride substrate do not change the electrical properties of the mercury cadmium telluride film. Also, in the growth of cadmium telluride crystals for use as substrates, it is extremely desirable that the starting cadmium telluride material be as close to stoichiometry as can be achieved. While such materials are presently available, they are extremely expensive due to the very high cost of relatively pure cadmium and tellurium.
- cadmium and tellurium are placed at the bottom of an ampoule, the ampoule then being evacuated and sealed and the cadmium and tellurium then being melted to form cadmium telluride. In this procedure there is a problem of sticking to the amorphous quartz ampoule.
- a quartz tube is provided with a plurality of quartz rings spaced apart therein and with cadmium placed at the bottom portion of the tube beneath the bottom-most ring and tellurium placed in the tube downstream of the second quartz ring.
- the tube is evacuated and then a heater is placed opposite the cadmium to cause the cadmium to evaporate and move into the region between the first and second ring, this being done at a temperature in the range of 400 to 500 degrees C.
- the cadmium residue has been analyzed and found to be cadmium oxide.
- the heater is then moved between the first and second rings and causes the cadmium to move further downstream of the second ring and contact the tellurium.
- the furnace is then moved up beyond the second ring and causes the tellurium and cadmium to combine to form cadmium telluride.
- the cadmium telluride does not stick to the quartz tube and therefore it is clear that the end product is pure. However, as stated above, this procedure does not lend itself to commercial production of cadmium telluride which is of high purity, single crystal and stoichiometric in nature.
- a method of purifying cadmium and tellurium constituents and reacting these purified constituents to form stoichiometric cadmium telluride which is composed of small single crystals and is of consistent composition makes use of thermodynamic calculations which show that advantages chemical purification for certain elements such as carbon and sulphur can be realized by exposing cadmium, tellurium or cadmium telluride to a reducing atmosphere containing water vapor.
- atmosphere can be hydrogen or forming gas (10% H 2 , 90% N 2 ) as examples.
- the purification of these elements occurs because, at elevated temperatures, they react with water to form hydrogen and a gas, e.g., C+H 2 O ⁇ H 2 +CO.
- the water does not react with cadmium, tellurium or cadmium telluride if the gas is reducing in nature.
- the method further makes use of the purification which occurs during a distillation operation.
- This technique utilizes differences in vapor pressure of elements. If, for example, cadmium or tellurium are raised to suitable temperatures, they will evaporate at appreciable rates. Impurities with high vapor pressures will also evaporate rapidly whereas materials with low vapor pressures will show extremely slow evaporation.
- impure cadmium is placed in a boat in a first chamber and impure tellurium is placed in a boat in a second chamber, both the boat and the chamber preferably being formed of vitreous silica or high purity aluminum oxide, with each chamber having an exit into a common region.
- the chamber containing the cadmium is heated to a temperature to provide evaporation of the cadmium to provide some predetermined vapor pressure at the temperature in the chamber and the chamber containing the tellurium is raised to a temperature so that the tellurium will evaporate at the same vapor pressure as that of the cadmium to provide, at the common output of the two chambers, an essentially stoichiometric amount of cadmium and tellurium.
- wet forming gas or hydrogen in a reducing atmosphere is passed through each of the two chambers to react with the impurities, those impurities having a vapor pressure the same as or greater than the cadmium or tellurium being vaporized and passing out of the chamber exits along with the cadmium and tellurium, whereas those impurities having a vapor pressure lower than the cadmium or tellurium remaining in the boats in the chambers.
- the cadmium and tellurium react with each other upon combining at the exit of the two chambers in a further tapered chamber in a first region thereof having an elevated temperature of about 1000 degrees C.
- FIG. 1 is a schematic diagram of a cadmium and tellurium purification system with cadmium telluride formation in accordance with the present invention.
- FIG. 2 is an enlarged view of the encircled portion of FIG. 1 at outlet 15.
- FIG. 1 there is shown a schematic diagram of a purification system for providing pure cadmium and tellurium in stoichiometric quantities to form crystalline cadmium telluride which is pure and of the proper stoichiometry.
- the system includes a reactor tube 1 which is preferably formed of vitreous quartz and which has a pair of fittings 3 and 5 at opposite ends thereof. The fittings 3 and 5 seal off the ends of the reactor tube 1 except for tubes 7, 9 and 23 passing therethrough which will now be explained.
- the fitting 3 includes a pair of tubes 7 and 9 passing therethrough, the tube 9 passing to a first chamber 11 in which is disposed a vitreous quartz boat 13 having impure cadmium therein.
- the chamber 11 has an outlet 15 having a constriction 16 as shown in FIG. 2.
- a tapered ceramic tube 17 is disposed within tube 1, abuts the constriction 16 at its wide end and is adjacent the outlets of chambers 11 and 19 for reasons as will be explained hereinbelow.
- the inlet tube 7 passes to the chamber 19 within the reactor tube 1, the chamber 19 including a ceramic quartz boat 21 in which is disposed impure tellurium.
- the outlet of the chamber 19 passes to the inlet of the tapered tube 17 at which point the output gasses from the chambers 11 and 19 will mix.
- the tapered ceramic tube 17 passes for an extended distance within the reactor tube 1 as will be explained in more detail hereinbelow and then the reactor tube alone continues to the fitting 5 through which is disposed the outlet tube 23 to an exhaust system and scrubbers and other desirable
- furnace elements 25, 27, 29, 31 and 33 are disposed along the reactor tube 1, the first furnace element 25 being disposed around the chamber 11 containing the cadmium in the boat 13, the second element 27 being disposed about the chamber 19 and tellurium containing boat 19, the third element 29 being disposed for a small region along the inlet to the tapered tube 17 at the outlet of the chambers 11 and 19, the fourth element 31 being disposed about a major portion of the tapered tube 17 and a fifth element 33 being disposed about the downstream end portion of the tapered tube 17 and beyond and along the reactor tube 1.
- the purpose of the five furnace elements is, in the case of the element 25 over the cadmium containing boat 13 and the element 27 over the tellurium containing boat 21, to provide the proper vapor pressure in each chamber so that the same amounts of cadmium and tellurium will evaporate on a time basis for reaction externally to these chambers at the inlet to tapered tube 17.
- Preferable temperatures for these elements are 450 degrees C. for element 25 and 500 degrees C. for element 27, it being understood that these temperatures can be altered to provide proper stoichiometric amounts of the volatilized elements so long as the temperature is high enough to provide rapid volatilization.
- the element 29 is positioned at the outlet of the chambers 11 and 19 and is at a temperature designed to cause rapid reaction between the cadmium and tellurium to form cadmium telluride and also to maintain the cadmium telluride thus formed in the vapor state.
- a preferred temperature of 1000 degrees C. is utilized for the element 29.
- the heating element 31 is designed to provide a temperature within the tapered tube which is sufficiently low to cause condensation of the cadmium telluride within the tapered tube. Accordingly, the reacted cadmium telluride will condense in the tapered tube 17 in the region within the heating element 31.
- the heating element 33 is designed to be at a temperature so that cadmium telluride will not condense in that zone.
- a mixture of water and a reducing agent such as hydrogen, forming gas (10% H 2 , 90% N 2 ) or the like is passed through the tube 7 and 9 into the chambers 11 and 19.
- a reducing agent such as hydrogen, forming gas (10% H 2 , 90% N 2 ) or the like
- the cadmium and tellurium will volatilize and any gasses formed in these chambers, by existence themselves or by reaction of impurities with the water, which have a vapor pressure higher than the cadmium or tellurium, will also volatilize and pass out of these chambers.
- compounds will be formed with hydrocarbons that may be present with carbon itself, with sulphur, and the like, as is readily apparent.
- the system is shut down, the tapered tube 17 is removed and the cadmium telluride thereon or therein is removed therefrom, this cadmium telluride being pure and therefore not sticking to the quartz tapered tube 17. Impurities havig a vapor pressure lower than the cadmium or tellurium will remain in the boats. The system is then set up for operation again and the cycle is repeated.
- the reactor performs a multitude of functions, these being the fact that the furnace elements heat the cadmium and tellurium to temperatures at which vaporization occurs at a desired rate, thereby providing purification thereof within the chambers 11 and 19.
- impurities with low vapor pressures are left in the boats 13 and 21.
- certain impurities such as hydrocarbons and sulphur are also volatilized with the cadmium and tellurium but they react with the water in the flowing gas to produce harmless gases which pass out of the system.
- the cadmium and tellurium flow to the tapered tube 17 where they are mixed for the first time in a zone at 1000 degrees C.
- cadmium telluride which has a vapor pressure substantially lower than cadmium or tellurium at the same temperature, however, at 1000 degrees C. the cadmium telluride has little tendency to deposit, thus the initial end of the tapered tube remains clean.
- the cadmium telluride vapors move to the 800 degree zone which is low enough in temperature for condensation to occur.
- the condensation process consists of the growth of cadmium telluride crystals possessing nearly perfect stoichiometry.
- the 800 degrees C. temperature is too high for cadmium, tellurium or volatile impurities to condense and therefore they move down the tube.
- the cadmium telluride which grows in the tapered tube posseses exceptional purity and stoichiometry.
- the excess cadmium and/or tellurium and the impurities exit from the tube into the scrubber system which removes them from the carrier gas if desired.
- the scrubber system which removes them from the carrier gas if desired.
- zone temperatures By proper control of zone temperatures, gas velocities and zone lengths, a high yield process can be obtained.
- the tapered tube can be removed from the reactor and the cadmium telluride released into a storage chamber.
- the cadmium and tellurium can be placed in separate chambers connected with the reactor tube in a Y or T configuration.
- the process described also lends itself to automation where, by using appropriate interlock chambers, the cadmium and tellurium are maintained at desired levels in their boats. Therefore, when the systems would be opened only to remove the cadmium telluride but not to refill the cadmium and telluride boats, operation can continue on a continuous basis.
- the invention is not restricted to the design described.
- Impurity elements possessing low vapor pressure at the preferred temperatures for the Cd and Te zones e.g., Fe, Mn, Cu etc.
- These impurity elements might form an oxide coating due to reaction with the H 2 O vapor but would still would remain in the boat.
- a third zone containing Zn could be attached to the system to permit the compounding of (Cd,Zn)Te which is a popular substrate material.
- the zinc furnace element would be set to 550 degrees C.; the impure cadmium would be heated to about 450 degrees C.; the impure tellurium would be heated to about 500 degrees C.; the cadmium zinc telluride would form at about 1000 degrees C. and be solidified at about 800 degrees C.
- doping e.g. with As
- a separate zone could be attached to the system for this purpose. Of course, each zone attached to the system would have to be maintained at its proper temperature to create the desired concentration of the specie in the vapor phase, and consequently the proper composition of the final product.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/315,077 US4911905A (en) | 1988-10-03 | 1989-02-24 | Method of forming stoichiometric II-VI compounds of high purity |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US25389788A | 1988-10-03 | 1988-10-03 | |
| US07/315,077 US4911905A (en) | 1988-10-03 | 1989-02-24 | Method of forming stoichiometric II-VI compounds of high purity |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US25389788A Continuation-In-Part | 1988-10-03 | 1988-10-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US4911905A true US4911905A (en) | 1990-03-27 |
Family
ID=26943666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/315,077 Expired - Fee Related US4911905A (en) | 1988-10-03 | 1989-02-24 | Method of forming stoichiometric II-VI compounds of high purity |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | US4911905A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5742060A (en) * | 1994-12-23 | 1998-04-21 | Digirad Corporation | Medical system for obtaining multiple images of a body from different perspectives |
| US5786597A (en) * | 1994-12-23 | 1998-07-28 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US6055450A (en) * | 1994-12-23 | 2000-04-25 | Digirad Corporation | Bifurcated gamma camera system |
| US20100080750A1 (en) * | 2008-09-30 | 2010-04-01 | Audet Nicholas | Cadmium telluride production process |
| WO2011153994A3 (en) * | 2010-05-31 | 2012-03-15 | Albert-Ludwigs-Universität Freiburg | Method for growing ii-vi semiconductor crystals and ii-vi semiconductor crystals |
| CN103420346A (en) * | 2012-05-22 | 2013-12-04 | 广东先导稀材股份有限公司 | Preparation method for cadmium telluride |
| CN113428844A (en) * | 2021-06-25 | 2021-09-24 | 铜陵有色金属集团股份有限公司 | Production equipment and production process of 6N-grade high-purity tellurium |
| CN114906825A (en) * | 2022-07-19 | 2022-08-16 | 矿冶科技集团有限公司 | Method for preparing cadmium telluride powder by wet method |
| CN116395646A (en) * | 2023-03-17 | 2023-07-07 | 广东长信精密设备有限公司 | A kind of tellurium ingot casting method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1963546A (en) * | 1932-08-10 | 1934-06-19 | American Zinc Lead & Smelting | Process for making pigments |
| SU138056A1 (en) * | 1960-03-18 | 1960-11-30 | А.К. Мелик-Шахназарян | The method of obtaining cadmium |
| US4401463A (en) * | 1981-09-24 | 1983-08-30 | Sab Nife Ab | Process for the recovery of metals from the scrap from nickel-cadmium electric storage batteries |
-
1989
- 1989-02-24 US US07/315,077 patent/US4911905A/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1963546A (en) * | 1932-08-10 | 1934-06-19 | American Zinc Lead & Smelting | Process for making pigments |
| SU138056A1 (en) * | 1960-03-18 | 1960-11-30 | А.К. Мелик-Шахназарян | The method of obtaining cadmium |
| US4401463A (en) * | 1981-09-24 | 1983-08-30 | Sab Nife Ab | Process for the recovery of metals from the scrap from nickel-cadmium electric storage batteries |
Non-Patent Citations (2)
| Title |
|---|
| Kogtev et al., "Inorg. Mat.", vol. 14, No. 1, 1/78, pp. 30-32. |
| Kogtev et al., Inorg. Mat. , vol. 14, No. 1, 1/78, pp. 30 32. * |
Cited By (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6541763B2 (en) | 1994-12-23 | 2003-04-01 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US5742060A (en) * | 1994-12-23 | 1998-04-21 | Digirad Corporation | Medical system for obtaining multiple images of a body from different perspectives |
| US5847396A (en) * | 1994-12-23 | 1998-12-08 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US6055450A (en) * | 1994-12-23 | 2000-04-25 | Digirad Corporation | Bifurcated gamma camera system |
| US6080984A (en) * | 1994-12-23 | 2000-06-27 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US6091070A (en) * | 1994-12-23 | 2000-07-18 | Digirad Corporation | Semiconductor gamma- ray camera and medical imaging system |
| US6172362B1 (en) | 1994-12-23 | 2001-01-09 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US6194715B1 (en) | 1994-12-23 | 2001-02-27 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US5786597A (en) * | 1994-12-23 | 1998-07-28 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
| US7749480B2 (en) | 2008-09-30 | 2010-07-06 | 5N Plus Inc. | Cadmium telluride production process |
| US20100080750A1 (en) * | 2008-09-30 | 2010-04-01 | Audet Nicholas | Cadmium telluride production process |
| WO2011153994A3 (en) * | 2010-05-31 | 2012-03-15 | Albert-Ludwigs-Universität Freiburg | Method for growing ii-vi semiconductor crystals and ii-vi semiconductor crystals |
| US20130068156A1 (en) * | 2010-05-31 | 2013-03-21 | Albert-Ludwigs-Universitaet Freiburg | Method for growing ii-vi semiconductor crystals and ii-vi semiconductor layers |
| CN103420346A (en) * | 2012-05-22 | 2013-12-04 | 广东先导稀材股份有限公司 | Preparation method for cadmium telluride |
| CN103420346B (en) * | 2012-05-22 | 2015-02-04 | 广东先导稀材股份有限公司 | Preparation method for cadmium telluride |
| CN113428844A (en) * | 2021-06-25 | 2021-09-24 | 铜陵有色金属集团股份有限公司 | Production equipment and production process of 6N-grade high-purity tellurium |
| CN113428844B (en) * | 2021-06-25 | 2023-08-01 | 安徽铜冠产业技术研究院有限责任公司 | Production equipment and production process of 6N-level high-purity tellurium |
| CN114906825A (en) * | 2022-07-19 | 2022-08-16 | 矿冶科技集团有限公司 | Method for preparing cadmium telluride powder by wet method |
| CN116395646A (en) * | 2023-03-17 | 2023-07-07 | 广东长信精密设备有限公司 | A kind of tellurium ingot casting method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0802159B1 (en) | Method of manufacturing lithium sulfide | |
| US4911905A (en) | Method of forming stoichiometric II-VI compounds of high purity | |
| US4250205A (en) | Process for depositing a III-V semi-conductor layer on a substrate | |
| CN102421702A (en) | Methods and reactor designs for producing phosphorus pentafluoride | |
| Nagano | Growth of SnO2 whiskers by VLS mechanism | |
| JPS56100114A (en) | Alpha-type silicon nitride of high purity and its manufacture | |
| Hamilton | The synthesis of single crystals of the sulphides of zinc, cadmium and mercury and of mercuric selenide by vapour phase methods | |
| US5211801A (en) | Method for manufacturing single-crystal silicon carbide | |
| US4869893A (en) | Preparation of high purity compounds of sulfur, selenium, and tellurium | |
| US3519492A (en) | Process for the production of pure semiconductor materials | |
| JPS61291410A (en) | Silicon manufacturing method | |
| GB1570131A (en) | Manufacture of silicon | |
| RU2031983C1 (en) | Method for preparing crystals of chalcogenides of aiibvi-type | |
| JPH0259561B2 (en) | ||
| US3342551A (en) | Method and apparatus for producing a semiconducting compound of two or more components | |
| US3152932A (en) | Reduction in situ of a dipolar molecular gas adhering to a substrate | |
| US3384447A (en) | Method of producing monocrystalline boracites | |
| SU899464A1 (en) | Process for producing silicon disulphide | |
| US3305385A (en) | Method for the preparation of gallium phosphide | |
| Pernot et al. | Photo‐assisted chemical vapor deposition of gallium sulfide thin films | |
| Hellstrom et al. | Preparation of aluminum sulfide | |
| Borshchevsky et al. | Effects of heat pretreatment of starting materials on the optical transparency of CdGeAs2 crystals | |
| RU1791425C (en) | Method of polycrystalline cadmium telluride block production | |
| JP3932017B2 (en) | Method for producing iron silicide crystal | |
| Jain et al. | Structure of flash-evaporated Pb1− xHgxS alloy films |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: TEXAS INSTRUMENTS INCORPORATED, TEXAS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:WEIRAUCH, DONALD F.;REEL/FRAME:005049/0738 Effective date: 19890224 |
|
| FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| FPAY | Fee payment |
Year of fee payment: 4 |
|
| FEPP | Fee payment procedure |
Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| AS | Assignment |
Owner name: RAYTHEON TI SYSTEMS, INC., TEXAS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS DEUTSCHLAND GMBH;REEL/FRAME:008628/0414 Effective date: 19970711 |
|
| FPAY | Fee payment |
Year of fee payment: 8 |
|
| AS | Assignment |
Owner name: DRS INFRARED TECHNOLOGIES, LP, NEW JERSEY Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:RAYTHEON TI SYSTEMS, INC.;REEL/FRAME:009624/0760 Effective date: 19981020 |
|
| AS | Assignment |
Owner name: DRS FPA, L.P., NEW JERSEY Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:RAYTHEON TI SYSTEMS, INC.;REEL/FRAME:009624/0422 Effective date: 19981020 |
|
| AS | Assignment |
Owner name: MELLON BANK, N.A., AS AGENT, PENNSYLVANIA Free format text: AMENDED AND RESTATED PATENT AND SECURITY AGREEMENT AND MORTGAGE;ASSIGNORS:DRS AHEAD TECHNOLOGY, INC., DRS FPA, L.P.;DRS EO, INC.;REEL/FRAME:009689/0001 Effective date: 19981020 |
|
| REMI | Maintenance fee reminder mailed | ||
| LAPS | Lapse for failure to pay maintenance fees | ||
| STCH | Information on status: patent discontinuation |
Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |
|
| FP | Lapsed due to failure to pay maintenance fee |
Effective date: 20020327 |
|
| AS | Assignment |
Owner name: FIRST UNION NATIONAL BANK, NORTH CAROLINA Free format text: ASSIGNMENT OF SECURITY INTEREST;ASSIGNOR:MELLON BANK, N.A.;REEL/FRAME:012884/0280 Effective date: 20010928 |
|
| AS | Assignment |
Owner name: FIRST UNION NATIONAL BANK, NORTH CAROLINA Free format text: SECURITY INTEREST;ASSIGNOR:DRS INFRARED TECHNOLOGIES, LP;REEL/FRAME:013463/0251 Effective date: 20010928 |
|
| AS | Assignment |
Owner name: WACHOVIA BANK, NATIONAL ASSOCIATION, NORTH CAROLIN Free format text: PATENT SECURITY AGREEMENT;ASSIGNOR:DRS SENSORS & TARGETING SYSTEMS, INC.;REEL/FRAME:019580/0785 Effective date: 20060615 |