US4719641A - Multiple chamber laser containment system - Google Patents
Multiple chamber laser containment system Download PDFInfo
- Publication number
- US4719641A US4719641A US06/796,550 US79655085A US4719641A US 4719641 A US4719641 A US 4719641A US 79655085 A US79655085 A US 79655085A US 4719641 A US4719641 A US 4719641A
- Authority
- US
- United States
- Prior art keywords
- laser
- medium
- vessel
- pressurized
- head assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000007789 gas Substances 0.000 claims description 29
- 239000000203 mixture Substances 0.000 claims description 16
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 8
- 230000005284 excitation Effects 0.000 claims description 8
- 238000000605 extraction Methods 0.000 claims description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 229910052757 nitrogen Inorganic materials 0.000 claims description 4
- 229910018503 SF6 Inorganic materials 0.000 claims description 3
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 239000001307 helium Substances 0.000 claims description 3
- 229910052734 helium Inorganic materials 0.000 claims description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 3
- SFZCNBIFKDRMGX-UHFFFAOYSA-N sulfur hexafluoride Chemical compound FS(F)(F)(F)(F)F SFZCNBIFKDRMGX-UHFFFAOYSA-N 0.000 claims description 3
- 229960000909 sulfur hexafluoride Drugs 0.000 claims description 3
- 229910052743 krypton Inorganic materials 0.000 claims description 2
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052754 neon Inorganic materials 0.000 claims description 2
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims description 2
- 229910052724 xenon Inorganic materials 0.000 claims description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000003990 capacitor Substances 0.000 description 17
- 230000001939 inductive effect Effects 0.000 description 4
- 239000000872 buffer Substances 0.000 description 3
- 229910052736 halogen Inorganic materials 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- ISQINHMJILFLAQ-UHFFFAOYSA-N argon hydrofluoride Chemical compound F.[Ar] ISQINHMJILFLAQ-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 239000000539 dimer Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- BQCIDUSAKPWEOX-UHFFFAOYSA-N 1,1-Difluoroethene Chemical compound FC(F)=C BQCIDUSAKPWEOX-UHFFFAOYSA-N 0.000 description 1
- 229920006370 Kynar Polymers 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- JWNBYUSSORDWOT-UHFFFAOYSA-N [Kr]Cl Chemical compound [Kr]Cl JWNBYUSSORDWOT-UHFFFAOYSA-N 0.000 description 1
- VZPPHXVFMVZRTE-UHFFFAOYSA-N [Kr]F Chemical compound [Kr]F VZPPHXVFMVZRTE-UHFFFAOYSA-N 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- CFQGDIWRTHFZMQ-UHFFFAOYSA-N argon helium Chemical compound [He].[Ar] CFQGDIWRTHFZMQ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- ILFGODHCYAHKOR-UHFFFAOYSA-N dibromoxenon Chemical compound Br[Xe]Br ILFGODHCYAHKOR-UHFFFAOYSA-N 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 229920002313 fluoropolymer Polymers 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 231100001261 hazardous Toxicity 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000002430 laser surgery Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000002560 therapeutic procedure Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- IGELFKKMDLGCJO-UHFFFAOYSA-N xenon difluoride Chemical compound F[Xe]F IGELFKKMDLGCJO-UHFFFAOYSA-N 0.000 description 1
- HGCGQDMQKGRJNO-UHFFFAOYSA-N xenon monochloride Chemical compound [Xe]Cl HGCGQDMQKGRJNO-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/038—Electrodes, e.g. special shape, configuration or composition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/036—Means for obtaining or maintaining the desired gas pressure within the tube, e.g. by gettering, replenishing; Means for circulating the gas, e.g. for equalising the pressure within the tube
Definitions
- the technical field of the invention pertains generally to lasers and more particularly to pressurized excimer laser devices and the like.
- Excimer or "excited dimer” lasers are pulsed gas lasers which typically employ mixtures of halogens and rare gases, together with buffer gases and other additives to create an active medium. When pumped to an electronically excited state, the rare gas and halogen ions form dimer molecules. These molecules emit high intensity, short wavelength radiation when they relax and return to the dissociated ground state.
- a high energy, compact and efficient excimer laser is disclosed.
- the laser medium is operated at high pressures, for example, at pressures of about 3 atmospheres or above, to yield higher performances.
- High pressure operation is achieved by employing a two or more stage containment system. Since the limiting factor in laser vessel pressurization typically is the pressure differential--about 2 atmospheres--which can be tolerated at the laser windows, the use of a multi-stage system assures that the window pressure limit is not exceeded. Multiple stage containment also provides an added measure of safety, making the laser system particularly useful for laser surgery or other therapy in hospitals and clinical environments where humans might otherwise be exposed to potentially hazardous gas leaks. Moreover, the two stage pressurization system of the present invention permits differential pressure adjustment of the laser medium.
- the high voltage supply, thyratron, magnetic switch and pulse-shaping capacitors are encased by a first containment stage and pressurized to about two or more times the normal atmosphere pressure.
- the laser vessel, itself, with the rare gas and halide mixture, can then be pressurized to higher pressure within a second containment system.
- the first containment system housing the high voltage components
- the high dielectric constant gas has a first ionization potential of about 10 electron-volts or higher.
- Such high dielectric constant gases include, without limitation, helium, neon, argon, xenon, krypton, sulfur hexafluoride, nitrogen and mixtures thereof. The use of such gases can elminate ozone production due to corona effects and allows closer packing of the high voltage components. These factors together permit higher operational voltages (i.e., up to 40 kV or more) and, thereby, increase volumetric energy extraction.
- the gas medium for the laser vessel or head is preferably pressurized to a higher pressure, for example, about three or more times normal atmospheric pressure, to further increase volumetric energy extraction.
- the gas media useful for lasers according to the present invention include, without limitation, Argon-Fluoride mixtures, Argon-Helium mixtures, Xenon-Fluoride mixtures, Xenon-Chloride mixtures, Xenon-Bromide mixtures, Krypton-Fluoride mixtures and Krypton-Chloride mixtures.
- Excimer gas mixtures useful in the present invention can also include various buffers, such as helium or argon buffers, and various additives, for enhanced performance.
- a flow nozzle be incorporated into the laser head design to insure rapid clearing of the gas medium and the elimination of stagnant pockets where heating and then arcing can occur.
- the flow nozzle design allows the laser to operate at high pulse repetition rates, directing the gas across and between any preionization elements to cool them and thereby avoid heat damage.
- ventilated discharge electrode design is disclosed to eliminate stagnant gas pockets in critical areas.
- the ventilated electrode cooperates with the flow nozzle to clear the laser medium from the discharge region between pulses.
- FIG. 1 is an overall schematic diagram of a laser system according to the invention
- FIG. 2 is more detailed partial cross-sectional, isometric representation of a laser head for use in a laser system of FIG. 1;
- FIG. 3 is an end view of the laser head of FIG. 2;
- FIG. 4 is a top view of the laser head of FIG. 2;
- FIG. 1 a detailed illustration of a laser system 10 is shown, consisting of a primary containment vessel 12, encasing a high voltage supply 14, a pulse-forming network 16 and a secondary containment vessel 18 (with a laser head assembly 20 therein).
- the primary containment vessel 12 is preferrably filled with a high dielectric constant gas 4, such as a nitrogen (80 percent) and sulfur hexafluoride (20 percent mixture, via value V3 and pressurized to about to 2-4 atmospheres.
- the secondary containment vessel contains the laser medium, for example, an argon fluoride mixture, and can be further pressurized to about 3-6 atmospheres.
- the gas tank 8 containing the laser gas is preferably housed within the primary containment vessel 12 for added safety and the gas is metered into the secondary containment vessel 18 via regulator 6.
- Valves V1 and V2 are coupled to a gas (scrubber) trap 70 and a vacuum 72 source to permit the safe evacuation of the vessels 12 and 18.
- the pulse forming network of the present invention includes primary main storage capacitors 22, a thyratron switch 24, secondary main storage capacitors 26 and a saturable magnetic switch 28.
- the high voltage source delivers D.C. high voltage of about 1 kilojoule per second at 40 V which charge capacitors 22.
- the primary storage capacitors can be formed by eight parallel-connected capacitors of about 2.5 nano-farads each.
- the thyratron switch (typically rated at 35 kV at 3-5 kA) is triggered to discharge the capacitors into a second set of storage capacitors 26 (similarly a set of eight, 2.5 nano-farad capacitors) which fed the saturable magnetic switch 28.
- the saturable switch 28 can be formed, for example, by a coaxial transmission line having a plurality of metal-impregnated core elements 29.
- the saturable switch 28 impedes the current flow until it saturates and then acts as a short circuit.
- the cummulative effect of the pulse forming network is to compress the initial high voltage pulse of about 600 nano-seconds into a pulse of about 60 nano-seconds.
- the voltage-time product associated with the charge transfer from the primary main storage capacitors 22 to the secondary capacitors 26 can be controlled.
- An initializing inductor 31 can also be employed to ground the common sides of capacitor 22 and 26, respectively, thereby providing a charging path and draining the secondary capacitors 26 between pulses.
- the laser head assembly 20 is shown in FIGS. 1-4 as consisting of a laser medium 32, a grounded electrode 34, a plurality of decoupling inductors 37, a charge transfer bus 36, a first spark array 38, a floating electrode 40, a second spark array 42 and a series of sustainer capacitors 44.
- a laser medium 32 a laser medium 32
- a grounded electrode 34 a plurality of decoupling inductors 37
- a charge transfer bus 36 for simplicity only a few of the excitation elements as shown in FIG. 1.
- the secondary containment vessel 18 also includes mirrors 50, 52 which define the resonant cavity of the laser. Mirror 52 is partially transmissive and thereby allows extraction of the laser beam through output port 54.
- the mirrors 50, 52 can be formed, for example, by reflective coatings on calcium fluoride windows.
- a blower turbine blade 56 disposed within the secondary containment vessel 18 is a blower turbine blade 56, operated by blower motor 58 to circulate the medium 32 between electrodes 34 and 40.
- an alignment laser 46 together with an adjustable mirror or prime element 48 can be disposed within the primary containment vessel 12. All of the electrical elements, as shown in FIG. 1 are preferably controlled by a microprocessor 60 or the like located outside of the containment vessels.
- FIG. 1 also shows another feature of the invention, that being, ventilated electrodes.
- the grounded electrode 34 and the floating electrode 40 can be formed by elongated rail-shaped elements, disposed opposite each other and each presenting a smooth, curved equipotential surface to the other.
- the rail-shaped elements are supported by a plurality of support posts 41. The spaces between the support posts 41 serve to ventilate the electrodes 34, 40, allowing the laser medium to flow with less obstruction.
- FIGS. 2, 3 and 4 show the elements of the laser head assembly 20 in more detail.
- Charge is transferred to the excitation system of the present invention via bus bar 36 which is electrically connected in parallel to a plurality of first spark inducing elements 38 via a plurality of decoupling inductors 37.
- bus bar 36 which is electrically connected in parallel to a plurality of first spark inducing elements 38 via a plurality of decoupling inductors 37.
- the high voltage pulse passes through the floating electrode 40 to plurality of second spark inducing elements 42.
- FIG. 3 presents a side view of the laser, showing the relationship of the electrodes 34, 40 and two individual spark-inducing elements 38a, 42a from the first and second arrays most clearly.
- Inductors 45 serve to ground the floating electrode 40 after each pulse while inductors 47 serve to drain the sustainer capacitor 44 between pulses.
- a flow channel 60 preferably formed from a high temperature fluorocarbon polymer, such as Kynar, defining a flow nozzle 62.
- FIG. 4 a top view, one preferred arrangement of the first and second spark arrays is shown wherein the position of the sustainer capacitors 44 relative to the bus bar 36 (and hence the first and second spark-inducing elements) is alternated from one side to the other side along the length of the head assembly.
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Lasers (AREA)
Abstract
Description
Claims (12)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/796,550 US4719641A (en) | 1985-11-08 | 1985-11-08 | Multiple chamber laser containment system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/796,550 US4719641A (en) | 1985-11-08 | 1985-11-08 | Multiple chamber laser containment system |
Publications (1)
Publication Number | Publication Date |
---|---|
US4719641A true US4719641A (en) | 1988-01-12 |
Family
ID=25168463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US06/796,550 Expired - Lifetime US4719641A (en) | 1985-11-08 | 1985-11-08 | Multiple chamber laser containment system |
Country Status (1)
Country | Link |
---|---|
US (1) | US4719641A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989002176A1 (en) * | 1987-08-31 | 1989-03-09 | Acculase, Inc. | Improved rare gas-halogen excimer laser |
US4866727A (en) * | 1986-11-10 | 1989-09-12 | The European Atomic Energy Community | Electromagnetic screening arrangement for a laser |
US4891818A (en) * | 1987-08-31 | 1990-01-02 | Acculase, Inc. | Rare gas-halogen excimer laser |
US5863017A (en) * | 1996-01-05 | 1999-01-26 | Cymer, Inc. | Stabilized laser platform and module interface |
EP0994541A2 (en) * | 1998-10-16 | 2000-04-19 | Cymer, Inc. | Gas laser chamber/optics support structure |
US6263007B1 (en) * | 1998-03-23 | 2001-07-17 | T & S Team Incorporated | Pulsed discharge gas laser having non-integral supply reservoir |
US6466598B2 (en) * | 1998-06-04 | 2002-10-15 | Lambda Physik Ag | F2-laser with line selection |
US6477192B2 (en) * | 1999-02-12 | 2002-11-05 | Lambda Physik Ag | Device for on-line control of output power of vacuum-UV laser |
US20050001894A1 (en) * | 2003-06-20 | 2005-01-06 | Dainippon Screen Mfg. Co Ltd. | Image recorder |
US20050175055A1 (en) * | 2004-02-11 | 2005-08-11 | Levatter Jeffrey I. | Rare gas-halogen excimer lasers with baffles |
US20070022623A1 (en) * | 2005-07-29 | 2007-02-01 | Board Of Regents Of University Of Nebraska | Laser surface drying |
US20070280323A1 (en) * | 2006-06-05 | 2007-12-06 | Cymer, Inc. | Chamber for a high energy excimer laser source |
US20100195692A1 (en) * | 2005-08-05 | 2010-08-05 | Photomedex | Apparatus and method for purging and recharging excimer laser gases |
US20100232469A1 (en) * | 2007-03-27 | 2010-09-16 | Photomedex | Method and apparatus for efficiently operating a gas discharge excimer laser |
Citations (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3449694A (en) * | 1964-09-09 | 1969-06-10 | Spectra Physics | Gas laser with internal electrodes |
US3477038A (en) * | 1965-01-22 | 1969-11-04 | Hitachi Ltd | Freon-rare gas laser |
US3702973A (en) * | 1970-09-17 | 1972-11-14 | Avco Corp | Laser or ozone generator in which a broad electron beam with a sustainer field produce a large area, uniform discharge |
US3721915A (en) * | 1969-09-19 | 1973-03-20 | Avco Corp | Electrically excited flowing gas laser and method of operation |
US3842366A (en) * | 1973-03-12 | 1974-10-15 | Battelle Memorial Institute | Double discharge, large volume excitation gas laser |
US3883818A (en) * | 1973-04-27 | 1975-05-13 | Coherent Radiation | Metal-vapor laser with improved vapor condensing means |
US4283686A (en) * | 1979-03-21 | 1981-08-11 | Avco Everett Research Laboratory, Inc. | Laser operation with closed gas and tuned duct pulsing |
US4301425A (en) * | 1979-10-10 | 1981-11-17 | The United States Of America As Represented By The United States Department Of Energy | XeCl Avalanche discharge laser employing Ar as a diluent |
US4313093A (en) * | 1979-03-23 | 1982-01-26 | Nippon Infrared Industries Co., Ltd. | Laser device |
US4317087A (en) * | 1980-03-04 | 1982-02-23 | The United States Of America As Represented By The United States Department Of Energy | Apparatus for improving the working time of the XeBr laser |
US4318056A (en) * | 1978-08-17 | 1982-03-02 | The United States Of America As Represented By The United States Department Of Energy | Excimer laser with fluoropolymer lining |
US4334199A (en) * | 1978-10-27 | 1982-06-08 | The University Of Rochester | Excimer laser |
US4340968A (en) * | 1980-06-09 | 1982-07-20 | Canadian Patents & Dev. Ltd. | Rare-gas hydrogen-halide excimer laser with hydrogen additive |
US4348647A (en) * | 1980-06-05 | 1982-09-07 | United Technologies Corporation | Stability enhanced rare-gas monofluoride lasers |
US4393505A (en) * | 1978-07-24 | 1983-07-12 | Gte Sylvania Incorporated | Gas discharge laser having a buffer gas of neon |
US4417342A (en) * | 1981-03-03 | 1983-11-22 | Lumonics Inc. | Laser |
US4426706A (en) * | 1981-12-16 | 1984-01-17 | The United States Of America As Represented By The Secretary Of The Navy | Molecular excimer gas UV preionized transverse discharge laser tube assembly |
US4618960A (en) * | 1984-01-23 | 1986-10-21 | Laser Science, Inc. | Gas laser with acoustic baffle |
US8606642B2 (en) * | 2010-02-24 | 2013-12-10 | Constantine Siounis | Remote and/or virtual mall shopping experience |
-
1985
- 1985-11-08 US US06/796,550 patent/US4719641A/en not_active Expired - Lifetime
Patent Citations (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3449694A (en) * | 1964-09-09 | 1969-06-10 | Spectra Physics | Gas laser with internal electrodes |
US3477038A (en) * | 1965-01-22 | 1969-11-04 | Hitachi Ltd | Freon-rare gas laser |
US3721915A (en) * | 1969-09-19 | 1973-03-20 | Avco Corp | Electrically excited flowing gas laser and method of operation |
US3702973A (en) * | 1970-09-17 | 1972-11-14 | Avco Corp | Laser or ozone generator in which a broad electron beam with a sustainer field produce a large area, uniform discharge |
US3842366A (en) * | 1973-03-12 | 1974-10-15 | Battelle Memorial Institute | Double discharge, large volume excitation gas laser |
US3883818A (en) * | 1973-04-27 | 1975-05-13 | Coherent Radiation | Metal-vapor laser with improved vapor condensing means |
US4393505A (en) * | 1978-07-24 | 1983-07-12 | Gte Sylvania Incorporated | Gas discharge laser having a buffer gas of neon |
US4318056A (en) * | 1978-08-17 | 1982-03-02 | The United States Of America As Represented By The United States Department Of Energy | Excimer laser with fluoropolymer lining |
US4334199A (en) * | 1978-10-27 | 1982-06-08 | The University Of Rochester | Excimer laser |
US4283686A (en) * | 1979-03-21 | 1981-08-11 | Avco Everett Research Laboratory, Inc. | Laser operation with closed gas and tuned duct pulsing |
US4313093A (en) * | 1979-03-23 | 1982-01-26 | Nippon Infrared Industries Co., Ltd. | Laser device |
US4301425A (en) * | 1979-10-10 | 1981-11-17 | The United States Of America As Represented By The United States Department Of Energy | XeCl Avalanche discharge laser employing Ar as a diluent |
US4317087A (en) * | 1980-03-04 | 1982-02-23 | The United States Of America As Represented By The United States Department Of Energy | Apparatus for improving the working time of the XeBr laser |
US4348647A (en) * | 1980-06-05 | 1982-09-07 | United Technologies Corporation | Stability enhanced rare-gas monofluoride lasers |
US4340968A (en) * | 1980-06-09 | 1982-07-20 | Canadian Patents & Dev. Ltd. | Rare-gas hydrogen-halide excimer laser with hydrogen additive |
US4417342A (en) * | 1981-03-03 | 1983-11-22 | Lumonics Inc. | Laser |
US4426706A (en) * | 1981-12-16 | 1984-01-17 | The United States Of America As Represented By The Secretary Of The Navy | Molecular excimer gas UV preionized transverse discharge laser tube assembly |
US4618960A (en) * | 1984-01-23 | 1986-10-21 | Laser Science, Inc. | Gas laser with acoustic baffle |
US8606642B2 (en) * | 2010-02-24 | 2013-12-10 | Constantine Siounis | Remote and/or virtual mall shopping experience |
Non-Patent Citations (2)
Title |
---|
"Atmospheric-Pressure Pulsed Co2 Laser Utilizing Preionization by High-Energy Electrons", Garnsworthy et al., Applied Physics Letters, vol. 19 #12, Dec. 1971. |
Atmospheric Pressure Pulsed Co 2 Laser Utilizing Preionization by High Energy Electrons , Garnsworthy et al., Applied Physics Letters, vol. 19 12, Dec. 1971. * |
Cited By (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4866727A (en) * | 1986-11-10 | 1989-09-12 | The European Atomic Energy Community | Electromagnetic screening arrangement for a laser |
WO1989002176A1 (en) * | 1987-08-31 | 1989-03-09 | Acculase, Inc. | Improved rare gas-halogen excimer laser |
US4891818A (en) * | 1987-08-31 | 1990-01-02 | Acculase, Inc. | Rare gas-halogen excimer laser |
US5863017A (en) * | 1996-01-05 | 1999-01-26 | Cymer, Inc. | Stabilized laser platform and module interface |
US6109574A (en) * | 1996-01-05 | 2000-08-29 | Cymer, Inc. | Gas laser chamber/optics support structure |
US6263007B1 (en) * | 1998-03-23 | 2001-07-17 | T & S Team Incorporated | Pulsed discharge gas laser having non-integral supply reservoir |
US6466598B2 (en) * | 1998-06-04 | 2002-10-15 | Lambda Physik Ag | F2-laser with line selection |
EP0994541A2 (en) * | 1998-10-16 | 2000-04-19 | Cymer, Inc. | Gas laser chamber/optics support structure |
EP0994541A3 (en) * | 1998-10-16 | 2002-09-25 | Cymer, Inc. | Gas laser chamber/optics support structure |
US6477192B2 (en) * | 1999-02-12 | 2002-11-05 | Lambda Physik Ag | Device for on-line control of output power of vacuum-UV laser |
US20050001894A1 (en) * | 2003-06-20 | 2005-01-06 | Dainippon Screen Mfg. Co Ltd. | Image recorder |
US7209157B2 (en) * | 2003-06-20 | 2007-04-24 | Dainippon Screen Mfg. Co., Ltd. | Image recorder |
EP1564851A1 (en) * | 2004-02-11 | 2005-08-17 | Photomedex | Rare gas-halogen excimer lasers with baffles |
US20050175055A1 (en) * | 2004-02-11 | 2005-08-11 | Levatter Jeffrey I. | Rare gas-halogen excimer lasers with baffles |
US7257144B2 (en) | 2004-02-11 | 2007-08-14 | Photomedex | Rare gas-halogen excimer lasers with baffles |
US20070022623A1 (en) * | 2005-07-29 | 2007-02-01 | Board Of Regents Of University Of Nebraska | Laser surface drying |
US20100195692A1 (en) * | 2005-08-05 | 2010-08-05 | Photomedex | Apparatus and method for purging and recharging excimer laser gases |
US20070280323A1 (en) * | 2006-06-05 | 2007-12-06 | Cymer, Inc. | Chamber for a high energy excimer laser source |
WO2007145792A2 (en) | 2006-06-05 | 2007-12-21 | Cymer, Inc. | Chamber for a high energy excimer laser source |
US7369596B2 (en) * | 2006-06-05 | 2008-05-06 | Cymer, Inc. | Chamber for a high energy excimer laser source |
WO2007145792A3 (en) * | 2006-06-05 | 2008-10-16 | Cymer Inc | Chamber for a high energy excimer laser source |
EP2036169A2 (en) * | 2006-06-05 | 2009-03-18 | Cymer, Inc. | Chamber for a high energy excimer laser source |
EP2036169A4 (en) * | 2006-06-05 | 2011-07-06 | Cymer Inc | Chamber for a high energy excimer laser source |
KR101385047B1 (en) * | 2006-06-05 | 2014-04-14 | 사이머 엘엘씨 | Chamber for a high energy excimer laser source |
US20100232469A1 (en) * | 2007-03-27 | 2010-09-16 | Photomedex | Method and apparatus for efficiently operating a gas discharge excimer laser |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4719641A (en) | Multiple chamber laser containment system | |
EP0150692B1 (en) | Corona discharge preionizer for gas laser | |
US4088965A (en) | Charge transfer reaction laser with preionization means | |
JP3353253B2 (en) | Gas pulse laser play-on device | |
US4709373A (en) | Laser excitation system | |
US4817096A (en) | Multiple wavelength excimer laser | |
EP0798823A1 (en) | Low cost corona pre-ionizer for a laser | |
US4542529A (en) | Preionizing arrangement for transversely excited lasers | |
US5042047A (en) | Laser apparatus | |
US6999492B2 (en) | Reduced-maintenance excimer laser with oil-free solid state pulser | |
US4468776A (en) | Reinjection laser oscillator and method | |
US6847670B1 (en) | Gas laser apparatus emitting ultraviolet radiation | |
US4381564A (en) | Waveguide laser having a capacitively coupled discharge | |
Hasson et al. | Simple and compact photopreionization‐stabilized excimer lasers | |
US4292600A (en) | Pulsed gas laser emitting high-power beam of short wavelength | |
Letardi et al. | Some design limitations for large-aperture high-energy per pulse excimer lasers | |
Fahlen | High‐pulse‐rate 10‐W KrF laser | |
Apollonov et al. | High-power electric-discharge CO2 laser with easily ionizable substances added to the mixture | |
Newman | XeF* and KrF* waveguide lasers excited by a capacitively coupled discharge | |
US6671302B2 (en) | Device for self-initiated UV pre-ionization of a repetitively pulsed gas laser | |
US4509174A (en) | Capacitor discharge excited gas laser | |
US4847853A (en) | CO2 tea laser having isolated preionization compartments | |
Pace et al. | Miniature, sealed TEA‐CO2 lasers with integral semiconductive preionization | |
US4882735A (en) | Modular UV preionization package for a CO2 laser | |
US4692664A (en) | Gaseous discharge device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: LASER SOLUTIONS, INC., BOSTON, MA., A CORP. OF MA. Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNORS:MULLER, DAVID F.;SCOTT, PETER B.;REEL/FRAME:004484/0213 Effective date: 19851108 Owner name: EXCIMED TECHNOLOGIES, 28 EXETER STREET, SUITE 507, Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:LASER SOLUTIONS, INC.;REEL/FRAME:004484/0211 Effective date: 19851108 |
|
AS | Assignment |
Owner name: SUMMIT TECHNOLOGY, INC., 150 COOLIDGE AVENUE, WATE Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:EXCIMED TECHNOLOGIES;REEL/FRAME:004539/0276 Effective date: 19860416 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
FEPP | Fee payment procedure |
Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FEPP | Fee payment procedure |
Free format text: PAT HLDR NO LONGER CLAIMS SMALL ENT STAT AS SMALL BUSINESS (ORIGINAL EVENT CODE: LSM2); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FPAY | Fee payment |
Year of fee payment: 12 |